Aehr Test Systems develops, manufactures and sells systems, which is designed to reduce the cost of testing and to perform reliability screening, or burn-in, of complex logic and memory devices. These systems can be used to perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die or ICs still in wafer form. It manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures, die carriers and related accessories. The Company has developed and introduced several product families, including the ABTSTM and FOXTM systems, the WaferPak cartridge and the DiePak carrier. The new ABTS family of systems can perform test during burn-in of complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip, and offers Individual Temperature Control for high-power advanced logic devices. The WaferPak cartridge includes a full-wafer probe card for use in testing wafers in FOX systems.