Aehr Test Systems (Aehr Test) develops, manufactures and sells systems, which are designed to reduce the cost of testing flash, dynamic random access memory (DRAM), and other memory devices, and to perform reliability screening or burn-in of complex logic and memory devices. These systems can be used to perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die, or ICs still in wafer form. The Company has developed and introduced several product families, including the ABTS, FOX, MTX and MAX systems, the WaferPak cartridge and the DiePakR carrier. The Company manufactures and markets full wafer contact systems, monitored burn-in systems, massively parallel test systems, test fixtures, die carriers and related accessories. The Company markets and sells its products to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers and burn-in and test service companies.