CN102109606A - Compensation type pulse X-ray detecting device with double scintillators - Google Patents
Compensation type pulse X-ray detecting device with double scintillators Download PDFInfo
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- CN102109606A CN102109606A CN 201010589044 CN201010589044A CN102109606A CN 102109606 A CN102109606 A CN 102109606A CN 201010589044 CN201010589044 CN 201010589044 CN 201010589044 A CN201010589044 A CN 201010589044A CN 102109606 A CN102109606 A CN 102109606A
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Abstract
The invention relates to a compensation type pulse X-ray detecting device with double scintillators, which comprises a hollow metal shell, an entrance window and an exit window that are arranged on two opposite ends of the metal shell, a detecting component and a photoelectric detector; the detecting component is arranged in the cavity surrounded by the metal shell, the entrance window and the exit window; the photoelectric detector is communicated with the cavity through a hole arranged in the metal shell; the detecting component comprises an inorganic thin film scintillator and an organic thin film scintillator; the inorganic thin film scintillator is arranged inside the entrance window, and the organic thin film scintillator is arranged inside the exit window. The device solves the technical problem that the existing detecting device is unstable in detecting sensitivity and cannot satisfy the absolute measurement demands of ray intensity. The device has the advantages of flat sensitivity response and relatively quicker response time, and can be used for the absolute measurement of the radiation field intensity of pulse X-ray in energy section.
Description
Technical field
The invention belongs to radiation detector assembly, be specifically related to a kind of flash detection device that is suitable for the absolute measurement of pulsed X-ray intensity.
Background technology
X ray intensity and number are one of major parameters of pulsed X-ray source and radiation field, and it directly determines the result of X ray and matter interaction.Therefore, measured X ray absolute strength, number and become the core content of pulsed X-ray research over time.Obtain absolute strength, the number of pulsed X-ray radiation field, require accurately to know the response (sensitivity) of the power spectrum in pulsed X-ray source and sniffer the different-energy X ray.Yet, up to the present, accurately still there is difficulty greatly on the spectroscopic technique of measurement pulsed X-ray source and radiation field, in this case, obtain parameters such as the absolute strength of pulsed X-ray and number, one of feasible method is exactly to explore and set up energy response (sensitivity) not with the pulsed X-ray Detection Techniques principle and the system architecture of X ray energy variation, develops the smooth sniffer of energy response.Because the cross section and the energy of X ray and matter interaction are closely related, the sniffer of developing detection sensitivity invariable (energy response is smooth) in broad can spectral limit is a problem that technical difficulty is very big, also is that a difficult problem of capturing is wanted in the absolute measurement of pulsed X-ray radiation field always.
Some common sniffers do not have the smooth characteristic of energy response, x-ray diode for example, semiconductor sniffer and common flash detection device all are used to pulsed X-ray source strength detection aspect research, because the pulsed X-ray source has the energy distribution of broad usually, what these sniffer measurement results were directly reacted is dosage and dose rate, the X-radiation field strength need push back according to radiation field spectral distribution and sniffer energy response, yet the very big difficulty of the technical existence of pulsed X-ray spectral measurement, usually convert according to the theoretical spectrum of bremsstrahlung, because there is certain difference in actual spectral distribution with theoretical spectrum, cause the intensity fluctuation that calculates very big, be difficult to satisfy the demand of present intensity absolute measurement.
Summary of the invention
In order to solve existing detection sensitivity instability, can't to satisfy the technical matters of the demand of transmitted intensity absolute measurement, the invention provides a kind of twin scintillator offset-type pulsed X-ray sniffer.
Technical solution of the present invention:
A kind of twin scintillator offset-type pulsed X-ray sniffer, it comprises the metal shell 5 of hollow, be arranged on the entrance window 6 and the exit window 7 of metal shell two opposite ends, exploring block and photodetector 8, described exploring block is arranged on metal shell 5, in the cavity 10 that entrance window 6 and exit window 7 surround, described photodetector 8 is communicated with cavity 10 by the hole that is provided with on the metal shell, it is characterized in that: described exploring block comprises inorganic thin film scintillator 2 and organic film scintillator 3, described inorganic thin film scintillator 2 is arranged on entrance window 6 inboards, and described organic film scintillator 3 is arranged on exit window 7 inboards.
Be provided with absorbing sheet 1 between above-mentioned inorganic thin film scintillator 2 and the entrance window 6.
Be provided with backward scattering sheet 4 between above-mentioned organic film scintillator 3 and the exit window 7.
Above-mentioned inorganic thin film scintillator 2 is a doping zinc oxide crystal, and its thickness is 0.1～0.5mm.
Above-mentioned doping zinc oxide crystal is ZnO:In or ZnO:Ga.
Above-mentioned organic film scintillator 3 is a plastic scintillant, and its thickness is 0.05～0.5mm.
Above-mentioned absorbing sheet 1 is iron, copper, nickel, zinc or silver metal membraneous material, and its thickness is 10～200 μ m.
Above-mentioned backward scattering sheet 4 is a silverskin, and its thickness is 50～200 μ m.
Above-mentioned photodetector 8 is semi-conductor type photodetector, photomultiplier or photoelectric tube.
Advantage of the present invention is:
1, the present invention utilizes organic film scintillator and inorganic thin film scintillator to respond complementary principle at tens X-ray energy spectrums that arrive hundreds of keV, two kinds of film scintillators are made up, form offset-type scintillation pulse X ray sniffer, this sniffer is smooth to the X ray sensitivity response in hundreds of keV interval to energy tens, and have time response faster, can be used for the absolute measurement of this energy section pulsed X-ray radiation field intensity.
2, the present invention has adopted the time response of scintillator material faster, for example ZnO:In and ZnO:Ga can reach subnanosecond time response, and ultrafast organic plastics scintillator time response is also at subnanosecond, by being equipped with ultrafast photoelectric device, this pulsed X-ray sniffer can reach the subnanosecond level time response, can satisfy the measurement demand of ultrafast pulse X ray.The present invention is equally applicable to the ionization meter of this energy section stable state X-radiation field.
3, the present invention is provided with absorbing sheet between entrance window and inorganic scintillator, the backward scattering sheet is set between exit window and organic scintillator, by changing material, adjusting its thickness, can regulate between energy range the detector energy flat response, improve the smooth scope of energy response.
Description of drawings
Fig. 1 is the structural representation of twin scintillator offset-type pulsed X-ray sniffer of the present invention;
Fig. 2 is that the organic film scintillator is to the relative curve of the energy response of X ray;
Fig. 3 is that the inorganic thin film scintillator is to the relative curve of the energy response of X ray;
Fig. 4 is the energy response normalizing curve of sniffer under the collocation structure of the present invention to X ray;
Reference numeral is as follows: 1-absorbing sheet, 2-inorganic thin film scintillator, 3-organic film scintillator, 4-backward scattering sheet, 5-metal shell, 6-entrance window, 7-exit window, 8-photodetector, 9-photodetector shell, 10-cavity.
Embodiment
For realize that sniffer responds smooth in the energy range of broad, the present invention is from ray and matter interaction principle, sniffer material, structure and physical dimension etc. are designed, developed the X ray energy and in the 40keV-800keV interval, responded smooth pulsed X-ray sniffer.
Be illustrated in figure 1 as the structural representation of a kind of twin scintillator offset-type of the present invention pulsed X-ray sniffer, it comprises the metal shell 5 of hollow, be arranged on the entrance window 6 and the exit window 7 at metal shell 5 two ends, exploring block and photodetector 8, exploring block is arranged on metal shell 5, entrance window 6 and exit window enclose in 7 one-tenth the cavity 10, photodetector is communicated with cavity by the hole that is provided with on the metal shell 5 and is fixed on the metal shell 5 by electric explorer shell 9, exploring block comprises inorganic thin film scintillator 2 and organic film scintillator 3, inorganic thin film scintillator 2 next-door neighbour's entrance windows 6 are provided with, organic film scintillator 3 next-door neighbour's exit windows 7 are provided with, and inorganic thin film scintillator 2 is put in opposite directions with organic film scintillator 3.Photodetector 8 can be photomultiplier, photoelectric tube and semi-conductor type photodetector.
Inorganic thin film scintillator 2 adopts is thickness between 0.1 to 0.5mm doping zinc oxide crystal, comprises ZnO:In and ZnO:Ga, and the inorganic thin film scintillator of other fast-response also can be used for this sniffer design; The organic film scintillator that adopted 3 is plastic scintillant, thickness between 0.05 to 0.5mm.
In order to improve the smooth scope of energy response: at entrance window 6 and 2 of inorganic thin film scintillators absorbing sheet 1 is arranged, be provided with backward scattering sheet 4 at exit window 7 and 3 of organic film scintillators.Absorbing sheet 1 can be metallic film materials such as iron, copper, nickel, zinc, silver, and thickness is between 10 to 200 μ m.Backward scattering sheet 4 is the silverskin of thickness between 50 to 200 μ m.
Below in conjunction with accompanying drawing the present invention is further described:
Fig. 2 is the response curve of the organic plastics film scintillator of different-thickness to X ray between the energy 30keV to 800keV, the plots changes of different-thickness (0.1mm, 1.2mm, 0.3mm, 0.5mm, 0.8mm, 1.0mm) film is difference slightly, thicker organic scintillator increases and increases along with the X ray energy the response of X ray, and thin organic scintillator responds when energy is higher slightly and descends.As shown in Figure 3, inorganic scintillator ZnO:In film is to just opposite with the organic scintillator variation tendency in the energy of X ray is between this energy range.Two kinds of film scintillators are opposite to the energy response variation tendency of X ray, and inorganic scintillator is stronger to the low energy X ray response, and organic scintillator is stronger to the high energy partial response, exists complementary preferably.
For ease of the collection of light, take inorganic scintillator preceding, organic scintillator after in-line configuration, it is luminous that photodetector is collected scintillator by the side.Smooth for sniffer is responded in the energy range of broad simultaneously, certain material also need be set on beam channel, influence ray in scintillator self-energy deposition process by changing radiation environment, and then the governing response curve.Decay material in the scintillator front side can suitably reduce the response of low energy part, and response compensates to scintillator can to produce backscattered electron at the material of scintillator rear side setting.Explorer response is from organic film scintillator and inorganic thin film scintillator two parts, and the size of contribution is a proportionate relationship separately, and being what specifically needs to measure by experiment to determine, reduces film size and can reduce that it is luminous, and then reduce its contribution.Because the film scintillator is relevant with film thickness and residing environment to X ray response curve shape, and almost irrelevant with film scintillator area, so can regulate the relative luminous intensity of two kinds of film scintillators by adjusting flicker film relative area.The pulsed X-ray panel detector structure synoptic diagram of organic scintillator and inorganic thin film scintillator combination is as shown in Figure 1: the radiation detection parts are in the cavity that cylinder type metal shell 5 and entrance window 6 and exit window 7 surround; Wherein: inorganic thin film scintillator 2 is in the sniffer front end near entrance window 6 rear sides, is provided with absorbing sheet 1 between the two; Organic film scintillator 3 is in the sniffer rear end and is positioned at exit window 7 front sides, and backward scattering sheet 4 is arranged between the two; Metal shell 5 sides are connected with photodetector shell 9, and its internal fixation has photodetector 8.
The course of work of this sniffer measured X ray is: X ray enters sniffer inside through sniffer entrance window 6, with the matter interaction on the radiation channel, electronics that effect produces and inorganic thin film scintillator 2 and 3 effects of organic film scintillator make it luminous, the luminous photoelectric device 8 by the side of scintillator is collected and is converted electric signal output to, realizes the X ray detection.This sniffer needs collimation and shielding at work in addition.
This sniffer material and size combinations are not unique, as embodiment, the inorganic scintillator of 0.3mmZnO:In doping zinc oxide crystal material and 0.15mmST401 organic scintillator have been chosen as the radiation detection material, sniffer entrance window and exit window are 0.2mm aluminium, spacing is 10cm, what the absorbing sheet material adopted is 100 μ m iron films, and the backward scattering sheet material is the silver of 0.1mm, and photodetector is low noise photomultiplier.The sniffer response curve that obtains under this parameter as shown in Figure 4, response curve fluctuation is about 5% between 40keV to 800keV.Compare the relative luminous intensity of inorganic thin film scintillator and organic film scintillator by experiment, choose both diameters and be respectively 2.54mm and 2.12mm.
Inventive principle: typical hard X ray source energy covers tens to hundreds of keV, according to thinner thickness inorganic scintillator and organic scintillator are discovered in the X ray sensitivity response of this energy area, two kinds of thin scintillators have good complementarity to X-ray energy spectrum response curve shape, can obtain the smooth pulsed X-ray sniffer of energy response by organic scintillator and the combination of inorganic thin film scintillator.
Sniffer of the present invention can be used to the correlative study that absorption process is measured the pulsed X-ray power spectrum.
Claims (9)
1. twin scintillator offset-type pulsed X-ray sniffer, it comprises the metal shell (5) of hollow, be arranged on the entrance window (6) and the exit window (7) of metal shell two opposite ends, exploring block and photodetector (8), described exploring block is arranged on metal shell (5), in the cavity (10) that entrance window (6) and exit window (7) surround, described photodetector (8) is communicated with cavity (10) by the hole that is provided with on the metal shell, it is characterized in that: described exploring block comprises inorganic thin film scintillator (2) and organic film scintillator (3), described inorganic thin film scintillator (2) is arranged on entrance window (6) inboard, and described organic film scintillator (3) is arranged on exit window (7) inboard.
2. twin scintillator offset-type pulsed X-ray sniffer according to claim 1 is characterized in that: be provided with absorbing sheet (1) between described inorganic thin film scintillator (2) and the entrance window (6).
3. twin scintillator offset-type pulsed X-ray sniffer according to claim 1 and 2 is characterized in that: be provided with backward scattering sheet (4) between described organic film scintillator (3) and the exit window (7).
4. the described twin scintillator offset-type of root claim 3 pulsed X-ray sniffer, it is characterized in that: described inorganic thin film scintillator (2) is a doping zinc oxide crystal, and its thickness is 0.1～0.5mm.
5. twin scintillator offset-type pulsed X-ray sniffer according to claim 4, it is characterized in that: described doping zinc oxide crystal is ZnO:In or ZnO:Ga.
6. twin scintillator offset-type pulsed X-ray sniffer according to claim 3, it is characterized in that: described organic film scintillator (3) is a plastic scintillant, and its thickness is 0.05～0.5mm.
7. twin scintillator offset-type pulsed X-ray sniffer according to claim 3 is characterized in that: described absorbing sheet (1) is iron, copper, nickel, zinc or silver metal membraneous material, and its thickness is 10～200 μ m.
8. twin scintillator offset-type pulsed X-ray sniffer according to claim 3, it is characterized in that: described backward scattering sheet (4) is a silverskin, and its thickness is 50～200 μ m.
9. twin scintillator offset-type pulsed X-ray sniffer according to claim 3 is characterized in that: described photodetector (8) is semi-conductor type photodetector, photomultiplier or photoelectric tube.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015263A (en) * | 2017-04-09 | 2017-08-04 | 东北大学 | A kind of " the scintillator semiconductor scintillator " of same matrix is combined X-ray detector |
| CN107153213A (en) * | 2017-07-19 | 2017-09-12 | 上海仁机仪器仪表有限公司 | High range ray rapid measurement device and its measuring method |
| WO2020125123A1 (en) * | 2018-12-21 | 2020-06-25 | 苏州瑞派宁科技有限公司 | Scintillation crystal assembly and radiation detection device and system comprising same |
| CN114994743A (en) * | 2022-06-14 | 2022-09-02 | 西北核技术研究所 | Fast neutron time spectrum detection method and device |
| US11633627B2 (en) | 2018-02-22 | 2023-04-25 | The Trustees Of Dartmouth College | Dosimetry systems for radiation treatment using radiation-detector-triggered cameras to image Cherenkov emissions or thin-sheet scintillators |
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| US5412217A (en) * | 1990-06-13 | 1995-05-02 | Earthnics Corporation | Density-moisture measuring apparatus |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015263A (en) * | 2017-04-09 | 2017-08-04 | 东北大学 | A kind of " the scintillator semiconductor scintillator " of same matrix is combined X-ray detector |
| CN107015263B (en) * | 2017-04-09 | 2019-11-15 | 东北大学 | A kind of " scintillator-semiconductor-scintillator " compound X-ray detector of same matrix |
| CN107153213A (en) * | 2017-07-19 | 2017-09-12 | 上海仁机仪器仪表有限公司 | High range ray rapid measurement device and its measuring method |
| US11633627B2 (en) | 2018-02-22 | 2023-04-25 | The Trustees Of Dartmouth College | Dosimetry systems for radiation treatment using radiation-detector-triggered cameras to image Cherenkov emissions or thin-sheet scintillators |
| WO2020125123A1 (en) * | 2018-12-21 | 2020-06-25 | 苏州瑞派宁科技有限公司 | Scintillation crystal assembly and radiation detection device and system comprising same |
| CN114994743A (en) * | 2022-06-14 | 2022-09-02 | 西北核技术研究所 | Fast neutron time spectrum detection method and device |
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