CA2049616A1 - Contactless test method and system for testing printed circuit boards - Google Patents

Contactless test method and system for testing printed circuit boards

Info

Publication number
CA2049616A1
CA2049616A1 CA2049616A CA2049616A CA2049616A1 CA 2049616 A1 CA2049616 A1 CA 2049616A1 CA 2049616 A CA2049616 A CA 2049616A CA 2049616 A CA2049616 A CA 2049616A CA 2049616 A1 CA2049616 A1 CA 2049616A1
Authority
CA
Canada
Prior art keywords
printed circuit
circuit boards
pattern
faulty
near field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2049616A
Other languages
French (fr)
Other versions
CA2049616C (en
Inventor
Jacob Soiferman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2049616A1 publication Critical patent/CA2049616A1/en
Application granted granted Critical
Publication of CA2049616C publication Critical patent/CA2049616C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/315Contactless testing by inductive methods

Abstract

This application describes a novel method and its implementation for testing unpopulated and populated electronic printed circuit boards (PCBs).
This method can be used to develop a new contactless test system (CTS). While eliminating drawbacks of existing test systems, this method measures electromagnetic near field distribution in the vicinity of a PCB, contactlessly, by using suitable sensors (possibly printed near field planar antennas) and sensitive measuring and processing devices. The electromagnetic fields (EMF) are generated by the distribution of charges and currents on paths and elements of the board under test (BUT). Therefore, accurate and repeatable measurements of these fields produce a specific pattern for the BUT. Such a pattern is then compared to a known pattern for the same type of board to determine whether the BUT is faulty or non-faulty.
CA002049616A 1991-01-22 1991-08-21 Contactless test method and system for testing printed circuit boards Expired - Fee Related CA2049616C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64335691A 1991-01-22 1991-01-22
US643,356 1991-01-22

Publications (2)

Publication Number Publication Date
CA2049616A1 true CA2049616A1 (en) 1992-07-23
CA2049616C CA2049616C (en) 2000-04-04

Family

ID=24580470

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002049616A Expired - Fee Related CA2049616C (en) 1991-01-22 1991-08-21 Contactless test method and system for testing printed circuit boards

Country Status (2)

Country Link
US (1) US5218294A (en)
CA (1) CA2049616C (en)

Families Citing this family (82)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5406209A (en) * 1993-02-04 1995-04-11 Northern Telecom Limited Methods and apparatus for testing circuit boards
US5631572A (en) * 1993-09-17 1997-05-20 Teradyne, Inc. Printed circuit board tester using magnetic induction
DE4402230C1 (en) * 1994-01-26 1995-01-19 Gfp Ges Fuer Prueftechnik Mbh Method for testing whether terminal pins (posts) of an integrated circuit are electrically conductively soldered into a printed circuit and circuit arrangement for carrying out the method
JP3368451B2 (en) * 1995-03-17 2003-01-20 富士通株式会社 Circuit board manufacturing method and circuit inspection device
US5517110A (en) * 1995-04-06 1996-05-14 Yentec Inc. Contactless test method and system for testing printed circuit boards
SG45512A1 (en) * 1995-10-30 1998-01-16 Matsushita Electric Ind Co Ltd Electromagnetic radiation measuring apparatus
DE19541307C2 (en) * 1995-11-06 2001-09-27 Atg Test Systems Gmbh Method for testing electrical conductor arrangements and device for carrying out the method
CA2162347C (en) * 1995-11-07 2001-01-09 Gary Gunthorpe Method and apparatus for high-speed scanning of electromagnetic field levels
US5714888A (en) * 1995-12-26 1998-02-03 Motorola, Inc. Method and apparatus for testing electronic circuitry in a manufacturing environment
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester
US5821759A (en) * 1997-02-27 1998-10-13 International Business Machines Corporation Method and apparatus for detecting shorts in a multi-layer electronic package
US6154043A (en) * 1997-05-07 2000-11-28 Advanced Micro Devices, Inc. Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer
US6118279A (en) 1997-07-30 2000-09-12 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
US6107806A (en) 1997-07-30 2000-08-22 Candescent Technologies Corporation Device for magnetically sensing current in plate structure
US6201403B1 (en) * 1997-09-22 2001-03-13 Nortel Networks Limited Integrated circuit package shielding characterization method and apparatus
DE19742055C2 (en) * 1997-09-24 2000-02-24 Ita Ingb Testaufgaben Gmbh Device for testing circuit boards
US6331782B1 (en) 1998-03-23 2001-12-18 Conexant Systems, Inc. Method and apparatus for wireless testing of integrated circuits
IL124961A (en) * 1998-06-16 2006-10-05 Orbotech Ltd Contactless test method and system
DE19837169A1 (en) * 1998-08-17 2000-02-24 Reinhold Wein Method for testing printed and unprinted circuit board assemblies aligning a focused, high-frequency electromagnetic transmission beam to irradiate a component to be tested and produce a spectral measuring signal.
JP3189801B2 (en) * 1998-08-28 2001-07-16 日本電気株式会社 Semiconductor evaluation device, magnetic field detector used therefor, manufacturing method thereof, and storage medium storing semiconductor evaluation program
US6300785B1 (en) 1998-10-20 2001-10-09 International Business Machines Corporation Contact-less probe of semiconductor wafers
FR2792076B1 (en) * 1999-04-06 2001-05-04 Thomson Plasma DEVICE FOR TESTING AN ELECTRODE NETWORK AND RELATED METHOD
JP2003500655A (en) * 1999-05-21 2003-01-07 コネクサント システムズ インコーポレイテッド Integrated circuit wireless inspection apparatus and inspection method
JP2001272430A (en) * 2000-03-24 2001-10-05 Oht Inc Apparatus and method for inspection
US6759850B2 (en) * 2001-03-28 2004-07-06 Orbotech Ltd. System and method for non-contact electrical testing employing a CAM derived reference
JP2003035738A (en) 2001-07-19 2003-02-07 Omron Corp Method and apparatus for checking component mounting substrate
US6734681B2 (en) 2001-08-10 2004-05-11 James Sabey Apparatus and methods for testing circuit boards
US6865503B2 (en) * 2002-12-24 2005-03-08 Conexant Systems, Inc. Method and apparatus for telemetered probing of integrated circuit operation
US7220990B2 (en) 2003-08-25 2007-05-22 Tau-Metrix, Inc. Technique for evaluating a fabrication of a die and wafer
US7102363B2 (en) * 2003-11-21 2006-09-05 Neocera, Inc. Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits
DE10358794B4 (en) * 2003-12-12 2012-10-04 Eurocopter Deutschland Gmbh Near-field measurement method for printed circuit boards
WO2005081000A1 (en) * 2004-02-23 2005-09-01 Asetronics Ag Method and apparatus for inspecting a printed circuit board assembly
US7250757B1 (en) * 2004-09-16 2007-07-31 Radiation Monitoring Devices, Inc. Apparatus and method for circuit analysis using magnetic and electromagnetic stimulation of the circuit for dual magnetic field imaging
US7622931B2 (en) * 2005-10-03 2009-11-24 University Of Utah Research Foundation Non-contact reflectometry system and method
KR100799161B1 (en) * 2006-07-20 2008-01-29 마이크로 인스펙션 주식회사 Non-contact type single side probe and inspection apparatus and method for open/short test of pattern electrodes used thereof
US7496466B2 (en) * 2007-01-19 2009-02-24 Huntron, Inc. System for fault determinations for high frequency electronic circuits
JP2009002788A (en) * 2007-06-21 2009-01-08 Panasonic Corp Electromagnetic wave measuring method and electromagnetic wave measuring device
US8069490B2 (en) * 2007-10-16 2011-11-29 Oracle America, Inc. Detecting counterfeit electronic components using EMI telemetric fingerprints
FI122041B (en) * 2008-09-18 2011-07-29 Jot Automation Oy Test Adapter Configuration
US8643539B2 (en) * 2008-11-19 2014-02-04 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool
US8136982B2 (en) * 2009-03-16 2012-03-20 International Business Machines Corporation Thermal profiling to validate electronic device authenticity
US8242793B2 (en) * 2009-03-17 2012-08-14 International Business Machines Corporation Electromagnetic profiling to validate electronic device authenticity
US8760185B2 (en) * 2009-12-22 2014-06-24 Anthony J. Suto Low capacitance probe for testing circuit assembly
US8310256B2 (en) * 2009-12-22 2012-11-13 Teradyne, Inc. Capacitive opens testing in low signal environments
US9205270B2 (en) 2010-06-28 2015-12-08 Nokomis, Inc Method and apparatus for the diagnosis and prognosis of active implants in or attached to biological hosts or systems
US8825823B2 (en) 2011-01-06 2014-09-02 Nokomis, Inc System and method for physically detecting, identifying, diagnosing and geolocating electronic devices connectable to a network
US10475754B2 (en) * 2011-03-02 2019-11-12 Nokomis, Inc. System and method for physically detecting counterfeit electronics
US9059189B2 (en) 2011-03-02 2015-06-16 Nokomis, Inc Integrated circuit with electromagnetic energy anomaly detection and processing
FR2974634B1 (en) * 2011-04-27 2014-01-17 Thales Sa METHOD FOR CONTROLLING THE OPERATION OF AN ELECTRONIC COMPONENT, ELECTRONIC DEVICE AND ELECTRONIC COMPUTER FOR CORRESPONDING INBOARDS
JP2013051379A (en) * 2011-08-31 2013-03-14 Panasonic Corp High-frequency module and inspection method of high-frequency module
US8896320B2 (en) 2011-08-31 2014-11-25 Infineon Technologies Ag Measuring device and a method for measuring a chip-to-chip-carrier connection
US8933722B2 (en) * 2011-08-31 2015-01-13 Infineon Technologies Ag Measuring device and a method for measuring a chip-to-chip-carrier connection
US9285463B1 (en) 2011-12-12 2016-03-15 Nokomis, Inc. Method and apparatus for battle damage assessment of electric or electronic devices and systems
US9851386B2 (en) 2012-03-02 2017-12-26 Nokomis, Inc. Method and apparatus for detection and identification of counterfeit and substandard electronics
US9658314B2 (en) 2012-03-02 2017-05-23 Nokomis, Inc. System and method for geo-locating and detecting source of electromagnetic emissions
JP6171264B2 (en) * 2012-03-30 2017-08-02 株式会社デンソー Imaging device
US9625509B1 (en) 2013-03-06 2017-04-18 Nokomis, Inc. Automated sensor system for RF shielding characterization
US9599576B1 (en) 2013-03-06 2017-03-21 Nokomis, Inc. Acoustic—RF multi-sensor material characterization system
US9500690B2 (en) * 2013-11-07 2016-11-22 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Radio frequency and microwave imaging with a two-dimensional sensor array
WO2015089346A1 (en) 2013-12-13 2015-06-18 Battelle Memorial Institute Electronic component classification
US9772363B2 (en) 2014-02-26 2017-09-26 Nokomis, Inc. Automated analysis of RF effects on electronic devices through the use of device unintended emissions
EP2930523B1 (en) * 2014-04-10 2016-11-16 D-Con Ab Contactless conductive interconnect testing
US9642014B2 (en) 2014-06-09 2017-05-02 Nokomis, Inc. Non-contact electromagnetic illuminated detection of part anomalies for cyber physical security
US10395032B2 (en) 2014-10-03 2019-08-27 Nokomis, Inc. Detection of malicious software, firmware, IP cores and circuitry via unintended emissions
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US10895592B2 (en) * 2017-03-24 2021-01-19 Rosemount Aerospace Inc. Probe heater remaining useful life determination
US11060992B2 (en) 2017-03-24 2021-07-13 Rosemount Aerospace Inc. Probe heater remaining useful life determination
US10914777B2 (en) 2017-03-24 2021-02-09 Rosemount Aerospace Inc. Probe heater remaining useful life determination
US10789550B2 (en) 2017-04-13 2020-09-29 Battelle Memorial Institute System and method for generating test vectors
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
US10962580B2 (en) 2018-12-14 2021-03-30 Rosemount Aerospace Inc. Electric arc detection for probe heater PHM and prediction of remaining useful life
US11061080B2 (en) 2018-12-14 2021-07-13 Rosemount Aerospace Inc. Real time operational leakage current measurement for probe heater PHM and prediction of remaining useful life
US10685226B1 (en) * 2019-03-05 2020-06-16 Oracle International Corporation Detecting counterfeit components in utility system electronics based on EMI fingerprints
US11639954B2 (en) 2019-05-29 2023-05-02 Rosemount Aerospace Inc. Differential leakage current measurement for heater health monitoring
US11472562B2 (en) 2019-06-14 2022-10-18 Rosemount Aerospace Inc. Health monitoring of an electrical heater of an air data probe
CN112415358A (en) * 2019-08-22 2021-02-26 上海为彪汽配制造有限公司 Fault tracing method, storage medium, electronic device and system
US11930563B2 (en) 2019-09-16 2024-03-12 Rosemount Aerospace Inc. Monitoring and extending heater life through power supply polarity switching
EP4034895A4 (en) * 2019-09-23 2023-10-18 Palitronica Inc. A method and apparatus for detection of counterfeit parts, compromised or tampered components or devices, tampered systems such as local communication networks, and for secure identification of components
US11293995B2 (en) 2020-03-23 2022-04-05 Rosemount Aerospace Inc. Differential leakage current measurement for heater health monitoring
US11630140B2 (en) 2020-04-22 2023-04-18 Rosemount Aerospace Inc. Prognostic health monitoring for heater
CN113777464A (en) * 2020-06-10 2021-12-10 深南电路股份有限公司 Circuit board function testing device, system and method
US11768225B2 (en) 2021-06-29 2023-09-26 International Business Machines Corporation Removable contactless probe

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3327212A (en) * 1963-02-07 1967-06-20 Cutler Hammer Inc Multi-mode microwave power meter having oversized measuring waveguide section with probes on all four walls
JPS5032569B1 (en) * 1968-09-04 1975-10-22
US4507605A (en) * 1982-05-17 1985-03-26 Testamatic, Incorporated Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items
US4704614A (en) * 1985-11-06 1987-11-03 The United States Of America As Represented By The Secretary Of The Air Force Apparatus for scanning and measuring the near-field radiation of an antenna
CA1286724C (en) * 1986-03-27 1991-07-23 Richard Ralph Goulette Method and apparatus for monitoring electromagnetic emission levels

Also Published As

Publication number Publication date
US5218294A (en) 1993-06-08
CA2049616C (en) 2000-04-04

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