CA2119127A1 - Improved Diffusion-Type Gas Sample Chamber - Google Patents

Improved Diffusion-Type Gas Sample Chamber

Info

Publication number
CA2119127A1
CA2119127A1 CA 2119127 CA2119127A CA2119127A1 CA 2119127 A1 CA2119127 A1 CA 2119127A1 CA 2119127 CA2119127 CA 2119127 CA 2119127 A CA2119127 A CA 2119127A CA 2119127 A1 CA2119127 A1 CA 2119127A1
Authority
CA
Canada
Prior art keywords
chamber
radiation
closed
hollow tube
sample chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2119127
Other languages
French (fr)
Other versions
CA2119127C (en
Inventor
Jacob Y. Wong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gaztech International Corp
Original Assignee
Jacob Y. Wong
Gaztech International Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jacob Y. Wong, Gaztech International Corporation filed Critical Jacob Y. Wong
Publication of CA2119127A1 publication Critical patent/CA2119127A1/en
Application granted granted Critical
Publication of CA2119127C publication Critical patent/CA2119127C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N21/3518Devices using gas filter correlation techniques; Devices using gas pressure modulation techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/031Multipass arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/0332Cuvette constructions with temperature control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G08SIGNALLING
    • G08BSIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B17/00Fire alarms; Alarms responsive to explosion
    • G08B17/10Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means
    • G08B17/117Actuation by presence of smoke or gases, e.g. automatic alarm devices for analysing flowing fluid materials by the use of optical means by using a detection device for specific gases, e.g. combustion products, produced by the fire
    • GPHYSICS
    • G08SIGNALLING
    • G08BSIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B29/00Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
    • G08B29/18Prevention or correction of operating errors
    • G08B29/20Calibration, including self-calibrating arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/031Multipass arrangements
    • G01N2021/0314Double pass, autocollimated path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0385Diffusing membrane; Semipermeable membrane
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/158Eliminating condensation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids
    • G01N2021/8578Gaseous flow
    • G01N2021/8585Gaseous flow using porous sheets, e.g. for separating aerosols
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • G01N21/61Non-dispersive gas analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/02Mechanical
    • G01N2201/022Casings
    • G01N2201/0228Moulded parts

Abstract

The improved sample chamber includes an elongated hollow tube (12) closed at one end (14) and having specularly-reflective inwardly facing surfaces (16). A source (26) of radiation and a detector (28) of radiation are mounted side by side in the open end of the hollow tube, both facing the closed end. A plurality of filtering apertures (20) are formed in the tube (12), and each aperture is covered by a sheet (22) of a semipermeable membrane that serves to prevent airborne particles larger than a predetermined size from entering the chamber while not interfering with the free diffusion of the gas to be measured into and out of the chamber. The use of an elongated hollow tube that is closed at one end results in no loss in the efficiency with which the radiation is conducted from the source to the detector while decreasing the external length of the chamber by 50 percent. <IMAGE>
CA002119127A 1992-07-16 1993-07-16 Improved diffusion-type gas sample chamber Expired - Lifetime CA2119127C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/915,003 1992-07-16
US07/915,003 US5340986A (en) 1991-11-18 1992-07-16 Diffusion-type gas sample chamber

Publications (2)

Publication Number Publication Date
CA2119127A1 true CA2119127A1 (en) 1994-01-17
CA2119127C CA2119127C (en) 1997-01-21

Family

ID=25435070

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002119127A Expired - Lifetime CA2119127C (en) 1992-07-16 1993-07-16 Improved diffusion-type gas sample chamber

Country Status (9)

Country Link
US (2) US5340986A (en)
EP (2) EP0997727B1 (en)
JP (1) JPH0666724A (en)
AT (2) ATE199458T1 (en)
AU (1) AU657638B2 (en)
CA (1) CA2119127C (en)
DE (2) DE69329968T2 (en)
DK (1) DK0634009T3 (en)
WO (1) WO1994018546A1 (en)

Families Citing this family (68)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5616923A (en) * 1990-05-23 1997-04-01 Novametrix Medical Systems Inc. Gas analyzer cuvettes
JP2854731B2 (en) * 1991-07-15 1999-02-03 鐘紡株式会社 A reversing device that aligns randomly supplied noodle balls in one direction
US6107925A (en) * 1993-06-14 2000-08-22 Edwards Systems Technology, Inc. Method for dynamically adjusting criteria for detecting fire through smoke concentration
FR2712390B1 (en) * 1993-11-12 1996-02-09 Saphir Gas detection device by infrared absorption.
US5709082A (en) * 1994-06-27 1998-01-20 General Motors Corporation Modulation schemes for on-board diagnostic exhaust system
WO1996007886A1 (en) * 1994-09-02 1996-03-14 Ntc Technology, Inc. Gas analyzer cuvettes
DE4438244C1 (en) * 1994-10-26 1996-03-07 Frobenius Wolf Dietrich Prof D Gas component concn. in mixture measuring appts. for esp. carbon dioxide in atmos.
US5572031A (en) * 1994-11-23 1996-11-05 Sri International Pressure- and temperature-compensating oxygen sensor
US5475222A (en) * 1994-12-05 1995-12-12 Detector Electronics Corporation Ruggedized gas detector
DE29505014U1 (en) * 1995-03-24 1996-08-01 Palocz Andresen Michael Dr Ing Low cost multi-channel gas analyzer
US5650624A (en) * 1995-04-13 1997-07-22 Engelhard Sensor Technologies, Inc. Passive infrared analysis gas sensor
US5721430A (en) * 1995-04-13 1998-02-24 Engelhard Sensor Technologies Inc. Passive and active infrared analysis gas sensors and applicable multichannel detector assembles
SE510549C2 (en) * 1995-11-13 1999-05-31 Hans Goeran Evald Martin Gas sensor
DE19605054C2 (en) * 1996-02-12 1999-09-02 Palocz Andresen Multi-channel gas analyzer for the determination of gas components of a gas in compact form
DE19717145C2 (en) * 1997-04-23 1999-06-02 Siemens Ag Method for the selective detection of gases and gas sensor for its implementation
US5869749A (en) * 1997-04-30 1999-02-09 Honeywell Inc. Micromachined integrated opto-flow gas/liquid sensor
EP1027592B1 (en) 1997-10-28 2005-04-06 Edwards Systems Technology Inc. Diffusion-type ndir gas analyzer with convection flow
US6410918B1 (en) * 1997-10-28 2002-06-25 Edwards Systems Technology, Inc. Diffusion-type NDIR gas analyzer with improved response time due to convection flow
US6181426B1 (en) * 1998-04-03 2001-01-30 Mcdonnell Douglas Corporation Gas concentration monitoring system
TW354647U (en) * 1998-06-29 1999-03-11 Ind Tech Res Inst Air sampler
US5969811A (en) * 1998-08-24 1999-10-19 Waller; Michael V. Spectral analyzer
US6284545B1 (en) * 1999-03-24 2001-09-04 Industrial Scientific Corporation Filter for gas sensor
DE19951163A1 (en) * 1999-10-23 2001-05-17 Draeger Sicherheitstech Gmbh Gas sensor for measuring gas concentration, has beam splitter, catalytic emitter, measurement and reference radiation detectors that are arranged in housing which has partial gas permeable areas
DE10058469C1 (en) * 2000-11-24 2002-05-02 Draeger Safety Ag & Co Kgaa Robust, compact optical gas sensor, comprises reflective annular chamber promoting long, multiply-reflected circumferential beam path
US6931710B2 (en) * 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
GB2372099B (en) * 2001-02-08 2003-11-05 Status Scient Controls Ltd Gas sensor
KR100729228B1 (en) * 2001-12-12 2007-06-15 삼성전자주식회사 Apparatus for determining gas in the device
DE10221954B3 (en) * 2002-05-14 2004-01-15 Msa Auer Gmbh Infrared sensor for gas measuring devices with explosion protection approval
DE20301081U1 (en) * 2002-05-24 2003-04-10 Draeger Safety Ag & Co Kgaa Optical gas sensor
SE524900C2 (en) * 2002-07-22 2004-10-19 Senseair Ab Gas analyzing arrangements
US7028562B2 (en) * 2003-02-06 2006-04-18 University Of Maryland, Baltimore County Vacuum membrane extraction system
US7064835B2 (en) * 2003-09-02 2006-06-20 Symmetricom, Inc. Miniature gas cell with folded optics
US7284382B2 (en) * 2003-10-10 2007-10-23 Wong Jacob Y Apparatus and method for controlling a fan, cooling unit and a fresh air damper of an air conditioner through use of a Capno-Switch
US7089781B2 (en) * 2003-11-04 2006-08-15 Honeywell International, Inc. Detector with condenser
EP1695066A4 (en) * 2003-12-12 2010-02-17 Elt Inc Gas sensor
DE102004028023B4 (en) * 2004-06-09 2006-07-06 Perkinelmer Optoelectronics Gmbh & Co.Kg Sensor unit for detecting a fluid, in particular for detecting natural gas, hydrocarbons, carbon dioxide or the like. In ambient air
DE102004030855A1 (en) * 2004-06-25 2006-01-12 Tyco Electronics Raychem Gmbh Method for reducing condensation in gas sensor arrangements
US7358489B2 (en) * 2005-08-04 2008-04-15 Airware, Inc. Ultra low cost NDIR gas sensors
JP4605508B2 (en) * 2005-12-28 2011-01-05 セイコーエプソン株式会社 Atomic frequency acquisition device and atomic clock
JP2007256243A (en) * 2006-03-27 2007-10-04 Riken Keiki Co Ltd Infrared gas detector
JP2007333567A (en) * 2006-06-15 2007-12-27 Riken Keiki Co Ltd Multi-reflection type cell and infrared ray gas detector
US7715010B2 (en) * 2007-01-26 2010-05-11 O.I. Corporation Non-dispersive electromagnetic radiation detector
DE102007026073B4 (en) * 2007-05-25 2009-10-01 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Apparatus and method for determining the rate of permeation of at least one permeant through a diffusion barrier forming element
JP2009092630A (en) * 2007-10-12 2009-04-30 National Institute For Environmental Studies Aircraft loading type carbon dioxide continuous measuring device
JP5026940B2 (en) * 2007-12-06 2012-09-19 矢崎総業株式会社 Gas sample chamber and concentration measuring apparatus provided with the gas sample chamber
JP2010060485A (en) * 2008-09-05 2010-03-18 Yazaki Corp Gas cell, gas sample chamber and concentration measuring instrument
CA2751080C (en) * 2008-09-30 2018-06-12 Forced Physics Llc Method and apparatus for control of fluid temperature and flow
DE102008044171B4 (en) 2008-11-28 2022-08-11 Robert Bosch Gmbh Optical sensor, exhaust system and method of operating the sensor
DE102009001615A1 (en) * 2009-03-17 2010-09-23 Robert Bosch Gmbh Control arrangement for an exhaust gas recirculation system, exhaust gas recirculation system and method for operating an exhaust gas recirculation system
US8143581B2 (en) * 2009-08-21 2012-03-27 Jacob Y Wong Absorption biased NDIR gas sensing methodology
US8816779B2 (en) 2009-09-04 2014-08-26 Csem Centre Suisse D'electronique Et De Microtechnique S.A. Device for an atomic clock
EP2473885B1 (en) 2009-09-04 2013-05-29 CSEM Centre Suisse D'electronique Et De Microtechnique SA Device for atomic clock
GB201000756D0 (en) 2010-01-18 2010-03-03 Gas Sensing Solutions Ltd Gas sensor with radiation guide
WO2011126476A1 (en) * 2010-04-06 2011-10-13 Utc Fire & Security Corporation Toxic gas detector
US8358417B2 (en) * 2010-10-21 2013-01-22 Spectrasensors, Inc. Spectrometer with validation cell
EP2498150A1 (en) 2011-03-09 2012-09-12 CSEM Centre Suisse D'electronique Et De Microtechnique SA Atomic clock
US8178832B1 (en) * 2011-05-31 2012-05-15 Wong Jacob Y Re-calibration methodology for NDIR gas sensors
CN102778441A (en) * 2012-07-12 2012-11-14 电子科技大学 High-precision infrared gas sensor with bent pipe optical cavity gas chamber
US8842282B2 (en) * 2012-12-12 2014-09-23 Spectrasensors, Inc. Optical reflectors for spectrometer gas cells
US10488258B2 (en) 2012-12-12 2019-11-26 Spectrasensors, Inc. Optical reflectors for spectrometer gas cells
CN103884655B (en) * 2012-12-19 2017-03-15 北京大方科技有限责任公司 A kind of gas analyser sample gas cell device
CN103091279A (en) * 2013-01-11 2013-05-08 四川汇源科技发展股份有限公司 Gas sensor provided with elbow gas chamber
JP6347051B2 (en) * 2013-03-04 2018-06-27 パナソニックIpマネジメント株式会社 device
FR3005738B1 (en) * 2013-05-14 2016-02-05 Capelec OPACIMETER FOR DETECTION OF LOW LEVELS OF POLLUTANTS IN AN EXHAUST GAS
FR3030041B1 (en) * 2014-12-12 2017-12-22 Bertin Technologies Sa OPTICAL FILTERING DEVICE FOR DETECTING GAS
FR3062912A1 (en) * 2017-02-14 2018-08-17 Elichens METHOD OF ESTIMATING THE INTENSITY OF A WAVE EMITTED BY A TRANSMITTING SOURCE
NO20200904A1 (en) * 2020-08-14 2022-02-15 Optronics Tech As Gas detector system
DE102021107594A1 (en) * 2021-03-25 2022-09-29 Endress+Hauser Group Services Ag Sensor for determining a measurand and method for a measurand with a sensor

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2113062C3 (en) * 1971-03-18 1975-12-04 Heinrich Luehr Vdi Staubtechnik, 4960 Stadthagen Process for dedusting dust gases containing fine dust by means of pocket or bag filters
US3726598A (en) * 1972-02-14 1973-04-10 Wilks Scientific Corp Multiple pass optical absorption cell
US3968367A (en) * 1974-09-16 1976-07-06 Honeywell Inc. Filter system for infrared analysis
JPS5643529A (en) * 1979-09-18 1981-04-22 Nec Corp Measuring method of minute refractive index difference between optical waveguide line and its substrate
JPS60257347A (en) * 1984-06-05 1985-12-19 Ngk Insulators Ltd Normal incidence type non-dispersive infrared gas analyzer
US4749276A (en) * 1986-01-23 1988-06-07 Mcdonnell Douglas Corporation Long path absorption cell
DE3830906A1 (en) * 1988-09-10 1990-03-15 Draegerwerk Ag MIRROR ARRANGEMENT FOR A RADIATION IN A MULTIPLE REFLECTION MEASURING CELL
US5060508A (en) * 1990-04-02 1991-10-29 Gaztech Corporation Gas sample chamber
US5053754A (en) * 1990-04-02 1991-10-01 Gaztech Corporation Simple fire detector
US5222389A (en) * 1990-04-02 1993-06-29 Gaztech International Corporation Multi-channel gas sample chamber
US5125742A (en) * 1990-07-25 1992-06-30 General Analysis Corporation Long path gas absorption cell

Also Published As

Publication number Publication date
CA2119127C (en) 1997-01-21
US5340986A (en) 1994-08-23
EP0634009B1 (en) 2001-02-28
EP0997727B1 (en) 2005-11-16
EP0634009A1 (en) 1995-01-18
DE69333910T2 (en) 2006-08-10
DE69329968T2 (en) 2001-09-20
AU4681993A (en) 1994-08-29
WO1994018546A1 (en) 1994-08-18
JPH0666724A (en) 1994-03-11
AU657638B2 (en) 1995-03-16
EP0997727A1 (en) 2000-05-03
ATE199458T1 (en) 2001-03-15
DK0634009T3 (en) 2001-06-25
DE69329968D1 (en) 2001-04-05
DE69333910D1 (en) 2005-12-22
ATE310240T1 (en) 2005-12-15
EP0634009A4 (en) 1996-01-03
US5502308A (en) 1996-03-26

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