CA2177264A1 - Apparatus and method for eliminating mapping jitter - Google Patents
Apparatus and method for eliminating mapping jitterInfo
- Publication number
- CA2177264A1 CA2177264A1 CA002177264A CA2177264A CA2177264A1 CA 2177264 A1 CA2177264 A1 CA 2177264A1 CA 002177264 A CA002177264 A CA 002177264A CA 2177264 A CA2177264 A CA 2177264A CA 2177264 A1 CA2177264 A1 CA 2177264A1
- Authority
- CA
- Canada
- Prior art keywords
- circuit
- value
- asynchronous data
- elastic
- gapfill
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J3/00—Time-division multiplex systems
- H04J3/02—Details
- H04J3/06—Synchronising arrangements
- H04J3/07—Synchronising arrangements using pulse stuffing for systems with different or fluctuating information rates or bit rates
- H04J3/076—Bit and byte stuffing, e.g. SDH/PDH desynchronisers, bit-leaking
Abstract
A desynchronizer (10) for eliminating output mapping jitter includes a demapper circuit (12) for reading asynchronous data and clock rate of an embedded signal within a synchronous channel (14). The payload data is buffered in an elastic store circuit (ESC) (17). The demapper circuit (12) outputs bit stuff and pointer justification timing adjustments (PJTAs) to an overhead gapfill circuit (OHGC) (19) and a pointer justification leaky accumulator circuit (PJLAC) (20). The OHGC (19) calculates overhead gaps within the payload data to generate a gapfill value (34). The PJLAC (20) determines the bit stuffs and pointer justifications in the payload data to produce an accumulated value (36). The gapfill and accumulated values (34, 36) are combined with an elastic fill value (EFV) (18) from the ESC (17) to eliminate instantaneous variations and reduce the effects of bit stuffing and PJTAs in the EFV (18). An adjusted fill value goes to a clock recovery PLL circuit (CRPLL) (29). The CRPLL (29) generates a clock for transmitting the data from the ESC (17).
Description
~ WO 95/15042 2 t 7 7 2 6 4 Pcr/u594/13601 APPARATUS AND MTeTHOD FOR
T.~T.TMT~rTI~ NAPPING JITTER
TEt'TlNTt'~T. FTTeT.I- OF 'I~TT' l~v~Ll~N
The pre6ent invention relates in general to t~le: ;cations n~L..J.}~: and more particularly to an Lu5 and method for eliminating mapping jitter.
I j ~ , . .
36560-1150 2 l 7 72 6 4 PCT~S 94~ 13 6 0 1
T.~T.TMT~rTI~ NAPPING JITTER
TEt'TlNTt'~T. FTTeT.I- OF 'I~TT' l~v~Ll~N
The pre6ent invention relates in general to t~le: ;cations n~L..J.}~: and more particularly to an Lu5 and method for eliminating mapping jitter.
I j ~ , . .
36560-1150 2 l 7 72 6 4 PCT~S 94~ 13 6 0 1
2 IPEA/us 2 2 JUN Igg5 BA~ ~u~ OF THE INVFNTION
A desynchronizer is a device that LeCuV:L_ an P~nhP~Pd signal containing a~yllullLvlluus data at a specific clock rate from wLthin a higher rate digital bit stream of a ~yll- IILO~UUS channel. The clock rate for the Pmhe~l iPd signal is unrelated to the clock rate for the nyllullLulloug channel. When the P~hP~l~lP~ signal is multiplexed into the Yyll~llLulluus channel, it is necesclry to synchronize the : -- ?d signal with bit or byte timing adjustments. The process of recovering the asyn~ 1lLul-ous data and clock rate of the - '~od signal is complicated by data gaps and overhead timing adjustments ne~PCs~ry to map the P~he~lAPd signal into the ~yl.~.l.Lulluus channel.
The conventional approach to ~ ting the overhead gaps is to allow them to appear as fluctuations in the instantaneous fill level of a data buffer referred to as an elastic store. Clock Lec~ Ly is accomplished by using the fill level of the elastic store to drive a low pass filter, which in turn drives a voltage control oscillator, to produce a desired clock signal for nyll~ Lùl~uuS transmission of the data from the elastic store. High frequency instal,~lneuus variations in the elastic store fill value, due to the overhead gaps installed during ~jyll~llLul~ization~ are filtered by the low pass ~ilter but not completely eliminated. Napping j itter remains on the output of the de-yll~:llLullizer due to instantaneous variations in the elastic store f ill value that are not fully filtered out. Therefore, it is desirable to have a denyl-~ l.Lul~izer without any mapping
A desynchronizer is a device that LeCuV:L_ an P~nhP~Pd signal containing a~yllullLvlluus data at a specific clock rate from wLthin a higher rate digital bit stream of a ~yll- IILO~UUS channel. The clock rate for the Pmhe~l iPd signal is unrelated to the clock rate for the nyllullLulloug channel. When the P~hP~l~lP~ signal is multiplexed into the Yyll~llLulluus channel, it is necesclry to synchronize the : -- ?d signal with bit or byte timing adjustments. The process of recovering the asyn~ 1lLul-ous data and clock rate of the - '~od signal is complicated by data gaps and overhead timing adjustments ne~PCs~ry to map the P~he~lAPd signal into the ~yl.~.l.Lulluus channel.
The conventional approach to ~ ting the overhead gaps is to allow them to appear as fluctuations in the instantaneous fill level of a data buffer referred to as an elastic store. Clock Lec~ Ly is accomplished by using the fill level of the elastic store to drive a low pass filter, which in turn drives a voltage control oscillator, to produce a desired clock signal for nyll~ Lùl~uuS transmission of the data from the elastic store. High frequency instal,~lneuus variations in the elastic store fill value, due to the overhead gaps installed during ~jyll~llLul~ization~ are filtered by the low pass ~ilter but not completely eliminated. Napping j itter remains on the output of the de-yll~:llLullizer due to instantaneous variations in the elastic store f ill value that are not fully filtered out. Therefore, it is desirable to have a denyl-~ l.Lul~izer without any mapping
3 O j itter on its output .
From the foregoing, it may be appreciated that a need has arisen for a deny..~ l.ru..izer device that eliminates instantaneous variations in the elastic store f ill value caused by overhead gaps on the nyl.. l.ru..uus channel. A need has also arisen to remove mapping jitter from the output of the denyll~llLullizer device.
AMENl~ED SHEET
~ WO95/15042 21 77264 PCT/USg4113601 6TTMMAT2V OF ~I'T-TT~ INVl;NTION
In accordance with the present invention, an apparatus and method for eliminating mapping j itter are provided which substantially eliminate or reduce di~adv-n~a~s and problems associated with conv~nti~AnAl deay.. l,Lol.izer devices .
According to an omho~l; L of the present invention, there is provided an a~uAL-Lus for eliminating mapping ~itter that ;nr1~ O~ a ~ ~ circuit for reading a~yll~llLulluus data and a clock rate of an omhe~lod signal within an ~y11u11Lu11uus payload envelope received over a ~,y11u11lv1-uus channel and an elastic store circuit for storing the aDyll~llLUllUUS data, ;nrl~l-l;nj overhead gaps and timing adjustments, read by the 1 , circuit according to the clock rate of the omhP~locl signal. Instantaneous variations due to overhead gaps in a fill value of the elastic store circuit are detorminocl by an overhead gapfill circuit . A mapping j itter elimination circuit eliminates the instAntAnooll~ variations r~Pt_rm; nod by the overhead gapfill circuit in order to recover an output clock rate for the y11u11Lu11uus transfer of ~..y11u11Lu11ous data from the elastic store circuit.
The apparatus and method of the present invention provide various torhn; ~AA 1 advantages over convont; ,A,llA 1 de_yll~llLullizer devices. For example, one terhn;rAl adv~..Lag~ is in ~otorm;n;nj the in~,La--Lu,-eous variations in the fill value of the elastic store circuit due to vvt:Ll-ead gaps placed in the ~ signal during Dyll-,llL u..ization.
Another terhn;rAl advA--La~ is in eliminating the instantaneous variations in order to recover an output clock rate for the Dy11ul1Lu11uu~ transmission of the aDyll~;llLUllUU~ data within the elastic store circuit. Yet another technical advantage is in eliminating mapping ~itter from the LeCuv~Led output clock rate of the deDy-.u1.Lu-.izer device. Other torhn;~AAl advantages are WO 95115042 2 1 7 7 2 6 4 PCrNS94/13601 ~
readily ~a~ellL to one skilled in the art ~rom the following ~igures, descriptions, and claims.
~ wo 9S/1504~ 2 1 7 7 2 6 4 PCT/USg4/13601 FIRT~F r)ES~RTPTION OF T~E DR~wJNGs For a more complete understanding of the present invention and the advantages thereof, reference is now made to the following description taken in cv..ju--~ Lion with ~ _ nying drawings, wherein like reference numerals :e~LeSellL like parts, in which:
FIGURE 1 illustrates a block diagram of a d~ay-~ ul~izer device;
FIGURE 2 illustrates a diagram of an: ` -'' 1 signal lû mapped into a ayllo11~ulluus payload envelope;
FIGURE 3 i6 a timing diagram illustrating an ~nhs-nrl~l operating mode of the deay-.. 1~, ul.izer device; and FIGI~RE 4 is a simplif ied schematic diagram of a low pass f ilter within the deay-..l.L u..izer device .
- 36560--1150 4 -- i .~ L
6 IPEA/l~
D~TATT T'lf DESt`PTPTION OF 'I~IT~' TNvENTIoN
FIGURE i is a block diagram of a deay..ul.ru.lizer device 10 . Desynchronizer device 10 ; n~ Pc a demapper circuit 12 that receives Yyll~ t u-.uus data at a _yllul~lùl-uua clock rate over synchronous channel 14. Demapper circuit 12 extracts a payload clock 15 and a payload data 16 for an '--''-' signal within ay~ Lulluus channel 14. Payload data 16 is buffered within an elastic store circuit 17 according to payload clock 15. Elastic store circuit 17 generates an elastic fill value 18 indicating a depth of asynchronous data wlthin elastic store circuit 17.
Demapper circuit 12 generates bit stuf f and pointer justif ication outputs for use by an overhead gapf ill circuit 19 and a pointer justification leaky AC, lator circuit 20. Outputs of elastic store circuit 17, overhead gapfill circuit 19, and pointer justification leaky a~ lator circuit 20 enter a mapping jitter elimination circuit 21 and pass through digital-to-analog converters 22, 24, and 26, respectively, and are combined at summing node 28. The combined output from summing node 28 enters a clock recuv~ly phase lock loop circuit 29 and are filtered by a low pass filter 30 to drive a voltage controlled oscillator 32. Voltage controlled oscillator 32 generates an output clock signal to _yll- llLUllUU~ly transmit a payload output 33 from elastic store circuit 17.
In oper~tion, desynchronizer device 10 iterates on a specific number of bytes on ~y~ollrulluus channel 14 for a predet~rm;n~l interval. The nominal frequency of the yll- llr~lluus channel is 51. 84 NHz . FIGURE 2 is a diagram of how the ~mh~ d signal is mapped into a :~yl-ullrul~ous payload envelope of the synchronous channel as def ined by the ~yll-llrulluus optical network (SONET) specification. The ayll~ ulluu5 payload envelope includes 90 bytes; 3 bytes of transport overhead, 1 byte of path overhead, and 86 bytes of the mapped ~mhorl~ecl signal. Nine ayll~llLùllOus payload envelopes make up a single frame on :-yllullLullous channel 14 AMENOE~ SffEET
_ _ _ _ _ _ _ _ _ . . . ,, ., .,,, ,, . ,,, . , _ .. ,, . , . _ . , 36560-1150 2177264 j~,~'T,i~ 94113~1 of FIGU~E 1. The ~ od signal is mapped with information bits, fixed stuff bits, stuff control bits, stuff U~J~JUL Lul~ity bits, and overhead control bits.
Demapper circuit 12 ~Locesses information on :.yl.~ l.Lùl~uuS channel 14 by extracting a synchronous payload envelope and then extracting the asyn~ l.L~uuS data and clock rate of the o~he~ ocl signal within the synchronous payload envelope. Demapper circuit 12 generates payload data 16 and payload clock 15 of the omho(~rlod signal for use by elastic store circuit 17 for storage of the asynchronous data . Demapper circuit 12 also provides bit stuf f and pointer justification outputs which indicate whether or not timing adjustments have occurred during an iteration interval .
Elastic store circuit 17 is an up/down ~ tor which accepts bit count in-iL~ ts from ,1 ror circuit 12 and bit count dec~L~ - from voltage controlled oscillator 32. Elastic store circuit 17 maintains a running count of the difference between the number of received payload data bits and the number of transmitted payload data bits. The following ~ c-lccl nn as6umes that elastic store circuit 17 has a capacity of 512 bits, allowing a fluctuation of +/-256 bits.
Overhead gap~ill circuit 19 calculates the effect of overhead gaps within the omhe~l~ocl signal. Overhead gaps neCoccii~ry to map the ai~yllcllLu~luus data to synchronous payload envelopes within ay..~ l.Lvlluus channel 14 cause instantaneous variations in elastic fill value 18 of elastic store circuit 17 that do not reflect changes in the clock rate. Typically for the omhod~o~ signal, these overhead gaps occur at an 8 kilohertz rate and can be filtered out by low pass filter 30 of clock recu~Ly phase lock loop circuit 29. EIowever, adequate elimination of the effects of the overhead gaps requires a very low bandwidth phase lock loop on the order of 1 hertz. Wider bandwidth filters would be easier and more ocn~ ici~l to implement ~ WO9S/ISo42 2 1 7 7 2 6 4 PCr~US9~J13601 than such a low bandwidth filter. Overhead gapfill circuit 19 allows for the impl Lation of wider bandwidth f ilters .
Overhead gapfill circuit 19 l~oduces a gapfill value to effectively eliminate the overhead gaps from entry into low pass filter 30 and voltage controlled oscillator 32 of clock L~Cuve:~y phase lock loop circuit 29. Gapfill value 34 is combined with elastic fill value 18 of elastic store circuit 17 to eliminate the overhead gap contribution to elastic store circuit 17 before it can ~uual~a~e through to low pass filter 30 and voltage controlled oscillator 32 of clock recovery phase lock loop circuit 29. Overhead gapfill circuit 19 calculates gapfill Yalue 34 from the following equation:
gapfillfi=~prf; 7 7" 1+ (6 . 9 ~7BPI) +BSD ~1) + [ ( 2 07 /29 ) PJ] - NBITS
where, gapfilln_1 is the previous gapfill value, (6 . 9 NBPI) is an l-e~ l~cl number of data bits per ~y~ Lulluu:, channel byte (information bits/bytes in syn~ ul.uus payload envelopes =
5+20o+92oo8+2o8=6~9) multiplied by number of ~yll~:llr u--uu~ channel bytes ~Lo~essed in each iteration, BSD is the number of data bits occurring in the bit stuff position, [ (207/29) PJ) ] is an expected number of data bits in an extra pointer justification byte (information bits/bytes of ~ signal = 6871 = 22097 ) multiplied by a pointer justification flag (+1 for added data byte, O for no adju~-i , and ~ Wo 9S/15042 2 1 7 7 2 6 4 Pcr/uS9~/13601 -1 for stuff data byte), and NBITS is the number of: '~''^~ a~y~lul~rulluus data bits received in the elastic store circuit during the iteration interval.
ûverhead gapfill circuit 19 receives the number of bytes processed, the number of bit stuffs occurring, and the pointer justification flag from t~ _, circuit 12.
ûverhead gapfill circuit l9 ~lDtprminpc the effect of an overhead gap by ~ietPrm;n~n^; the average number of data bits that should be received in the interval and subtracting the number actually received. The calculated value is added to the previous value to maintain an ~ ted phase shift.
Timing a,l; u~ t. due to bit stuf f 5 and pointer justif ications rt:uLa5~ ins~Ant~np~ c phase shi~ts in the : '~P-l signal data stream which also produces Lallkllle~/u~ changes to elastic fill value 18 of elastic store circuit 17. The effects of these inDLa--Lc...auus phase shifts can be sufficiently smoothed if a very low loop bandwidth, a small fraction of a hertz, is i _ l Led in low pass filter 30 and voltage controlled oscillator 32 of clock Le~uv~=Ly phase lock loop circuit 29. To avoid having a very low loop bandwidth and allowing for the use of a less stable voltage controlled oscillator, the timing adjustments can be digitally filtered. Pointer justif ication leaky ~ tor circuit 20 R . _ ' Les this by n~ 1 ~ting recent pointer justif ication timing 2dju~; Lt, and subtracts them from elastic fill value 18 of elastic store circuit 17. In this manner, recent pointer justification timing adju~l Ls are removed from the input to clock r~uvve:Ly phase lock loop circuit 29 of low pass filter 30 and voltage controlled oscillator 32.
An a~L l~ted value 36 detPrm;npc~ by pointer justification leaky n~ l~tor circuit 20 is allowed to decay at a very slow rate, referred to as frArtion~l bit leaking, to allow clock Lecuv Ly phase lock loop circuit 29 to ~t -'~te the phase adjustments on a gradual basis.
W09~/~5042 PCrll1S94/13601 The equation executed by pointer justification leaky accumul~tor circuit 20 once per iteration i6:
PJAn=PJAn l- [sig7l0f(P~JAL l) (MIN~as(PJAn 1) ) (2) (SC~LE/1024) ] - (7 p~
where, PJAn_1 is the previous pointer justification ~ ted value, NIN is a ,,UL UyL hl P minimum leak rate (where 10 is a nominal value, SCALE is a ~LVyL hlP factor (1, 2, 4, 8) that allows for accelerated leaking, and PJ is a pointer justification flag (+1 for added data byte, 0 for no adju~ L, and -l for stuff data byte .
The NIN value, scale factor, and 1024 divisor are designated for executing leak calculations at 1 Tn~ cpcnTl~
intervals. A pointer justification timing adju~ L
UIJUUL Lullity~ the time where PJ may have a non-zero value, occurs once every 500 micrss~ nn~lC. The accumulated PJA
value is inverted by the term (7 PJ) to allow for positive summation in circuitry external to the digital logic, such as at summing node 28.
Digital-to-analog converter 22 converts elastic f ill value 18 of elastic source circuit 17 to analog f orm by dividing the fL~4Uell~:y of a most significant bit of an elastic store circuit 17 write address by 2 and exclusive-or'ing this result with a most significant bit of an elastic store circuit 17 read address divided by 2. For an elastic store circuit 17 having a store size of 512 bits, the most significant bits change state once every 11.44 microsecnnAC (elastic store capacity of 512 bits/nominal center rLeyue~ y of voltage controlled oscillator 32 of 44.736 NHz). Nore frequent measures of elastic fill value 18 of elastic store circuit 17 may be obtained by ~ WO 9~1l5042 2 1 7 7 2 6 4 PcrluS94113601 implementing an ~nh~n~-ed mode that use6 less significant bits in the ad.lLe~c~s. This ~nh;~ln~ l mode inserts extra speed up or slow down transitions in elastic f 111 value 18 of elastic store circuit 17 in between changes of state of the most signif icant bits . Since t_e ~nh~nred mode provides more gain for small phase offsets but less dynamic range, it may be desirable to disable the ~nh~nred mode during phase lock loop initialization. FIGURE 3 shows the timing diagram for the speed up and slow down transitions of the ~nh51n-~ed mode implementation that may be performed by digital-to-analog converter 22.
Digital-to-analog converter 24 generates a pulse width modulation output containing gapfill value 34 of overhead gapfill circuit 19. Gapfill value 34 is generated once every 3 . 086 seconds or every 20 ~yllcllL~ U5 channel bytes at digital-to-analog converter 24. Digital-to-analog converter 26 generates a pulse width modulation output containing ~ ted value 36 from pointer justification leaky ? ~ tor circuit 2 0 . ~ ted value 3 6 is gelleL~Ited once every 1 mi11; ceCon~l at digital-to-analog converter 26.
FIGURE 4 is a c; _lif;ed diagram of low pass filter circuit 30. Low pass filter circuit 30 ;nrl~ c resistors R1, R3, and R4 tied to elastic fill value 18, a: l~ted value 36, and gapfill value 34, respectively, which are tied to summing node 28. A resistor R2, a capacitor C, and an operational amplif ier 38 make up the low pass f ilter l- of low pass filter 30. The three input resistors R1, R3, and R4 provide the summing function of summing node 28 as well as contributing to the definition of the loop bandwidth ~n. Clock rec~v~Ly phase lock loop circuit 29 of low pass filter 30 and voltage controlled oscillator 32 is a conventional second order phase lock loop defined by a low pass filter transfer function:
36560-1150 ~ i ~ U ~
12 IPEA/US 2 2 J~N 1g95 - F(s) 5 1 T, ~3) and open loop transfer function:
G(s) 5 Rd F(s) Ko( 1) = ~ n n t4 and a closed loop transfer function:
N(~) = 2 ~n n 2 (5) where, Tl = Rl C which equals a loop time constant in seconds, T2 ' R2 C which equals a loop time constant in seconds, Kd is the phase detector gain in volts per cycle, Rl is resistance in oh~ns, R2 is resistance in ohms, C i8 capacitance in ~arads, Ro is the VC0 gain factor in hertz per volt, Fo is the VC0 center frequency in hertz, RA is equal to Kd-Ko which is the loop gain in hertz per cycle, ~n ls equal to the sguare root o~ KA divided by T1 which is the closed loop natural f requency in radians per second, ~ is a constant, LDR is equal to ~n T2 divided by 2 which is the loop damping ratio .
Resistor R3 iB identical in value to resistor R1. The value of resistor R4 is determined such that equal input AMEN~iEO S~i'Er . . _ _ . _ . _ . _ _ _ _ _ _ _ .
36560--1150 ., -8 13 PEq~UJ
current~ ~low through each of resistors Rl, R3, and R4.
Gapfill value 34 is pulse width modulated with each new calculation of gapfill value 34 for combination to elastic rill value 18 of elastic store circuit 17 and ~rc~ ted value 36 of the timing adJu~i ts. For an overhead gapfill circuit 19 having a 12 bit width (11 bits of magnitude and 1 bit of polarity), the seven most signiricant bits are used with the 51. 84 r~Hz clock of the ~iyll~.llLUl~ous channel and the pulse width modulator is scaled to 128 counts out of 160 counts in an interval. Elastic fill value 18 of elastic store circuit 17 has a voltage range of 2 . 5 volts for a full scale value of 256 and 2.5/256 volts per bit. Gapfill value 34 has a voltage range of (128/160)-2.5 = 2 volts for a full scale value of 2048/29 and 29/1024 volts per bit. For equal input currents per bit into summing node 28 (2 . 5/256) /Rl must equal (29/1024)/R4. Hence R4 = (29/10)-Rl. Table I shows representative values of selected loop parameters.
Tl~BLE I
Rl = 15K c=0 . 331-f R2 = 499K Kd = 8 . 8 volts/UI
R3 -- 15K XO ~ 955Hz/v R4 -- 43 . 2K Jn = 41. 2 rps LDR -- 3.39 Though specific values for certain parameters are shown, none of the parameter tolerances are critical except for the ratio R4/Rl = 2 . 9 .
De~y.. ~l.Lul~izer device 10 ~,u-luces output jitter from three different sources - mapping jitter due to overhead gaps, waiting time jitter ~Luduced by bit stuffing u~u~c,L Lul,ities, and j itter ~ luced by pointer ~ustifications. Overhead gapfill circuit 19 detDrm;nDc gapfill value 34 to account for the effect of the overhead gaps and eliminate mapping j itter from the output of ~ WO95/15042 2 1 77264 PC'r/US9.t~1360~
de~,yllo1.Lvllizer device lO. Similarly, pointer justification leaky ~ tor circuit 20 llt~t~rm;nt~c :~rc~ ted value 36 and fractlonal bit leaking allows clock Le~uvt:Ly phase lock loop circuit 29 to ~ te the phase F-lJu-i ~8 on a gradual basis to reduce the effect of pointer justification jitter on the output of deayll..l.Lu.lizer device lO. Pointer justification leaky ~,: lAtor circuit 20 may also account for the waiting time jitter by inrlllA;n~ bit stuff in~ L Ls in equation 2. The new equation to account for bit stuff in~:L~ L5 is:
PJAn=PJAL l- [signof(PJAn l) (~in+abg(P~TAn-1) ) ~6) (SG~LE/1024) ] - (7-PJ) -BSA
where BSA is a bit stuff adjustment value indicating a variation from a nominal stuff ratio of 2/3 (BSA =
+2/3 for data bit in stuffing U~J~)UL Lu..ity, 0 for no stuffing opportunity, -l/3 for stuff bit in stuffing U~ )L Lu--ity) .
The fractional bit leaking of the n~ l ~ted value will also reduce the waiting time jitter due to bit stuffs through this t~nhAnrt~ addition to the equation for pointer justification leaky ~t l~tor circuit 20.
In summary, a de~y-..:l.Lv-lizer eliminates mapping jitter on its output by calculating the overhead gaps in an I ,h~ lt~Cl signal mapped into a :~yll~l~Lul-ûus channel. These overhead gaps cause inst:~n+~nt~o~C variations in the elastic fill value of an elastic store circuit which propagate onto the payload output resulting in the mapping j itter. An overhead gapfill circuit uses bit stuff outputs, pointer justification outputs, and data outputg from a tA- ~
circuit to calculate a gapfill value for the overhead gaps.
The gapfill value is added to the elastic fill value of an elastic store circuit to eliminate the i~ t~t llc variations due to overhead gaps from entering into a clock ~ Wo 9511So42 2 1 7 7 2 6 4 PCT~US94/13601 recuvury phase lock loop of a low pass filter and a voltage controlled oscillator. Jitter from bit stuffing operations and pointer justirications are reduced by eliminating an A~ ted value ~t~rmin~d by a pointer justii~ication leaky ~ tor circuit frûm the elastic fill value Or the elastic store circuit prior to ; r~ Lation of the low pass ~ilter and voltage controlled oscillator of the clock recovery phase lock loop.
Thus, it is a~ar~ L that there has been provided, in accordance with the present invention, an auua- aLus and method for eliminating mapping jitter that satisfy the advall~a~s set forth above. Although the preferred Pmho,7 i ~ L has been described in detail, it should be understood that various changes, substitutions, and alterations can be made herein. For example, though speciric values and timing intervals have been ~; CC71qqc~
alternate values and timing intervals may be used with similar effectiveness. Fur~h a, analog summation as ~mhot9ied in summation circuit 21 can be implemented digitally. Other changes may be made by one skilled in the art without departing from the spirit and scope o~ the invention as defined by the following claims.
From the foregoing, it may be appreciated that a need has arisen for a deny..~ l.ru..izer device that eliminates instantaneous variations in the elastic store f ill value caused by overhead gaps on the nyl.. l.ru..uus channel. A need has also arisen to remove mapping jitter from the output of the denyll~llLullizer device.
AMENl~ED SHEET
~ WO95/15042 21 77264 PCT/USg4113601 6TTMMAT2V OF ~I'T-TT~ INVl;NTION
In accordance with the present invention, an apparatus and method for eliminating mapping j itter are provided which substantially eliminate or reduce di~adv-n~a~s and problems associated with conv~nti~AnAl deay.. l,Lol.izer devices .
According to an omho~l; L of the present invention, there is provided an a~uAL-Lus for eliminating mapping ~itter that ;nr1~ O~ a ~ ~ circuit for reading a~yll~llLulluus data and a clock rate of an omhe~lod signal within an ~y11u11Lu11uus payload envelope received over a ~,y11u11lv1-uus channel and an elastic store circuit for storing the aDyll~llLUllUUS data, ;nrl~l-l;nj overhead gaps and timing adjustments, read by the 1 , circuit according to the clock rate of the omhP~locl signal. Instantaneous variations due to overhead gaps in a fill value of the elastic store circuit are detorminocl by an overhead gapfill circuit . A mapping j itter elimination circuit eliminates the instAntAnooll~ variations r~Pt_rm; nod by the overhead gapfill circuit in order to recover an output clock rate for the y11u11Lu11uus transfer of ~..y11u11Lu11ous data from the elastic store circuit.
The apparatus and method of the present invention provide various torhn; ~AA 1 advantages over convont; ,A,llA 1 de_yll~llLullizer devices. For example, one terhn;rAl adv~..Lag~ is in ~otorm;n;nj the in~,La--Lu,-eous variations in the fill value of the elastic store circuit due to vvt:Ll-ead gaps placed in the ~ signal during Dyll-,llL u..ization.
Another terhn;rAl advA--La~ is in eliminating the instantaneous variations in order to recover an output clock rate for the Dy11ul1Lu11uu~ transmission of the aDyll~;llLUllUU~ data within the elastic store circuit. Yet another technical advantage is in eliminating mapping ~itter from the LeCuv~Led output clock rate of the deDy-.u1.Lu-.izer device. Other torhn;~AAl advantages are WO 95115042 2 1 7 7 2 6 4 PCrNS94/13601 ~
readily ~a~ellL to one skilled in the art ~rom the following ~igures, descriptions, and claims.
~ wo 9S/1504~ 2 1 7 7 2 6 4 PCT/USg4/13601 FIRT~F r)ES~RTPTION OF T~E DR~wJNGs For a more complete understanding of the present invention and the advantages thereof, reference is now made to the following description taken in cv..ju--~ Lion with ~ _ nying drawings, wherein like reference numerals :e~LeSellL like parts, in which:
FIGURE 1 illustrates a block diagram of a d~ay-~ ul~izer device;
FIGURE 2 illustrates a diagram of an: ` -'' 1 signal lû mapped into a ayllo11~ulluus payload envelope;
FIGURE 3 i6 a timing diagram illustrating an ~nhs-nrl~l operating mode of the deay-.. 1~, ul.izer device; and FIGI~RE 4 is a simplif ied schematic diagram of a low pass f ilter within the deay-..l.L u..izer device .
- 36560--1150 4 -- i .~ L
6 IPEA/l~
D~TATT T'lf DESt`PTPTION OF 'I~IT~' TNvENTIoN
FIGURE i is a block diagram of a deay..ul.ru.lizer device 10 . Desynchronizer device 10 ; n~ Pc a demapper circuit 12 that receives Yyll~ t u-.uus data at a _yllul~lùl-uua clock rate over synchronous channel 14. Demapper circuit 12 extracts a payload clock 15 and a payload data 16 for an '--''-' signal within ay~ Lulluus channel 14. Payload data 16 is buffered within an elastic store circuit 17 according to payload clock 15. Elastic store circuit 17 generates an elastic fill value 18 indicating a depth of asynchronous data wlthin elastic store circuit 17.
Demapper circuit 12 generates bit stuf f and pointer justif ication outputs for use by an overhead gapf ill circuit 19 and a pointer justification leaky AC, lator circuit 20. Outputs of elastic store circuit 17, overhead gapfill circuit 19, and pointer justification leaky a~ lator circuit 20 enter a mapping jitter elimination circuit 21 and pass through digital-to-analog converters 22, 24, and 26, respectively, and are combined at summing node 28. The combined output from summing node 28 enters a clock recuv~ly phase lock loop circuit 29 and are filtered by a low pass filter 30 to drive a voltage controlled oscillator 32. Voltage controlled oscillator 32 generates an output clock signal to _yll- llLUllUU~ly transmit a payload output 33 from elastic store circuit 17.
In oper~tion, desynchronizer device 10 iterates on a specific number of bytes on ~y~ollrulluus channel 14 for a predet~rm;n~l interval. The nominal frequency of the yll- llr~lluus channel is 51. 84 NHz . FIGURE 2 is a diagram of how the ~mh~ d signal is mapped into a :~yl-ullrul~ous payload envelope of the synchronous channel as def ined by the ~yll-llrulluus optical network (SONET) specification. The ayll~ ulluu5 payload envelope includes 90 bytes; 3 bytes of transport overhead, 1 byte of path overhead, and 86 bytes of the mapped ~mhorl~ecl signal. Nine ayll~llLùllOus payload envelopes make up a single frame on :-yllullLullous channel 14 AMENOE~ SffEET
_ _ _ _ _ _ _ _ _ . . . ,, ., .,,, ,, . ,,, . , _ .. ,, . , . _ . , 36560-1150 2177264 j~,~'T,i~ 94113~1 of FIGU~E 1. The ~ od signal is mapped with information bits, fixed stuff bits, stuff control bits, stuff U~J~JUL Lul~ity bits, and overhead control bits.
Demapper circuit 12 ~Locesses information on :.yl.~ l.Lùl~uuS channel 14 by extracting a synchronous payload envelope and then extracting the asyn~ l.L~uuS data and clock rate of the o~he~ ocl signal within the synchronous payload envelope. Demapper circuit 12 generates payload data 16 and payload clock 15 of the omho(~rlod signal for use by elastic store circuit 17 for storage of the asynchronous data . Demapper circuit 12 also provides bit stuf f and pointer justification outputs which indicate whether or not timing adjustments have occurred during an iteration interval .
Elastic store circuit 17 is an up/down ~ tor which accepts bit count in-iL~ ts from ,1 ror circuit 12 and bit count dec~L~ - from voltage controlled oscillator 32. Elastic store circuit 17 maintains a running count of the difference between the number of received payload data bits and the number of transmitted payload data bits. The following ~ c-lccl nn as6umes that elastic store circuit 17 has a capacity of 512 bits, allowing a fluctuation of +/-256 bits.
Overhead gap~ill circuit 19 calculates the effect of overhead gaps within the omhe~l~ocl signal. Overhead gaps neCoccii~ry to map the ai~yllcllLu~luus data to synchronous payload envelopes within ay..~ l.Lvlluus channel 14 cause instantaneous variations in elastic fill value 18 of elastic store circuit 17 that do not reflect changes in the clock rate. Typically for the omhod~o~ signal, these overhead gaps occur at an 8 kilohertz rate and can be filtered out by low pass filter 30 of clock recu~Ly phase lock loop circuit 29. EIowever, adequate elimination of the effects of the overhead gaps requires a very low bandwidth phase lock loop on the order of 1 hertz. Wider bandwidth filters would be easier and more ocn~ ici~l to implement ~ WO9S/ISo42 2 1 7 7 2 6 4 PCr~US9~J13601 than such a low bandwidth filter. Overhead gapfill circuit 19 allows for the impl Lation of wider bandwidth f ilters .
Overhead gapfill circuit 19 l~oduces a gapfill value to effectively eliminate the overhead gaps from entry into low pass filter 30 and voltage controlled oscillator 32 of clock L~Cuve:~y phase lock loop circuit 29. Gapfill value 34 is combined with elastic fill value 18 of elastic store circuit 17 to eliminate the overhead gap contribution to elastic store circuit 17 before it can ~uual~a~e through to low pass filter 30 and voltage controlled oscillator 32 of clock recovery phase lock loop circuit 29. Overhead gapfill circuit 19 calculates gapfill Yalue 34 from the following equation:
gapfillfi=~prf; 7 7" 1+ (6 . 9 ~7BPI) +BSD ~1) + [ ( 2 07 /29 ) PJ] - NBITS
where, gapfilln_1 is the previous gapfill value, (6 . 9 NBPI) is an l-e~ l~cl number of data bits per ~y~ Lulluu:, channel byte (information bits/bytes in syn~ ul.uus payload envelopes =
5+20o+92oo8+2o8=6~9) multiplied by number of ~yll~:llr u--uu~ channel bytes ~Lo~essed in each iteration, BSD is the number of data bits occurring in the bit stuff position, [ (207/29) PJ) ] is an expected number of data bits in an extra pointer justification byte (information bits/bytes of ~ signal = 6871 = 22097 ) multiplied by a pointer justification flag (+1 for added data byte, O for no adju~-i , and ~ Wo 9S/15042 2 1 7 7 2 6 4 Pcr/uS9~/13601 -1 for stuff data byte), and NBITS is the number of: '~''^~ a~y~lul~rulluus data bits received in the elastic store circuit during the iteration interval.
ûverhead gapfill circuit 19 receives the number of bytes processed, the number of bit stuffs occurring, and the pointer justification flag from t~ _, circuit 12.
ûverhead gapfill circuit l9 ~lDtprminpc the effect of an overhead gap by ~ietPrm;n~n^; the average number of data bits that should be received in the interval and subtracting the number actually received. The calculated value is added to the previous value to maintain an ~ ted phase shift.
Timing a,l; u~ t. due to bit stuf f 5 and pointer justif ications rt:uLa5~ ins~Ant~np~ c phase shi~ts in the : '~P-l signal data stream which also produces Lallkllle~/u~ changes to elastic fill value 18 of elastic store circuit 17. The effects of these inDLa--Lc...auus phase shifts can be sufficiently smoothed if a very low loop bandwidth, a small fraction of a hertz, is i _ l Led in low pass filter 30 and voltage controlled oscillator 32 of clock Le~uv~=Ly phase lock loop circuit 29. To avoid having a very low loop bandwidth and allowing for the use of a less stable voltage controlled oscillator, the timing adjustments can be digitally filtered. Pointer justif ication leaky ~ tor circuit 20 R . _ ' Les this by n~ 1 ~ting recent pointer justif ication timing 2dju~; Lt, and subtracts them from elastic fill value 18 of elastic store circuit 17. In this manner, recent pointer justification timing adju~l Ls are removed from the input to clock r~uvve:Ly phase lock loop circuit 29 of low pass filter 30 and voltage controlled oscillator 32.
An a~L l~ted value 36 detPrm;npc~ by pointer justification leaky n~ l~tor circuit 20 is allowed to decay at a very slow rate, referred to as frArtion~l bit leaking, to allow clock Lecuv Ly phase lock loop circuit 29 to ~t -'~te the phase adjustments on a gradual basis.
W09~/~5042 PCrll1S94/13601 The equation executed by pointer justification leaky accumul~tor circuit 20 once per iteration i6:
PJAn=PJAn l- [sig7l0f(P~JAL l) (MIN~as(PJAn 1) ) (2) (SC~LE/1024) ] - (7 p~
where, PJAn_1 is the previous pointer justification ~ ted value, NIN is a ,,UL UyL hl P minimum leak rate (where 10 is a nominal value, SCALE is a ~LVyL hlP factor (1, 2, 4, 8) that allows for accelerated leaking, and PJ is a pointer justification flag (+1 for added data byte, 0 for no adju~ L, and -l for stuff data byte .
The NIN value, scale factor, and 1024 divisor are designated for executing leak calculations at 1 Tn~ cpcnTl~
intervals. A pointer justification timing adju~ L
UIJUUL Lullity~ the time where PJ may have a non-zero value, occurs once every 500 micrss~ nn~lC. The accumulated PJA
value is inverted by the term (7 PJ) to allow for positive summation in circuitry external to the digital logic, such as at summing node 28.
Digital-to-analog converter 22 converts elastic f ill value 18 of elastic source circuit 17 to analog f orm by dividing the fL~4Uell~:y of a most significant bit of an elastic store circuit 17 write address by 2 and exclusive-or'ing this result with a most significant bit of an elastic store circuit 17 read address divided by 2. For an elastic store circuit 17 having a store size of 512 bits, the most significant bits change state once every 11.44 microsecnnAC (elastic store capacity of 512 bits/nominal center rLeyue~ y of voltage controlled oscillator 32 of 44.736 NHz). Nore frequent measures of elastic fill value 18 of elastic store circuit 17 may be obtained by ~ WO 9~1l5042 2 1 7 7 2 6 4 PcrluS94113601 implementing an ~nh~n~-ed mode that use6 less significant bits in the ad.lLe~c~s. This ~nh;~ln~ l mode inserts extra speed up or slow down transitions in elastic f 111 value 18 of elastic store circuit 17 in between changes of state of the most signif icant bits . Since t_e ~nh~nred mode provides more gain for small phase offsets but less dynamic range, it may be desirable to disable the ~nh~nred mode during phase lock loop initialization. FIGURE 3 shows the timing diagram for the speed up and slow down transitions of the ~nh51n-~ed mode implementation that may be performed by digital-to-analog converter 22.
Digital-to-analog converter 24 generates a pulse width modulation output containing gapfill value 34 of overhead gapfill circuit 19. Gapfill value 34 is generated once every 3 . 086 seconds or every 20 ~yllcllL~ U5 channel bytes at digital-to-analog converter 24. Digital-to-analog converter 26 generates a pulse width modulation output containing ~ ted value 36 from pointer justification leaky ? ~ tor circuit 2 0 . ~ ted value 3 6 is gelleL~Ited once every 1 mi11; ceCon~l at digital-to-analog converter 26.
FIGURE 4 is a c; _lif;ed diagram of low pass filter circuit 30. Low pass filter circuit 30 ;nrl~ c resistors R1, R3, and R4 tied to elastic fill value 18, a: l~ted value 36, and gapfill value 34, respectively, which are tied to summing node 28. A resistor R2, a capacitor C, and an operational amplif ier 38 make up the low pass f ilter l- of low pass filter 30. The three input resistors R1, R3, and R4 provide the summing function of summing node 28 as well as contributing to the definition of the loop bandwidth ~n. Clock rec~v~Ly phase lock loop circuit 29 of low pass filter 30 and voltage controlled oscillator 32 is a conventional second order phase lock loop defined by a low pass filter transfer function:
36560-1150 ~ i ~ U ~
12 IPEA/US 2 2 J~N 1g95 - F(s) 5 1 T, ~3) and open loop transfer function:
G(s) 5 Rd F(s) Ko( 1) = ~ n n t4 and a closed loop transfer function:
N(~) = 2 ~n n 2 (5) where, Tl = Rl C which equals a loop time constant in seconds, T2 ' R2 C which equals a loop time constant in seconds, Kd is the phase detector gain in volts per cycle, Rl is resistance in oh~ns, R2 is resistance in ohms, C i8 capacitance in ~arads, Ro is the VC0 gain factor in hertz per volt, Fo is the VC0 center frequency in hertz, RA is equal to Kd-Ko which is the loop gain in hertz per cycle, ~n ls equal to the sguare root o~ KA divided by T1 which is the closed loop natural f requency in radians per second, ~ is a constant, LDR is equal to ~n T2 divided by 2 which is the loop damping ratio .
Resistor R3 iB identical in value to resistor R1. The value of resistor R4 is determined such that equal input AMEN~iEO S~i'Er . . _ _ . _ . _ . _ _ _ _ _ _ _ .
36560--1150 ., -8 13 PEq~UJ
current~ ~low through each of resistors Rl, R3, and R4.
Gapfill value 34 is pulse width modulated with each new calculation of gapfill value 34 for combination to elastic rill value 18 of elastic store circuit 17 and ~rc~ ted value 36 of the timing adJu~i ts. For an overhead gapfill circuit 19 having a 12 bit width (11 bits of magnitude and 1 bit of polarity), the seven most signiricant bits are used with the 51. 84 r~Hz clock of the ~iyll~.llLUl~ous channel and the pulse width modulator is scaled to 128 counts out of 160 counts in an interval. Elastic fill value 18 of elastic store circuit 17 has a voltage range of 2 . 5 volts for a full scale value of 256 and 2.5/256 volts per bit. Gapfill value 34 has a voltage range of (128/160)-2.5 = 2 volts for a full scale value of 2048/29 and 29/1024 volts per bit. For equal input currents per bit into summing node 28 (2 . 5/256) /Rl must equal (29/1024)/R4. Hence R4 = (29/10)-Rl. Table I shows representative values of selected loop parameters.
Tl~BLE I
Rl = 15K c=0 . 331-f R2 = 499K Kd = 8 . 8 volts/UI
R3 -- 15K XO ~ 955Hz/v R4 -- 43 . 2K Jn = 41. 2 rps LDR -- 3.39 Though specific values for certain parameters are shown, none of the parameter tolerances are critical except for the ratio R4/Rl = 2 . 9 .
De~y.. ~l.Lul~izer device 10 ~,u-luces output jitter from three different sources - mapping jitter due to overhead gaps, waiting time jitter ~Luduced by bit stuffing u~u~c,L Lul,ities, and j itter ~ luced by pointer ~ustifications. Overhead gapfill circuit 19 detDrm;nDc gapfill value 34 to account for the effect of the overhead gaps and eliminate mapping j itter from the output of ~ WO95/15042 2 1 77264 PC'r/US9.t~1360~
de~,yllo1.Lvllizer device lO. Similarly, pointer justification leaky ~ tor circuit 20 llt~t~rm;nt~c :~rc~ ted value 36 and fractlonal bit leaking allows clock Le~uvt:Ly phase lock loop circuit 29 to ~ te the phase F-lJu-i ~8 on a gradual basis to reduce the effect of pointer justification jitter on the output of deayll..l.Lu.lizer device lO. Pointer justification leaky ~,: lAtor circuit 20 may also account for the waiting time jitter by inrlllA;n~ bit stuff in~ L Ls in equation 2. The new equation to account for bit stuff in~:L~ L5 is:
PJAn=PJAL l- [signof(PJAn l) (~in+abg(P~TAn-1) ) ~6) (SG~LE/1024) ] - (7-PJ) -BSA
where BSA is a bit stuff adjustment value indicating a variation from a nominal stuff ratio of 2/3 (BSA =
+2/3 for data bit in stuffing U~J~)UL Lu..ity, 0 for no stuffing opportunity, -l/3 for stuff bit in stuffing U~ )L Lu--ity) .
The fractional bit leaking of the n~ l ~ted value will also reduce the waiting time jitter due to bit stuffs through this t~nhAnrt~ addition to the equation for pointer justification leaky ~t l~tor circuit 20.
In summary, a de~y-..:l.Lv-lizer eliminates mapping jitter on its output by calculating the overhead gaps in an I ,h~ lt~Cl signal mapped into a :~yll~l~Lul-ûus channel. These overhead gaps cause inst:~n+~nt~o~C variations in the elastic fill value of an elastic store circuit which propagate onto the payload output resulting in the mapping j itter. An overhead gapfill circuit uses bit stuff outputs, pointer justification outputs, and data outputg from a tA- ~
circuit to calculate a gapfill value for the overhead gaps.
The gapfill value is added to the elastic fill value of an elastic store circuit to eliminate the i~ t~t llc variations due to overhead gaps from entering into a clock ~ Wo 9511So42 2 1 7 7 2 6 4 PCT~US94/13601 recuvury phase lock loop of a low pass filter and a voltage controlled oscillator. Jitter from bit stuffing operations and pointer justirications are reduced by eliminating an A~ ted value ~t~rmin~d by a pointer justii~ication leaky ~ tor circuit frûm the elastic fill value Or the elastic store circuit prior to ; r~ Lation of the low pass ~ilter and voltage controlled oscillator of the clock recovery phase lock loop.
Thus, it is a~ar~ L that there has been provided, in accordance with the present invention, an auua- aLus and method for eliminating mapping jitter that satisfy the advall~a~s set forth above. Although the preferred Pmho,7 i ~ L has been described in detail, it should be understood that various changes, substitutions, and alterations can be made herein. For example, though speciric values and timing intervals have been ~; CC71qqc~
alternate values and timing intervals may be used with similar effectiveness. Fur~h a, analog summation as ~mhot9ied in summation circuit 21 can be implemented digitally. Other changes may be made by one skilled in the art without departing from the spirit and scope o~ the invention as defined by the following claims.
Claims (19)
1. A desynchronizer, comprising:
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in a fill level of said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations in response to said fill level of said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit.
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in a fill level of said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations in response to said fill level of said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit.
2. A desynchronizer, comprising:
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations from said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit, wherein said demapper circuit generates timing adjustment signals that indicate bit stuffs and pointer justifications made to said asynchronous data for transmission on said synchronous channel, said overhead gapfill circuit processing said timing adjustment signals in order to determine said instantaneous variations.
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations from said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit, wherein said demapper circuit generates timing adjustment signals that indicate bit stuffs and pointer justifications made to said asynchronous data for transmission on said synchronous channel, said overhead gapfill circuit processing said timing adjustment signals in order to determine said instantaneous variations.
3. The desynchronizer of Claim 1, further comprising:
a pointer justification leaky accumulator circuit for accumulating pointer justification timing adjustments, said mapping jitter elimination circuit gradually eliminating said pointer justification timing adjustments from said asynchronous data.
a pointer justification leaky accumulator circuit for accumulating pointer justification timing adjustments, said mapping jitter elimination circuit gradually eliminating said pointer justification timing adjustments from said asynchronous data.
4. A desynchronizer, comprising:
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations from said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit;
a pointer justification leaky accumulator circuit for accumulating pointer justification timing adjustments, said mapping jitter elimination circuit gradually eliminating said pointer justification timing adjustments from said asynchronous data, wherein said pointer justification leaky accumulator circuit receives bit stuff timing adjustments from said demapper circuit, said mapping jitter elimination circuit gradually eliminating said bit stuff timing adjustments from said store circuit.
a demapper circuit for reading asynchronous data received over a synchronous channel;
an elastic store circuit for storing said asynchronous data from said demapper circuit;
an overhead gapfill circuit for determining instantaneous variations in said elastic store circuit in response to overhead gaps within said asynchronous data;
a mapping jitter elimination circuit for eliminating said instantaneous variations from said elastic store circuit;
a clock recovery circuit for generating a clock signal in response to said elimination of said instantaneous variations, said clock signal operable to transmit said asynchronous data from said elastic store circuit;
a pointer justification leaky accumulator circuit for accumulating pointer justification timing adjustments, said mapping jitter elimination circuit gradually eliminating said pointer justification timing adjustments from said asynchronous data, wherein said pointer justification leaky accumulator circuit receives bit stuff timing adjustments from said demapper circuit, said mapping jitter elimination circuit gradually eliminating said bit stuff timing adjustments from said store circuit.
5. The desynchronizer of Claim 1, wherein said clock recovery circuit includes a low pass filter and a voltage controlled oscillator.
6. A desynchronizer, comprising:
a demapper circuit for reading asynchronous data received over a synchronous channel, said demapper circuit generating bit stuff and pointer justification timing adjustment signals;
an elastic store circuit for storing said asynchronous data from said demapper circuit, said elastic store circuit generating an elastic fill value that indicates a depth of said asynchronous data stored within said elastic store circuit;
an overhead gapfill circuit for determining a gapfill value that indicates instantaneous variations in said elastic fill value of said elastic store circuit caused by overhead gaps within said asynchronous data in response to said bit stuff and pointer justification timing adjustment signals;
a jitter elimination circuit for combining said gapfill value with said elastic fill value in order to eliminate mapping jitter causing instantaneous variations in said elastic fill value, said jitter elimination circuit generating a combined value of said gapfill value and said elastic fill value; and a clock recovery circuit for generating a clock signal in response to said combined value, said clock signal operable to transmit said asynchronous data from said elastic store circuit without injecting mapping jitter.
a demapper circuit for reading asynchronous data received over a synchronous channel, said demapper circuit generating bit stuff and pointer justification timing adjustment signals;
an elastic store circuit for storing said asynchronous data from said demapper circuit, said elastic store circuit generating an elastic fill value that indicates a depth of said asynchronous data stored within said elastic store circuit;
an overhead gapfill circuit for determining a gapfill value that indicates instantaneous variations in said elastic fill value of said elastic store circuit caused by overhead gaps within said asynchronous data in response to said bit stuff and pointer justification timing adjustment signals;
a jitter elimination circuit for combining said gapfill value with said elastic fill value in order to eliminate mapping jitter causing instantaneous variations in said elastic fill value, said jitter elimination circuit generating a combined value of said gapfill value and said elastic fill value; and a clock recovery circuit for generating a clock signal in response to said combined value, said clock signal operable to transmit said asynchronous data from said elastic store circuit without injecting mapping jitter.
7. The desynchronizer of Claim 6, further comprising:
a pointer justification leaky accumulator for receiving said bit stuff and pointer justification timing adjustment signals to accumulate and leak bit stuff and pointer justification timing adjustments made to said asynchronous data during placement on said synchronous channel, said jitter elimination circuit reducing waiting time jitter and pointer induced jitter from said clock rate caused by said bit stuff and pointer justification timing adjustments respectively.
a pointer justification leaky accumulator for receiving said bit stuff and pointer justification timing adjustment signals to accumulate and leak bit stuff and pointer justification timing adjustments made to said asynchronous data during placement on said synchronous channel, said jitter elimination circuit reducing waiting time jitter and pointer induced jitter from said clock rate caused by said bit stuff and pointer justification timing adjustments respectively.
8 . The desynchronizer of Claim 7, wherein said pointer justification leaky accumulator circuit generates an accumulated value in response to said bit stuff and pointer justification timing adjustment signals, said jitter elimination circuit combining said accumulated value with said elastic fill value and said gapfill value to produce said combined value and reduce bit stuff and pointer justification timing adjustment effects from said elastic fill value.
9. The desynchronizer of Claim 8, further comprising:
a digital to analog converter for converting said elastic fill value, said gapfill value, and said accumulated value into analog signals, said elastic fill value, said gapfill value, and said accumulated value having equivalent current strengths.
a digital to analog converter for converting said elastic fill value, said gapfill value, and said accumulated value into analog signals, said elastic fill value, said gapfill value, and said accumulated value having equivalent current strengths.
10. The desynchronizer of Claim 9, wherein said digital-to-analog converter converts said elastic fill value to analog form by exclusive-or'ing a most significant bit of a write address of said elastic store circuit whose frequency is divided by two with a most significant bit of a read address of said elastic store circuit whose frequency is divided by two.
11. The desynchronizer of Claim 10, wherein said digital-to-analog converter takes more frequent measures of said elastic fill value by inserting transitions in said elastic fill value in between changes of state of said most significant bits.
12. The desynchronizer of Claim 6, wherein said overhead gapfill circuit determining said gapfill value from gapfill=gapfilln-1 + (6.9NBPI)+BSD (7) + [(207/29)PJ]-NBITS
where, gapfilln-1 is the previous gapfill value, 6.9NBPI is an expected number of data bits per synchronous channel byte (information bits/bytes in synchronous payload envelopes =
5+200+208+208 divided by 90 = 6.9) multiplied by number of synchronous channel bytes processed in each iteration, BSD is the number of data bits occurring in the bit stuff position, [(207/29)PJ] is an expected number of data bits in an extra pointer justification byte (information bits bytes of embedded signal = multiplied by a pointer justification flag (+1 for added data byte, 0 for no adjustment, and -1 for stuff data byte), and NBITS is the number of embedded asynchronous data bits received in the elastic store circuit during the iteration interval.
where, gapfilln-1 is the previous gapfill value, 6.9NBPI is an expected number of data bits per synchronous channel byte (information bits/bytes in synchronous payload envelopes =
5+200+208+208 divided by 90 = 6.9) multiplied by number of synchronous channel bytes processed in each iteration, BSD is the number of data bits occurring in the bit stuff position, [(207/29)PJ] is an expected number of data bits in an extra pointer justification byte (information bits bytes of embedded signal = multiplied by a pointer justification flag (+1 for added data byte, 0 for no adjustment, and -1 for stuff data byte), and NBITS is the number of embedded asynchronous data bits received in the elastic store circuit during the iteration interval.
13. The desynchronizer of Claim 8, wherein said pointer justification leaky accumulator circuit determines said accumulated value from PJAn=PJAn-1- [signof(PJAn-1)(Min+abs(PJAn-1)) (8) (SCALE/1024)] - (7PJ)-BSA
where BSA is a bit stuff adjustment value indicating a variation from a nominal stuff ratio of 2/3 (BSA =
+2/3 for data bit in stuffing opportunity, 0 for no stuffing opportunity, -1/3 for stuff bit in stuffing opportunity).
where, PJAn-1 is the previous pointer justification accumulated value, MIN is a programmable minimum leak rate (where 10 is a nominal value, SCALE is a programmable factor (1, 2, 4, 8) that allows for accelerated leaking, and PJ is a pointer justification flag (+1 for added data byte, 0 for no adjustment, and -1 for stuff data byte.
where BSA is a bit stuff adjustment value indicating a variation from a nominal stuff ratio of 2/3 (BSA =
+2/3 for data bit in stuffing opportunity, 0 for no stuffing opportunity, -1/3 for stuff bit in stuffing opportunity).
where, PJAn-1 is the previous pointer justification accumulated value, MIN is a programmable minimum leak rate (where 10 is a nominal value, SCALE is a programmable factor (1, 2, 4, 8) that allows for accelerated leaking, and PJ is a pointer justification flag (+1 for added data byte, 0 for no adjustment, and -1 for stuff data byte.
14. A method for eliminating mapping jitter, comprising the steps of:
reading asynchronous data from a synchronous channel;
storing the asynchronous data;
generating a fill value indicating an amount of asynchronous data stored;
determining a number of bit stuff and pointer justification timing adjustments made to the asynchronous data during incorporation to the synchronous channel;
determining a number of overhead gaps in the asynchronous data in response to the bit stuff and pointer justification timing adjustments and the amount of asynchronous data stored;
creating an adjusted fill value by eliminating the number of overhead gaps from the fill value; and recovering a clock rate in response to the adjusted fill value in order to transmit the stored asynchronous data.
reading asynchronous data from a synchronous channel;
storing the asynchronous data;
generating a fill value indicating an amount of asynchronous data stored;
determining a number of bit stuff and pointer justification timing adjustments made to the asynchronous data during incorporation to the synchronous channel;
determining a number of overhead gaps in the asynchronous data in response to the bit stuff and pointer justification timing adjustments and the amount of asynchronous data stored;
creating an adjusted fill value by eliminating the number of overhead gaps from the fill value; and recovering a clock rate in response to the adjusted fill value in order to transmit the stored asynchronous data.
15. The method of Claim 14, further comprising the step of:
gradually eliminating the bit stuff and pointer justification timing adjustments from the fill value during creation of the adjusted fill value.
gradually eliminating the bit stuff and pointer justification timing adjustments from the fill value during creation of the adjusted fill value.
16. The method of Claim 15, wherein said adjusted fill value creating step includes converting the number of overhead gaps, the number of bit stuff and pointer justification timing adjustments, and the fill value into analog signals having the same current strength.
17. The method of Claim 16, wherein said adjusted fill value creating step includes combining the analog signals into the adjusted fill value prior to said clock rate recovery step.
18. The method of Claim 16, wherein the fill value is converted to analog form by exclusive-or'ing a most significant bit of a write address whose frequency is divided by two with a most significant bit of a read address whose frequency is divided by two, the write address used in said asynchronous data storing step and the read address used in said clock rate recovering step.
19. The method of Claim 18, wherein the fill value is measured more frequently by inserting transitions in the fill value in between changes of state of the most significant bits of the write and read addresses.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/158,967 US5457717A (en) | 1993-11-29 | 1993-11-29 | Apparatus and method for eliminating mapping jitter |
| US158,967 | 1993-11-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2177264A1 true CA2177264A1 (en) | 1995-06-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002177264A Abandoned CA2177264A1 (en) | 1993-11-29 | 1994-11-28 | Apparatus and method for eliminating mapping jitter |
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| Country | Link |
|---|---|
| US (1) | US5457717A (en) |
| EP (1) | EP0732015A4 (en) |
| JP (1) | JP3303110B2 (en) |
| CA (1) | CA2177264A1 (en) |
| WO (1) | WO1995015042A1 (en) |
Families Citing this family (26)
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|---|---|---|---|---|
| FI95636C (en) * | 1992-02-14 | 1996-02-26 | Nokia Telecommunications Oy | Desynchronizer and method of attenuating pointer jets in a desynchronizer |
| GB9323187D0 (en) * | 1993-11-10 | 1994-01-05 | Northern Telecom Ltd | Pointer justification even leak control |
| ES2102938B1 (en) * | 1994-03-28 | 1998-04-16 | Alcatel Standard Electrica | PHASE FLUCTUATION REDUCTION SYSTEM IN DIGITAL DEMULTIPLEXERS. |
| US5781597A (en) * | 1995-02-16 | 1998-07-14 | Alcatel Sel Aktiengesellschaft | Synchronous digital transmission system having justification circuit that counts frame bytes, calculates offsets, compares thresholds, and initiates justification action |
| US5699391A (en) * | 1995-05-31 | 1997-12-16 | Dsc Communications Corporation | Digital desynchronizer |
| US5872822A (en) * | 1995-10-26 | 1999-02-16 | Mcdata Corporation | Method and apparatus for memory sequencing |
| DK133395A (en) * | 1995-11-24 | 1997-05-25 | Dsc Communications As | Data transmission system for transmission of a large number of telephone channels and associated methods |
| US5761203A (en) * | 1996-04-04 | 1998-06-02 | Lucent Technologies Inc. | Synchronous and asynchronous recovery of signals in an ATM network |
| US6064706A (en) * | 1996-05-01 | 2000-05-16 | Alcatel Usa, Inc. | Apparatus and method of desynchronizing synchronously mapped asynchronous data |
| US5933432A (en) * | 1996-08-23 | 1999-08-03 | Daewoo Telecom, Ltd. | Mapping apparatus for use in a synchronous multiplexer |
| FI965072A (en) | 1996-12-17 | 1998-08-13 | Nokia Telecommunications Oy | Method for damping transients caused by smoothing events in a desynchronizer |
| DE19653470C2 (en) * | 1996-12-20 | 1998-10-08 | Siemens Ag | Method and arrangement for clock recovery from a digital signal |
| US6088413A (en) * | 1997-05-09 | 2000-07-11 | Alcatel | Apparatus for reducing jitter in a desynchronizer |
| JP3419345B2 (en) | 1999-05-28 | 2003-06-23 | 日本電気株式会社 | Clock recovery method and circuit for low-order group signal in pulse stuff synchronization system |
| TW452956B (en) | 2000-01-04 | 2001-09-01 | Siliconware Precision Industries Co Ltd | Heat dissipation structure of BGA semiconductor package |
| US7227918B2 (en) * | 2000-03-14 | 2007-06-05 | Altera Corporation | Clock data recovery circuitry associated with programmable logic device circuitry |
| US7333570B2 (en) * | 2000-03-14 | 2008-02-19 | Altera Corporation | Clock data recovery circuitry associated with programmable logic device circuitry |
| US6754295B1 (en) | 2000-04-07 | 2004-06-22 | Comrex Corporation | Method and apparatus for synchronizing data transmission and reception over a network |
| CA2327906A1 (en) * | 2000-12-08 | 2002-06-08 | Nortel Networks Limited | Apparatus and method for attaching a data sub-channel to a digital payload |
| US6882662B2 (en) * | 2001-06-07 | 2005-04-19 | Applied Micro Circuits Corporation | Pointer adjustment wander and jitter reduction apparatus for a desynchronizer |
| US7286568B2 (en) * | 2002-09-03 | 2007-10-23 | Intel Corporation | Techniques to generate a clock signal |
| US7443888B2 (en) * | 2003-10-02 | 2008-10-28 | Ciena Corporation | Transparent sub-wavelength network |
| US7564875B2 (en) * | 2003-11-11 | 2009-07-21 | Intel Corporation | Techniques to map and de-map signals |
| CN100544677C (en) * | 2005-08-16 | 2009-09-30 | 深圳迈瑞生物医疗电子股份有限公司 | Handle the method for Doppler signal gap |
| CN1983885B (en) * | 2005-12-31 | 2011-05-11 | 华为技术有限公司 | Method and device for de-reflecting from light-channel data unit to synchronous light-transmitting network |
| US9011338B2 (en) | 2012-07-12 | 2015-04-21 | Siemens Medical Solutions Usa, Inc. | Gap filling for spectral doppler ultrasound |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1262173A (en) * | 1986-05-29 | 1989-10-03 | James Angus Mceachern | Synchronization of asynchronous data signals |
| US5119406A (en) * | 1990-05-30 | 1992-06-02 | At&T Bell Laboratories | Digital signal synchronization employing single elastic store |
| JP2777929B2 (en) * | 1990-07-04 | 1998-07-23 | 富士通株式会社 | Asynchronous signal extraction circuit |
| US5052025A (en) * | 1990-08-24 | 1991-09-24 | At&T Bell Laboratories | Synchronous digital signal to asynchronous digital signal desynchronizer |
| DE69228775T2 (en) * | 1991-02-08 | 1999-09-02 | Nec Corp | Distributed bit-by-bit unblocking circuit for byte-stuffed multi-frame data |
| DE4110933A1 (en) * | 1991-04-04 | 1992-10-08 | Philips Patentverwaltung | TRANSMISSION SYSTEM FOR THE SYNCHRONOUS DIGITAL HIERACHIE |
| CA2063930C (en) * | 1991-07-08 | 1998-09-15 | Edmond Bernardy | Synchronous digital signal to asynchronous digital signal desynchronizer |
| US5268936A (en) * | 1991-07-08 | 1993-12-07 | At&T Bell Laboratories | Synchronous digital signal to asynchronous digital signal desynchronizer |
| US5200982A (en) * | 1991-10-02 | 1993-04-06 | Alcatel Network Systems, Inc. | In-line piece-wise linear desynchronizer |
| DE69227820T2 (en) * | 1991-10-10 | 1999-05-12 | Nec Corp | Sonet DS-N desynchronizer |
| US5268935A (en) * | 1991-12-20 | 1993-12-07 | At&T Bell Laboratories | Synchronous digital signal to asynchronous digital signal desynchronizer |
| FI90709C (en) * | 1992-02-14 | 1994-03-10 | Nokia Telecommunications Oy | Arrangement for damping pointer vibration in a desynchronizer |
-
1993
- 1993-11-29 US US08/158,967 patent/US5457717A/en not_active Expired - Lifetime
-
1994
- 1994-11-28 JP JP51525195A patent/JP3303110B2/en not_active Expired - Lifetime
- 1994-11-28 EP EP95901974A patent/EP0732015A4/en not_active Withdrawn
- 1994-11-28 WO PCT/US1994/013601 patent/WO1995015042A1/en not_active Application Discontinuation
- 1994-11-28 CA CA002177264A patent/CA2177264A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| JP3303110B2 (en) | 2002-07-15 |
| US5457717A (en) | 1995-10-10 |
| WO1995015042A1 (en) | 1995-06-01 |
| JPH09505705A (en) | 1997-06-03 |
| EP0732015A4 (en) | 1998-07-22 |
| EP0732015A1 (en) | 1996-09-18 |
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