CA2172015A1 - Method for Adjusting a Position of a Solid-State Image Detector in a Given Image-Forming Optical System - Google Patents

Method for Adjusting a Position of a Solid-State Image Detector in a Given Image-Forming Optical System

Info

Publication number
CA2172015A1
CA2172015A1 CA2172015A CA2172015A CA2172015A1 CA 2172015 A1 CA2172015 A1 CA 2172015A1 CA 2172015 A CA2172015 A CA 2172015A CA 2172015 A CA2172015 A CA 2172015A CA 2172015 A1 CA2172015 A1 CA 2172015A1
Authority
CA
Canada
Prior art keywords
solid
state image
image detector
optical system
adjusting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2172015A
Other languages
French (fr)
Other versions
CA2172015C (en
Inventor
Kouji Ohura
Keiji Shintani
Yoko Koseki
Toshiro Obi
Kazuyuki Kobayashi
Hiroto Toba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP7266689A external-priority patent/JP2899553B2/en
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of CA2172015A1 publication Critical patent/CA2172015A1/en
Application granted granted Critical
Publication of CA2172015C publication Critical patent/CA2172015C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/13—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with multiple sensors
    • H04N23/15—Image signal generation with circuitry for avoiding or correcting image misregistration
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Automatic Focus Adjustment (AREA)
  • Studio Devices (AREA)

Abstract

A three-dimensional resolution chart is used to adjust the position of a solid-state image detector 4 in a given image-forming optical system. A plurality of blocks 10a are provided on an upper surface of a resolution chart 10. Each block 10a has an adjusting pattern A-D depicted on a slant surface thereof. An image of each adjusting pattern A-D is formed on the solid-state image detector 4 through a master lens 2. The contrast integration value F is calculated based on the image of the adjusting pattern at each of a plurality of designated areas hj (j=1---n) on the slant surface of each block 10a provided on the resolution chart 10, to find out a specific position on each block where the contrast integration value F becomes maximum, thereby identifying the specific position as focus point of the master lens 2. The back focus of the solid-state image detector 4 is calculated based on thus obtained focus point. An optimum gradient (.alpha., .beta.) of the solid-state image detector 4 is calculated based on three-dimensional relationship between plural focus points of the master lens 2 detected on the plural blocks 10a. Finally, each positioning mechanism 11 adjusts each solid-state image detector 4 to the calculated optimum position or at the optimum gradient.
CA002172015A 1995-06-20 1996-03-18 Method for adjusting a position of a solid-state image detector in a given image-forming optical system Expired - Fee Related CA2172015C (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP7-152871 1995-06-20
JP15287195 1995-06-20
JP7-266689 1995-10-16
JP7266689A JP2899553B2 (en) 1994-11-28 1995-10-16 Position adjustment method for solid-state imaging device

Publications (2)

Publication Number Publication Date
CA2172015A1 true CA2172015A1 (en) 1996-12-21
CA2172015C CA2172015C (en) 1999-05-25

Family

ID=26481665

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002172015A Expired - Fee Related CA2172015C (en) 1995-06-20 1996-03-18 Method for adjusting a position of a solid-state image detector in a given image-forming optical system

Country Status (2)

Country Link
US (2) US5805218A (en)
CA (1) CA2172015C (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998028919A1 (en) * 1996-12-24 1998-07-02 Mitsubishi Denki Kabushiki Kaisha Color characteristic measuring apparatus and method, and storage medium of image pickup data
US7023472B1 (en) * 1999-04-23 2006-04-04 Hewlett-Packard Development Company, L.P. Camera calibration using off-axis illumination and vignetting effects
US20010010514A1 (en) * 1999-09-07 2001-08-02 Yukinobu Ishino Position detector and attitude detector
US6727885B1 (en) 1999-09-07 2004-04-27 Nikon Corporation Graphical user interface and position or attitude detector
ATE332610T1 (en) * 2000-04-07 2006-07-15 Pilz Gmbh & Co Kg PROTECTIVE DEVICE FOR SECURING A DANGER AREA AND METHOD FOR CHECKING THE FUNCTIONAL SAFETY OF SUCH
US6985177B2 (en) * 2000-07-04 2006-01-10 Canon Kabushiki Kaisha Image sensing system and its control method
WO2005010461A1 (en) * 2003-07-25 2005-02-03 Advantest Corporation Position detection device, position detection method, test device, and camera module manufacturing device
US7629998B2 (en) * 2005-06-23 2009-12-08 Elbex Video Limited Method and apparatus for measuring illumination and camera performances
US7999851B2 (en) * 2007-05-24 2011-08-16 Tessera Technologies Ltd. Optical alignment of cameras with extended depth of field
EP2034718A1 (en) * 2007-09-05 2009-03-11 THOMSON Licensing System and method for positioning and fixing an image sensor to a beamsplitter
US8675077B2 (en) * 2008-07-23 2014-03-18 Flir Systems, Inc. Alignment metrology and resolution measurement system for imaging arrays
US9621874B2 (en) * 2014-08-29 2017-04-11 Delphi Technologies, Inc. Multiple imager camera
US11159706B2 (en) 2019-03-19 2021-10-26 Pfa Corporation Camera module manufacturing apparatus and camera module manufacturing method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4513319A (en) * 1981-12-30 1985-04-23 U.S. Philips Corporation Method for automatically setting up a television camera
JP2606185B2 (en) * 1985-06-17 1997-04-30 ソニー株式会社 Method for measuring registration of solid-state image sensor
US5140418A (en) * 1991-03-18 1992-08-18 The United States Of America As Represented By The Secretary Of The Army System for quantitatively evaluating imaging devices
US5444481A (en) * 1993-01-15 1995-08-22 Sanyo Machine Works, Ltd. Method of calibrating a CCD camera
JP3471156B2 (en) * 1995-05-30 2003-11-25 シャープ株式会社 Image shift mechanism and imaging device

Also Published As

Publication number Publication date
US5805218A (en) 1998-09-08
CA2172015C (en) 1999-05-25
US5909027A (en) 1999-06-01

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Legal Events

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EEER Examination request
MKLA Lapsed