CN101303384B - Test device and test method of rapid response electronic device response speed - Google Patents
Test device and test method of rapid response electronic device response speed Download PDFInfo
- Publication number
- CN101303384B CN101303384B CN 200810115885 CN200810115885A CN101303384B CN 101303384 B CN101303384 B CN 101303384B CN 200810115885 CN200810115885 CN 200810115885 CN 200810115885 A CN200810115885 A CN 200810115885A CN 101303384 B CN101303384 B CN 101303384B
- Authority
- CN
- China
- Prior art keywords
- response
- module
- timer
- electronic device
- shaping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Abstract
The invention discloses a device for testing the response speed of quick response electronic devices and a testing method thereof. The device for testing the response speed of the invention comprises a power control circuit, at least two response modules of the electronic devices to be tested and a timer; the power control circuit is electrically connected with the power source end of the response modules; all modules are connected in series; the startup trigger signal of the timer synchronizes the trigger signal of the first response module; the shutoff trigger signal of the timer synchronizes the output signal of the last response module. The testing device and the testing method of the invention aim at overcoming the defects of the high cost and low measurement precision of the testing the response speed of the quick response electronic devices, measure the total response time by connecting a plurality of devices to be tested in series, obtain the response time of each group of devices by calculation, require no application of the display instruments of high cost and can obtain a high-precision testing result of electronic devices of the same type at the same time.
Description
Technical field
The present invention relates to a kind of proving installation and method of testing thereof, particularly a kind of device and method of testing thereof of testing rapid response electronic device response speed.
Background technology
Along with the develop rapidly of electron devices such as semiconductor, the performance and the reaction velocity of various electron devices were greatly improved in recent years, and be corresponding, the development that device performance testing apparatus is thereupon also being maked rapid progress.At present, various quick electronic device responses, response speed as the high-performance optical charge coupled device has reached the wonderful level of millimicro, and the measuring accuracy of testing apparatus does not reach demand far away, the test job of being done only is the result that walk through test obtains, or adopting the expensive a large amount of fund of testing equipment cost, cost is too high.
In addition, emerging in recent years display of organic electroluminescence (OLED), a series of advantages such as having from main light emission, low-voltage direct drive, solidify entirely, the visual angle is wide, color is abundant is compared with LCD, and OLED does not need backlight, the visual angle is big, power is low, and especially its response speed can reach 1000 times of LCD, and manufacturing cost but is lower than the LCD of equal resolution, therefore, display of organic electroluminescence has broad application prospects.
And the response speed of testing OLED screen at present is to use photovoltaic sensing element basically, puts the light-emitting area of photovoltaic sensing element in the OLED screen, connects amplifier and shaping circuit behind the photovoltaic sensing element, after connect oscillograph.The time difference of the rising edge by the waveform on the observation oscilloscope, can estimate response time of OLED screen.
There is following defective in old-fashioned test;
1, very short because of the response time of OLED screen, observe waveform needs high-speed oscilloscope, instrument expense height;
2, waveform flashes across on oscillograph so fast, can't examine research, influences measuring accuracy;
3, the time delay of photovoltaic sensing element response speed, amplification and shaping circuit can't be distinguished, OLED screen response speed will be flooded or be influenced greatly to these factors.
Summary of the invention
The object of the present invention is to provide a kind of response speed that can accurately measure quick electronic device response, lower-cost response speed proving installation.
Another object of the present invention is to provide a kind of method that adopts above-mentioned proving installation test electronic device response speed.
The objective of the invention is to be achieved by the following technical programs: the present invention's response speed proving installation comprises power control circuit, the response module of the tested electron device of at least two groups, timer; Described power control circuit is electrically connected with response module power end, and each responds module and is connected in series, and signal is opened in the triggering of timer and first group of trigger pip that responds module is synchronous, and signal is closed in the triggering of timer and last output signal of organizing the response module is synchronous.
The trigger pip that signal and first group of response module are opened in the triggering of described timer can be same trigger pip.
The output signal that signal and last group response module are closed in the triggering of described timer can be same signal.
Described response module can be photoelectric response module or electroresponse module or acoustic-electric response module.
Described response module also can comprise amplification shaping and switch triggering circuit.
Described tested electron device is electrically connected with amplifying shaping and switch triggering circuit input end, and amplification shaping and switch triggering circuit output end organize tested electron device trigger end with next or the timer triggering pass broken ends of fractured bone is electrically connected.
Described response module also comprises photovoltaic sensing element or acoustic-electric sensing element.
Described respectively the response can adopt light isolated or sound is isolated between the module.
Described photovoltaic sensing element or acoustic-electric sensing element are electrically connected with amplifying shaping and switch triggering circuit input end, and amplification shaping and switch triggering electrical output terminal organize tested electron device trigger end with next or the timer triggering pass broken ends of fractured bone is electrically connected.
Another object of the present invention is achieved by the following technical programs: the method for testing of the present invention's rapid response electronic device response speed comprises the steps;
(1) adopt described proving installation measuring N (N 〉=2) group to respond the overall response time T of module;
(2) utilize formula 1. or formula 2., 3. formula calculate the response time T of each tested electron device
i
T＝(T
i+T
K)N ①
T＝(T
i+T
K+T
G)×N ②
T＝T
i×N ③
In the formula, T
KFor amplifying shaping and switch triggering circuit response time, T
GBe photovoltaic sensing element or acoustic-electric sensing element response time, wherein T
GFor known.
Described step (2) also comprises test amplification shaping and switch triggering circuit response time T
K
Shaping and switch triggering circuit response time T are amplified in described test
KBe electrically connected with the input end, the output terminal that amplify shaping and switch triggering circuit respectively for the triggering of timer being opened, triggered the pass, shaping and switch triggering circuit response time T are amplified in test
K
The present invention is directed to the response speed testing cost height and the not high existing defective of measuring accuracy of quick electronic device response, adopt the series connection of many group measured devices to measure overall response time, by calculating the response time of every group of device, need not the display instrument of cost of use costliness, can access the high-precision test result of same model electron device response speed simultaneously.
Description of drawings
Fig. 1 is an electron device response speed proving installation structural representation of the present invention;
Fig. 2 is the embodiment of the invention 1 an organic electroluminescence device response speed proving installation structural representation;
Fig. 3 is the embodiment of the invention 2 triode response speed proving installation structural representations;
Fig. 4 is that shaping and switch triggering circuit response time T are amplified in the embodiment of the invention 1 test
K
Embodiment
The present invention will be further described below in conjunction with drawings and Examples.
With reference to Fig. 1.The proving installation of the present invention's rapid response electronic device response speed comprises power control circuit 1, the response module 2 of the tested electron device 5 of at least two groups, timer 3; Power control circuit 1 is electrically connected with response module 2 power ends, each responds module 2 and is connected in series, signal is opened in the triggering of timer 3 and first group of trigger pip that responds module 2 is synchronous, and signal is closed in the triggering of timer 3 and last output signal of organizing response module 2 is synchronous., need its output signal is amplified shaping during more weak or irregularity when the output signal of tested electron device 5, promptly as Fig. 1, each group response module 2 increases and amplifies shaping and switch triggering circuit 4, organizes and responds module 2 in order to this group output signal is outputed to next.Because the response time of this amplifications shaping and switch triggering circuit 4 can survey, the response speed test of tested electron device 5 there is not any influence, only need in overall response time, deduct this part response time to get final product.
The trigger pip that signal and first group response module 2 is opened in the triggering of timer 3 can be same trigger pip, and therefore, tested electron device 5 and the triggering of timer 3 are opened signal and be same trigger circuit and provide.Signal is closed in the triggering of timer 3 and last output signal of organizing response module 2 can be same signal, and output of last group response module 2 soon directly connects the triggering pass signal into timer 3.
Response module 2 can be photoelectric response module or electroresponse module or acoustic-electric response module.For example can organic elctroluminescent device (OLED), triode carry out the test of its response speed faster to response speed.If, response speed to photoelectric device or acoustoelectric device is tested, response module 2 also comprises photovoltaic sensing element or acoustic-electric sensing element, as photoelectric sensor 6 or acoustoelectric sensor, simultaneously, each responds needs to adopt light isolated or sound is isolated between the module 2, disturb to stop to produce between each group, causes test error to increase.
The situation of or irregularity more weak for the output signal of tested electron device 5, tested electron device 5 is electrically connected with amplifying shaping and switch triggering circuit 4 input ends, and amplification shaping and switch triggering circuit 4 output terminals organize tested electron device 5 trigger ends with next or the timer 3 triggering pass broken ends of fractured bone are electrically connected.For tested electron device 5 is photoelectric device or acoustoelectric device, simultaneously, the situation of the more weak or irregularity of output signal, its photovoltaic sensing element or acoustic-electric sensing element are electrically connected with amplifying shaping and switch triggering circuit 4 input ends, and amplification shaping and switch triggering circuit 4 output terminals organize tested electron device 5 trigger ends with next or the timer 3 triggering pass broken ends of fractured bone are electrically connected.
Embodiment 1
With reference to Fig. 2.The tested electron device of present embodiment is organic elctroluminescent device (OLED) 5-1, it is a photoelectric device, test need be converted to electric signal with its response speed, increase photoelectric sensor 6, simultaneously, since photoelectric sensor 6 output signals a little less than, need with its output signal end with amplify shaping and switch triggering circuit 4 and be connected, trigger the response that next organizes OLED5-1 by this circuit output end.Present embodiment adopts 20 groups of OLED5-1 response module series connection carrying out tests of Whole Response time.Adopt proving installation as Fig. 2.Step is as follows:
(1) adopt described proving installation to measure the overall response time T of 20 groups of response modules.At first, by power control circuit---trigger circuit 1 are opened for simultaneously the triggering of first group of OLED response module 2 and timer 3 same trigger pip are provided, timer 3 picks up counting, OLED screen body 5-1 in first group of OLED response module 2 is luminous, by photoelectric sensor 3 light signal of sensing is converted to electric signal, be transferred to and amplify shaping and switch triggering circuit 1, through amplification and shaping to signal, this circuit is exported the OLED screen body 5-1 of a trigger pip to next group OLED response module 2,, so, to the last the amplification shaping and the switch triggering circuit 4 of one group of response module 2 are passed to timer 3 with trigger pip, timer 3 is closed, and writes down this time T.
(2) shaping and 4 response time of switch triggering circuit T are amplified in test
KAs Fig. 4, this step is only advanced circuit with trigger circuit 1, timer 3,20 groups of amplifications shaping and 4 series connection of switch triggering circuit, operates as step (1), closes up to timer 3, writes down this time T
K
(3) utilize formula 2. to calculate the response time T of each tested OLED screen body 5-1
i
T＝(T
i+T
K+T
G)×N ②
Wherein, it is HS0038A2 that photoelectric sensor 6 models are adopted in this test, provides factory data according to manufacturer, and its response speed is lns, i.e. the 2. middle T of formula
GBe 1; N=20.Above-mentioned data are calculated, drawn the response time T of each tested OLED screen body 5-1
iBe T/20-T
K-1 (has measured T, T according to above testing procedure
KValue).
Embodiment 2
With reference to Fig. 3.The tested electron device of present embodiment is triode 5-2, test need not sensor, in addition, because triode emitter-base bandgap grading output signal is more stable, do not need to add amplification shaping and 4 connections of switch triggering circuit, directly organize tested triode 5-2 base stage b with next by triode 5-2 emitter-base bandgap grading e and be connected, the triggering of last group triode 5-2 emitter-base bandgap grading e signal triggering timer 3 is turn-offed.Present embodiment adopts the test of Whole Response time is carried out in 2 series connection of 20 groups of triode response modules.Adopt proving installation as Fig. 3.
Step is as follows:
(1) adopt described proving installation to measure the overall response time T of 20 groups of triode response modules 2.At first, 5-2 is arranged to state of saturation with triode, open for simultaneously the triggering of the base stage b of first group of triode response module 2 and timer 3 by trigger circuit same trigger pip is provided, timer 3 picks up counting, among first group of triode 5-2 electric current by base stage b to emitter-base bandgap grading e, flow to next group transistor base b by this group triode 5-2 emitter-base bandgap grading e again,, so, to the last one group of triode 5-2 emitter-base bandgap grading e passes to timer 3 with trigger pip, timer 3 is closed, and writes down this time T.
(2) utilize formula 3. to calculate the response time T of each tested triode 5-2
i
T＝T
i×N ③
Above-mentioned data are calculated, drawn the response time T of each tested triode 5-2
iBe T/N.
Though the present invention discloses as above with preferred embodiment; yet it is not in order to limit the present invention; anyly be familiar with this technology personage; without departing from the spirit and scope of the present invention; when being used for a variety of modifications and variations; therefore, protection scope of the present invention is as the criterion when the claim with application defines.
Claims (11)
1. the proving installation of a rapid response electronic device response speed, it is characterized in that, comprise power control circuit, the response module of the tested electron device of at least two groups, timer, described power control circuit is electrically connected with response module power end, and each responds module and is connected in series, signal is opened in the triggering of timer and first group of trigger pip that responds module is synchronous, and signal is closed in the triggering of timer and last output signal of organizing the response module is synchronous.
2. the proving installation of rapid response electronic device response speed according to claim 1, it is characterized in that, the trigger pip that signal and first group of response module are opened in the triggering of described timer is same trigger pip, and the output signal that signal and last group response module are closed in the triggering of described timer is same signal.
3. the proving installation of rapid response electronic device response speed according to claim 1 and 2 is characterized in that, described response module is photoelectric response module or electroresponse module or acoustic-electric response module.
4. the proving installation of rapid response electronic device response speed according to claim 1 and 2 is characterized in that, described response module also comprises amplification shaping and switch triggering circuit.
5. the proving installation of rapid response electronic device response speed according to claim 4, it is characterized in that, described tested electron device is electrically connected with amplifying shaping and switch triggering circuit input end, and amplification shaping and switch triggering circuit output end organize tested electron device trigger end with next or the timer triggering pass broken ends of fractured bone is electrically connected.
6. the proving installation of rapid response electronic device response speed according to claim 3 is characterized in that, described response module also comprises photovoltaic sensing element or acoustic-electric sensing element.
7. the proving installation of rapid response electronic device response speed according to claim 6 is characterized in that, described respectively respond between the module adopts light isolated or sound is isolated.
8. according to the proving installation of claim 6 or 7 described rapid response electronic device response speeds, it is characterized in that, described photovoltaic sensing element or acoustic-electric sensing element are electrically connected with amplifying shaping and switch triggering circuit input end, and amplification shaping and switch triggering circuit output end organize tested electron device trigger end with next or the timer triggering pass broken ends of fractured bone is electrically connected.
9. method of testing that adopts proving installation as claimed in claim 1 to rapid response electronic device response speed, its step comprises:
(1) the overall response time T of the described proving installation measuring N group response of employing module, N 〉=2;
(2) utilize formula 1. or formula 2., 3. formula calculate the response time T of each tested electron device
i
T＝(T
i+T
K)×N ①
T＝(T
i+T
K+T
G)×N ②
T＝T
i×N ③
In the formula, T
KFor amplifying shaping and switch triggering circuit response time, T
GBe photovoltaic sensing element or acoustic-electric sensing element response time, wherein T
GFor known.
10. the method for testing of rapid response electronic device response speed according to claim 9 is characterized in that, described step (2) also comprises test amplification shaping and switch triggering circuit response time T
K
11. the method for testing of rapid response electronic device response speed according to claim 10 is characterized in that, shaping and switch triggering circuit response time T are amplified in described test
KBe electrically connected with the input end, the output terminal that amplify shaping and switch triggering circuit respectively for the triggering of timer being opened, triggered the pass, shaping and switch triggering circuit response time T are amplified in test
K
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810115885 CN101303384B (en) | 2008-06-30 | 2008-06-30 | Test device and test method of rapid response electronic device response speed |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810115885 CN101303384B (en) | 2008-06-30 | 2008-06-30 | Test device and test method of rapid response electronic device response speed |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101303384A CN101303384A (en) | 2008-11-12 |
| CN101303384B true CN101303384B (en) | 2010-11-10 |
Family
ID=40113385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200810115885 Active CN101303384B (en) | 2008-06-30 | 2008-06-30 | Test device and test method of rapid response electronic device response speed |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101303384B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103091621B (en) * | 2013-01-14 | 2015-01-21 | 中国兵器工业集团第二一四研究所苏州研发中心 | Long timekeeping chain fast testing method |
| DE102013102155B4 (en) * | 2013-03-05 | 2015-04-09 | Friedrich-Alexander-Universität Erlangen-Nürnberg | METHOD FOR TESTING COMPONENTS AND MEASURING ARRANGEMENT |
| CN106970477A (en) * | 2017-04-07 | 2017-07-21 | 深圳市帝晶光电科技有限公司 | A kind of liquid crystal response time simple method for testing bacterial resistance based on photoelectric sensor |
| CN108594627A (en) * | 2018-05-29 | 2018-09-28 | 华中科技大学 | A kind of acquisition methods of the delay time of function optical device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6363507B1 (en) * | 1998-10-19 | 2002-03-26 | Teradyne, Inc. | Integrated multi-channel analog test instrument architecture providing flexible triggering |
| CN1837835A (en) * | 2006-04-18 | 2006-09-27 | 北京大学深圳研究生院 | High-frequency clock jitter measuring circuit and calibration method thereof |
| CN2840044Y (en) * | 2005-11-24 | 2006-11-22 | 中国科学院长春光学精密机械与物理研究所 | High-precision and wide range tachometer circuit |
| CN101176129A (en) * | 2005-05-16 | 2008-05-07 | 路创电子公司 | Status indicator circuit for a dimmer switch |
-
2008
- 2008-06-30 CN CN 200810115885 patent/CN101303384B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6363507B1 (en) * | 1998-10-19 | 2002-03-26 | Teradyne, Inc. | Integrated multi-channel analog test instrument architecture providing flexible triggering |
| CN101176129A (en) * | 2005-05-16 | 2008-05-07 | 路创电子公司 | Status indicator circuit for a dimmer switch |
| CN2840044Y (en) * | 2005-11-24 | 2006-11-22 | 中国科学院长春光学精密机械与物理研究所 | High-precision and wide range tachometer circuit |
| CN1837835A (en) * | 2006-04-18 | 2006-09-27 | 北京大学深圳研究生院 | High-frequency clock jitter measuring circuit and calibration method thereof |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2003-121501A 2003.04.23 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101303384A (en) | 2008-11-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101832830B (en) | Flush packaged pressure sensor with high temperature resistance and high frequency response | |
| CN101303384B (en) | Test device and test method of rapid response electronic device response speed | |
| CN103278693A (en) | Probe contact resistance measuring method | |
| CN104808146A (en) | High-accuracy motor testing system | |
| CN104062618A (en) | Verification method for on-line monitoring device of double-signal-source capacitive equipment | |
| CN105277111A (en) | Star arrow locking device strain monitoring system | |
| CN203688743U (en) | OLED device optical and electrical property testing system | |
| CN202758003U (en) | DC resistance tester | |
| CN104090165B (en) | The huge piezoresistance coefficient of silicon nanosensor array measures system and four-point bending force application apparatus | |
| CN102419427B (en) | Apparatus for calibrating rise time of oscilloscope | |
| CN106645910B (en) | Micro-current testing method suitable for micro-current of micro-current level of electronic equipment of carrier rocket | |
| CN103542877A (en) | Method for calibrating aircraft starting box comprehensive inspection tester | |
| CN206223724U (en) | A kind of test system of blood sugar instrument | |
| CN104515968B (en) | A kind of capacitor moment open-short circuit tester calibrating installation and calibration method | |
| CN203444733U (en) | Testing device for measuring device response time | |
| CN207851137U (en) | The faint Leakage Current Detector of semiconductor | |
| CN104076313A (en) | Online calibration device for solar simulator electronic load case | |
| CN204101634U (en) | The huge piezoresistance coefficient measuring system of silicon nanosensor array and four-point bending force application apparatus | |
| CN101551423A (en) | Thermal resistance simulation and calibration system for device ageing screening lathe | |
| CN106990343A (en) | The method of testing and system of electronic component | |
| CN204882483U (en) | It fires fast circuit to measure solid propellant | |
| CN202013377U (en) | Ultramicro current detecting device | |
| CN209446732U (en) | Real-time clock detection device | |
| CN203930003U (en) | A kind of simulating signal excitation system for chip detection | |
| CN201335861Y (en) | Direct current millivoltmeter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |