Rudolph Technologies, Inc. is engaged in the design, development, and manufacture of process control defect inspection, metrology, and process control software systems used by microelectronics device manufacturers. The Company provides yield management solutions used in both wafer processing and final manufacturing through a family of standalone systems for macro-defect inspection, probe card test and analysis, and transparent and opaque thin film measurements. It markets and sells products to logic, memory, data storage and application-specific integrated circuit device manufacturers. In Inspection Systems, the Company�s chip manufacturers deploy macro-defect inspection throughout the fab to monitor key process steps. The Company�s transparent film technology uses up to four lasers operating simultaneously at multiple angles and multiple wavelengths, providing analysis and measurement capabilities. In June 2012, the Company acquired the assets of NanoPhotonics GmbH, Mainz, Germany.