Nova Measuring Instruments Limited (Nova) is engaged in designing, developing and manufacturing of integrated process control metrology systems. The Company is also engaged in designing, manufacturing and selling metrology used in the manufacturing process of semiconductors. Nova supplies the metrology systems to the semiconductor companies globally, either directly or through process equipment manufacturers. The products of the Company include metrology systems for thin film measurement in chemical mechanical polishing and chemical vapor deposition applications; optical CD and metal line thickness (MLT) systems for use in post-copper chemical mechanical polishing applications and optical critical dimension systems for lithography and etch applications. The integrated thickness monitoring system for chemical mechanical polishing process control enables wafer-to-wafer closed loop control.