CA2387341A1 - Method and apparatus for supercritical processing of multiple workpieces - Google Patents
Method and apparatus for supercritical processing of multiple workpieces Download PDFInfo
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- CA2387341A1 CA2387341A1 CA002387341A CA2387341A CA2387341A1 CA 2387341 A1 CA2387341 A1 CA 2387341A1 CA 002387341 A CA002387341 A CA 002387341A CA 2387341 A CA2387341 A CA 2387341A CA 2387341 A1 CA2387341 A1 CA 2387341A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67213—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one ion or electron beam chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
Abstract
An apparatus for supercritical processing of multiple workpieces comprises a transfer module, first and second supercritical processing modules, and a robot. The transfer module includes an entrance. The first and second supercritical processing modules are coupled to the transfer module. The robot is preferably located with the transfer module. In operation, the robot transfers a first workpiece from the entrance of the transfer module to the first supercritical processing module. The robot then transfers a second workpiece from the entrance to the second supercritical processing module.
After the workpieces have been processed, the robot returns the first and second workpieces to the entrance of the transfer module. Alternatively, the apparatus includes additional supercritical processing modules coupled to the transfer module.
After the workpieces have been processed, the robot returns the first and second workpieces to the entrance of the transfer module. Alternatively, the apparatus includes additional supercritical processing modules coupled to the transfer module.
Description
METHOD AND APPARATUS FOR SUPERCRITICAL
PROCESSING OF MULTIPLE WORKPIECES
RELATED APPLICATIONS
This application claims priority from U.S. Provisional Patent Application No.
60/163,121 filed on Nov. 2, 1999, which is incorporated by reference.
FIELD OF THE INVENTION
This invention relates to the field of supercritical processing. More particularly, this invention relates to the field of supercritical processing where multiple workpieces are processed simultaneously.
BACKGROUND OF THE INVENTION
Semiconductor fabrication uses photoresist in ion implantation, etching, and other processing steps. In the ion implantation steps, the photoresist masks areas of a semiconductor substrate that are not implanted with a dopant. In the etching steps, the photoresist masks areas of the semiconductor substrate that are not etched.
Examples of the other processing steps include using the photoresist as a blanket protective coating of a processed wafer or the blanket protective coating of a MEMS (micro electro-mechanical system) device. Following the ion implantation steps, the photoresist exhibits a hard outer crust covering a jelly-like core. The hard outer crust leads to difficulties in a photoresist removal. Following the etching steps, remaining photoresist exhibits a hardened character that leads to difficulties in the photoresist removal. Following the etching steps, residue (photoresist residue mixed with etch residue) coats sidewalk of etch features.
Depending on a type of etching step and material etched, the photoresist residue mixed with the etch residue presents a challenging removal problem since the photoresist residue mixed with the etch residue often strongly bond to the sidewalls of the etch features.
Typically, in the prior art, the photoresist and the residue are removed by plasma asking in an OZ plasma followed by cleaning in a wet-clean bath. A
semiconductor etching and metallization process of the prior art is illustrated in block diagram format in FIG. 1. The semiconductor etching and metallization process 10 includes a photoresist application step 12, a photoresist exposure step 14, a photoresist development step 16, a dielectric etch step 18, an asking step 20, a wet cleaning step 22, and a metal deposition step 24.
In the photoresist application step 12, the photoresist is applied to a wafer having an exposed oxide layer. In the photoresist exposure step 14, the photoresist is exposed to light which is partially blocked by a mask.
Depending upon whether the photoresist is a positive or negative photoresist, either exposed photoresist or non-exposed photoresist, respectively, is removed in the photoresist development step 16 leaving a exposed pattern on the oxide layer. In the dielectric etch step 18, the exposed pattern on the oxide layer is etched in an RIE (reactive ion etch) process which etches the exposed pattern into the oxide layer, forming an etched pattern, while also partially etching the photoresist. This produces the residue which coats the sidewalls of the etch features while also hardening the photoresist. In the ashing step 20, the OZ plasma oxidizes and partially removes the photoresist and the residue. In the wet cleaning step 22, remaining photoresist and residue is cleaned in the wet-clean bath.
S In the metal deposition step 24, a metal layer is deposited on the wafer filling the etched pattern and also covering non-etched regions. In subsequent processing, at least part of the metal covering the non-etched regions is removed in order to form a circuit.
Nishikawa et al. in U.S. Patent No. 4,944,837, issued on Jul. 31, 1990, recite a prior art method of removing a resist using liquidized or supercritical gas. A
substrate with the resist is placed into a pressure vessel, which also contains the liquidized or supercritical gas.
After a predetermined time lapse, the liquidized or supercritical gas is rapidly expanded, which removes the resist.
Nishikawa et al. teach that supercritical CO, can be used as a developer for photoresist. A substrate with a photoresist layer is exposed in a pattern to light, thus forming a latent image. The substrate with the photoresist and the latent image is placed in a supercritical CO, bath for 30 minutes. The supercritical CO, is then condensed leaving the pattern of the photoresist. Nishikawa et al. further teach that 0.5 % by weight of methyl isobutyl ketone (MIBK) can be added to the supercritical COZ, which increases an effectiveness of the supercritical COZ and, thus, reduces a development time from the 30 minutes to 5 minutes.
Nishikawa et al. also teach that a photoresist can be removed using the supercritical COZ and 7 % by weight of the MIBK. The substrate with the photoresist is placed in the supercritical CO~ and the MIBK for 30-45 minutes. Upon condensing the supercritical CO2, the photoresist has been removed.
The methods taught by Nishikawa et al. are inappropriate for a semiconductor fabrication line for a number of reasons. Rapidly expanding a liquidized or supercritical gas to remove a photoresist from a substrate creates a potential for breakage of the substrate. A
photoresist development process which takes 30 minutes is too inefficient. A
photoresist development or removal process which uses MIBK is not preferred because MIBK
is toxic and because MIBK is used only when a more suitable choice is unavailable.
Smith, Jr. et al. in U.S. Patent No. 5,377,705, issued on Jan. 3, 1995, teach a system for cleaning contaminants from a workpiece. The contaminants include organic, particulate, and ionic contaminants. The system includes a pressurizable cleaning vessel, a liquid COZ
storage container, a pump, a solvent delivery system, a separator, a condenser, and various valves. The pump transfers COz gas and solvent to the cleaning vessel and pressurizes the COz gas to supercritical COz. The supercritical CO, and the solvent remove the contaminants from the workpiece. A valve allows some of the supercritical COz and the solvent to bleed from the cleaning vessel while the pump replenishes the supercritical COZ and the solvent.
The separator separates the solvent from the supercritical CO~. The condenser condenses the COZ to liquid CO, so that the liquid COZ storage container can be replenished.
PROCESSING OF MULTIPLE WORKPIECES
RELATED APPLICATIONS
This application claims priority from U.S. Provisional Patent Application No.
60/163,121 filed on Nov. 2, 1999, which is incorporated by reference.
FIELD OF THE INVENTION
This invention relates to the field of supercritical processing. More particularly, this invention relates to the field of supercritical processing where multiple workpieces are processed simultaneously.
BACKGROUND OF THE INVENTION
Semiconductor fabrication uses photoresist in ion implantation, etching, and other processing steps. In the ion implantation steps, the photoresist masks areas of a semiconductor substrate that are not implanted with a dopant. In the etching steps, the photoresist masks areas of the semiconductor substrate that are not etched.
Examples of the other processing steps include using the photoresist as a blanket protective coating of a processed wafer or the blanket protective coating of a MEMS (micro electro-mechanical system) device. Following the ion implantation steps, the photoresist exhibits a hard outer crust covering a jelly-like core. The hard outer crust leads to difficulties in a photoresist removal. Following the etching steps, remaining photoresist exhibits a hardened character that leads to difficulties in the photoresist removal. Following the etching steps, residue (photoresist residue mixed with etch residue) coats sidewalk of etch features.
Depending on a type of etching step and material etched, the photoresist residue mixed with the etch residue presents a challenging removal problem since the photoresist residue mixed with the etch residue often strongly bond to the sidewalls of the etch features.
Typically, in the prior art, the photoresist and the residue are removed by plasma asking in an OZ plasma followed by cleaning in a wet-clean bath. A
semiconductor etching and metallization process of the prior art is illustrated in block diagram format in FIG. 1. The semiconductor etching and metallization process 10 includes a photoresist application step 12, a photoresist exposure step 14, a photoresist development step 16, a dielectric etch step 18, an asking step 20, a wet cleaning step 22, and a metal deposition step 24.
In the photoresist application step 12, the photoresist is applied to a wafer having an exposed oxide layer. In the photoresist exposure step 14, the photoresist is exposed to light which is partially blocked by a mask.
Depending upon whether the photoresist is a positive or negative photoresist, either exposed photoresist or non-exposed photoresist, respectively, is removed in the photoresist development step 16 leaving a exposed pattern on the oxide layer. In the dielectric etch step 18, the exposed pattern on the oxide layer is etched in an RIE (reactive ion etch) process which etches the exposed pattern into the oxide layer, forming an etched pattern, while also partially etching the photoresist. This produces the residue which coats the sidewalls of the etch features while also hardening the photoresist. In the ashing step 20, the OZ plasma oxidizes and partially removes the photoresist and the residue. In the wet cleaning step 22, remaining photoresist and residue is cleaned in the wet-clean bath.
S In the metal deposition step 24, a metal layer is deposited on the wafer filling the etched pattern and also covering non-etched regions. In subsequent processing, at least part of the metal covering the non-etched regions is removed in order to form a circuit.
Nishikawa et al. in U.S. Patent No. 4,944,837, issued on Jul. 31, 1990, recite a prior art method of removing a resist using liquidized or supercritical gas. A
substrate with the resist is placed into a pressure vessel, which also contains the liquidized or supercritical gas.
After a predetermined time lapse, the liquidized or supercritical gas is rapidly expanded, which removes the resist.
Nishikawa et al. teach that supercritical CO, can be used as a developer for photoresist. A substrate with a photoresist layer is exposed in a pattern to light, thus forming a latent image. The substrate with the photoresist and the latent image is placed in a supercritical CO, bath for 30 minutes. The supercritical CO, is then condensed leaving the pattern of the photoresist. Nishikawa et al. further teach that 0.5 % by weight of methyl isobutyl ketone (MIBK) can be added to the supercritical COZ, which increases an effectiveness of the supercritical COZ and, thus, reduces a development time from the 30 minutes to 5 minutes.
Nishikawa et al. also teach that a photoresist can be removed using the supercritical COZ and 7 % by weight of the MIBK. The substrate with the photoresist is placed in the supercritical CO~ and the MIBK for 30-45 minutes. Upon condensing the supercritical CO2, the photoresist has been removed.
The methods taught by Nishikawa et al. are inappropriate for a semiconductor fabrication line for a number of reasons. Rapidly expanding a liquidized or supercritical gas to remove a photoresist from a substrate creates a potential for breakage of the substrate. A
photoresist development process which takes 30 minutes is too inefficient. A
photoresist development or removal process which uses MIBK is not preferred because MIBK
is toxic and because MIBK is used only when a more suitable choice is unavailable.
Smith, Jr. et al. in U.S. Patent No. 5,377,705, issued on Jan. 3, 1995, teach a system for cleaning contaminants from a workpiece. The contaminants include organic, particulate, and ionic contaminants. The system includes a pressurizable cleaning vessel, a liquid COZ
storage container, a pump, a solvent delivery system, a separator, a condenser, and various valves. The pump transfers COz gas and solvent to the cleaning vessel and pressurizes the COz gas to supercritical COz. The supercritical CO, and the solvent remove the contaminants from the workpiece. A valve allows some of the supercritical COz and the solvent to bleed from the cleaning vessel while the pump replenishes the supercritical COZ and the solvent.
The separator separates the solvent from the supercritical CO~. The condenser condenses the COZ to liquid CO, so that the liquid COZ storage container can be replenished.
-2-WO 01/33615 CA 02387341 2002-04-11 pCT/US00/41787 Employing a system such as taught by Smith, Jr. et al. for removing photoresist and residue presents a number of difficulties. The pressurizable cleaning vessel is not configured appropriately for semiconductor substrate handling. It is inefficient to bleed the supercritical CO, and the solvent during cleaning. Such a system is not readily adaptable to throughput requirements of a semiconductor fabrication line. Such a system is not conducive to safe semiconductor substrate handling, which is crucial in a semiconductor fabrication line. Such a system is not economical for semiconductor substrate processing.
What is needed is a method of developing photoresist using supercritical carbon dioxide appropriate for a semiconductor fabrication line.
What is needed is a method of removing photoresist using supercritical carbon dioxide appropriate for a semiconductor fabrication line.
What is needed is a supercritical processing system which is configured for handling semiconductor substrates.
What is needed is a supercritical processing system in which supercritical COz and solvent are not necessarily bled from a processing chamber in order to create a fluid flow within the processing chamber.
What is needed is a supercritical processing system which meets throughput requirements of a semiconductor fabrication line.
What is needed is a supercritical processing system which provides safe semiconductor substrate handling.
What is needed is a supercritical processing system which provides economical semiconductor substrate processing.
SUMMARY OF THE INVENTION
The present invention is an apparatus for supercritical processing of multiple workpieces. The apparatus includes a transfer module, first and second supercritical processing modules, and a robot. The transfer module includes an entrance. The first and second supercritical processing modules are coupled to the transfer module.
The robot is preferably located within the transfer module. In operation, the robot transfers a first workpiece from the entrance of the transfer module to the first supercritical processing module. The robot then transfers a second workpiece from the entrance to the second supercritical processing module. After the workpieces have been processed, the robot returns the first and second workpieces to the entrance of the transfer module.
Alternatively, the apparatus includes additional supercritical processing modules coupled to the transfer module.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 illustrates, in block diagram format, a process flow for a semiconductor etching and metallization process of the prior art.
FIG. 2 illustrates, in block diagram format, a process flow for a semiconductor etching _3_ WO 01/33615 CA 02387341 2002-04-11 pCT/US00/41787 and metallization process of the present invention.
FIG. 3 illustrates, in block diagram format, a supercritical removal process of the present invention.
FIG. 4 illustrates the preferred supercritical processing system of the present invention.
FIG. S illustrates the preferred supercritical processing module of the present invention.
FIG. 6 illustrates a first alternative supercritical processing system of the present invention.
FIG. 7 illustrates a second alternative supercritical processing system of the present invention.
FIG. 8 illustrates a third alternative supercritical processing system of the present invention.
FIG. 9 illustrates a fourth alternative supercritical processing system of the present 1 S invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
A semiconductor etch and metallization process of the present invention is illustrated, as a block diagram, in FIG. 2. The semiconductor etch and metallization process 30 includes a photoresist application step 32, a photoresist exposure step 34, a photoresist development step 36, a dielectric etch step 38, a supercritical removal process 40, and a metal deposition step 42. In the photoresist application step 32, the photoresist is applied to a wafer having an exposed oxide layer. In the photoresist exposure step 34, the photoresist is exposed to light which is partially blocked by a mask.
Depending upon whether the photoresist is a positive or negative photoresist, either exposed photoresist or non-exposed photoresist, respectively, is removed in the photoresist development step 36 leaving a exposed pattern on the oxide layer. In the dielectric etch step 38, the exposed pattern on the oxide layer is preferably etched in an RIE
(reactive ion etch) process which etches the exposed pattern into the oxide layer while also partially etching the photoresist. This produces the residue which coats the sidewalls of the etch features while also hardening the photoresist.
In the supercritical removal process 40, supercritical carbon dioxide and a solvent are used to remove the photoresist and the residue. In the metal deposition step 42, a metal layer is deposited on the wafer filling the etched pattern and also covering non-etched regions. In subsequent processing, at least part of the metal covering the non-etched regions is removed in order to form a circuit.
The supercritical removal process 40 of the present invention is illustrated, as a block diagram, in FIG. 3. The supercritical removal process 40 begins by placing the wafer, with the photoresist and the residue on the wafer, within a pressure chamber and sealing the pressure chamber in a first process step 52. In a second process step 54, the pressure chamber is pressurized with carbon dioxide until the carbon dioxide becomes the supercritical carbon dioxide (SCCOZ). In a third process step 56, the supercritical carbon dioxide carries a solvent into the process chamber. In a fourth process step 58, the supercritical carbon dioxide and the solvent are maintained in contact with the wafer until the photoresist and the residue are removed from the wafer. In the fourth process step 58, the solvent at least partially dissolves the photoresist and the residue. In a fifth process step 60, the pressure chamber is partially exhausted. In a sixth process step 62, the wafer is rinsed. In a seventh process step 64, the supercritical removal process 40 ends by depressurizing the pressure chamber and removing the wafer.
The supercritical removal process 40 is preferably implemented in a semiconductor fabrication line by the preferred supercritical processing system of the present invention, which is illustrated in FIG. 4. The preferred supercritical processing system 70 includes a transfer module 72, first through fifth supercritical processing modules, 74-78, a robot 80, and control electronics 82. The transfer module includes first through fifth process ports, 84-88, and a transfer module entrance 90. The transfer module entrance 90 includes first and second hand-off stations, 92 and 94, and first and second entrance ports, 96 and 98.
The first through fifth supercritical processing modules, 74-78, are coupled to the transfer module 72 via the first through fifth process ports, 84-88, respectively. Preferably, the robot 80 is coupled to the transfer module 72 at a center of the transfer module 72. The first and second hand-off stations, 92 and 94, are coupled to the transfer module via the first and second entrance ports, 96 and 98, respectively. The control electronics 82 are coupled to the transfer module 72.
Preferably, the transfer module 72 operates at atmospheric pressure.
Alternatively, the transfer module 72 operates at a slight positive pressure relative to a surrounding environment where the slight positive pressure is produced by an inert gas injection arrangement. The inert gas injection arrangement injects an inert gas, such as Ar, COz, or Nz, into the transfer module 72. This assures a cleaner processing environment within the transfer module 72.
The robot 80 preferably includes a robot base 100, a robot arm 102, and an end effector 104. The robot base is coupled to the transfer module 72. The robot arm 102 is preferably a two piece robot arm, which couples the end effector 104 to the robot base 100.
The end effector 104 is configured to pick and place workpieces. Preferably, the end effector 104 is configured to pick and place the wafer. Alternatively, the end effector 104 is configured to pick and place a puck or other substrate. Alternatively, a dual arm robot replaces the robot 80, where the dual arm robot includes two arms and two end effectors.
The first through fifth supercritical processing modules, 74-78, preferably include first through fifth gate valves, 106-110, respectively. The first through fifth gate valves, 106-110, couple first through fifth workpiece cavities, 112-116, of the first through fifth supercritical processing modules, 74-78, respectively, to the first through fifth process ports, 84-88.
Preferably, in operation, the robot 80 transfers a first workpiece 118 from the first WO 01!33615 CA 02387341 2002-04-11 pCT~S00/41787 hand-off station 92 to the first supercritical processing module 74, where the supercritical removal process 40 is performed. Subsequently, the robot 80 transfers a second workpiece 120 from the first hand-off station 92 to the second supercritical processing module 75, where the supercritical removal process 40 is performed. Further, the robot 80 transfers third S through fifth workpieces (not shown) from the first hand-off station 92 to the third through fifth supercritical processing modules, 76-78, respectively, where the supercritical removal process 40 is performed.
In subsequent operation, the robot 80 transfers the first workpiece from the first supercritical processing module 74 to the second hand-off station 94. Further, the robot 80 transfers the second workpiece from the second supercritical processing module 75 to the second hand-off station 94. Moreover, the robot 80 transfers the third through fifth workpieces from the third through fifth supercritical processing modules, 76-78, respectively, to the second hand-off station 94.
Preferably, the first workpiece 118, the second wafer 120, and the third through fifth workpieces are wafers. Preferably, the wafers are in a first cassette at the first hand-off station 92 prior to supercritical processing. Preferably, the wafers are placed by the robot 80 in a second cassette at the second hand-off station 94 following the supercritical processing.
Alternatively, the wafers begin and end in the first cassette at the first hand-off station 92 along while a second group of wafers begins and ends in the second cassette at the second hand-off station 94.
It will be readily apparent to one skilled in the art that the second hand-off station 94 can be eliminated or that additional hand-off stations can be added to the preferred supercritical processing system 70. Further, it will be readily apparent to one skilled in the art that the preferred supercritical processing system 70 can be configured with less than the first through fifth supercritical processing modules, 74-78, or more than the first through fifth supercritical processing modules, 74-78. Moreover, it will be readily apparent to one skilled in the art that the robot 80 can be replaced by a transfer mechanism which is configured to transfer the first workpiece 118, the second workpiece 120, and the third through fifth workpieces. Additionally, it will be readily apparent to one skilled in the art that the first and second cassettes can be front opening unified pods which employ a standard mechanical interface concept so that the wafers can be maintained in a clean environment separate from the surrounding environment.
The first supercritical processing module 74 of the present invention is illustrated in FIG. 5. The first supercritical processing module 74 includes a carbon dioxide supply vessel 132, a carbon dioxide pump 134, the pressure chamber 136, a chemical supply vessel 138, a circulation pump 140, and an exhaust gas collection vessel 144. The carbon dioxide supply vessel 132 is coupled to the pressure chamber 136 via the carbon dioxide pump 134 and carbon dioxide piping 146. The carbon dioxide piping 146 includes a carbon dioxide heater 148 located between the carbon dioxide pump 134 and the pressure chamber 136.
The pressure chamber 136 includes a pressure chamber heater 150. The circulation pump 140 is located on a circulation line 152, which couples to the pressure chamber 136 at a circulation inlet 154 and at a circulation outlet 156. The chemical supply vessel 138 is coupled to the circulation line 152 via a chemical supply line 158, which includes a first injection pump 159.
A rinse agent supply vessel 160 is coupled to the circulation line 152 via a rinse supply line 162, which includes a second injection pump 163. The exhaust gas collection vessel 144 is coupled to the pressure chamber 136 via exhaust gas piping 164.
The carbon dioxide supply vessel 132, the carbon dioxide pump 134, and the carbon dioxide heater 148 form a carbon dioxide supply arrangement 149. The chemical supply vessel 138, the first injection pump 159, the rinse agent supply vessel 160, and the second injection pump 163 form a chemical and rinse agent supply arrangement 165.
Preferably, the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 service the second through fifth supercritical processing modules, 75-78, (FIG. 3) as well as the first supercritical processing module 74.
In other words, preferably, the first supercritical processing module 74 includes the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 while the second through fifth supercritical processing modules, 75-78, share the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 of the first supercritical processing module 74.
It will be readily apparent to one skilled in the art that one or more additional carbon dioxide supply arrangements, one or more additional chemical and rinse agent supply arrangements, or one or more additional exhaust gas collection vessels can be provided to service the second through fifth supercritical processing modules, 75-78.
Further, it will be readily apparent to one skilled in the art that the first supercritical processing module 74 includes valuing, control electronics, filters, and utility hookups which are typical of supercritical fluid processing systems. Moreover, it will be readily apparent to one skilled in the art that additional chemical supply vessels could be coupled to the first injection pump 159 or that the additional chemical supply vessels and additional injection pumps could be coupled to the circulation line 152.
Referring to FIGS. 3, 4, and 5, implementation of the supercritical removal method 40 begins with the first process step 52, in which the wafer, having the photoresist or the residue (or both the photoresist and the residue) is inserted through the first process port and placed in the first wafer cavity 112 of the pressure chamber 136 by the robot 80 and, then, the pressure chamber 136 is sealed by closing the gate valve 106. In the second process step 54, the pressure chamber 136 is pressurized by the carbon dioxide pump 134 with the carbon dioxide from the carbon dioxide supply vessel 132. During the second step 54, the carbon dioxide is heated by the carbon dioxide heater 148 while the pressure chamber 136 is heated by the pressure chamber heater 150 to ensure that a temperature of the carbon dioxide in the pressure chamber 136 is above a critical temperature. The critical temperature for the carbon dioxide is 31 °C. Preferably, the temperature of the carbon dioxide in the pressure chamber 136 is _7_ v~-v i'G~~VG UJUV41 lLil within a range of 45 °C to 75 °C. Alternatively, the temperature of the carbon dioxide in tn~
pressure chamber 136 is maintained within a range of from 31 °C to about 100 °C.
Upon reaching initial supercritical conditions, the first injection pump 159 pumps the solvent from the chemical supply vessel 138 into the pressure chamber 136 via the circulation line 152 while the carbon dioxide pump further pressurizes the supercritical carbon dioxide in the third process step 56. At a beginning of a solvent injection, the pressure in the pressure chamber 136 is about 1,100-1,200 psi (7.58-8.27 MPa). Qnce a desired amount of the solvent has been pumped into the pressure chamber 136 and desired supercritical conditions are reached, the carbon dioxide pump 134 stops pressurizing the pressure chamber 136, the first injection pump 159 stops pumping the solvent into the pressure chamber 136, and the .
circulation pump 140 begins circulating the supercritical carbon dioxide ~d the solvent in the fourth process step 58. Preferably, the pressure at this point is about 2,700-2,800 psi (18.62-1931 MPa). By circulating the supercritical carbon dioxide and the solvent, the supercritical carbon dioxide maintains the solvent in contact with the wafer. Additionally, by circulating the supercritical carboy dioxide and the solvent, a fluid.flow. enhances removal of the photoresist and the residue from the wafer. . . . - .- . ' Preferably, the wafer is held stationary in the pressure chamber 136 during the fourth pmcess step 58. Alternatively, the wafer is spun within the pressure chamber 136 during the.
fourth process step 58. ' ' A$er the photoresist and the residua has bees removed from the wafer, the pressure chamber 136 is partially depressurized by exhausting some ofthe supercritical carbon dioxide, the solvent, removed photoresist, and removed residue to the exhaust gas collection vessel 144 in order to return conditions in the pressure chamber 136 to near the initial supezcritical conditions in the fifth process step 60. Preferably, tha pressure within the pressure chamber 136 is cycled at least once at this point by raising. the pressure and then again partially exhausting the pressure chamber 136. This enhances a cleanliness within the pressure chamber 136. In the fifth pmcess step 60, the pressure chamber is preferably maintained above the critical temperature and above a critical pressure. The critical pressure for carbon dioxide is 1,070 psi (7.38 MPa). . ' -In the sixth process step 62, the second injection pump 163 pumps a rinse agent from the rinse agent supply vessel 160 into the pressure chamber.136 via the circulation line while the carbon dioxide pump 134 pressurizes the pressura chamber 136 to near the desired supercritical conditions and, then, the circulation puaap 140 circulates the supercritical carbon dioxide and the rinse agent in order to rinse the wafer. Preferably, the rinse agent is selected $om the group consisting of water, alcohol, acetone, and a mixture thereof.
More. preferably, the rinse agent is the mixture of the alcohol and the water. Preferably, the alcohol is selected from the group consisting of isopropyl alcohol, ethanol, and other low molecular weight alcohols. More preferably, the alcohol is selected from the group consisting of the isopropyl alcohol and the ethanol. Most preferably, the alcohol is the ethanol.
Preferably, the wafer is held stationary in the pressure chamber 136 during the sixth Empf .ze~i t : 03I01I2002 19:23 Empf .nr .:058 P .016 AMENDED SHEET
u~-u r -cuuc U JUU4 I / ti process step 62. Alternatively, the.waf~ is spun within the nr~ssure chamber I36 a~,riing the sixth process step 62.
In the seventh process step 64, the pressure chamber 136 is depressurizcd, by exhausting the pressure chamber 136 to the exhaust gas collection vessel 144, the gate valve 106 is opened, and the wafer is removed from the pressure chamber I36 by the robot 80.
Alternative supercritical removal processes of the present invention are taught in the following patent documents, all of which are incorporated in their entirety byreference: U.S.
Patent Application 09/697,227, filed on Oct. 25, 2000 (also filed as PCTIUSOOl30218 on .
Nev. 1, 2000, which was published as WO 01/33613 on May 10, 2001); U.S. Patent TO Application No. 09/085,391 filed on May 27,1998 (which has issued as U.S.
Patent No.
6,306,564 on Oct. 23, 2001); and U.S. Provisional Patent Application No.
60/047,739, filed on May 27,1997 (which provides priority for U.S. Patent No. 6,306,564).
A first alternative supercritical processing system of the present invention is.
illustrated in FIG. 6. The first alternative supercritical processing system 170 adds first.
through fifth ante-chambers,172-176, and first through fifth sate-chamber robots, 178-182, to the prefeaed supercritical processing system 70. In operation, the.first through fifth ante-chambers, 172-176, operate from about atmospheric pressure to some elevated pressure. This allows the first through fifth wafer cavities, 112-Ib, to operate between the elevated pressure and supercritical pressure and, thus, eahanci>gg throughput. Alternatively, in the first ~ alternative supercritical processing system 170, the 5rst through fifth ante-chamber robots, 178-182, are replaced with first through fifth magnetically coupled mechanisms, or first through fifth hydraulically driven mechanisms, or first through fifth pneumatically driven mechanisms.
A second alternative supercritical processing system of the present invention of the present invention is illustrated in FIG. 7. The second alternative supercritical processing system 190 replaces the first and second hand-off stations, 92 and 94, of the preferred supercritical processing system ?0 with first and second loadlocks, 192 and 194. In operation, the transfer module operates at a second elevated pressure and, thus, also enhances the throughput.
A third alternative supercritical processing system of the present invention of the present invention is illustrated in FIG. 8. The third alternative supercritical processing system 200 comprises an alternative transfer module 202 and a robot track 204.
A fourth alternative supercritical processing system of the present invention is.
illushated in FIG. 9. The fourth alternative supercritical processing system 210 preferably replaces the third supercritical processing module 76 of the preferred supercritical processing system 70 with a third hand-off station 212 and adds a second transfer module 214, a second robot 216, and additional supercritical processing modules 218. In the fourth alternative supercritical processing system 210, the third band-off station 212 couples the transfer module 72 to the second transfer module 214. The second robot Z 16 preferably resides in the second transfer module 214. The additional supercritical processing modules 218 are coupled Empf .zei t :03101/2002 19:24 Etr>Pf .nr .:058 P.017 AMENDED SHEET
U.3-U 1-GUUG UJUU41 /tS
to the second transfer module 214. Thus, the fourth alternative supercriiical processing system Z10 allows for more supercritical processing modules than the preferred supercritical processing system 70.
A fifth alternative supercritical processing system of the present invention eliminates the transfer module 72 of the preferred supercritical processing system 70. In the fifth alternative supercritical processing system, the rnbot 80 is configured to move worJspieces between the first and second hand-off stations, 92 and 94, and the first through fifth supercritical processing modules, 74-78, without benefitting from a covering effect provided by the transfer module 72.
~ A sixth alternative supercritical processing system of the present invention adds an inspection station to the preferred supercritical processing system 70. In the sixth alternative supercritical processing system, the first workpiece 118, the second workpiece 120, and the third through fifth workpieces are transferred to the inspection station prior to being transferred to the second hand-offstation 94. At the inspection station, an inspection.of the workpieces ensures that the photoresist and the residue have been removed from the .
workpieces. Preferably, the inspection station uses spectroscopy to~inspect the workpieces.
A seventh alternative supercritical processing system of the present invention adds a front-end robot to the preferred supercritical processing syste~na 70. In the seventh alternative.
supercritical processing system, the front end robot resides outside of the entrance to the transfer module 72 and the first and second cassettes are located away from the first and second hand-o$ stations, 92 and 94. The front-end robot is preferably configured to move ttrc wafers from the first cassette to the first hand off station 92 and is also preferably configured' to move the wafers from the second hand-off station 94 to the second cassette.
.
An eighth alternative supercritical processing system of the present invention adds a wafer orientation mechanism to the preferred supercritical processing system 70. The wafer orientation mechanism orients the wafer according to a flat, a notch, or an other orientation indicator. Preferably, the wafer is oriented at the fast hand off station 92.
Alternatively, the wafer is oriented at the second hand-off station 94.
A first alternative supercritical processing module of the present invention replaces the pressure chamber 136 and gate valve 106 with an alternative pressure chambez. The alternative pressure chamber comprises a chamber housing and a hydraulicly driven wafer.
platen. The chamber housing comprises a cylindrical cavity which is open at its bottom. The hydraulicly driven wafer platen is configured to seal against the chamber housing outside of the cylindrical cavity. In operation, the wafer is placed on the hydraulicly driven wafer platen, Then, the hydraulicly driven wafer platen moves upward and seals with the chamber.
housing. Once the wafer has bean processed the hydraulicly driven wafer platen is lowered and the wafer is taken away.
A second alternative supercritical processing module of the present invention places alternative inlets for the circulation line 152 to enter the wafer cavity 112 at a circumference of the wafer cavity 112 and places an alternative outlet at a top center of the wafer cavity 112.
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UJUU~ f !0l VJ'V I-LVVL
The alternative inlets are preferably configured to i~ect fne supercritical carbon dioxide in a plane defined by the wafer cavity 112. Preferably, tine alternative inlets are angled with respect to a radius of the wafer cavity 112 so that in operation the alternative inlets and the alternative outlet create a vortex within the wafer cavity 112.
It will be readily apparent to one stilled in the art that other various modifications may be made to the preferred embodiment without departing from the spirit and scope of the invention as defined by the appended claims.
Er~f .ze f t :03!0112002 19:25 . Emaf .nr .:058 P .019 AMENDED SHEET
What is needed is a method of developing photoresist using supercritical carbon dioxide appropriate for a semiconductor fabrication line.
What is needed is a method of removing photoresist using supercritical carbon dioxide appropriate for a semiconductor fabrication line.
What is needed is a supercritical processing system which is configured for handling semiconductor substrates.
What is needed is a supercritical processing system in which supercritical COz and solvent are not necessarily bled from a processing chamber in order to create a fluid flow within the processing chamber.
What is needed is a supercritical processing system which meets throughput requirements of a semiconductor fabrication line.
What is needed is a supercritical processing system which provides safe semiconductor substrate handling.
What is needed is a supercritical processing system which provides economical semiconductor substrate processing.
SUMMARY OF THE INVENTION
The present invention is an apparatus for supercritical processing of multiple workpieces. The apparatus includes a transfer module, first and second supercritical processing modules, and a robot. The transfer module includes an entrance. The first and second supercritical processing modules are coupled to the transfer module.
The robot is preferably located within the transfer module. In operation, the robot transfers a first workpiece from the entrance of the transfer module to the first supercritical processing module. The robot then transfers a second workpiece from the entrance to the second supercritical processing module. After the workpieces have been processed, the robot returns the first and second workpieces to the entrance of the transfer module.
Alternatively, the apparatus includes additional supercritical processing modules coupled to the transfer module.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 illustrates, in block diagram format, a process flow for a semiconductor etching and metallization process of the prior art.
FIG. 2 illustrates, in block diagram format, a process flow for a semiconductor etching _3_ WO 01/33615 CA 02387341 2002-04-11 pCT/US00/41787 and metallization process of the present invention.
FIG. 3 illustrates, in block diagram format, a supercritical removal process of the present invention.
FIG. 4 illustrates the preferred supercritical processing system of the present invention.
FIG. S illustrates the preferred supercritical processing module of the present invention.
FIG. 6 illustrates a first alternative supercritical processing system of the present invention.
FIG. 7 illustrates a second alternative supercritical processing system of the present invention.
FIG. 8 illustrates a third alternative supercritical processing system of the present invention.
FIG. 9 illustrates a fourth alternative supercritical processing system of the present 1 S invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
A semiconductor etch and metallization process of the present invention is illustrated, as a block diagram, in FIG. 2. The semiconductor etch and metallization process 30 includes a photoresist application step 32, a photoresist exposure step 34, a photoresist development step 36, a dielectric etch step 38, a supercritical removal process 40, and a metal deposition step 42. In the photoresist application step 32, the photoresist is applied to a wafer having an exposed oxide layer. In the photoresist exposure step 34, the photoresist is exposed to light which is partially blocked by a mask.
Depending upon whether the photoresist is a positive or negative photoresist, either exposed photoresist or non-exposed photoresist, respectively, is removed in the photoresist development step 36 leaving a exposed pattern on the oxide layer. In the dielectric etch step 38, the exposed pattern on the oxide layer is preferably etched in an RIE
(reactive ion etch) process which etches the exposed pattern into the oxide layer while also partially etching the photoresist. This produces the residue which coats the sidewalls of the etch features while also hardening the photoresist.
In the supercritical removal process 40, supercritical carbon dioxide and a solvent are used to remove the photoresist and the residue. In the metal deposition step 42, a metal layer is deposited on the wafer filling the etched pattern and also covering non-etched regions. In subsequent processing, at least part of the metal covering the non-etched regions is removed in order to form a circuit.
The supercritical removal process 40 of the present invention is illustrated, as a block diagram, in FIG. 3. The supercritical removal process 40 begins by placing the wafer, with the photoresist and the residue on the wafer, within a pressure chamber and sealing the pressure chamber in a first process step 52. In a second process step 54, the pressure chamber is pressurized with carbon dioxide until the carbon dioxide becomes the supercritical carbon dioxide (SCCOZ). In a third process step 56, the supercritical carbon dioxide carries a solvent into the process chamber. In a fourth process step 58, the supercritical carbon dioxide and the solvent are maintained in contact with the wafer until the photoresist and the residue are removed from the wafer. In the fourth process step 58, the solvent at least partially dissolves the photoresist and the residue. In a fifth process step 60, the pressure chamber is partially exhausted. In a sixth process step 62, the wafer is rinsed. In a seventh process step 64, the supercritical removal process 40 ends by depressurizing the pressure chamber and removing the wafer.
The supercritical removal process 40 is preferably implemented in a semiconductor fabrication line by the preferred supercritical processing system of the present invention, which is illustrated in FIG. 4. The preferred supercritical processing system 70 includes a transfer module 72, first through fifth supercritical processing modules, 74-78, a robot 80, and control electronics 82. The transfer module includes first through fifth process ports, 84-88, and a transfer module entrance 90. The transfer module entrance 90 includes first and second hand-off stations, 92 and 94, and first and second entrance ports, 96 and 98.
The first through fifth supercritical processing modules, 74-78, are coupled to the transfer module 72 via the first through fifth process ports, 84-88, respectively. Preferably, the robot 80 is coupled to the transfer module 72 at a center of the transfer module 72. The first and second hand-off stations, 92 and 94, are coupled to the transfer module via the first and second entrance ports, 96 and 98, respectively. The control electronics 82 are coupled to the transfer module 72.
Preferably, the transfer module 72 operates at atmospheric pressure.
Alternatively, the transfer module 72 operates at a slight positive pressure relative to a surrounding environment where the slight positive pressure is produced by an inert gas injection arrangement. The inert gas injection arrangement injects an inert gas, such as Ar, COz, or Nz, into the transfer module 72. This assures a cleaner processing environment within the transfer module 72.
The robot 80 preferably includes a robot base 100, a robot arm 102, and an end effector 104. The robot base is coupled to the transfer module 72. The robot arm 102 is preferably a two piece robot arm, which couples the end effector 104 to the robot base 100.
The end effector 104 is configured to pick and place workpieces. Preferably, the end effector 104 is configured to pick and place the wafer. Alternatively, the end effector 104 is configured to pick and place a puck or other substrate. Alternatively, a dual arm robot replaces the robot 80, where the dual arm robot includes two arms and two end effectors.
The first through fifth supercritical processing modules, 74-78, preferably include first through fifth gate valves, 106-110, respectively. The first through fifth gate valves, 106-110, couple first through fifth workpiece cavities, 112-116, of the first through fifth supercritical processing modules, 74-78, respectively, to the first through fifth process ports, 84-88.
Preferably, in operation, the robot 80 transfers a first workpiece 118 from the first WO 01!33615 CA 02387341 2002-04-11 pCT~S00/41787 hand-off station 92 to the first supercritical processing module 74, where the supercritical removal process 40 is performed. Subsequently, the robot 80 transfers a second workpiece 120 from the first hand-off station 92 to the second supercritical processing module 75, where the supercritical removal process 40 is performed. Further, the robot 80 transfers third S through fifth workpieces (not shown) from the first hand-off station 92 to the third through fifth supercritical processing modules, 76-78, respectively, where the supercritical removal process 40 is performed.
In subsequent operation, the robot 80 transfers the first workpiece from the first supercritical processing module 74 to the second hand-off station 94. Further, the robot 80 transfers the second workpiece from the second supercritical processing module 75 to the second hand-off station 94. Moreover, the robot 80 transfers the third through fifth workpieces from the third through fifth supercritical processing modules, 76-78, respectively, to the second hand-off station 94.
Preferably, the first workpiece 118, the second wafer 120, and the third through fifth workpieces are wafers. Preferably, the wafers are in a first cassette at the first hand-off station 92 prior to supercritical processing. Preferably, the wafers are placed by the robot 80 in a second cassette at the second hand-off station 94 following the supercritical processing.
Alternatively, the wafers begin and end in the first cassette at the first hand-off station 92 along while a second group of wafers begins and ends in the second cassette at the second hand-off station 94.
It will be readily apparent to one skilled in the art that the second hand-off station 94 can be eliminated or that additional hand-off stations can be added to the preferred supercritical processing system 70. Further, it will be readily apparent to one skilled in the art that the preferred supercritical processing system 70 can be configured with less than the first through fifth supercritical processing modules, 74-78, or more than the first through fifth supercritical processing modules, 74-78. Moreover, it will be readily apparent to one skilled in the art that the robot 80 can be replaced by a transfer mechanism which is configured to transfer the first workpiece 118, the second workpiece 120, and the third through fifth workpieces. Additionally, it will be readily apparent to one skilled in the art that the first and second cassettes can be front opening unified pods which employ a standard mechanical interface concept so that the wafers can be maintained in a clean environment separate from the surrounding environment.
The first supercritical processing module 74 of the present invention is illustrated in FIG. 5. The first supercritical processing module 74 includes a carbon dioxide supply vessel 132, a carbon dioxide pump 134, the pressure chamber 136, a chemical supply vessel 138, a circulation pump 140, and an exhaust gas collection vessel 144. The carbon dioxide supply vessel 132 is coupled to the pressure chamber 136 via the carbon dioxide pump 134 and carbon dioxide piping 146. The carbon dioxide piping 146 includes a carbon dioxide heater 148 located between the carbon dioxide pump 134 and the pressure chamber 136.
The pressure chamber 136 includes a pressure chamber heater 150. The circulation pump 140 is located on a circulation line 152, which couples to the pressure chamber 136 at a circulation inlet 154 and at a circulation outlet 156. The chemical supply vessel 138 is coupled to the circulation line 152 via a chemical supply line 158, which includes a first injection pump 159.
A rinse agent supply vessel 160 is coupled to the circulation line 152 via a rinse supply line 162, which includes a second injection pump 163. The exhaust gas collection vessel 144 is coupled to the pressure chamber 136 via exhaust gas piping 164.
The carbon dioxide supply vessel 132, the carbon dioxide pump 134, and the carbon dioxide heater 148 form a carbon dioxide supply arrangement 149. The chemical supply vessel 138, the first injection pump 159, the rinse agent supply vessel 160, and the second injection pump 163 form a chemical and rinse agent supply arrangement 165.
Preferably, the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 service the second through fifth supercritical processing modules, 75-78, (FIG. 3) as well as the first supercritical processing module 74.
In other words, preferably, the first supercritical processing module 74 includes the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 while the second through fifth supercritical processing modules, 75-78, share the carbon dioxide supply arrangement 149, the chemical and rinse agent supply arrangement 165, and the exhaust gas collection vessel 144 of the first supercritical processing module 74.
It will be readily apparent to one skilled in the art that one or more additional carbon dioxide supply arrangements, one or more additional chemical and rinse agent supply arrangements, or one or more additional exhaust gas collection vessels can be provided to service the second through fifth supercritical processing modules, 75-78.
Further, it will be readily apparent to one skilled in the art that the first supercritical processing module 74 includes valuing, control electronics, filters, and utility hookups which are typical of supercritical fluid processing systems. Moreover, it will be readily apparent to one skilled in the art that additional chemical supply vessels could be coupled to the first injection pump 159 or that the additional chemical supply vessels and additional injection pumps could be coupled to the circulation line 152.
Referring to FIGS. 3, 4, and 5, implementation of the supercritical removal method 40 begins with the first process step 52, in which the wafer, having the photoresist or the residue (or both the photoresist and the residue) is inserted through the first process port and placed in the first wafer cavity 112 of the pressure chamber 136 by the robot 80 and, then, the pressure chamber 136 is sealed by closing the gate valve 106. In the second process step 54, the pressure chamber 136 is pressurized by the carbon dioxide pump 134 with the carbon dioxide from the carbon dioxide supply vessel 132. During the second step 54, the carbon dioxide is heated by the carbon dioxide heater 148 while the pressure chamber 136 is heated by the pressure chamber heater 150 to ensure that a temperature of the carbon dioxide in the pressure chamber 136 is above a critical temperature. The critical temperature for the carbon dioxide is 31 °C. Preferably, the temperature of the carbon dioxide in the pressure chamber 136 is _7_ v~-v i'G~~VG UJUV41 lLil within a range of 45 °C to 75 °C. Alternatively, the temperature of the carbon dioxide in tn~
pressure chamber 136 is maintained within a range of from 31 °C to about 100 °C.
Upon reaching initial supercritical conditions, the first injection pump 159 pumps the solvent from the chemical supply vessel 138 into the pressure chamber 136 via the circulation line 152 while the carbon dioxide pump further pressurizes the supercritical carbon dioxide in the third process step 56. At a beginning of a solvent injection, the pressure in the pressure chamber 136 is about 1,100-1,200 psi (7.58-8.27 MPa). Qnce a desired amount of the solvent has been pumped into the pressure chamber 136 and desired supercritical conditions are reached, the carbon dioxide pump 134 stops pressurizing the pressure chamber 136, the first injection pump 159 stops pumping the solvent into the pressure chamber 136, and the .
circulation pump 140 begins circulating the supercritical carbon dioxide ~d the solvent in the fourth process step 58. Preferably, the pressure at this point is about 2,700-2,800 psi (18.62-1931 MPa). By circulating the supercritical carbon dioxide and the solvent, the supercritical carbon dioxide maintains the solvent in contact with the wafer. Additionally, by circulating the supercritical carboy dioxide and the solvent, a fluid.flow. enhances removal of the photoresist and the residue from the wafer. . . . - .- . ' Preferably, the wafer is held stationary in the pressure chamber 136 during the fourth pmcess step 58. Alternatively, the wafer is spun within the pressure chamber 136 during the.
fourth process step 58. ' ' A$er the photoresist and the residua has bees removed from the wafer, the pressure chamber 136 is partially depressurized by exhausting some ofthe supercritical carbon dioxide, the solvent, removed photoresist, and removed residue to the exhaust gas collection vessel 144 in order to return conditions in the pressure chamber 136 to near the initial supezcritical conditions in the fifth process step 60. Preferably, tha pressure within the pressure chamber 136 is cycled at least once at this point by raising. the pressure and then again partially exhausting the pressure chamber 136. This enhances a cleanliness within the pressure chamber 136. In the fifth pmcess step 60, the pressure chamber is preferably maintained above the critical temperature and above a critical pressure. The critical pressure for carbon dioxide is 1,070 psi (7.38 MPa). . ' -In the sixth process step 62, the second injection pump 163 pumps a rinse agent from the rinse agent supply vessel 160 into the pressure chamber.136 via the circulation line while the carbon dioxide pump 134 pressurizes the pressura chamber 136 to near the desired supercritical conditions and, then, the circulation puaap 140 circulates the supercritical carbon dioxide and the rinse agent in order to rinse the wafer. Preferably, the rinse agent is selected $om the group consisting of water, alcohol, acetone, and a mixture thereof.
More. preferably, the rinse agent is the mixture of the alcohol and the water. Preferably, the alcohol is selected from the group consisting of isopropyl alcohol, ethanol, and other low molecular weight alcohols. More preferably, the alcohol is selected from the group consisting of the isopropyl alcohol and the ethanol. Most preferably, the alcohol is the ethanol.
Preferably, the wafer is held stationary in the pressure chamber 136 during the sixth Empf .ze~i t : 03I01I2002 19:23 Empf .nr .:058 P .016 AMENDED SHEET
u~-u r -cuuc U JUU4 I / ti process step 62. Alternatively, the.waf~ is spun within the nr~ssure chamber I36 a~,riing the sixth process step 62.
In the seventh process step 64, the pressure chamber 136 is depressurizcd, by exhausting the pressure chamber 136 to the exhaust gas collection vessel 144, the gate valve 106 is opened, and the wafer is removed from the pressure chamber I36 by the robot 80.
Alternative supercritical removal processes of the present invention are taught in the following patent documents, all of which are incorporated in their entirety byreference: U.S.
Patent Application 09/697,227, filed on Oct. 25, 2000 (also filed as PCTIUSOOl30218 on .
Nev. 1, 2000, which was published as WO 01/33613 on May 10, 2001); U.S. Patent TO Application No. 09/085,391 filed on May 27,1998 (which has issued as U.S.
Patent No.
6,306,564 on Oct. 23, 2001); and U.S. Provisional Patent Application No.
60/047,739, filed on May 27,1997 (which provides priority for U.S. Patent No. 6,306,564).
A first alternative supercritical processing system of the present invention is.
illustrated in FIG. 6. The first alternative supercritical processing system 170 adds first.
through fifth ante-chambers,172-176, and first through fifth sate-chamber robots, 178-182, to the prefeaed supercritical processing system 70. In operation, the.first through fifth ante-chambers, 172-176, operate from about atmospheric pressure to some elevated pressure. This allows the first through fifth wafer cavities, 112-Ib, to operate between the elevated pressure and supercritical pressure and, thus, eahanci>gg throughput. Alternatively, in the first ~ alternative supercritical processing system 170, the 5rst through fifth ante-chamber robots, 178-182, are replaced with first through fifth magnetically coupled mechanisms, or first through fifth hydraulically driven mechanisms, or first through fifth pneumatically driven mechanisms.
A second alternative supercritical processing system of the present invention of the present invention is illustrated in FIG. 7. The second alternative supercritical processing system 190 replaces the first and second hand-off stations, 92 and 94, of the preferred supercritical processing system ?0 with first and second loadlocks, 192 and 194. In operation, the transfer module operates at a second elevated pressure and, thus, also enhances the throughput.
A third alternative supercritical processing system of the present invention of the present invention is illustrated in FIG. 8. The third alternative supercritical processing system 200 comprises an alternative transfer module 202 and a robot track 204.
A fourth alternative supercritical processing system of the present invention is.
illushated in FIG. 9. The fourth alternative supercritical processing system 210 preferably replaces the third supercritical processing module 76 of the preferred supercritical processing system 70 with a third hand-off station 212 and adds a second transfer module 214, a second robot 216, and additional supercritical processing modules 218. In the fourth alternative supercritical processing system 210, the third band-off station 212 couples the transfer module 72 to the second transfer module 214. The second robot Z 16 preferably resides in the second transfer module 214. The additional supercritical processing modules 218 are coupled Empf .zei t :03101/2002 19:24 Etr>Pf .nr .:058 P.017 AMENDED SHEET
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to the second transfer module 214. Thus, the fourth alternative supercriiical processing system Z10 allows for more supercritical processing modules than the preferred supercritical processing system 70.
A fifth alternative supercritical processing system of the present invention eliminates the transfer module 72 of the preferred supercritical processing system 70. In the fifth alternative supercritical processing system, the rnbot 80 is configured to move worJspieces between the first and second hand-off stations, 92 and 94, and the first through fifth supercritical processing modules, 74-78, without benefitting from a covering effect provided by the transfer module 72.
~ A sixth alternative supercritical processing system of the present invention adds an inspection station to the preferred supercritical processing system 70. In the sixth alternative supercritical processing system, the first workpiece 118, the second workpiece 120, and the third through fifth workpieces are transferred to the inspection station prior to being transferred to the second hand-offstation 94. At the inspection station, an inspection.of the workpieces ensures that the photoresist and the residue have been removed from the .
workpieces. Preferably, the inspection station uses spectroscopy to~inspect the workpieces.
A seventh alternative supercritical processing system of the present invention adds a front-end robot to the preferred supercritical processing syste~na 70. In the seventh alternative.
supercritical processing system, the front end robot resides outside of the entrance to the transfer module 72 and the first and second cassettes are located away from the first and second hand-o$ stations, 92 and 94. The front-end robot is preferably configured to move ttrc wafers from the first cassette to the first hand off station 92 and is also preferably configured' to move the wafers from the second hand-off station 94 to the second cassette.
.
An eighth alternative supercritical processing system of the present invention adds a wafer orientation mechanism to the preferred supercritical processing system 70. The wafer orientation mechanism orients the wafer according to a flat, a notch, or an other orientation indicator. Preferably, the wafer is oriented at the fast hand off station 92.
Alternatively, the wafer is oriented at the second hand-off station 94.
A first alternative supercritical processing module of the present invention replaces the pressure chamber 136 and gate valve 106 with an alternative pressure chambez. The alternative pressure chamber comprises a chamber housing and a hydraulicly driven wafer.
platen. The chamber housing comprises a cylindrical cavity which is open at its bottom. The hydraulicly driven wafer platen is configured to seal against the chamber housing outside of the cylindrical cavity. In operation, the wafer is placed on the hydraulicly driven wafer platen, Then, the hydraulicly driven wafer platen moves upward and seals with the chamber.
housing. Once the wafer has bean processed the hydraulicly driven wafer platen is lowered and the wafer is taken away.
A second alternative supercritical processing module of the present invention places alternative inlets for the circulation line 152 to enter the wafer cavity 112 at a circumference of the wafer cavity 112 and places an alternative outlet at a top center of the wafer cavity 112.
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The alternative inlets are preferably configured to i~ect fne supercritical carbon dioxide in a plane defined by the wafer cavity 112. Preferably, tine alternative inlets are angled with respect to a radius of the wafer cavity 112 so that in operation the alternative inlets and the alternative outlet create a vortex within the wafer cavity 112.
It will be readily apparent to one stilled in the art that other various modifications may be made to the preferred embodiment without departing from the spirit and scope of the invention as defined by the appended claims.
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Claims (30)
1. An apparatus for supercritical processing of first and second workpieces comprising:
a. a transfer module (72, 202) having an entrance;
b. first and second supercritical processing modules (74, 75) coupled to the transfer module; and c. a transfer mechanism (80) coupled to the transfer module, the transfer mechanism configured to move the first workpiece between the enhance and the first supercritical processing module, the transfer mechanism configured to move the second workpiece between the entrance and the second supercritical processing module.
a. a transfer module (72, 202) having an entrance;
b. first and second supercritical processing modules (74, 75) coupled to the transfer module; and c. a transfer mechanism (80) coupled to the transfer module, the transfer mechanism configured to move the first workpiece between the enhance and the first supercritical processing module, the transfer mechanism configured to move the second workpiece between the entrance and the second supercritical processing module.
2. The apparatus of claim 1 wherein the transfer module operates at about atmospheric pressure.
3. The apparatus of claim 1 wherein the transfer module further comprises means for maintaining a slight positive pressure in the transfer module relative to a surrounding environment.
4. The apparatus of claim 3 wherein the means for maintaining the slight positive pressure in the transfer module comprise as inert gas injection arrangement.
5. The apparatus of claim 2 wherein the entrance of the transfer module comprises a hand-off station (92).
6. The apparatus of claim 5 wherein the entrance of the transfer module further comprises an additional land-off station (94).
7. The apparatus of claim 1 wherein the transfer module operates at a pressure above atmospheric pressure and further wherein the entrance of the transfer module comprises a loadlock (192).
8. The apparatus of claim 7 wherein the entrance of the transfer module further comprises an additional loadlock (194).
9. The apparatus of claim 1 wherein the transfer mechanism comprises a robot (80).
10. The apparatus of claim 9 wherein the transfer module comprises a circular configuration (72).
11. The apparatus of claim 10 wherein the robot comprises a central robot, the central robot occupying a center of the circular configuration.
12. The apparatus of claim 9 wherein the transfer module comprises a track configuration (202).
13. The apparatus of claim 12 wherein the robot comprises a tracked robot (204), the tracked robot comprising the robot coupled to a track such that the robot moves along the track in order to reach the first and second processing module located along the track.
14. The apparatus of claim 13 further comprising third and fourth supercritical processing modules (77, 78), the third and fourth supercritical processing modules located along the track, the third and fourth supercritical processing modules located opposite the first and second supercritical processing modules relative to the track.
15. The apparatus of claim 9 wherein the robot comprises an extendable arm (102) and an end effector (104).
16. The apparatus of claim 15 wherein the robot further comprises an additional arm and an additional end effector.
17. The apparatus of claim 1 wherein the first supercritical processing module comprises a first pressure vessel (136) and further wherein the second supercritical processing module comprises a second pressure vessel.
18. The apparatus of claim 17 wherein:
a. the first pressure vessel comprises a first workpiece cavity (112) and a first pressure vessel entrance (84), the first workpiece cavity holding the first workpiece during supercritical processing, the first pressure vessel entrance providing ingress and egress for the first workpiece; and b. the second pressure vessel comprises a second workpiece cavity (113) and a second pressure vessel entrance (85), the second workpiece cavity holding the second workpiece during the supercritical processing, the second pressure vessel entrance providing ingress and egress for the first workpiece.
a. the first pressure vessel comprises a first workpiece cavity (112) and a first pressure vessel entrance (84), the first workpiece cavity holding the first workpiece during supercritical processing, the first pressure vessel entrance providing ingress and egress for the first workpiece; and b. the second pressure vessel comprises a second workpiece cavity (113) and a second pressure vessel entrance (85), the second workpiece cavity holding the second workpiece during the supercritical processing, the second pressure vessel entrance providing ingress and egress for the first workpiece.
19. The apparatus of claim 18 wherein the transfer mechanism is configured to place the first and second workpieces in the first and second workpiece cavities, respectively.
20. The apparatus of claim 19 wherein the transfer module and the supercritical processing module are configured to operate at supercritical conditions.
21. The apparatus of claim 19 further comprising first and second gate valves (106,107), the first gate valve coupling the transfer module and the first supercritical processing module, the second gate valve coupling the transfer module and the second supercritical processing module.
22. The apparatus of claim 18 further comprising first and second ante-chambers (172, 173), the first ante-chamber coupling the transfer module and the first supercritical processing module, the second ante-chamber coupling the transfer module and the second supercritical processing module.
23. The apparatus of claim 1 further comprising means (134, 146) for pressurizing the first and second supercritical processing modules.
24. The apparatus of claim 23 wherein the means for pressurizing comprises a CO2 pressurizing configuration which comprises a CO2 supply vessel (132) coupled to a pump (134) which is coupled to the first and second supercritical processing modules such that the CO2 pressurizing configuration pressurizes the first supercritical processing module independently of the second supercritical processing module and further such that the CO2 pressurizing configuration pressurizes the second supercritical processing module independently of the first supercritical processing module.
25. The apparatus of claim 18 further comprising first and second means (106, 107) for sealing, the first means for sealing operable to seal the first pressure vessel entrance, the second means for sealing operable to seal the second pressure vessel entrance.
26. The apparatus of claim 1 further comprising means (82) for controlling such that the means for controlling directs the transfer mechanism to move the first and second workpieces between the entrance of the transfer module and the first and second supercritical processing modules, respectively, and further such that the means for controlling controls the first supercritical processing module independently of the second supercritical processing module.
27. A method of supercritical processing first and second workpieces comprising the steps of:
a. transferring the first workpiece from an entrance of a transfer module (72, 202) to a first supercritical processing module (74) coupled to the transfer module;
b. transferring the second workpiece from the entrance of the transfer module to a second supercritical processing module (75) coupled to the transfer module;
c. processing the first and second workpieces in the first and second supercritical processing modules, respectively;
d. transferring the first workpiece from the first supercritical processing module to the entrance of the transfer module; and e. transferring the second workpiece from the second supercritical processing module to the entrance of the transfer module.
a. transferring the first workpiece from an entrance of a transfer module (72, 202) to a first supercritical processing module (74) coupled to the transfer module;
b. transferring the second workpiece from the entrance of the transfer module to a second supercritical processing module (75) coupled to the transfer module;
c. processing the first and second workpieces in the first and second supercritical processing modules, respectively;
d. transferring the first workpiece from the first supercritical processing module to the entrance of the transfer module; and e. transferring the second workpiece from the second supercritical processing module to the entrance of the transfer module.
28. The method of claim 27 wherein the entrance of the transfer module comprises a hand-off station (92).
29. The method of claim 28 wherein the entrance of the transfer module further comprises an additional hand-off station (94).
30. An apparatus for supercritical processing comprising:
a. a transfer module (72, 202) having an entrance (90);
b. an inert gas injection arrangement coupled to the transfer module such that in operation the inert gas injection arrangement maintains a slight positive pressure in the transfer module relative to a surrounding environment;
c. a first supercritical processing module (74) coupled to the transfer module, the first supercritical processing module including first means for sealing the first supercritical processing module;
d. a second supercritical processing module (75) coupled to the transfer module, the second supercritical processing module including second means for sealing the second supercritical processing module; and e. a transfer mechanism (80) coupled to the transfer module such that in operation the transfer mechanism transfers first and second semiconductor substrates between the first and second supercritical processing modules, respectively, and the entrance of the transfer module.
a. a transfer module (72, 202) having an entrance (90);
b. an inert gas injection arrangement coupled to the transfer module such that in operation the inert gas injection arrangement maintains a slight positive pressure in the transfer module relative to a surrounding environment;
c. a first supercritical processing module (74) coupled to the transfer module, the first supercritical processing module including first means for sealing the first supercritical processing module;
d. a second supercritical processing module (75) coupled to the transfer module, the second supercritical processing module including second means for sealing the second supercritical processing module; and e. a transfer mechanism (80) coupled to the transfer module such that in operation the transfer mechanism transfers first and second semiconductor substrates between the first and second supercritical processing modules, respectively, and the entrance of the transfer module.
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US60/163,121 | 1999-11-02 | ||
PCT/US2000/041787 WO2001033615A2 (en) | 1999-11-02 | 2000-11-01 | Method and apparatus for supercritical processing of multiple workpieces |
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CA002387341A Abandoned CA2387341A1 (en) | 1999-11-02 | 2000-11-01 | Method and apparatus for supercritical processing of multiple workpieces |
CA002387373A Abandoned CA2387373A1 (en) | 1999-11-02 | 2000-11-01 | Method and apparatus for supercritical processing of a workpiece |
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CA002387373A Abandoned CA2387373A1 (en) | 1999-11-02 | 2000-11-01 | Method and apparatus for supercritical processing of a workpiece |
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EP (2) | EP1234322A2 (en) |
JP (2) | JP4621400B2 (en) |
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- 2000-11-01 EP EP00991448A patent/EP1234322A2/en not_active Withdrawn
- 2000-11-01 CN CNB008152993A patent/CN1175470C/en not_active Expired - Fee Related
- 2000-11-01 WO PCT/US2000/041787 patent/WO2001033615A2/en active Application Filing
- 2000-11-01 WO PCT/US2000/041853 patent/WO2001046999A2/en not_active Application Discontinuation
- 2000-11-01 CA CA002387341A patent/CA2387341A1/en not_active Abandoned
- 2000-11-01 AU AU32672/01A patent/AU3267201A/en not_active Abandoned
- 2000-11-01 CN CNB008152985A patent/CN1192417C/en not_active Expired - Fee Related
- 2000-11-01 AU AU49022/01A patent/AU4902201A/en not_active Abandoned
- 2000-11-01 JP JP2001547635A patent/JP4621400B2/en not_active Expired - Lifetime
- 2000-11-01 EP EP00992996A patent/EP1243021A2/en not_active Withdrawn
- 2000-11-01 CA CA002387373A patent/CA2387373A1/en not_active Abandoned
- 2000-11-01 KR KR1020027005569A patent/KR100742473B1/en active IP Right Grant
- 2000-11-01 KR KR1020027005570A patent/KR100744888B1/en not_active IP Right Cessation
- 2000-11-01 JP JP2001535218A patent/JP5073902B2/en not_active Expired - Fee Related
- 2000-11-02 TW TW089123137A patent/TW484169B/en not_active IP Right Cessation
-
2003
- 2003-01-15 US US10/346,445 patent/US7060422B2/en not_active Expired - Fee Related
- 2003-03-06 US US10/384,096 patent/US6926798B2/en not_active Expired - Fee Related
Also Published As
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CN1399790A (en) | 2003-02-26 |
JP2003513466A (en) | 2003-04-08 |
AU4902201A (en) | 2001-07-03 |
CN1387673A (en) | 2002-12-25 |
AU3267201A (en) | 2001-05-14 |
WO2001046999A3 (en) | 2002-07-11 |
WO2001033615A3 (en) | 2001-12-06 |
JP2003518736A (en) | 2003-06-10 |
US20030150559A1 (en) | 2003-08-14 |
TW484169B (en) | 2002-04-21 |
JP5073902B2 (en) | 2012-11-14 |
KR100742473B1 (en) | 2007-07-25 |
KR20020047315A (en) | 2002-06-21 |
US6926798B2 (en) | 2005-08-09 |
CN1192417C (en) | 2005-03-09 |
CA2387373A1 (en) | 2001-06-28 |
US7060422B2 (en) | 2006-06-13 |
EP1243021A2 (en) | 2002-09-25 |
KR20020047314A (en) | 2002-06-21 |
WO2001046999A2 (en) | 2001-06-28 |
EP1234322A2 (en) | 2002-08-28 |
JP4621400B2 (en) | 2011-01-26 |
CN1175470C (en) | 2004-11-10 |
WO2001033615A2 (en) | 2001-05-10 |
KR100744888B1 (en) | 2007-08-01 |
US20030136514A1 (en) | 2003-07-24 |
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