CN1494872A - 计算机层析x射线摄影机 - Google Patents

计算机层析x射线摄影机 Download PDF

Info

Publication number
CN1494872A
CN1494872A CNA03139096XA CN03139096A CN1494872A CN 1494872 A CN1494872 A CN 1494872A CN A03139096X A CNA03139096X A CN A03139096XA CN 03139096 A CN03139096 A CN 03139096A CN 1494872 A CN1494872 A CN 1494872A
Authority
CN
China
Prior art keywords
ray
detector
scintillation crystal
quasiconductor
ray camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA03139096XA
Other languages
English (en)
Inventor
��˹��ŵ��
阿诺夫·奥佩尔特
ʩ�ٶ�˹�и�
卡尔·施蒂尔斯托弗
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of CN1494872A publication Critical patent/CN1494872A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations

Abstract

本发明公开了一种计算机层析X射线摄影机,其具有一个X射线放射源(1),该放射源发射扇面状的X射线束(2),射线束撞击到一探测器(3)上,该探测器由一排单个探测元件所组成,其中,设有一个直接转换的半导体作为X射线探测器,为消除直接转换半导体内的串扰,该半导体具有多个像素接触点(18)。

Description

计算机层析X射线摄影机
本申请是原申请日为1998年3月23日、申请号为98105757.8的发明名称为“计算机层析X射线摄影机”的发明专利申请的分案申请。
技术领域
在X射线技术领域使用X射线探测器是众所周知的,在X射线探测器里闪烁晶体将X射线转变成可见光,可见光通过一个光电转换器被转变成一电信号。由此得到一个被检查物体的图像。在此位置分辨率通常是下降的,因为在闪烁晶体里光的传播会导致图像模糊。例如在闪烁晶体下部的点的图像就会出现点的边缘被抹去的现象。
背景技术
在数字X射线照相领域,作为X射线转换器的一个闪烁晶体配置有多个用于产生相应图像电信号的光电转换器也是众所周知的。由此可得到所需的图像分辨率(US 5587591;物理研究中的核仪器及方法,A310,1991,471至474页;DE 1952 4858A1;DE 4420603C1)。然而我们所熟知的X射线转换器在计算机层析X射线摄影方面却是不适用的。
发明内容
本发明要解决的技术问题在于,针对计算机层析X射线摄影机中设置的X射线探测器来设计一个计算机层析X射线摄影机,以改善现有技术的图像清晰度。
上述技术问题按照本发明通过这样一种计算机层析X射线摄影机来解决,其具有一个X射线放射源,该放射源发射扇面状的X射线束,射线束撞击到一探测器上,该探测器由一排单个探测元件所组成,其中,设有一个直接转换的半导体作为X射线探测器,该半导体具有多个像素接触点。
对于本发明重要的是,设有一个直接转换的半导体作为X射线探测器,该半导体具有多个像素接触点。由此可以重现一个清晰的测量信号。
附图说明
下面借助附图对本发明作进一步的详细说明,附图中:
图1所示为带有一X射线探测器的计算机层析X射线摄影机的主要部件;
图2至图5所示为图1所示计算机层析X射线摄影机的X射线探测器的变型。
具体实施方式
图1所示的计算机层析X射线摄影机具有一由X射线源1和一探测器3组成的检测单元1,3,X射线源发射扇形的X射线束2,探测器由一排,例如512个单个探测元件所组成。焦点用11来表示。被检查的病人4躺在病榻5上。为了对病人进行扫描,检测单元1,3环绕病人4所在的检测域9作360度旋转。转轴用10来表示。在此由X射线发生器6供给的X射线放射源1发出脉动的或连续的放射线。当检测单元1,3位于预定的角位置时产生多组数据,这些数据由探测器3传送到计算机7,计算机从所产生的数据组中计算出预定图像点的衰减系数,并在显示器8上再现图像。在显示器8上相应的出现病人透视层图像。
由图2可知,探测器3由一排闪烁晶体12所组成,光电二极管层13与其建立光学接触。光电二极管层13在图2的右边单独示出。由此可见,沿放射线方向看过去,在每个闪烁晶体12后面都有一排光电二极管。按照图2的实施例,沿Z向,亦即沿转轴10的方向,探测器3没有形成结构,而在ψ向具有结构。
在图3所示实施例中,探测器3由闪烁晶体14构成的矩阵所组成。在每个闪烁晶体14后面有与之光学接触的光电二极管15组成的矩阵。
在图4所示的实施例中,探测器3结构中的闪烁晶体12具有如图2所示的那种结构。在每个闪烁晶体12后面有一个由光电二极管16构成的矩阵。
图5所示的探测器3由直接转换的半导体17构成,该半导体位于一偏压V下。半导体17带有象素接触点18(Pixelkontakt)。许多象素接触点18位于唯一的一个例如碲化镉制的半导体17上。
对于图2至图4重要的是,一个没有其它结构的闪烁晶体与一光电二极管矩阵光学耦合在一起。
由于闪烁晶体不清晰,对于闪烁晶体来说信号M被如此测定,来替代清晰度(理论上是以一个不模糊的闪烁晶体来测定的)信号:
M i = Σ j A ij S j
耦合矩阵Aij包括了系统的不清晰度。如果耦合矩阵是已知的和可逆的,则S可以用来测定信号M来重现:
S i = Σ j ( A - 1 ) ij M j
人们可以通过下面的方法得到耦合矩阵A:如果这样来照射系统,使每次(如第K次)只有一部分屏段被照射(Sj= S当j=k,0除外),得到Mi=Aik;测定信号正好是矩阵A的k列。如果对于所有的k重复这一过程,则可得到全部的耦合矩阵。如果在每列中对角元素是最大的,则耦合矩阵A是可逆的这个先决条件得以满足。这种情况发生在,闪烁晶体不模糊的时候,即点像函数的范围位于屏的数量级范围内的时候。

Claims (1)

1.一种计算机层析X射线摄影机,其具有一个X射线放射源(1),该放射源发射扇面状的X射线束(2),射线束撞击到一探测器(3)上,该探测器由一排单个探测元件所组成,其中,设有一个直接转换的半导体作为X射线探测器,该半导体具有多个像素接触点(18)。
CNA03139096XA 1997-04-09 1998-03-23 计算机层析x射线摄影机 Pending CN1494872A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19714689.9 1997-04-09
DE19714689A DE19714689A1 (de) 1997-04-09 1997-04-09 Röntgendetektor

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CNB981057578A Division CN1135430C (zh) 1997-04-09 1998-03-23 计算机层析x射线摄影机

Publications (1)

Publication Number Publication Date
CN1494872A true CN1494872A (zh) 2004-05-12

Family

ID=7825933

Family Applications (2)

Application Number Title Priority Date Filing Date
CNA03139096XA Pending CN1494872A (zh) 1997-04-09 1998-03-23 计算机层析x射线摄影机
CNB981057578A Expired - Fee Related CN1135430C (zh) 1997-04-09 1998-03-23 计算机层析x射线摄影机

Family Applications After (1)

Application Number Title Priority Date Filing Date
CNB981057578A Expired - Fee Related CN1135430C (zh) 1997-04-09 1998-03-23 计算机层析x射线摄影机

Country Status (5)

Country Link
US (1) US6005908A (zh)
EP (1) EP0871044B1 (zh)
JP (1) JPH10339778A (zh)
CN (2) CN1494872A (zh)
DE (2) DE19714689A1 (zh)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6198791B1 (en) * 1998-08-25 2001-03-06 General Electric Company Scalable multislice imaging system
DE19842947B4 (de) * 1998-09-18 2004-07-01 Siemens Ag Verfahren zum Herstellen eines Strahlendetektors
US6175611B1 (en) * 1998-10-06 2001-01-16 Cardiac Mariners, Inc. Tiered detector assembly
US6418185B1 (en) * 1999-08-18 2002-07-09 General Electric Company Methods and apparatus for time-multiplexing data acquisition
DE10024489B4 (de) * 2000-05-18 2007-01-04 Siemens Ag Detektor für ein Röntgen-Computertomographiegerät
DE10110673A1 (de) * 2001-03-06 2002-09-26 Siemens Ag Röntgendetektorarray und Verfahren zu seiner Herstellung
US6993110B2 (en) * 2002-04-25 2006-01-31 Ge Medical Systems Global Technology Company, Llc Collimator for imaging systems and methods for making same
JP4247017B2 (ja) * 2003-03-10 2009-04-02 浜松ホトニクス株式会社 放射線検出器の製造方法
US6901135B2 (en) * 2003-08-28 2005-05-31 Bio-Imaging Research, Inc. System for extending the dynamic gain of an X-ray detector
JP2007514143A (ja) * 2003-11-25 2007-05-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Pet検出器用のシンチレーション層
US7298816B2 (en) * 2005-08-02 2007-11-20 The General Hospital Corporation Tomography system
US20070086565A1 (en) * 2005-10-13 2007-04-19 Thompson Richard A Focally aligned CT detector
DE102005049228B4 (de) * 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
JP2009512502A (ja) * 2005-10-19 2009-03-26 ザ・ゼネラル・ホスピタル・コーポレーション 画像化システム及び関連する技術
WO2013188498A2 (en) * 2012-06-12 2013-12-19 Arizona Board Of Regents Acting For And On Behalf Of Arizona State University Imaging system and methods of manufacturing and using the same
CN104665859B (zh) * 2013-11-29 2017-12-15 通用电气公司 成像系统
US9788804B2 (en) * 2014-07-22 2017-10-17 Samsung Electronics Co., Ltd. Anatomical imaging system with improved detector block module
US10646176B2 (en) * 2015-09-30 2020-05-12 General Electric Company Layered radiation detector
US11340359B2 (en) * 2017-05-01 2022-05-24 Koninklijke Philips N.V. Multi-layer radiation detector
US10145964B1 (en) * 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4872188A (en) * 1987-11-27 1989-10-03 Picker International, Inc. Registration correction for radiographic scanners with sandwich detectors
JPH06109855A (ja) * 1992-09-30 1994-04-22 Shimadzu Corp X線検出器
US5587591A (en) * 1993-12-29 1996-12-24 General Electric Company Solid state fluoroscopic radiation imager with thin film transistor addressable array
GB2289981A (en) * 1994-06-01 1995-12-06 Simage Oy Imaging devices systems and methods
DE4420603C1 (de) * 1994-06-13 1995-06-22 Siemens Ag Röntgendetektor und Verfahren zu seinem Betrieb
US5528043A (en) * 1995-04-21 1996-06-18 Thermotrex Corporation X-ray image sensor
DE19524858A1 (de) * 1995-07-07 1997-01-09 Siemens Ag Röntgenbilderzeugungssystem
US5818898A (en) * 1995-11-07 1998-10-06 Kabushiki Kaisha Toshiba X-ray imaging apparatus using X-ray planar detector

Also Published As

Publication number Publication date
DE19714689A1 (de) 1998-10-15
CN1135430C (zh) 2004-01-21
US6005908A (en) 1999-12-21
EP0871044A2 (de) 1998-10-14
JPH10339778A (ja) 1998-12-22
DE59813208D1 (de) 2005-12-29
CN1195787A (zh) 1998-10-14
EP0871044B1 (de) 2005-11-23
EP0871044A3 (de) 2003-11-12

Similar Documents

Publication Publication Date Title
CN1135430C (zh) 计算机层析x射线摄影机
CA1240074A (en) Digital radiography detector resolution improvement
US6052433A (en) Apparatus and method for dual-energy x-ray imaging
US4095107A (en) Transaxial radionuclide emission camera apparatus and method
CA1079871A (en) Device for measuring the absorption of radiation in a slice of a body
US3927318A (en) Cross-sectional fluorescent imaging system
US4755681A (en) Radiation image detecting apparatus with IC modules stacked stepwise
US4433427A (en) Method and apparatus for examining a body by means of penetrating radiation such as X-rays
US4284895A (en) Method and apparatus for tomographic examination of an object by penetrating radiation
GB2056671A (en) High resoltuion radiation detector
US5625192A (en) Imaging methods and imaging devices
CN1119664C (zh) 对施加到诊断用x射线管上的电压的间接测量
EP0089148B1 (en) Multiple line detector for use in radiography
US6332015B1 (en) Radiographic diagnosis apparatus, radiographic diagnosis method, plate member, and position detecting method
US6839401B2 (en) X-ray computed tomography apparatus
KR890000632B1 (ko) 방사선 촬영장치
EP0404118A3 (en) X-ray ct scanner device
US4437006A (en) Method and apparatus for measuring radiation in computer-assisted tomography and radiographic applications
CN1287327A (zh) 在重构图像中进行预滤波型加权的方法和装置
US7209541B2 (en) X-ray analysis apparatus
EP0085571A2 (en) A computerised tomography apparatus
DE4130369A1 (de) Vorrichtung zur medizinischen bildgebung mit licht
Johansson et al. The use of an active coded aperture for improved directional measurements in high energy γ-ray astronomy
CN1164313A (zh) X线断层图象数据的归一化
Steinbock Transmission tomography of nuclear fuel pins and bundles with an electronic line camera system

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication