CA2242068A1 - Apparatus and method for fluid analysis - Google Patents

Apparatus and method for fluid analysis Download PDF

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Publication number
CA2242068A1
CA2242068A1 CA002242068A CA2242068A CA2242068A1 CA 2242068 A1 CA2242068 A1 CA 2242068A1 CA 002242068 A CA002242068 A CA 002242068A CA 2242068 A CA2242068 A CA 2242068A CA 2242068 A1 CA2242068 A1 CA 2242068A1
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CA
Canada
Prior art keywords
refraction
index
sample cell
sample
window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002242068A
Other languages
French (fr)
Inventor
David B. Purves
Gary L. Workman
G. Wayne Thompson
Robert A. Mattes
David B. Smith
Kenneth D. Turner
Dan L. Cooper
Darell E. Engelhaupt
Harold J. See
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Alabama UA
C F C Tech Inc
Original Assignee
David B. Purves
Gary L. Workman
G. Wayne Thompson
Robert A. Mattes
David B. Smith
Kenneth D. Turner
Dan L. Cooper
Darell E. Engelhaupt
Harold J. See
C.F.C. Technology, Inc.
The Board Of Trustees Of The University Of Alabama
C.F.C. Reclamation & Recycling Service, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US08/734,231 priority Critical patent/US5870185A/en
Application filed by David B. Purves, Gary L. Workman, G. Wayne Thompson, Robert A. Mattes, David B. Smith, Kenneth D. Turner, Dan L. Cooper, Darell E. Engelhaupt, Harold J. See, C.F.C. Technology, Inc., The Board Of Trustees Of The University Of Alabama, C.F.C. Reclamation & Recycling Service, Inc. filed Critical David B. Purves
Priority to CA002242068A priority patent/CA2242068A1/en
Priority to SG9801816A priority patent/SG91804A1/en
Priority to EP98305755A priority patent/EP0974829A1/en
Priority to JP10229330A priority patent/JP3054125B2/en
Priority to BR9803127-9A priority patent/BR9803127A/en
Priority to TW087114152A priority patent/TW432211B/en
Publication of CA2242068A1 publication Critical patent/CA2242068A1/en
Abandoned legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133Refractometers, e.g. differential

Abstract

A method and apparatus for fluid analysis includes a sensor for determining the index of refraction of a fluid. Advanced methods of fluid analysis relate index of refraction and other measured physical characteristics of the fluid.

Description

Technical Field The present invention relates to measuring instruments, and more particularly to devices for analyzing fluids using measurements of index of refraction and other physical characteristics.
Background of the Invention Refi-igerant gases containing chlorine, for example diffuorodichloromethane (known as "R12"), have been phased out of use in new refrigeration systems fo.r their harmful effects on the environment. Tight regulatory controls have been imposed governing the reuse and reclamation of such refrigerants.
As a result of the new regulatory standards, it has become common to find refrigerant systems that are contaminated by additions of other more readily-available refrigerants. A
common "shade-tree" mechanic technique for repairing an automotive refrigeration system is to add R134a or R22 to an R12 system. R134a is now a commonly available non-chlorinated refrigerant, whereas R12 and R22 are not available. Many cars in the southern and western parts of the United States now contain unoriginal mixtures like two-thuds R12 and one-third R22. Similarly, in the past, it was known that an old refrigerator could be "juiced" to make it work a little while longer. The result in either case is an adulterated mixture of refrigerants, which plays havoc with the current requirements for reclaiming and recycling all chlorinated refrigerants. Currently, regulations permit contamination of only 0.5% in reusable, reclaimed refrigerant.
Thus, there presently exists a need for an instrument that HVAC and MVAC
technicians can use to analyze refrigerants for identity of refrigerants and their purity.
One prior attempted solution to the problem is disclosed in U.S. Patent No.
5,498,873. That solution, based on infrared absorption, was incomplete in a number of respects. The technique is similar to Near Infra-red Spectroscopic (NIR) techniques that have been used on contamination detection on critical space hardware. In practice, all species of refrigerant containing a hydrogen, such as the HCFC's, are easily distinguishable. The major difficulty is that if the two refrigerants were different in Cl or F, but contained the same number of H's on each carbon, then the NIR spectra are not easily distinguishable. The refrigerants R20, TCA, and TCE, each containing one or more hydrogens, are easily distinguishable. In contrast, both 8113 and R11 contain no hydrogens and show no spectra in the NIR. Further, TCA and R141b, each containing three hydrogens on one carbon; are very nearly indistinguishable in the NIR. Thus there are significant drawbacks in using NIR
for identification of a specific refrigerant.
In contrast, it has been found that the indices of refraction of the refi-igerants in the liquid state may be readily used to separate out the species by that property.
Index of refraction is defined as the angular change in a beam of light passing through the interface of two different substances. The technique of using index of refraction is based on the fact that each refrigerant has a different atomic composition and therefore a different index of refraction. Since the index of refraction is linear with respect to any two components. fairly accurate estimates of two component mixtures can be made.
A difficulty arises, however, in obtaining a reliable measurement of the more volatile refrigerants and comparing that to known values. Good control of temperature and pressure are required. Commercial index of refraction measuring instruments, such as the Abbe refractometer, already exist for liquids; but there are no instruments available which are capable of handling volatile species, such as R12, R22, etc. Hence, an instrument which can be used to perform index of refraction measurements on the volatile refrigerants in standard containers and refrigerating systems is required.
Thus a need presently exists for an instrument which can measure the index of refraction of all the commonly-available refrigerants and can be mounted on any standard connection to an AC system or bottle. The instrument must be temperature controlled to ., establish the index measurement for each specific refrigerant. These temperatures will be established beforehand, making the measurement very straight-forward for the technician making the measurement.
The two refrigerants closest in index of refraction are R12 and 8123, which have indices of 1.2870 and 1.2754, respectively. Thus, measuring index of refi-action to 4 significant figures will be a necessity.
A refrigerant monitor must be small and rugged enough for a technician to carry the unit to the equipment requiring a sample to be analyzed to determine which refrigerant and to what purity level was currently contained in the equipment.
Summary of the Invention The present invention in its simplest aspect provides a simple and rugged instrument for measuring the index of refraction of a fluid. A sample of the fluid is introduced into a sample chamber, and a source of light is passed through the interface of the fluid and a window in the chamber. An angle detector is positioned outside the chamber and adapted to determine the angle of the light emerging through the window, which leads to a direct determination of the index of refraction.
In a more specific aspect of the invention, the index of refraction measurement is combined with at least one other measured physical characteristic of the fluid sample, such as temperature or pressure, and then the fluid is identified by reference to known, pre-determined relationship data for a plurality of different fluids. In a more advanced apparatus, both temperature and pressure are measured and combined with the index of refraction measurement, and then the temperature is varied to obtain additional data, to identify the constituents of two-part ("binary") mixtures of certain fluids and measure the percentages of the mixtures.
In one embodiment, this invention was used in a device known as the Refrigerant Monitoring System ("RMS") providing instrumentation and software for monitoring the purity of CFC's, HCFC's and other refrigerants. This embodiment provides identification and purity of a specific CFC or HCFC refrigerant based upon the measurement of its index of refraction and/or hydrostatic pressure at measured temperatures. Binary mixtures, and to some degree higher order mixtures, can be analyzed using index of refraction and hydrostatic pressure measurements taken at several temperatures. The simple quality monitoring of refrigerants in specific classes of HVAC units (including automotive) or refrigerant recovery systems can be accomplished using index of refraction measurements alone.
Extending the scope to include the identification of refrigerants and binary mixtures in a broad class of refrigerants requires the use of both index of refraction and hydrostatic pressure.
Brief Description of the Drawings A more complete understanding of the invention and its advantages will be apparent from a review of the Detailed Description in conjunction with the following Drawings, in which:
FIGURE 1 is a schematic diagram illustrating the basic refractometer section of the invention;
FIGURE 2 is perspective view of the invention;
-S-FIGURE 3 is a view similar to FIGURE 2 with the cover removed;
FIGURE 4 is a top view of the apparatus of FIGURE 3;
FIGURE 5 is an expanded view of the sample cell;
FIGURES 6 and 7 are flow diagrams of the software algorithms used with the invention; and FIGURES 8-10 are diagrams of the electrical hardware used with the invention.
Detailed Descn_ption of the Preferred Embodiment In one specific form, the invention is incorporated in a specific device developed to monitor refrigerants. While the Refrigerant Monitoring System ("RMS") is described in detail herein, applications of the invention are not limited to refrigerant analysis, and many other environments will be found for beneficial use of the invention. For example, the device in its simplest form is a small, inexpensive, and rugged refractometer for making primary measurements of indices of refraction. The principles of fluid analysis invented in connection with the RMS can be used by those skilled in the art for analyzing fluids of any character, such as contaminated surface water, blood. beverages, etc.
The RlvIS described in detail herein is a portable instrument which provides an identification of the Freon~-type refi-igerants used in HVAC and MVAC systems in situ and a purity indication, utilizing the measurement of index of refraction in the liquid state at measured temperatures and/or combined index of refraction measurement with vapor pressure of the liquid. The RMS provides an indication when the soluble impurities in the refrigerant exceed a given threshold, which preferably is 0.5% according to current regulatory requirements.
The system includes a thermistor to measure fluid temperature, a refractometer capable measuring absolute indices of refraction from 1.1 S00 to 1..4000, with a resolution of 0.0002 (0.0001), and a pressure sensor to measure the pressure of the fluid.
The primary measurement of index of refraction is used to provide an initial estimate of refrigerant identification and quantification, with the hydrostatic pressure measurement used to provide a secondary discrimination between refrigerant components with similar indices of refraction and to analyze mixtures.
The relationship of index of refraction of refrigerants with respect to temperature is known from published references and shown in Table 1. Table 1 also includes the mathematical formulae for the index/temperature relationships. expressed in the form n~ _ C, - C,*F, where C, and C, are constants, F is temperature and nis the index of refraction for a given refrigerant ice. Most of the pure refrigerants can be identified easily by measuring and correlating the index of refraction and temperature of a sample.
To expand the coverage to include binary mixtures and separate out the species with close indices of refraction, the ability to make vapor pressure measurement at various temperatures is included. Table 2 shows the vapor pressure relationships to index of refraction at various temperatures. Table 3 is a listing of the mathematical formulae relating index of refi-action, temperature and pressure.
The construction of the refractometer includes a unique design to obtain a continuously diverging angular dependence on index of refraction of the fluid by optically coupling a transparent positioner of higher index of refraction to a transparent sample cell window. Therefore the resolution of the index of refraction measurement can be improved merely by extending the optical path of the instrument. Figure 1 illustrates the basic concepts of the index of refraction measuring apparatus.
Referring to Figure l, the index of the fraction measuring apparatus 10 includes a planar base 12 upon which the various components are mounted. The components include a diode laser 14 at one end of the base 12, a lens 16, a sample cell 18, a positioner 20, and an angle detector 22 at the other end of base 12. Laser 14 is a source of light positioned exterior of sample cell 18 to direct light into the sample chamber 24 through first transparent window 26. Light exits sample chamber 24 and sample cell 18 through second transparent window 28. Light exiting window 28 travels through positioner 20, which preferably is a transparent block of acrylic plastic. Angle detector 22 is preferably an array of photodiodes adapted to determine the angle of light exiting sample cell 18 with respect to the sample cell. Sample cell 18 has walls defining sample chamber 24, as well as an inlet opening 30 and an outlet 1S opening 32 for introducing a fluid sample into the sample chamber 24.
The angle QW of refracted rays in the positioner are determined by Snell's Law, Qw =
SIN-'(nf * sinaolnw), in the usual manner. The light beam from laser 14 enters cell 24 at 8~
degrees with respect to second window 28. All refracted rays begin at the same point of origin due to the fixed relationship of the laser and the sample cell. Optimal dispersion and resolution can be achieved by having the refractive indices of each successive element, including the window and transparent positioner and any optical coupling therebetween, to be _g_ always increasing. Intensity distribution over several array elements in angle detector 22 is used to interpolate between elements, thereby increasing overall resolution.
Referring to Figures 2-5, where like numerals indicate like and corresponding-elements, apparatus 10 includes a cover 100 having a carrying handle 102.
Keypad 104 and display 106 are provided on the top face of cover 100. Inlet conduit 108 includes a valve 110, and similarly outlet conduit 112 includes a valve 114. Conduits 108, 112 terminate at connection fittings 116, 118.
Figures 3-5 illustrate apparatus 10 with cover 100 removed. The components of the index ofrefraction apparatus are fixed to a planar base 120. The components include hollow sample cell 122, having interior and exterior walls 124, 125. The interior walls 124 define a sample chamber 126 (Figure 5). Sample cell 122 further has walls 128, 130 defining inlet and outlet openings 132, 134 through the interior and exterior walls 124, 125 for introducing a fluid sample into the sample chamber. Sample cell 122 further has first and second opposed, spaced-apart transparent windows 136, 138. A laser 142 is positioned exterior of the sample cell 122 opposite the first window 136. Lens 144 is interposed between the laser 142 and the first window 136 for transforming the light emitted by the laser 142 into a line of light. The laser 142, lens 144, and first and second windows 136, 138 are adapted and arranged such that a line of laser light is directed into the sample cell 122 through the first window 136, through the sample chamber 126, and out of the sample cell 122 through the second window 138.
A transparent positioner 146, or "waveguide", is connected to an exterior wall 125 of sample cell 122 and has a first face 148 opposite the second window 138 and a second face _g_ 150 (Figures 3 and 4) spaced apart and opposite from the first face 148. In the preferred embodiment, the windows are made of borosilicate, brand name Borofloat by Edmund Scientific. Preferably, a thin film of transparent optical-coupling fluid (not shown) is-interposed between first face 148 and second window 138, the fluid having an index of refraction between that of the window and the positioner. Angle detector 152 is connected to the second face 150 of the transparent positioner 146. In preferred form, angle detector 152 includes two linear photodiode arrays 154, 156 staggered as shown in Figures 3 and 4. Angle detector 152 is adapted to determine the angle of the line of light exiting the sample cell 122 with respect to the sample cell, with the linear arrays 154, 156 being arranged perpendicular to the line of laser light exiting the second window 138. The arrays 154, 156 are adapted to generate an electrical signal indicative of light-sensitive elements illuminated by the line of laser light. Improved resolution in the measurement of refracted angle is achieved by scanning over the pixel distribution illuminated and calculating the location (even if between pixels) of maximum intensity. The laser 142 is shown spaced apart from the sample cell, but it could be connected to the sample cell by an additional transparent positioner similar to positioner 146.
In the more complex version of the invention designed for fluid analysis, as opposed to simple index of refraction measurement, angle detector 152 i$ a first sensor for determining the index of refraction of a fluid sample in sample cell 122. A
second sensor 158 is provided for determining at least one additional physical characteristic of the fluid sample, and a third sensor 160 determines at least another additional characteristic of the fluid sample. Yet another sensor I62 may be used to determine the electroconductivity of the fluid sample, for determining water contamination.
The software algorithms used to determine specific refrigerant purity and composition of binary mixtures are illustrated in Figures 6 and 7. Discrimination between binary mixtures and refrigerants with similar characteristics is achieved using multivariate analysis (Figure 6) or neural networks (Figure 7).
Referring to Figure 6, where only index of refraction and temperature are measured, the refrigerant sample is placed in sample cell 18 in step 200. The temperature and index of refraction are measured in step 202. In step 204, index of refraction is related to temperature, and in step 206 a decision is made as to whether there is a match between the related index and temperature with known relationship data. If there is a match, the identity of the refrigerant is displayed at step 208.
If there is not a match, then the deviation is determined at step 210. If the deviation is less than 0.5 percent, then that information is displayed at step 212. If the deviation is greater than 0.5 percent, then calculations are done as shown in step 214 to determine the probable binary mixture of refrigerants. The first match for binary mi3ctures is determined in step 216, and displayed in steps 218-20.
Better discrimination between mixtures and their components is available where a third physical characteristic such as pressure is used in the analysis algorithm. Pressure can be used to resolve ambiguous or poor matching between mixture components and known relationship data.

Figure 7 illustrates a software algorithm that utilizes index of refraction, temperature, and pressure and their known relationship data, to solve for purity and mixture component using neural networks. Calibration data is loaded into the apparatus at step 300. Steg 302 begins the analysis of any given sample, where the physical characteristics of index of refraction, temperature, and pressure are measured. The identification of a single refrigerant with its associated purity is analyzed at step 306, similar to the steps employed in Figure 6.
If a single refrigerant with a purity of 99.5% or greater is detected, then a report to that effect is generated via branch 308 at step 310. In the event an impure refrigerant mixture is detected via branch 312, then the solutions in step 314 are applied. Step 314, entitled Classification Neural Network Dispatch Matrix, is a vector of nine methods, eight of which are neural nets, each with six inputs and nine outputs. The method to be used is based on a major refrigerant component. Given two sets of data (pressure, temperature, index of refraction), generated by measuring the data at one temperature and then heating or cooling the sample to get the second set of data, the appropriate method classifies the secondary' 1 ~ refi-igerant component. The data is passed to a function which solves for the percentages of each constituent. The difference between the non-neural network method described in Figure 6 is that the method of Figure 6 merely moves on the percentage function, assuming there is only one reasonable refrigerant mixture with any gig en primary component. In Step 316, the purity is solved, with the variable names indicated as follows:
Na index of refraction of A
Nb index of refraction of B
Nc index of refraction of the mixture of A and B
Ga concentration of A
Gb concentration of B, equal to (1.00 -Ga) MWa molecular weight of A
Mwb molecular weight of B
A report is then generated via branch 318. .
A computer and display hardware used in connection with the algorithms just described is illustrated in Figures 8-10. The hardware includes a microprocessor board 400, which in the preferred embodiment is a Micro Genius 2 board man~actured by Z-World Engineering, Inc. Keyboard 104, display 106 and thermal printer 402 are the user input/outputs. A provision is made so that an external computer 40-'' may be connected for calibration and setup purposes. The photodiode arrays 152 and 1 ~4 are connected to the microprocessor board 400. In the preferred embodiment, arrays I ~'_ and 154 are each a model TSL218 array manufactured by Texas Instruments. Tempen,.zure sensor 168 in the 16 preferred embodiment is a Radio Shack Model No. 271-110. Press~e sensor I60 in the preferred embodiment is a model 19CSOOAM made by Sensym, and is connected to microprocessor board 400 by way of an instrument op-amp circuit ~6.
Conductivity sensor 162 is connected to microprocessor board 400 by way of a conductivity amplifier 408.
Circuits 406 and 408 are described below in connection with Figure 10. Thermo-electric heater 410 and thermo-electric cooler 412 are provided to vary the temperature of the sample to collect additional sets of data, for use with the algorithm of Figure 7, to more accurately determine the percentages and constituents of binary mixtures.

Referring now to Figure 9, the pin connections for microprocessor board 400 include the connections to arrays 152, 154 and the sensors 158, 160, and 162. LCD
display 106 and keypad 104 are connected as shown.
Referring now to Figure 10, the support circuits for the apparatus include the laser voltage regulator circuit 500 which drops the twelve volt power supply at 502 to the required voltage for the laser at 504, via integrated circuit 506. In the preferred embodiment, laser 142 is a five mW 670 nm semiconductor diode laser manufactured by Meredith Instruments, although different types and wavelengths of lasers may be employed. In circuit 406, the input from pressure sensor 160 is placed on lines 508, 510, and converted to an output voltage at line 512 by way of op amps 514, 516. In circuit 408, the input from conductivity probe 162 is placed on line 518. The amplified output is sent to the microprocessor board via line 520, after amplification in integrated circuits in 522 and 524. In circuit 526, the voltage for the printer is dropped from 12 to 5 volts.
Whereas, the present invention has been described with the respect to a specific -embodiment thereof, it will be understood that various changes and modifications will be suggested to one skilled in the art, and it is intended to encompass such changes and modifications as fall within the scope of the appended claims.

Claims (5)

1. Apparatus for measuring the index of refraction of a fluid, comprising:
a hollow sample cell having interior and exterior walls, with the interior walls defining a sample chamber;
the sample cell further having walls defining inlet and outlet openings through the interior and exterior walls for introducing a fluid sample into the sample chamber;
the sample cell further having first and second opposed, spaced-apart, transparent windows;
a laser positioned exterior of the sample cell opposite the first window;
the laser and first and second windows positioned with respect to each other such that laser light is directed into the sample cell through the first window, through the sample chamber, and out of the sample cell through the second window;
a transparent positioner connected to an exterior wall of the sample cell and having a first face opposite the second window and a second face spaced apart and opposite from the first face; and an angle detector connected to the second face of the transparent positioner for determining the angle of the light exiting the sample cell with respect to the sample cell, the angle detector including a linear array of light-sensitive elements, the array operable to generate an electrical signal indicative of light-sensitive elements illuminated by the laser light; and a computer for determining the index of refraction from the electrical signal.
2. The apparatus of Claim 1 including a computer electrically connected to the array adapted to calculate the index of refraction of a fluid in the sample chamber based on the electrical signal generated by the linear array.
3. The apparatus of Claim 1 including a display electrically connected to the computer for visually indicating the index of refraction.
4. The apparatus of Claim 1 with a transparent optical coupling fluid between the second window and the transparent positioner.
5. The apparatus of claim 4 with the second window, coupling fluid and transparent positioner having ever-increasing indices of refraction with each successive element, such that the resolution of the apparatus is increased with the distance between the sample cell and the positioner.
CA002242068A 1996-10-21 1998-07-03 Apparatus and method for fluid analysis Abandoned CA2242068A1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
US08/734,231 US5870185A (en) 1996-10-21 1996-10-21 Apparatus and method for fluid analysis
CA002242068A CA2242068A1 (en) 1996-10-21 1998-07-03 Apparatus and method for fluid analysis
SG9801816A SG91804A1 (en) 1996-10-21 1998-07-16 Apparatus and method for fluid analysis
EP98305755A EP0974829A1 (en) 1996-10-21 1998-07-20 Laser refractometer for fluid analysis
JP10229330A JP3054125B2 (en) 1996-10-21 1998-07-29 Fluid analyzer
BR9803127-9A BR9803127A (en) 1996-10-21 1998-08-10 Apparatus and method for fluid analysis
TW087114152A TW432211B (en) 1996-10-21 1998-08-27 Apparatus and method for fluid analysis

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US08/734,231 US5870185A (en) 1996-10-21 1996-10-21 Apparatus and method for fluid analysis
CA002242068A CA2242068A1 (en) 1996-10-21 1998-07-03 Apparatus and method for fluid analysis
SG9801816A SG91804A1 (en) 1996-10-21 1998-07-16 Apparatus and method for fluid analysis
EP98305755A EP0974829A1 (en) 1996-10-21 1998-07-20 Laser refractometer for fluid analysis
JP10229330A JP3054125B2 (en) 1996-10-21 1998-07-29 Fluid analyzer
BR9803127-9A BR9803127A (en) 1996-10-21 1998-08-10 Apparatus and method for fluid analysis

Publications (1)

Publication Number Publication Date
CA2242068A1 true CA2242068A1 (en) 2000-01-03

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CA002242068A Abandoned CA2242068A1 (en) 1996-10-21 1998-07-03 Apparatus and method for fluid analysis

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US (1) US5870185A (en)
EP (1) EP0974829A1 (en)
JP (1) JP3054125B2 (en)
BR (1) BR9803127A (en)
CA (1) CA2242068A1 (en)
SG (1) SG91804A1 (en)
TW (1) TW432211B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6687004B1 (en) 1999-10-22 2004-02-03 Marquette University Optical sensor for opaque and non-opaque materials
DE19963561A1 (en) * 1999-12-23 2001-07-05 Merck Patent Gmbh Method and device for online analysis of solvent mixtures
SE519951C2 (en) * 2000-09-25 2003-04-29 Scania Cv Publ Method for determining the corrosion protection in a coolant
SE0302676D0 (en) * 2003-10-09 2003-10-09 Neural Ab Method and apparatus for holographic refractometry
US7295295B2 (en) * 2004-12-13 2007-11-13 Celanese International Corporation Paste solids measurement in real time
FI127243B (en) * 2014-05-13 2018-02-15 Janesko Oy Method and measuring device for continuous measurement of Abbe number
KR20210050517A (en) * 2018-08-31 2021-05-07 파티클 머슈어링 시스템즈, 인크. Fluid refractive index to optimize particle counter
CN114763951B (en) * 2021-01-13 2024-01-05 约克(无锡)空调冷冻设备有限公司 Detection device and refrigerating system comprising same
DE102022111450A1 (en) * 2022-05-09 2023-11-09 Hydac Filter Systems Gmbh Measuring device

Family Cites Families (99)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3895233A (en) * 1972-10-26 1975-07-15 Bailey Meter Co Gas analyzer
NL7314719A (en) * 1972-12-22 1974-06-25
US3932754A (en) * 1973-01-22 1976-01-13 Infrared Industries, Inc. Gas analyzer
US3976883A (en) * 1973-05-10 1976-08-24 Honeywell Inc. Infrared analyzer
US3898558A (en) * 1974-07-30 1975-08-05 Us Commerce Direct reading microwave refractometer
US4013260A (en) * 1974-09-27 1977-03-22 Andros, Incorporated Gas analyzer
US3951607A (en) * 1974-11-29 1976-04-20 Searle Cardio-Pulmonary Systems Inc. Gas analyzer
US3999856A (en) * 1976-01-02 1976-12-28 Monsanto Research Corporation Diffractometric refractometer
CA1074149A (en) * 1976-03-02 1980-03-25 Sadao Sumikama High-sensitivity differential refractometer
US4027237A (en) * 1976-07-22 1977-05-31 The United States Of America As Represented By The Secretary Of The Navy Airborne microwave refractometer
DE2654608C3 (en) * 1976-12-02 1979-06-21 Fa. Carl Zeiss, 7920 Heidenheim Refractometer for the automatic objective determination of the refractive state of an eye
US4078896A (en) * 1977-01-21 1978-03-14 International Telephone And Telegraph Corporation Photometric analyzer
DE2707090A1 (en) * 1977-02-18 1978-08-24 Siemens Ag GAS ANALYZER
US4293198A (en) * 1977-09-21 1981-10-06 Canon Kabushiki Kaisha Eye refractometer
JPS5494387A (en) * 1978-01-10 1979-07-26 Horiba Ltd Gas analyzer
JPS5555241A (en) * 1978-10-18 1980-04-23 Horiba Ltd Gas analyzer
US4188116A (en) * 1978-02-21 1980-02-12 American Optical Corporation Abbe refractometer
SE438208B (en) * 1978-04-17 1985-04-01 Sten Silverbage METCELL FOR USE IN A REFRACTOMETER
NO791305L (en) * 1978-08-04 1980-02-05 Sub Sea Oil Services Ssos Gas analyzers
JPS5531915A (en) * 1978-08-29 1980-03-06 Nippon Kogaku Kk <Nikon> Portable refraction meter
FI56902C (en) * 1978-09-01 1980-04-10 Instrumentarium Oy a gas analyzer
US4232224A (en) * 1978-09-28 1980-11-04 Westinghouse Electric Corp. Nuclear reactor primary coolant loop flowmeter with phase shift tracking compensation
US4233513A (en) * 1978-10-05 1980-11-11 Andros Incorporated Gas analyzer
US4227806A (en) * 1978-10-16 1980-10-14 Western Electric Company, Inc. Methods for non-destructively determining parameters of an optical fiber preform
US4286873A (en) * 1979-06-25 1981-09-01 Waters Associates, Inc. Refractometer cell with integral lens
US4236076A (en) * 1979-02-26 1980-11-25 Technicon Instruments Corporation Infrared analyzer
JPS55155631A (en) * 1979-05-21 1980-12-04 Tokyo Optical Projector for target in infrared eye refractometer
GB2049955B (en) * 1979-05-31 1983-10-19 Nat Res Dev Refractometer
GB2050629B (en) * 1979-05-31 1983-04-07 Nat Res Dev Refractometer
US4268479A (en) * 1980-01-10 1981-05-19 Instrumentation Laboratory Inc. Fluid analyzer
US4381895A (en) * 1980-02-28 1983-05-03 Biovation, Inc. Method and apparatus for automatic flow-through digital refractometer
US4325635A (en) * 1980-10-07 1982-04-20 The United States Of America As Represented By The Secretary Of The Army Heterodyne indicial refractometer
FR2500930B1 (en) * 1980-11-14 1985-12-06 Sopelem REFRACTOMETER USING THE LIMIT ANGLE METHOD
US4591247A (en) * 1981-06-03 1986-05-27 Tokyo Kogaku Kikai Kabushiki Kaisha Eye refractometer
JPS5824855A (en) * 1981-08-05 1983-02-14 Nippon Denso Co Ltd Oxygen concentration detector
US4451147A (en) * 1981-08-31 1984-05-29 Karel Dobes Refractometer
US4402821A (en) * 1981-11-13 1983-09-06 Mobil Oil Corporation Process for liquefaction of coal
US4469441A (en) * 1982-03-04 1984-09-04 Allied Corporation Scanning monochromator system with direct coupled dispersing element-electromagnetic drive transducer assembly
FI65496C (en) * 1982-08-30 1984-05-10 K Patents Oy MAETFOENSTER FOER PROCESSREFRAKTOMETER
DE3321203A1 (en) * 1983-06-11 1984-12-13 Phönix Armaturen-Werke Bregel GmbH, 6000 Frankfurt REFRACTOMETER
EP0133607B1 (en) * 1983-08-03 1988-11-23 Stanley Electric Co., Ltd. Refractometer for the measurement of the refractive index of a liquid
CH654664A5 (en) * 1983-09-07 1986-02-28 Battelle Memorial Institute Refractometer.
JPS6088353A (en) * 1983-10-20 1985-05-18 Seiko Instr & Electronics Ltd Refractive index measuring apparatus for liquid
US4806013A (en) * 1984-01-05 1989-02-21 Jerusalem College Of Technology Refractometer for fluids
JPS60163352U (en) * 1984-04-07 1985-10-30 株式会社 堀場製作所 gas analyzer
US4761070A (en) * 1984-12-07 1988-08-02 Tokyo Kogaku Kikai Kabushiki Kaisha Eye refractometer
US4692024A (en) * 1985-05-10 1987-09-08 Electro-Tec Corporation Automatic refractometer
JPS62122629A (en) * 1985-11-25 1987-06-03 キヤノン株式会社 Eye refractometer
JPS62148834A (en) * 1985-12-23 1987-07-02 Horiba Ltd Analyzer
JPH0814575B2 (en) * 1986-05-17 1996-02-14 三洋電機株式会社 Refrigerator oil concentration measurement method
JPS6319537A (en) * 1986-07-12 1988-01-27 Diesel Kiki Co Ltd Liquid measuring instrument
US5029583A (en) * 1986-07-22 1991-07-09 Personal Diagnostics, Inc. Optical analyzer
JPS63246641A (en) * 1987-04-01 1988-10-13 Ajinomoto Co Inc Fluorescence analyser
SE459126B (en) * 1987-09-15 1989-06-05 Gambro Engstrom Ab OPTICAL GAS ANALYZER
USH572H (en) * 1987-09-28 1989-02-07 The United States Of America As Represented By The United States Department Of Energy Optical analyzer
US4958075A (en) * 1987-10-09 1990-09-18 Ntc Technology Inc. Gas analyzer
US4890916A (en) * 1988-09-07 1990-01-02 Rainer E H Illuminator for a refractometer
US4952055A (en) * 1988-10-03 1990-08-28 Wyatt Technology Corporation Differential refractometer
US4934818A (en) * 1989-03-24 1990-06-19 American Telephone And Telegraph Company Refractive index profiling technique
JPH0774784B2 (en) * 1989-05-20 1995-08-09 株式会社堀場製作所 Infrared analyzer
US5231591A (en) * 1989-09-11 1993-07-27 Nellcor Incorporated Agent gas analyzer and method of use
US5046018A (en) * 1989-09-11 1991-09-03 Nellcor, Inc. Agent gas analyzer and method of use
US5060505A (en) * 1989-09-12 1991-10-29 Sensors, Inc. Non-dispersive infrared gas analyzer system
DE3932838C2 (en) * 1989-09-30 1996-03-07 Hartmann & Braun Ag Non-dispersive infrared gas analyzer
DE3937141A1 (en) * 1989-11-08 1991-05-16 Hartmann & Braun Ag NON-DISPERSIVE INFRARED GAS ANALYZER FOR SIMULTANEOUS MEASUREMENT OF THE CONCENTRATION OF SEVERAL COMPONENTS OF A GAS SAMPLE
US5157454A (en) * 1989-11-30 1992-10-20 Otsuka Electronics Co., Ltd. Differential refractometer
US4988863A (en) * 1990-01-03 1991-01-29 The United States Of America As Represented By The Secretary Of The Navy Optical fiber refractometer launching light at a non-zero launch angle
US4981338A (en) * 1990-01-03 1991-01-01 The United States Of America As Represented By The Secretary Of The Navy Optical fiber refractometer
KR940002500B1 (en) * 1990-02-08 1994-03-25 미쯔비시덴끼 가부시끼가이샤 Apparatus for detecting alcohol concentration
US5157452A (en) * 1990-07-03 1992-10-20 Mitsubishi Denki Kabushiki Kaisha Method and apparatus for liquid content detection with refractive index and temperature signal mixing
US5173747A (en) * 1990-09-20 1992-12-22 Battelle Memorial Institute Integrated optical directional-coupling refractometer apparatus
US5377008A (en) * 1990-09-20 1994-12-27 Battelle Memorial Institute Integrated optical compensating refractometer apparatus
US5174124A (en) * 1990-11-13 1992-12-29 Carrier Corporation Apparatus for sampling the purity of refrigerant flowing through a refrigeration circuit
US5186899A (en) * 1990-11-13 1993-02-16 Drago Thomas E Fixture for supporting a refrigerant sampling tube in a closed system
EP0508583B1 (en) * 1991-03-08 1997-09-17 Renishaw Transducer Systems Limited Absolute gas refractometer
US5218426A (en) * 1991-07-01 1993-06-08 The United States Of America As Represented By The Secretary Of Commerce Highly accurate in-situ determination of the refractivity of an ambient atmosphere
US5184015A (en) * 1991-09-27 1993-02-02 Martin Marietta Energy Systems, Inc. Charged particle mobility refrigerant analyzer
US5214931A (en) * 1991-12-20 1993-06-01 Carrier Corporation Apparatus for sampling the purity of refrigerant in the storage container of a refrigerant recovery and purification system
US5255527A (en) * 1992-01-02 1993-10-26 Carrier Corporation Method of testing the purity of refrigerant flowing through a refrigeration system
JPH0688968A (en) * 1992-04-07 1994-03-29 Sharp Corp Optical waveguide, optical input device using same, display device using same and manufacture thereof
US5311274A (en) * 1992-05-11 1994-05-10 Cole Jr Charles F Fiber optic refractometer
US5331409A (en) * 1992-06-12 1994-07-19 George Thurtell Tunable diode laser gas analyzer
JPH0634318A (en) * 1992-07-14 1994-02-08 Nikon Corp Interference measuring apparatus
DE4223840C2 (en) * 1992-07-20 1994-06-16 Zeiss Carl Jena Gmbh Refractometer
JP3309101B2 (en) * 1992-08-31 2002-07-29 株式会社シンクロン Method and apparatus for measuring refractive index of thin film
US5362967A (en) * 1992-09-30 1994-11-08 Horiba, Ltd. Pneumatic infrared ray detector for use in gas analyzer
JP3211405B2 (en) * 1992-10-01 2001-09-25 株式会社日立製作所 Refrigerant composition detector
US5394244A (en) * 1992-10-06 1995-02-28 Excel Precision Inc. Ambient air refracture index measuring device
US5357113A (en) * 1992-11-18 1994-10-18 Liston Scientific Corp. Infrared gas mixture analyzer
JPH06229922A (en) * 1993-02-02 1994-08-19 Agency Of Ind Science & Technol Very accurate air refractometer
US5355211A (en) * 1993-04-02 1994-10-11 Leica Inc. Refractometer subassembly method and apparatus
US5422714A (en) * 1993-06-07 1995-06-06 Corning Incorporated Device for comparing the refractive indices of an optical immersion liquid and a reference glass
SE501663C2 (en) * 1993-08-24 1995-04-10 Anders Hanning Refractometric method for indirect detection of a substance
SE503289C2 (en) * 1993-09-28 1996-05-13 Anders Hanning Ways to determine the concentration of substances in a liquid
US5524477A (en) * 1993-11-29 1996-06-11 Leybold Inficon Inc. Quantitative determination of air present in refrigerant sample by measurement of pressure coefficient of resonance frequency
US5419177A (en) * 1994-03-25 1995-05-30 Pastorello; John Refrigerant gas contamination detector kit
US5455645A (en) * 1994-04-11 1995-10-03 Lacrimedics, Inc. Refractometer for measuring spherical refractive errors
US5493869A (en) * 1994-12-16 1996-02-27 Spx Corporation Recovery of at least two different and incompatible refrigerant types
US5514595A (en) * 1995-01-09 1996-05-07 Spx Corporation Method for analyzing refrigerant properties

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EP0974829A1 (en) 2000-01-26
JP3054125B2 (en) 2000-06-19

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