CA2656956A1 - Multipole ion guide for mass spectrometry - Google Patents

Multipole ion guide for mass spectrometry Download PDF

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Publication number
CA2656956A1
CA2656956A1 CA002656956A CA2656956A CA2656956A1 CA 2656956 A1 CA2656956 A1 CA 2656956A1 CA 002656956 A CA002656956 A CA 002656956A CA 2656956 A CA2656956 A CA 2656956A CA 2656956 A1 CA2656956 A1 CA 2656956A1
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Prior art keywords
ion guide
ions
vacuum
mass analyzer
multipole
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CA002656956A
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French (fr)
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CA2656956C (en
Inventor
Craig M. Whitehouse
Erol Gulcicek
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Revvity Health Sciences Inc
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

Abstract

A multipole ion guide which begins in one pumping stage and extends continuously into one or more subsequent pumping stages has been incorporated into an atmospheric pressure ion source mass spectrometer system. Ions delivered into vacuum from an electrospray, atmospheric pressure chemical ionization or inductively coupled plasma ion source are guided and focused into a mass analyzer with high efficiency using the multipole ion guide.
The background pressure over a portion of the multipole ion guide length is high enough to cause kinetic energy cooling of ions traversing the ion guide length due to ion collisions with neutral background gas molecules. This ion kinetic energy cooling lowers energy spread of ions traversing the multipole ion guide length. The multipole ion guide DC
offset potential can be used to adjust the mean ion energy and the ion guide a and q values can be set to reduce or expand the range of ion mass to charge which will be transmitted through the ion guide. These features of multipole ion guides and multiple pumping stage multipole ion guides are used to improve performance and lower the cost of atmospheric pressure ion source mass spectrometer instruments.

Claims (147)

We claim: 41
1. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) at least two vacuum stages, each of said vacuum stages having means for pumping away gas to produce a partial vacuum, the first of said vacuum stages being in communication with said ion source such that at least some of said ions can flow from said ion source into said first vacuum stage, said vacuum stages in communication with each other such that at least some of said ions can flow from said first vacuum stage through a sequence of said vacuum stages;
(c) a mass analyzer and detector located in at least one of said vacuum stages;
(d) a multipole ion guide extending through a plurality of said vacuum stages such that said multipole ion guide begins in one of said vacuum stages and extends into at least one subsequent vacuum stage in said sequence of vacuum stages; and, (e) means for supplying said multipole ion guide with electrical voltages.
2. An apparatus according to claim 1, wherein said ion source is an Electrospray ion source.
3. An apparatus according to claim 1, wherein said ion source is an Atmospheric Pressure Chemical Ionization source.
4. An apparatus according to claim 1, wherein said ion source is an Inductively Coupled Plasma ion source.
5. An apparatus according to claim 1, wherein said multipole ion guide is a hexapole.
6. An apparatus according to claim 1, wherein said multipole ion guide is a quadrupole.
7. An apparatus according to claim 1, wherein said multipole ion guide has more than six poles.
8. An apparatus according to claim 1, wherein said mass analyzer is a quadrupole mass filter.
9. An apparatus according to claim 1, wherein said mass analyzer is a magnetic sector mass spectrometer.
10. An apparatus according to claim 1, wherein said mass analyzer is a Time-Of-Flight mass spectrometer.
11. An apparatus according to claim 1, wherein said mass analyzer is an orthogonal pulsing Time-Of-Flight mass spectrometer.
12. An apparatus according to claim 1, wherein said mass analyzer is a hybrid ion trap-Time-Of- Flight mass analyzer.
13. An apparatus according to claim 1, wherein said mass analyzer is an ion trap mass spectrometer.
14. An apparatus according to claim 1, wherein said mass analyzer is a Fourier Transform mass spectrometer.
15. An apparatus according to claim 1, comprising three of said vacuum stages.
16. An apparatus according to claim 1, comprising four of said vacuum stages.
17. An apparatus according to claim 1, comprising more than four of said vacuum stages.
18. An apparatus according to claim 1, wherein said ion guide extends continuously through two of said vacuum stages.
19. An apparatus according to claim 18, wherein said multipole ion guide begins in said first vacuum stage and extends continuously into vacuum stage two.
20. An apparatus according to claim 18, wherein said multipole ion guide begins in vacuum stage two and extends continuously into vacuum stage three.
21. An apparatus according to claim 1, wherein said ion guide extends continuously through three of said vacuum stages.
22. An apparatus according to claim 1, wherein said multipole ion guide begins in said first vacuum stage.
23. An apparatus according to claim 1, wherein said multipole ion guide begins in vacuum stage two.
24. An apparatus according to claim 1, wherein said ion guide extends continuously from said one vacuum stage through at least two of said subsequent vacuum stages.
25. An apparatus according to claim 1, wherein said multipole ion guide has means for applying AC and DC voltages to said multipole ion guide.
26. An apparatus according to claim 25, wherein said AC and DC voltages and the AC
frequency applied to said multipole ion guide are adjustable.
27. An apparatus according to claim 26, wherein said AC frequency is fixed, said AC
voltage amplitude is adjustable and said DC voltages are adjustable.
28. An apparatus according to claim 26, wherein said AC frequency and said AC
and DC
voltages are set to limit the range of mass-to-charge of said ions which can be transmitted through said multipole ion guide.
29. An apparatus according to claim 28, wherein said AC frequency is fixed and said AC
voltage amplitude and said DC voltages are adjusted to limit the range of mass-to-charge of ions which can be transmitted through said multipole ion guide.
30. An apparatus according to claim 1, wherein the background pressure in at least one of said vacuum stages where a portion of said multipole ion guide is located is high enough to cause cooling of ion kinetic energy.
31. An apparatus according to claim 1, wherein the radial distance from the inner surface of the poles of said multipole ion guide to the centerline of said multipole ion guide is 1.5 millimeters or less.
32. An apparatus according to claim 1, wherein said first vacuum stage has a background pressure of less than 20 torr.
33. An apparatus according to claim 1, wherein the second of said vacuum stages has a background pressure of less than 500 millitorr.
34. An apparatus according to claim 1, wherein the third of said vacuum stages has a background pressure of less than 10 millitorr.
35. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) at least two vacuum stages, each of said vacuum stages having means for pumping away gas to produce a partial vacuum, the first of said vacuum stages being in communication with said ion source such that at least some of said ions can flow from said ion source into said first vacuum stage, said vacuum stages in communication with each other such that at least some of said ions can flow from said first vacuum stage through a sequence of said vacuum stages;

(c) a Time-Of-Flight mass analyzer and detector having an ion pulsing region and Time-Of-Flight tube, said ion pulsing region and said Time-of-Flight tube each located in at least one of said vacuum pumping stages;

(d) at least one multipole ion guide located in at least one of said vacuum stages;
and, (e) means for supplying said multipole ion guide with electrical voltages.
36. An apparatus according to claim 35, wherein said ion source is an Electrospray ion source.
37. An apparatus according to claim 35, wherein said ion source is an Atmospheric Pressure Chemical Ionization source.
38. An apparatus according to claim 35, wherein said ion source is an Inductively Coupled Plasma ion source.
39. An apparatus according to claim 35, wherein said multipole ion guide is a hexapole.
40. An apparatus according to claim 35, wherein said multipole ion guide is a quadrupole.
41. An apparatus according to claim 35, wherein said multipole ion guide has more than six poles.
42. An apparatus according to claim 35, wherein said Time-Of-Flight mass analyzer includes means for orthogonal pulsing of said ions from said pulsing region into said Time-Of-Flight tube.
43. An apparatus according to claim 35, wherein said Time-Of-Flight mass analyzer includes means for in-line pulsing of said ions from said pulsing region into said Time-Of-Flight tube.
44. An apparatus according to claim 35, wherein said Time-of-Flight mass analyzer includes an ion trap for pulsing of said ions from said pulsing region into said Time-Of-Flight tube.
45. An apparatus according to claim 35, wherein at least one of said multipole ion guides is located in one of said vacuum stages such that it begins and ends in the same vacuum stage.
46. An apparatus according to claim 45, wherein each of said multipole ion guides in said apparatus begins and ends within its respective vacuum stage.
47. A method according to claim 35, wherein at least one of said multipole ion guides begins in one of said vacuum stages and extends into at least one subsequent vacuum stage.
48. An apparatus according to claim 35, wherein the background pressure in at least one of said vacuum stages where said at least one multipole ion guide is located is maintained high enough to cause cooling of ion kinetic energy.
49. An apparatus according to claim 35, wherein said ion guide has AC and DC
voltages applied as a means to select the energy of said ions entering said Time-Of-Flight mass analyzer.
50. An apparatus according to claim 49, wherein said AC and DC voltages applied to said multipole ion guide can be set to reduce the range of mass to charge of ions which can be transmitted through said multipole ion guide.
51. An apparatus according to claim 50, wherein said AC and DC voltages applied to said multipole ion guide can be set to increase the duty cycle of said Time-of-Flight mass analyzer.
52. An apparatus according to claim 50, wherein said AC and DC voltages applied to said multipole ion guide can be set to decrease the detector dead time of said Time-Of-Flight mass analyzer.
53. An apparatus according to claim 35, wherein the radial distance from the inner surface of a pole of said multipole ion guide to the centerline of said multipole ion guide is 1.5 millimeters or less.
54. An apparatus according to claim 35, wherein the radial distance from the inner surface of a pole of said multipole ion guide to the centerline of said multipole ion guide is 1 millimeter or less.
55. An apparatus for analyzing chemical species, comprising:
(a) an ion source for producing ions from a sample substance;
(b) at least two vacuum stages, each of said vacuum stages having means for pumping away gas to produce a partial vacuum, the first of said vacuum stages being in communication with said ion source such that at least some of said ions can flow from said ion source into said first vacuum stage, said vacuum stages in communication with each other such that at least some said ions can flow from said first vacuum stage through a sequence of said vacuum stages;
(c) a multipole ion guide extending through a plurality of said vacuum stages such that said multipole ion guide begins in one of said vacuum stages and extends into at least one subsequent vacuum stage in said sequence of vacuum stages;
(d) a mass analyzer located in at least one of said vacuum stages for analysis of said ions; and, (e) means for supplying said multipole ion guide with electrical voltages.
56. An apparatus according to claim 55, wherein said ion source is an Electrospray ion source.
57. An apparatus according to claim 55, wherein said ion source is an Atmospheric Pressure Chemical Ionization source.
58. An apparatus according to claim 55, wherein said ion source is an Inductively Coupled Plasma ion source.
59. An apparatus according to claim 55, wherein said multipole ion guide is a hexapole.
60. An apparatus according to claim 55, wherein said multipole ion guide is a quadrupole.
61. An apparatus according to claim 55, wherein said multipole ion guide has more than six poles.
62. An apparatus according to claim 55, wherein said mass analyzer is a quadrupole mass filter.
63. An apparatus according to claim 55, wherein said mass analyzer is a magnetic sector mass spectrometer.
64. An apparatus according to claim 55, wherein said mass analyzer is a Time-Of-Flight mass spectrometer.
65. An apparatus according to claim 55, wherein said mass analyzer is an orthogonal pulsing Time-Of-Flight mass spectrometer.
66. An apparatus according to claim 55, wherein said mass analyzer is a hybrid ion trap-Time-Of-Flight mass analyzer.
67. An apparatus according to claim 55, wherein said mass analyzer is an ion trap mass spectrometer.
68. An apparatus according to claim 55, wherein said mass analyzer is a Fourier Transform mass spectrometer.
69. An apparatus for analyzing chemical species, comprising:

(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) at least two vacuum stages, each of said vacuum stages having means for pumping away gas to produce a partial vacuum, the first of said vacuum stages being in communication with said ion source such that at least some of said ions can flow from said ion source into said first vacuum stage, said vacuum stages in communication with each other such that at least some of said ions can flow from said first vacuum stage through a sequence of said vacuum stages;

(c) a multipole ion guide extending through a plurality of said vacuum stages such that said multipole ion guide begins in one of said vacuum stages and extends into at least one subsequent vacuum stage in said sequence of vacuum stages;
(d) an orthogonally pulsed Time-Of-Flight mass analyzer and detector having an ion pulsing region and Time-Of-Flight tube, said ion pulsing region and said Time-Of-Flight tube each located in at least one of said vacuum pumping stages; and, (e) means for supplying said multipole ion guide with electrical voltages.
70. An apparatus according to claim 69, wherein said ion source is an Electrospray ion source.
71. An apparatus according to claim 69, wherein said ion source is an Atmospheric Pressure Chemical Ionization source.
72. An apparatus according to claim 69, wherein said ion source is an Inductively Coupled Plasma ion source.
73. An apparatus according to claim 69, wherein said multipole ion guide is a hexapole.
74. An apparatus according to claim 69, wherein said multipole ion guide is a quadrupole.
75. An apparatus according to claim 69, wherein said multipole ion guide has more than six poles.
76. An apparatus according to claim 69, wherein said background pressure in at least one of said vacuum stages where at least one said multipole ion guide is located, is maintained high enough to cause cooling of ion kinetic energy resulting in reduction of the ion energy spread for said ions of a given mass to charge transmitted through said multipole ion guide.
77. An apparatus according to claim 69, wherein said ion guide has AC and DC
voltages applied as a means to select the energy of said ions entering said Time-Of-Flight mass analyzer.
78. An apparatus according to claim 77, wherein said AC and DC voltages applied to said multipole ion guide can be set to reduce the range of mass to charge of said ions which are transmitted through said multipole ion guide.
79. An apparatus according to claim 78, wherein said AC and DC voltages applied to said multipole ion guide can be set to increase the duty cycle of said Time-OF-Flight mass analyzer.
80. An apparatus according to claim 78, wherein said AC and DC voltages applied said multipole ion guide can be set to decrease said detector dead time of said Time-Of-Flight mass analyzer.
81. An apparatus for analyzing chemical species, comprising:
(a) an ion source for producing ions from a sample substance;
(b) at least two vacuum stages, each of said vacuum stages having means for pumping away gas to produce a partial vacuum, the first of said vacuum stages being in communication with said ion source such that at least some of said ions can flow from said ion source into said first vacuum stage, said vacuum stages in communication with each other such that at least some of said ions can flow from said first vacuum stage through a sequence of said vacuum stages;
(c) a multipole ion guide extending through a plurality of said vacuum stages such that said multipole ion guide begins in one of said vacuum stages and extends into at least one subsequent vacuum stage in said sequence of vacuum stages, at least one of said plurality of vacuum stages into which said multipole ion guide extends being maintained at a background pressure equal to or greater than 20 millitorr;

(d) a mass analyzer located in at least one of said vacuum stages for analysis of said ions; and, (e) means for supplying said multipole ion guide with electrical voltages.
82. An apparatus according to claim 81, wherein said background pressure is equal to or greater than 50 millitorr.
83. An apparatus according to claim 81, wherein said background pressure is equal to or greater than 100 millitorr.
84. An apparatus according to claim 81, wherein said background pressure is equal to or greater than 150 millitorr.
85. A method of analyzing chemical species utilizing an ion source, a vacuum system with at least two vacuum stages, a mass analyzer, a multipole ion guide which extends through more than one of said vacuum stages, and means for supplying said multipole ion guide with electrical voltages, said method comprising:

(a) producing ions from a sample introduced into said ion source;
(b) directing at least some of said ions into the first of said vacuum stages and subsequently into said multipole ion guide;

(c) applying an AC and DC voltage to the rods of said multipole ion guide such that at least some ions of said ions will be transferred through said ion guide and directed into said mass analyzer to analyze said chemical species.
86. A method according to claim 85, wherein said step of producing said ions is accomplished at substantially atmospheric pressure.
87. A method according to claim 86, wherein said sample introduced into said ion source is a solution.
88. A method according to claim 85, further comprising the step of maintaining the pressure in at least a portion of said multipole ion guide at a level high enough to cause ions in said ion guide to lose kinetic energy from collisions with neutral gas molecules.
89. A method according to claim 85, further comprising the step of applying said DC
voltage to said ion guide rods at a level set to establish the energy of said ions exiting from said ion guide.
90. A method according to claim 85, further comprising the step of maintaining the background pressure in at least one of said vacuum stages in which a portion of said ion guide is located at or above 20 millitorr.
91. A method according to claim 85, further comprising the step of maintaining the background pressure in at least one of said vacuum stages in which a portion of said ion guide is located at or above 50 millitorr.
92. A method according to claim 85, further comprising the step of maintaining the background pressure in at least one of said vacuum stages in which a portion of said ion guide is located at or above 100 millitorr.
93. A method according to claim 85, further comprising the step of maintaining the background pressure in at least one of said vacuum stages in which a portion of said ion guide is located at or above 150 millitorr.
94. A method according to claim 85, wherein said AC and DC voltages applied to said ion guide rods are set to limit the m/z range of said ions which will pass through said ion guide.
95. A method according to claim 94, wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of an ion trap mass analyzer.
96. A method according to claim 94, wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of a Fourier Transform mass analyzer.
97. A method according to claim 94, wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of a Time-Of-Flight mass analyzer.
98. A method according to claim 94, wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the detector response of a Time-Of-Flight mass analyzer.
99. A method according to claim 85, wherein said analysis is conducted with a quadrupole mass analyzer.
100. A method according to claim 85, wherein said analysis is conducted with a magnetic sector mass analyzer.
101. A method according to claim 85, wherein said analysis is conducted with a Time-Of-Flight mass analyzer.
102. A method according to claim 85, wherein said analysis is conducted with an ion trap mass analyzer.
103. A method according to claim 85, wherein said analysis is conducted with a Fourier Transform mass analyzer.
104.
A method of analyzing chemical species utilizing an ion source operated substantially at atmospheric pressure, a vacuum system with at least two vacuum stages, a mass analyzer, a multipole ion guide which extends through more than one of said vacuum stages, and means for supplying said multipole ion guide with electrical voltages, said method comprising;

(a) producing ions from a sample introduced into said ion source;
(b) directing at least some of said ions into the first of said vacuum stages and subsequently into said multipole ion guide;

(c) applying an AC and DC voltage to the rods of said multipole ion guide so that at least some of said ions will be transferred through said ion guide and directed into said mass analyzer to analyze said chemical species.
106. A method according to claim 104, wherein said step of producing said ions is accomplished using nebulizer assisted Electrospray ionization.
107. A method according to claim 104, wherein said step of producing said ions is accomplished using Atmospheric Pressure Chemical Ionization.
108. A method according to claim 104, wherein said step of producing said ions is accomplished using Inductively Coupled Plasma ionization.
109. A method according to claim 104, further comprising the step of maintaining the pressure in a portion of the length of said ion guide at a level high enough to cause kinetic energy cooling of said ions in said ion guide from collisions with neutral gas molecules.
110. A method according to claim 104, wherein said DC voltage applied to said ion guide rods is set to establish the energy of said ions exiting from said ion guide.
111. A method according to claim 104, wherein the background pressure in at least one said vacuum stage in which a portion of said ion guide is located is maintained at or above 20 millitorr.
112. A method according to claim 104, wherein the background pressure in at least one said vacuum stage in which a portion of said ion guide is located is maintained at or above 50 millitorr.
113. A method according to claim 104, wherein the background pressure in at least one said vacuum stage in which a portion of said ion guide is located is maintained at or above 100 millitorr.
114. A method according to claim 104, wherein the background pressure in at least one said vacuum stage in which a portion of said ion guide is located is maintained at or above 150 millitorr.
115. A method according to claim 104, wherein said AC and DC voltages applied to said ion guide rods are set to limit the m/z range of said ions which will pass through said ion guide.
116. A method according to claim 115, wherein said ion guide AC and DC
voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of an ion trap mass analyzer.
117. A method according to claim 115, wherein said ion guide AC and DC
voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of a Fourier Transform mass analyzer.
118. A method according to claim 115, wherein said ion guide AC and DC
voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of a Time-Of-Flight mass analyzer.
119. A method according to claim 104, wherein said analysis is conducted with a quadrupole mass analyzer.
120. A method according to claim 104, wherein said analysis is conducted with a magnetic sector mass analyzer.
121. A method according to claim 104, wherein said analysis is conducted with a Time-Of-Flight mass analyzer.
122. A method according to claim 104, wherein said analysis is conducted with an ion trap mass analyzer.
123. A method according to claim 104, wherein said analysis is conducted with a Fourier Transform mass analyzer.
124. A method of analyzing chemical species utilizing an ion source operated substantially at atmospheric pressure, a vacuum system with at least two vacuum stages, at least one multipole ion guide located in at least one of said vacuum stages, a Time-Of-Flight mass analyzer and detector, and means for supplying said multipole ion guide with electrical voltages, said method comprising;
(a) producing ions from a sample introduced into said ion source;
(b) directing at least some of said ions into said multipole ion guide;
(c) applying an AC and DC voltage to the rods of said multipole ion guide so that at least some of said ions will be transferred through said ion guide and directed into said pulsing region of said mass analyzer.

(d) applying pulsing voltages to the lens elements in said pulsing region of said Time-Of-Flight mass analyzer to accelerate at least some of said ions into said Time-Of-Flight tube to analyze said sample ions.
125. A method according to claim 124 wherein said ions are produced with Electrospray ionization.
126. A method according to claim 124 wherein said ions are produced with nebulizer assisted Electrospray ionization.
127. A method according to claim 124 wherein said ions are produced with Atmospheric Pressure Chemical Ionization.
128. A method according to claim 124 wherein said ions are produced Inductively Coupled Plasma ionization.
129. A method according to claim 124 where said ions are directed into said pulsing region with a trajectory substantially orthogonal to said Time-Of-Flight tube axis.
130. A method according to claim 124 where ions are directed into said pulsing region with a trajectory substantially in line with said Time-Of-Flight tube axis.
131. A method according to claim 124 wherein the pressure in a portion of the length of said ion guide is maintained high enough to cause kinetic energy cooling of said ions in said ion guide from collisions with neutral gas molecules.
132. A method according to claim 124 wherein said DC voltage applied to said ion guide rods is set to establish the energy of said ions exiting from said ion guide.
133. A method according to claim 124 'wherein said AC and DC voltages applied to said ion guide rods are set to limit the m/z range of said ions which will pass through said ion guide.
134. A method according to claim 124 wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the analysis capability of said Time-Of-Flight mass analyzer.
135. A method according to claim 124 wherein said ion guide AC and DC voltages are set to limit said m/z range of ions passing through said ion guide to improve the detector response of a Time-Of-Flight mass analyzer.
136. A method of analyzing chemical species utilizing an ion source operated substantially at atmospheric pressure, a vacuum system with at least two vacuum stages, a Time-Of-Flight mass analyzer and detector, at least one multipole ion guide located in at least one of said vacuum stages, and means for supplying said multipole ion guide with electrical voltages, said method comprising:

(a) producing ions from a sample substance using an ion source;
(b) directing at least some of said ions into said multipole ion guide, at least one of said vacuum stages in which said multipole ion guide is located being maintained at a background pressure of at least 20 millitorr, and, (c) directing at least some of said ions into a Time-of-Flight mass analyzer and detector located in at least one of said vacuum stages for analysis of said ions.
137. A method according to claim 136, wherein said background pressure is equal to or greater than 50 millitorr.
138. A method according to claim 136, wherein said background pressure is equal to or greater than 100 millitorr.
139. A method according to claim 136, wherein said background pressure is equal to or greater than 150 millitorr.
140. A method of analyzing chemical species utilizing an ion source operated substantially at atmospheric pressure, a vacuum system with at least two vacuum stages, a mass analyzer, at least one multipole ion guide located in at least one of said vacuum stages, and means for supplying said multipole ion guide with electrical voltages, said method comprising:
(a) producing ions from a sample substance using an ion source;

(b) directing at least some of said ions into said multipole ion guide, at least one of said vacuum stages in which said multipole ion guide is located being maintained at a background pressure of at least 20 millitorr, and, (c) directing at least some of said ions into a mass analyzer located in at least one of said vacuum stages for analysis of said ions.
141. A method according to claim 140, wherein said background pressure is equal to or greater than 50 millitorr.
142. A method according to claim 140, wherein said background pressure is equal to or greater than 100 millitorr.
143. A method according to claim 140, wherein said background pressure is equal to or greater than 150 millitorr.
144. An apparatus according to claim 1, wherein said sample introduced into said ion source is a solution.
145. An apparatus according to claim 35, wherein said sample introduced into said ion source is a solution.
146. An apparatus according to claim 55, wherein said sample introduced into said ion source is a solution.
147. An apparatus according to claim 69, wherein said sample introduced into said ion source is a solution.
CA2656956A 1994-02-28 1995-02-27 Multipole ion guide for mass spectrometry Expired - Lifetime CA2656956C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US20250594A 1994-02-28 1994-02-28
US08/202,505 1994-02-28
CA002526197A CA2526197C (en) 1994-02-28 1995-02-27 Multipole ion guide for mass spectrometry

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CA2656956A1 true CA2656956A1 (en) 1995-08-31
CA2656956C CA2656956C (en) 2011-10-11

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US (6) US5652427A (en)
EP (3) EP1533829A3 (en)
JP (1) JP3671354B2 (en)
AU (1) AU1932095A (en)
CA (1) CA2656956C (en)
DE (1) DE69535979D1 (en)
DK (1) DK0748249T3 (en)
ES (1) ES2331494T3 (en)
WO (1) WO1995023018A1 (en)

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US10964521B2 (en) 2017-07-18 2021-03-30 Shimadzu Corporation Mass spectrometer

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EP1533829A3 (en) 2006-06-07
US6744047B2 (en) 2004-06-01
US20010038069A1 (en) 2001-11-08
EP0748249A4 (en) 1997-05-02
WO1995023018A1 (en) 1995-08-31
US20110303840A1 (en) 2011-12-15
ES2331494T3 (en) 2010-01-05
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US6188066B1 (en) 2001-02-13
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JP3671354B2 (en) 2005-07-13
AU1932095A (en) 1995-09-11
US5652427A (en) 1997-07-29
US8598519B2 (en) 2013-12-03
EP0748249A1 (en) 1996-12-18
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CA2656956C (en) 2011-10-11
US6403953B2 (en) 2002-06-11
US5962851A (en) 1999-10-05
US20030034451A1 (en) 2003-02-20
JPH09509781A (en) 1997-09-30

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