CA2085911A1 - Metallographic microscope useful for the characterization of conductors drawing dies - Google Patents

Metallographic microscope useful for the characterization of conductors drawing dies

Info

Publication number
CA2085911A1
CA2085911A1 CA002085911A CA2085911A CA2085911A1 CA 2085911 A1 CA2085911 A1 CA 2085911A1 CA 002085911 A CA002085911 A CA 002085911A CA 2085911 A CA2085911 A CA 2085911A CA 2085911 A1 CA2085911 A1 CA 2085911A1
Authority
CA
Canada
Prior art keywords
changes
integration
characterization
drawing dies
conductors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002085911A
Other languages
French (fr)
Other versions
CA2085911C (en
Inventor
Daniel Aguilera Longoria
Daniel Cardenas Garcia
Fernando Luengas Ruiz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centro De Investigacion Y Desarrollo Condumex SA de CV
Original Assignee
Daniel Aguilera Longoria
Daniel Cardenas Garcia
Fernando Luengas Ruiz
Centro De Investigacion Y Desarrollo Condumex, S.A. De C.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daniel Aguilera Longoria, Daniel Cardenas Garcia, Fernando Luengas Ruiz, Centro De Investigacion Y Desarrollo Condumex, S.A. De C.V. filed Critical Daniel Aguilera Longoria
Publication of CA2085911A1 publication Critical patent/CA2085911A1/en
Application granted granted Critical
Publication of CA2085911C publication Critical patent/CA2085911C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Abstract

The present invention is related to improvements to a conventional metallographic micro-scope to which changes have been made in the main parts such as the body, plating and lighting system which is integrated by two subsystems, the changes of the main parts are the following:
Integration of an electronic circuit for the control, monitoring, selection and ajustment of intensity of light.
Changes to the sources of light.
Installation of a collimating system for diascopic illumination. Integration of linear scales to the horizontal and vertical axis of the platina.
Installation of a positioning device in the platina.
Integration of the power supply of the video camera within the body of the microscope.
Internal cabling for feeding the camera, supplying signals for synchrony and video output.
These changes allow to obtain an ideal characterization of the drawing dies.
CA002085911A 1992-02-21 1992-12-21 Metallographic microscope useful for the characterization of conductors drawing dies Expired - Fee Related CA2085911C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
MX9200720 1992-02-21
MX9200720A MX9200720A (en) 1992-02-21 1992-02-21 IMPROVEMENTS TO A METALOGRAPHIC MICROSCOPE USEFUL FOR THE CHARACTERIZATION OF CONDUCTOR STRETCH DICE.

Publications (2)

Publication Number Publication Date
CA2085911A1 true CA2085911A1 (en) 1993-08-22
CA2085911C CA2085911C (en) 2001-10-16

Family

ID=19743783

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002085911A Expired - Fee Related CA2085911C (en) 1992-02-21 1992-12-21 Metallographic microscope useful for the characterization of conductors drawing dies

Country Status (8)

Country Link
US (1) US5457571A (en)
EP (1) EP0557648B1 (en)
JP (1) JP2964372B2 (en)
BR (1) BR9205102A (en)
CA (1) CA2085911C (en)
DE (1) DE69216808T2 (en)
ES (1) ES2100303T3 (en)
MX (1) MX9200720A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001521182A (en) * 1997-10-17 2001-11-06 アキュメッド インターナショナル インコーポレイテッド High precision computer-assisted microscope
JP2005321453A (en) * 2004-05-06 2005-11-17 Olympus Corp Fluorescent illuminating device for microscope
CN100371762C (en) * 2005-02-25 2008-02-27 宝钢集团上海梅山有限公司 Digital metallurgical microscopic image enlarging multiplying power calibrating method

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US977842A (en) * 1910-07-14 1910-12-06 Albert Sauveur Magnetic specimen-holder for microscopes.
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US3633991A (en) * 1969-10-01 1972-01-11 Morris Miller Metallurgical microscopes with mirror stages
CH518562A (en) * 1970-02-24 1972-01-31 Zeiss Carl Fa Method and device for the automatic focusing of microscopes
US4027942A (en) * 1975-12-16 1977-06-07 Kogaku Ltd. Micrometer microscope with binocular viewing
US4285568A (en) * 1979-08-13 1981-08-25 Alan Elgart Microscope stage
US4555620A (en) * 1983-01-11 1985-11-26 Bausch & Lomb Incorporated Automatic illumination control for multi-objective optical instruments such as microscopes
DE3312779A1 (en) * 1983-04-09 1984-10-11 Fa. Carl Zeiss, 7920 Heidenheim METHOD FOR MAKING A COMPARISON STANDARD INTO THE IMAGE OF A MICROSCOPE
JPH0662305B2 (en) * 1983-12-29 1994-08-17 オ−ストラリア国 Production of technetium-99m-labeled radiopharmaceutical
JPS60258513A (en) * 1984-06-05 1985-12-20 Olympus Optical Co Ltd Photometric microscope system
DE3535749A1 (en) * 1985-04-12 1986-10-16 Fa. Carl Zeiss, 7920 Heidenheim DEVICE FOR BRIGHTNESS CONTROL IN MICROSCOPES
DE3521047C1 (en) * 1985-06-12 1986-09-04 C. Reichert Optische Werke Ag, Wien microscope
US4971445A (en) * 1987-05-12 1990-11-20 Olympus Optical Co., Ltd. Fine surface profile measuring apparatus
JPH0245734A (en) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd Automatic structure analytic processor
DE3828381C2 (en) * 1988-08-20 1997-09-11 Zeiss Carl Fa Method and device for automatically focusing an optical system
JPH0249012A (en) * 1989-07-14 1990-02-19 Toray Ind Inc Production of novel graft copolymer
US5112129A (en) * 1990-03-02 1992-05-12 Kla Instruments Corporation Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology

Also Published As

Publication number Publication date
JPH05280924A (en) 1993-10-29
CA2085911C (en) 2001-10-16
US5457571A (en) 1995-10-10
MX9200720A (en) 1993-09-01
ES2100303T3 (en) 1997-06-16
JP2964372B2 (en) 1999-10-18
DE69216808T2 (en) 1997-08-07
EP0557648B1 (en) 1997-01-15
BR9205102A (en) 1993-08-24
EP0557648A1 (en) 1993-09-01
DE69216808D1 (en) 1997-02-27

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed