CN102539479B - Spacecraft in-cabin pollution load testing device - Google Patents

Spacecraft in-cabin pollution load testing device Download PDF

Info

Publication number
CN102539479B
CN102539479B CN201110425693.5A CN201110425693A CN102539479B CN 102539479 B CN102539479 B CN 102539479B CN 201110425693 A CN201110425693 A CN 201110425693A CN 102539479 B CN102539479 B CN 102539479B
Authority
CN
China
Prior art keywords
sensing chip
reference wafer
circuit
spacecraft
driver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201110425693.5A
Other languages
Chinese (zh)
Other versions
CN102539479A (en
Inventor
臧卫国
于钱
杨东升
张艳景
院小雪
李娜
焦子龙
孙继鹏
白羽
代佳龙
刘庆海
王俊峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Institute of Spacecraft Environment Engineering
Original Assignee
Beijing Institute of Spacecraft Environment Engineering
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Institute of Spacecraft Environment Engineering filed Critical Beijing Institute of Spacecraft Environment Engineering
Priority to CN201110425693.5A priority Critical patent/CN102539479B/en
Publication of CN102539479A publication Critical patent/CN102539479A/en
Application granted granted Critical
Publication of CN102539479B publication Critical patent/CN102539479B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention discloses a spacecraft in-cabin pollution load testing device for a vacuum thermal test. The spacecraft in-cabin pollution load testing device consists of an in-cabin pollution load probe system and a testing system which is electrically communicated with the in-cabin pollution load probe system, wherein the probe system comprises a probe and a driver; the probe comprises a sensing wafer and a reference wafer which are fixedly arranged on a flange; a temperature sensor for measuring the two wafers are also arranged on the flange; a circuit structure is arranged in the driver; and the temperature sensor and an output driving circuit in the driver are respectively and electrically communicated with the testing system so as to transmit temperature and frequency data to the testing system. According to the spacecraft in-cabin pollution load testing device for the vacuum thermal test, which is disclosed by the invention, measurement range of 1*10-5g/cm2 of a pollution load is realized, the adaptive temperature of the probe reaches 60 DEG C, and the requirement for monitoring the pollution load of the vacuum thermal test of a spacecraft is met.

Description

Spacecraft in-cabin pollution load testing device
Technical field
The invention belongs to the vacuum thermal test field of spacecraft, be specifically related to a kind of device that measures examination for the internal contamination of vacuum thermal test spacecraft module.
Background technology
The monitoring of spacecraft module internal contamination amount is that spacecraft pollutes one of key foundation of protecting.Pollutant in cabin can deposit or be deposited in spacecraft critical component near surface, cause critical component electric discharge, adhesion, short circuit, open circuit, can cause critical component Performance Decay and inefficacy.
Spacecraft indoor environment and extravehicular environment have very big difference, and in spacecraft module, environmental quality is that temperature is high, contaminant capacity is large, and through test analysis, in cabin, temperature can reach 60 ℃, and pollution deposit amount surpasses 10 -5g/cm 2; Spacecraft module external environment feature is that temperature is low, contaminant capacity is relatively less, and temperature is generally lower than-50 ℃ out of my cabin, and pollution deposit amount is generally 10 -7g/cm 2magnitude.
Beijing Satellite Environment Engineering Research Institute once adopted the outer contaminant capacity proving installation of spacecraft module to carry out spacecraft module internal contamination and measured examination, and test findings shows, the performance of test macro can not meet test request.Affect Cabin contamination amount Testing factors as follows:
A) the highest of contaminant capacity testing range is to 2 * 10 -6g/cm 2, can not meet 1 * 10 -5g/cm 2requirement;
B) contaminant capacity proving installation internal electron system works temperature range is up to 50 ℃, can not meet the requirement of 60 ℃.
Known in view of current research situation, provide a kind of spacecraft in-cabin pollution load testing device for vacuum thermal test extremely important and necessary.
Summary of the invention
The object of the present invention is to provide a kind of spacecraft in-cabin pollution load testing device for vacuum thermal test, having solved existing contaminant capacity test macro can not withstand high temperatures and the little problem of contaminant capacity range, thereby provides technical guarantee for spacecraft thermal vacuum test.
Spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention, by Cabin contamination amount probe system with the test macro of its telecommunication, form, wherein, probe system comprises probe and driver, probe comprises sensing chip and the reference wafer being fixedly installed on flange, on flange, be also provided with the temperature sensor of measuring two plates, in driver, be provided with circuit structure, in circuit structure, sensing chip high-gain driving circuit is electrically connected with the whole wave circuit of sensing chip, reference wafer high-gain driving circuit is electrically connected with the whole wave circuit of reference wafer, then both are parallel-connected in differential frequency circuit, differential frequency circuit is electrically connected on output driving circuit, sensing chip and reference wafer are electrically connected to sensing chip high-gain driving circuit and reference wafer high-gain driving circuit respectively, output driving circuit in temperature sensor and driver respectively with test macro telecommunication to send temperature and frequency data to test macro.
Further, the other heating radiator that is also provided with of driver.
Further, sensing chip and reference wafer electrode surface adopt chromium plating modification.
Spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention, has realized contaminant capacity measurement range and has reached 1 * 10 -5g/cm 2, probe adaptive temperature reaches 60 ℃, has met the needs of spacecraft thermal vacuum test contaminant capacity monitoring.
Accompanying drawing explanation
Fig. 1 is showing of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention
Intention.In figure: 1-probe, 2-driver, 3-test macro
Fig. 2 is the schematic diagram that the probe of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention forms.
In figure: 1.1-sensing chip, 1.2-temperature sensor, 1.3-reference wafer, 1.4-flange
Fig. 3 is the schematic diagram that the driver of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention forms.
In figure: 2.1-sensing chip high-gain driving circuit, 2.2-reference wafer high-gain driving circuit, the whole wave circuit of 2.3-sensing chip, the whole wave circuit of 2.4-reference wafer, 2.5-differential frequency circuit, 2.6-output driving circuit, 2.7-heating radiator.
Embodiment
Below in conjunction with accompanying drawing, the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention is further described.
Fig. 1 is the composition schematic diagram of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention.Wherein proving installation of the present invention comprises probe 1, driver 2 and test macro 3.The designed proving installation of the present invention is characterized in driver and probe separation structure, and the independent temperature adaptability of driver and probe is provided.
Fig. 2 is that the probe of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention forms schematic diagram.Wherein the probe in device of the present invention comprises sensing chip, temperature sensor, reference wafer and flange.Sensing chip 1.1 and reference wafer 1.3 are fixed on flange 1.4, on flange 1.4, be also provided with the temperature sensor 1.2 of measuring two plates, one of its feature of probe that the present invention is designed is that sensing chip, reference wafer, temperature sensor contact with flange close thermal, makes sensing chip, reference wafer temperature stabilization in environment temperature.Two of its feature of probe that the present invention is designed is that sensing chip and reference wafer electrode surface adopt chromium plating modification, improves the stability of sensing chip hot environment.
Fig. 3 is that the driver of the spacecraft in-cabin pollution load testing device for vacuum thermal test of the present invention forms schematic diagram.Wherein driver of the present invention comprises circuit structure, in circuit structure, sensing chip high-gain driving circuit 2.1 is electrically connected with the whole wave circuit 2.3 of sensing chip, reference wafer high-gain driving circuit 2.2 is electrically connected with the whole wave circuit 2.4 of reference wafer, then both are parallel-connected in differential frequency circuit 2.5, differential frequency circuit 2.5 is electrically connected on output driving circuit 2.6, sensing chip 1.1 and reference wafer 1.3 are electrically connected to sensing chip high-gain driving circuit 2.1 and reference wafer high-gain driving circuit 2.2 respectively, output driving circuit 2.6 in temperature sensor 1.3 and driver 2 respectively with test macro 3 telecommunications to send temperature and frequency data to test macro 3.One of its feature of driver of the present invention's design is to adopt high-gain driving circuit, improves sensing chip and reference wafer driving force, expands and measures range to 1 * 10 -5g/cm 2.Two of the driver feature of the present invention's design is that all circuit contact with heating radiator close thermal, reduces the temperature rise that circuit part heating causes, and expands environmental adaptation temperature to 60 ℃.
Although above the specific embodiment of the present invention has been given to describe in detail and explanation; but what should indicate is; we can carry out various equivalences to above-mentioned embodiment according to conception of the present invention and change and revise; when its function producing does not exceed spiritual that instructions and accompanying drawing contain yet, all should be within protection scope of the present invention.

Claims (1)

1. the spacecraft in-cabin pollution load testing device for vacuum thermal test, by Cabin contamination amount probe system with the test macro of its telecommunication, form, wherein, probe system comprises probe and driver, probe comprises sensing chip and the reference wafer being fixedly installed on flange, on flange, be also provided with the temperature sensor of measuring two plates, in driver, be provided with circuit structure, in circuit structure, sensing chip high-gain driving circuit is electrically connected with the whole wave circuit of sensing chip, reference wafer high-gain driving circuit is electrically connected with the whole wave circuit of reference wafer, then both are parallel-connected in differential frequency circuit, differential frequency circuit is electrically connected on output driving circuit, sensing chip and reference wafer are electrically connected to sensing chip high-gain driving circuit and reference wafer high-gain driving circuit respectively, output driving circuit in temperature sensor and driver respectively with test macro telecommunication to send temperature and frequency data to test macro, sensing chip, reference wafer, temperature sensor contacts with flange close thermal, make sensing chip, reference wafer temperature stabilization is in environment temperature, sensing chip and reference wafer electrode surface adopt chromium plating modification, the other heating radiator that is also provided with of driver, and all circuit contact with heating radiator close thermal.
CN201110425693.5A 2011-12-19 2011-12-19 Spacecraft in-cabin pollution load testing device Active CN102539479B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110425693.5A CN102539479B (en) 2011-12-19 2011-12-19 Spacecraft in-cabin pollution load testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110425693.5A CN102539479B (en) 2011-12-19 2011-12-19 Spacecraft in-cabin pollution load testing device

Publications (2)

Publication Number Publication Date
CN102539479A CN102539479A (en) 2012-07-04
CN102539479B true CN102539479B (en) 2014-02-19

Family

ID=46346894

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110425693.5A Active CN102539479B (en) 2011-12-19 2011-12-19 Spacecraft in-cabin pollution load testing device

Country Status (1)

Country Link
CN (1) CN102539479B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110824049A (en) * 2019-11-14 2020-02-21 上海卫星装备研究所 Pollution monitoring system and method for spacecraft vacuum thermal test
CN114609678B (en) * 2022-05-11 2022-08-19 兰州空间技术物理研究所 In-situ detector for dust deposition quality caused by lifting of spacecraft on lunar surface

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001242057A (en) * 2000-02-28 2001-09-07 Natl Inst Of Advanced Industrial Science & Technology Meti Small simplified detection device for gas or floating file particle in atmosphere
US6463787B1 (en) * 1999-03-23 2002-10-15 Atotech Deutschland Gmbh Mounting for a quartz crystal
CN201876398U (en) * 2010-10-25 2011-06-22 北京卫星环境工程研究所 Single-chip and double-counter-electrode quartz crystal microbalance probe device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6463787B1 (en) * 1999-03-23 2002-10-15 Atotech Deutschland Gmbh Mounting for a quartz crystal
JP2001242057A (en) * 2000-02-28 2001-09-07 Natl Inst Of Advanced Industrial Science & Technology Meti Small simplified detection device for gas or floating file particle in atmosphere
CN201876398U (en) * 2010-10-25 2011-06-22 北京卫星环境工程研究所 Single-chip and double-counter-electrode quartz crystal microbalance probe device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
基于PQCM和FPGA的空间应用分子污染监测仪设计;王峰 等;《计算机测量与控制》;20091231;第17卷(第1期);145-148、161 *
王峰 等.基于PQCM和FPGA的空间应用分子污染监测仪设计.《计算机测量与控制》.2009,第17卷(第1期),243-246.

Also Published As

Publication number Publication date
CN102539479A (en) 2012-07-04

Similar Documents

Publication Publication Date Title
CN106895924B (en) Flexible temperature and pressure sensor
Jonai et al. Relationship between cross-linking conditions of ethylene vinyl acetate and potential induced degradation for crystalline silicon photovoltaic modules
CN101447532A (en) Method for preparing crystalline silicon solar cell with passivation on double surfaces
CN102539479B (en) Spacecraft in-cabin pollution load testing device
CN203216867U (en) Reflectivity high temperature testing platform
CN201876398U (en) Single-chip and double-counter-electrode quartz crystal microbalance probe device
CN106033104A (en) Low-temperature-environment high-voltage test device for 10-kV insulators
CN103353565B (en) A kind of irradiation experiment plate for the general detection of DC/DC supply convertor single particle effect and installation method thereof
CN109904486A (en) A kind of bipolar plate fuel battery and its vehicle
CN103490724A (en) Full-back contact solar cell test bench
CN102183791A (en) Method for detecting ice coating of power line based on capacity effect
CN103474568A (en) Preparation method of film thermocouple based on electronic printing technology
Lee et al. Damp heat and thermal cycling-induced degradation mechanism of AZO and CIGS films in Cu (In, Ga) Se2 photovoltaic modules
CN106024775A (en) Integrated device with thermoelectric power generation sheet and manufacturing method thereof
CN206074358U (en) A kind of multi- scenarios method loading experimental apparatus of piezoelectric semiconductor's fracture failure
Li et al. On-line temperature monitoring of the GIS contacts based on infrared sensing technology
CN202870126U (en) Connector for testing wet leakage current of photovoltaic cell assembly
Quinto et al. Screen printing for perovskite solar cells metallization
CN203399056U (en) Potential induced attenuation testing device for solar cell module
CN206300011U (en) A kind of leak detection systems for LNG systems
CN212237334U (en) Horizontal table top capable of maintaining temperature balance
CN204730510U (en) A kind of autonomous type semiconductor refrigerating rack
CN103105536A (en) Detection method of signal crystal silicon slice of etched plasma
CN103776757B (en) The sample charger of gas attack and method under a kind of tip heat transfer controlled heat environment
CN106198225A (en) A kind of multi-scenarios method loading experimental apparatus of piezoelectric semiconductor fracture failure

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant