CN1725231A - 利用图像的区域分割的表面区域的获取 - Google Patents
利用图像的区域分割的表面区域的获取 Download PDFInfo
- Publication number
- CN1725231A CN1725231A CNA2005100746037A CN200510074603A CN1725231A CN 1725231 A CN1725231 A CN 1725231A CN A2005100746037 A CNA2005100746037 A CN A2005100746037A CN 200510074603 A CN200510074603 A CN 200510074603A CN 1725231 A CN1725231 A CN 1725231A
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- China
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/90—Determination of colour characteristics
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10152—Varying illumination
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
Abstract
Description
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004212537A JP4648660B2 (ja) | 2004-07-21 | 2004-07-21 | 画像の領域分割による物体の表面領域配置の取得 |
JP2004212537 | 2004-07-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1725231A true CN1725231A (zh) | 2006-01-25 |
CN100375110C CN100375110C (zh) | 2008-03-12 |
Family
ID=35657191
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100746037A Active CN100375110C (zh) | 2004-07-21 | 2005-05-30 | 利用图像的区域分割的表面区域的获取 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7480407B2 (zh) |
JP (1) | JP4648660B2 (zh) |
KR (1) | KR100753527B1 (zh) |
CN (1) | CN100375110C (zh) |
TW (1) | TWI277340B (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101275917A (zh) * | 2007-03-30 | 2008-10-01 | 大日本网目版制造株式会社 | 缺陷检查装置、图形描绘装置及图形描绘系统 |
US8300918B2 (en) | 2007-03-30 | 2012-10-30 | Dainippon Screen Mfg. Co., Ltd. | Defect inspection apparatus, defect inspection program, recording medium storing defect inspection program, figure drawing apparatus and figure drawing system |
CN105004727A (zh) * | 2014-04-24 | 2015-10-28 | 奥蒂玛光学科技(深圳)有限公司 | 电路板检测方法及系统 |
CN111665264A (zh) * | 2019-03-07 | 2020-09-15 | 株式会社斯库林集团 | 代表色决定方法、检查装置、检查方法以及记录介质 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4910128B2 (ja) * | 2006-03-13 | 2012-04-04 | 国立大学法人九州工業大学 | 対象物表面の欠陥検査方法 |
US7813537B2 (en) * | 2006-05-15 | 2010-10-12 | Siemens Medical Solutions Usa, Inc. | Motion-guided segmentation for cine DENSE images |
KR100834113B1 (ko) * | 2006-11-10 | 2008-06-02 | 아주하이텍(주) | 자동 광학 검사 시스템 |
JP2009109419A (ja) * | 2007-10-31 | 2009-05-21 | Sony Corp | 物品識別装置および方法、並びにプログラム |
JP5121510B2 (ja) * | 2008-03-04 | 2013-01-16 | キヤノン株式会社 | 撮像システム、撮影方法、プログラム、コンピュータ読み取り可能な記憶媒体及び画像処理装置 |
JP2010097433A (ja) * | 2008-10-16 | 2010-04-30 | Olympus Corp | 領域選択装置および領域選択方法 |
US8611655B2 (en) * | 2011-02-04 | 2013-12-17 | Apple Inc. | Hue-based color matching |
US8594426B2 (en) * | 2011-02-04 | 2013-11-26 | Apple Inc. | Color matching using color segmentation |
JP2012253713A (ja) | 2011-06-07 | 2012-12-20 | Sony Corp | 画像処理装置、および、画像処理装置の制御方法ならびに当該方法をコンピュータに実行させるプログラム |
JP6109317B2 (ja) * | 2013-08-22 | 2017-04-05 | 富士機械製造株式会社 | 基板の生産作業方法、基板の撮像条件決定方法、および基板の生産作業装置 |
US10685523B1 (en) * | 2014-07-09 | 2020-06-16 | Cummins-Allison Corp. | Systems, methods and devices for processing batches of coins utilizing coin imaging sensor assemblies |
DE102015102122A1 (de) * | 2015-02-13 | 2016-08-18 | Ksg Leiterplatten Gmbh | Verfahren und Vorrichtung zum Herstellen und Inventarisieren eines Schaltungsträgers |
JP6576059B2 (ja) * | 2015-03-10 | 2019-09-18 | キヤノン株式会社 | 情報処理、情報処理方法、プログラム |
JP6583000B2 (ja) | 2016-01-07 | 2019-10-02 | 株式会社デンソー | 回転電機の制御装置 |
JP6617963B2 (ja) | 2016-02-17 | 2019-12-11 | 株式会社Screenホールディングス | 基板保持状態の異常検査の検査領域の自動決定方法および基板処理装置 |
US11176651B2 (en) | 2017-10-18 | 2021-11-16 | Anthony C. Liberatori, Jr. | Computer-controlled 3D analysis of collectible objects |
CN116046819B (zh) * | 2023-04-03 | 2023-06-06 | 四川中科高能科技发展有限责任公司 | 一种基于辐照可用物品从而实现可用物品色泽识别方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60256004A (ja) * | 1984-06-01 | 1985-12-17 | Matsushita Electric Works Ltd | チツプ部品のはんだ付検査方法 |
US5220614A (en) * | 1991-02-22 | 1993-06-15 | Professional Coin Grading Service, Inc. | Automated coin grading system |
JPH0526636A (ja) * | 1991-06-21 | 1993-02-02 | Hitachi Ltd | プリント基板はんだ付け検査方法および検査装置 |
US5546475A (en) * | 1994-04-29 | 1996-08-13 | International Business Machines Corporation | Produce recognition system |
KR100186384B1 (ko) | 1996-04-15 | 1999-05-01 | 이종수 | 다단조명을 이용한 영상검사장치 |
US6198529B1 (en) * | 1999-04-30 | 2001-03-06 | International Business Machines Corporation | Automated inspection system for metallic surfaces |
JP4139571B2 (ja) | 2001-02-28 | 2008-08-27 | 大日本スクリーン製造株式会社 | カラー画像の領域分割 |
JP2003172711A (ja) * | 2001-09-26 | 2003-06-20 | Dainippon Screen Mfg Co Ltd | 画像処理を利用した検査対象物の表面検査 |
KR20010099501A (ko) * | 2001-10-11 | 2001-11-09 | (주)에이치아이티에스 | 인쇄회로기판의 결함검사장치 |
-
2004
- 2004-07-21 JP JP2004212537A patent/JP4648660B2/ja active Active
-
2005
- 2005-05-30 CN CNB2005100746037A patent/CN100375110C/zh active Active
- 2005-05-30 KR KR1020050045546A patent/KR100753527B1/ko active IP Right Grant
- 2005-06-13 TW TW094119467A patent/TWI277340B/zh active
- 2005-06-15 US US11/152,506 patent/US7480407B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101275917A (zh) * | 2007-03-30 | 2008-10-01 | 大日本网目版制造株式会社 | 缺陷检查装置、图形描绘装置及图形描绘系统 |
US8300918B2 (en) | 2007-03-30 | 2012-10-30 | Dainippon Screen Mfg. Co., Ltd. | Defect inspection apparatus, defect inspection program, recording medium storing defect inspection program, figure drawing apparatus and figure drawing system |
CN101275917B (zh) * | 2007-03-30 | 2013-03-06 | 大日本网目版制造株式会社 | 缺陷检查装置、图形描绘装置及图形描绘系统 |
CN105004727A (zh) * | 2014-04-24 | 2015-10-28 | 奥蒂玛光学科技(深圳)有限公司 | 电路板检测方法及系统 |
CN111665264A (zh) * | 2019-03-07 | 2020-09-15 | 株式会社斯库林集团 | 代表色决定方法、检查装置、检查方法以及记录介质 |
CN111665264B (zh) * | 2019-03-07 | 2023-07-04 | 株式会社斯库林集团 | 代表色决定方法、检查装置、检查方法以及记录介质 |
Also Published As
Publication number | Publication date |
---|---|
JP4648660B2 (ja) | 2011-03-09 |
KR100753527B1 (ko) | 2007-08-30 |
JP2006030106A (ja) | 2006-02-02 |
US7480407B2 (en) | 2009-01-20 |
CN100375110C (zh) | 2008-03-12 |
TW200605642A (en) | 2006-02-01 |
US20060018540A1 (en) | 2006-01-26 |
KR20060046275A (ko) | 2006-05-17 |
TWI277340B (en) | 2007-03-21 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: DAINIPPON SCREEN MFG. CO., LTD. Free format text: FORMER NAME: DAINIPPON MESH PLATE MFR. CO., LTD. Owner name: SCREEN GROUP CO., LTD. Free format text: FORMER NAME: DAINIPPON SCREEN MFG. CO., LTD. |
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CP01 | Change in the name or title of a patent holder |
Address after: Kyoto Japan Patentee after: Skilling Group Address before: Kyoto Japan Patentee before: DAINIPPON SCREEN MFG Co.,Ltd. Address after: Kyoto Japan Patentee after: DAINIPPON SCREEN MFG Co.,Ltd. Address before: Kyoto Japan Patentee before: Dainippon Screen Mfg. Co.,Ltd. |