CA2162856A1 - Method of plasma mass analysis with reduced space charge effects - Google Patents

Method of plasma mass analysis with reduced space charge effects

Info

Publication number
CA2162856A1
CA2162856A1 CA002162856A CA2162856A CA2162856A1 CA 2162856 A1 CA2162856 A1 CA 2162856A1 CA 002162856 A CA002162856 A CA 002162856A CA 2162856 A CA2162856 A CA 2162856A CA 2162856 A1 CA2162856 A1 CA 2162856A1
Authority
CA
Canada
Prior art keywords
reducer
orifice
ions
skimmer
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002162856A
Other languages
French (fr)
Other versions
CA2162856C (en
Inventor
Scott D. Tanner
Donald J. Douglas
Lisa Cousins
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nordion Inc
Original Assignee
Scott D. Tanner
Donald J. Douglas
Lisa Cousins
Mds Health Group Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Scott D. Tanner, Donald J. Douglas, Lisa Cousins, Mds Health Group Limited filed Critical Scott D. Tanner
Publication of CA2162856A1 publication Critical patent/CA2162856A1/en
Application granted granted Critical
Publication of CA2162856C publication Critical patent/CA2162856C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Abstract

A method of analyzing an analyte contained in a plasma, in inductively coupled plasma mass spectrometry (ICP-MS). A sample of the plasma is drawn through an orifice in a sampler. The sample is then skimmed in a skimmer orifice, and the skimmed sample is directed at supersonic velocity onto a blunt reducer having a small orifice therein, forming a shock wave on the reducer. Gas in the shock wave is sampled through an offset aperture in the reducer into a vacuum chamber containing ion optics and a mass spectrometer. Because the gas sampled through the skimmer and reducer orifices is substantially neutral (ions and free electrons are in close proximity), and also because the reducer orifice is very small, space charge effects are reduced, thus reducing mass bias and also reducing the mass dependency of matrix effects. Separation of ions from free electrons and focusing of ions into the mass spectrometer largely occurs in and downstream of the ion optics in the vacuum chamber. Since the region between the skimmer and the reducer can operate at about 0.1 Torr, which is the same pressure as that produced by the roughing pump which backs the high vacuum pump for the vacuum chamber, a single common pump can be used for both purposes, thus reducing the hardware needed.
CA002162856A 1993-05-11 1994-05-04 Method of plasma mass analysis with reduced space charge effects Expired - Fee Related CA2162856C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/059,393 US5381008A (en) 1993-05-11 1993-05-11 Method of plasma mass analysis with reduced space charge effects
US059,393 1993-05-11
PCT/CA1994/000247 WO1994027311A2 (en) 1993-05-11 1994-05-04 Method of plasma mass analysis with reduced space charge effects

Publications (2)

Publication Number Publication Date
CA2162856A1 true CA2162856A1 (en) 1994-11-24
CA2162856C CA2162856C (en) 2003-12-09

Family

ID=22022660

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002162856A Expired - Fee Related CA2162856C (en) 1993-05-11 1994-05-04 Method of plasma mass analysis with reduced space charge effects

Country Status (7)

Country Link
US (1) US5381008A (en)
EP (1) EP0698281B1 (en)
JP (1) JPH08511897A (en)
AU (1) AU6642894A (en)
CA (1) CA2162856C (en)
DE (1) DE69402191T2 (en)
WO (1) WO1994027311A2 (en)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6436635B1 (en) * 1992-11-06 2002-08-20 Boston University Solid phase sequencing of double-stranded nucleic acids
US5795714A (en) * 1992-11-06 1998-08-18 Trustees Of Boston University Method for replicating an array of nucleic acid probes
US6194144B1 (en) 1993-01-07 2001-02-27 Sequenom, Inc. DNA sequencing by mass spectrometry
EP1262564A3 (en) 1993-01-07 2004-03-31 Sequenom, Inc. Dna sequencing by mass spectrometry
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5565679A (en) * 1993-05-11 1996-10-15 Mds Health Group Limited Method and apparatus for plasma mass analysis with reduced space charge effects
JP3385707B2 (en) * 1994-03-17 2003-03-10 株式会社日立製作所 Mass spectrometer
JP3786724B2 (en) * 1994-08-11 2006-06-14 エスアイアイ・ナノテクノロジー株式会社 Inductively coupled plasma analyzer and its sample introduction device
US7803529B1 (en) 1995-04-11 2010-09-28 Sequenom, Inc. Solid phase sequencing of biopolymers
US20060063193A1 (en) * 1995-04-11 2006-03-23 Dong-Jing Fu Solid phase sequencing of double-stranded nucleic acids
US6146854A (en) * 1995-08-31 2000-11-14 Sequenom, Inc. Filtration processes, kits and devices for isolating plasmids
GB9612070D0 (en) 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer
US5777324A (en) 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
EP0954612A2 (en) * 1996-11-06 1999-11-10 Sequenom, Inc. Dna diagnostics based on mass spectrometry
CA2268740C (en) 1996-11-06 2010-07-20 Sequenom, Inc. High density immobilization of nucleic acids
US6207370B1 (en) 1997-09-02 2001-03-27 Sequenom, Inc. Diagnostics based on mass spectrometric detection of translated target polypeptides
US6268131B1 (en) 1997-12-15 2001-07-31 Sequenom, Inc. Mass spectrometric methods for sequencing nucleic acids
US6723564B2 (en) 1998-05-07 2004-04-20 Sequenom, Inc. IR MALDI mass spectrometry of nucleic acids using liquid matrices
US6265717B1 (en) 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
US6002097A (en) * 1998-09-01 1999-12-14 Transgenomic, Inc. System and method for producing nebulized sample analyte containing solution for introduction to sample analysis systems
GB9820210D0 (en) 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
EP1373561B1 (en) 2000-06-13 2009-02-18 The Trustees of Boston University Use of mass-matched nucleotides in the analysis of oligonucleotide mixtures and in highly multiplexed nucleic acid sequencing
CA2317085C (en) 2000-08-30 2009-12-15 Mds Inc. Device and method for preventing ion source gases from entering reaction/collision cells in mass spectrometry
US6630665B2 (en) 2000-10-03 2003-10-07 Mds Inc. Device and method preventing ion source gases from entering reaction/collision cells in mass spectrometry
USRE39627E1 (en) * 2000-08-30 2007-05-15 Mds Inc. Device and method preventing ion source gases from entering reaction/collision cells in mass spectrometry
KR100649342B1 (en) 2000-10-30 2006-11-27 시쿼넘, 인코포레이티드 Method and apparatus for delivery of submicroliter volumes onto a substrate
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
US8026477B2 (en) 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7700913B2 (en) 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
EP2035122A4 (en) * 2006-05-26 2010-05-05 Ionsense Inc Flexible open tube sampling system for use with surface ionization technology
WO2008046111A2 (en) * 2006-10-13 2008-04-17 Ionsense, Inc. A sampling system for containment and transfer of ions into a spectroscopy system
US8440965B2 (en) 2006-10-13 2013-05-14 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
JP5308641B2 (en) * 2007-08-09 2013-10-09 アジレント・テクノロジーズ・インク Plasma mass spectrometer
WO2009030048A1 (en) * 2007-09-07 2009-03-12 Ionics Mass Spectrometry Group, Inc. Multi-pressure stage mass spectrometer and methods
US20090180931A1 (en) 2007-09-17 2009-07-16 Sequenom, Inc. Integrated robotic sample transfer device
US7986484B2 (en) * 2007-11-30 2011-07-26 Hitachi Global Storage Technologies, Netherlands B.V. Method and system for fabricating a data storage medium
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
GB2472638B (en) 2009-08-14 2014-03-19 Edwards Ltd Vacuum system
CA2790834C (en) 2010-02-26 2017-11-28 Perkinelmer Health Sciences, Inc. Plasma mass spectrometry with ion suppression
US9190253B2 (en) 2010-02-26 2015-11-17 Perkinelmer Health Sciences, Inc. Systems and methods of suppressing unwanted ions
SG10201501031YA (en) 2010-02-26 2015-04-29 Perkinelmer Health Sci Inc Fluid chromatography injectors and injector inserts
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
GB201109384D0 (en) * 2011-06-03 2011-07-20 Micromass Ltd Sampling with increased efficiency
WO2015122920A1 (en) * 2014-02-14 2015-08-20 Perkinelmer Health Sciences, Inc. Systems and methods for automated analysis of output in single particle inductively coupled plasma mass spectrometry and similar data sets
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US11049703B2 (en) * 2015-08-21 2021-06-29 PharmaCadence Analytical Services, LLC Methods of evaluating performance of an atmospheric pressure ionization system
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
EP4052278A4 (en) 2019-10-28 2023-11-22 Ionsense, Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
WO2023028696A1 (en) * 2021-08-30 2023-03-09 Kimia Analytics Inc. Method and apparatus to increase sensitivity of inductively coupled plasma mass spectrometry

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE33386E (en) * 1983-01-14 1990-10-16 Method and apparatus for sampling a plasma into a vacuum chamber
CA1245778A (en) * 1985-10-24 1988-11-29 John B. French Mass analyzer system with reduced drift
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
GB8901975D0 (en) * 1989-01-30 1989-03-22 Vg Instr Group Plasma mass spectrometer
JP2543761B2 (en) * 1989-03-23 1996-10-16 セイコー電子工業株式会社 Inductively coupled plasma mass spectrometer
JPH03194843A (en) * 1989-12-25 1991-08-26 Hitachi Ltd Mass spectrometer for ultramicro elemental anlysis using plasma ion source
JPH03261062A (en) * 1990-03-09 1991-11-20 Hitachi Ltd Plasma trace element mass spectrometer

Also Published As

Publication number Publication date
WO1994027311A2 (en) 1994-11-24
JPH08511897A (en) 1996-12-10
US5381008A (en) 1995-01-10
DE69402191T2 (en) 1997-07-03
CA2162856C (en) 2003-12-09
WO1994027311A3 (en) 1995-01-19
DE69402191D1 (en) 1997-04-24
EP0698281A1 (en) 1996-02-28
AU6642894A (en) 1994-12-12
EP0698281B1 (en) 1997-03-19

Similar Documents

Publication Publication Date Title
CA2162856A1 (en) Method of plasma mass analysis with reduced space charge effects
GB2309580A (en) Method and apparatus for plasma mass analysis with reduced space charge effects
WO1994027311B1 (en) Method of plasma mass analysis with reduced space charge effects
US4633084A (en) High efficiency direct detection of ions from resonance ionization of sputtered atoms
US5432343A (en) Ion focusing lensing system for a mass spectrometer interfaced to an atmospheric pressure ion source
EP0532046B1 (en) Atmospheric pressure ionisation mass spectrometer and vacuum device therefor
US7230234B2 (en) Orthogonal acceleration time-of-flight mass spectrometer
EP0660966B1 (en) Reducing interferences in plasma source mass spectrometers
CA2090616A1 (en) Apparatus and methods for trace component analysis
CA2218158A1 (en) Mass spectrometer system and method for transporting and analyzing ions
CA2343735A1 (en) Means for removing unwanted ions from an ion transport system and mass spectrometer
CA2192915A1 (en) Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
CA2262627A1 (en) Multipole ion guide ion trap mass spectrometry
MoRITA et al. High resolution mass spectrometry with inductively coupled argon plasma ionization source
US9202679B2 (en) Electrically connected sample interface for mass spectrometer
CA2259352A1 (en) Ion source for a mass analyser and method of providing a source of ions for analysis
EP1470567B1 (en) Ion trap mass spectrometer with integrated ion focusing and gating optics
US5942752A (en) Higher pressure ion source for two dimensional radio-frequency quadrupole electric field for mass spectrometer
US9305758B2 (en) Interface for mass spectrometry apparatus
EP0700068A1 (en) Apparatus and method for isotopic ratio plasma mass spectrometry
US4740696A (en) ICP mass spectrometer
US5164593A (en) Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement
US6075243A (en) Mass spectrometer
CA2116821A1 (en) Improvements in plasma mass spectrometry
US5359196A (en) Mass spectrometry with gas counterflow for particle beam

Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed