DE10084702T1 - Verfahren und Vorrichtung zur Umweltüberwachung - Google Patents

Verfahren und Vorrichtung zur Umweltüberwachung

Info

Publication number
DE10084702T1
DE10084702T1 DE10084702T DE10084702T DE10084702T1 DE 10084702 T1 DE10084702 T1 DE 10084702T1 DE 10084702 T DE10084702 T DE 10084702T DE 10084702 T DE10084702 T DE 10084702T DE 10084702 T1 DE10084702 T1 DE 10084702T1
Authority
DE
Germany
Prior art keywords
environmental monitoring
environmental
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10084702T
Other languages
English (en)
Inventor
Endo Michiaki
Yoshida Haruo
Maeda Yasuhir
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10084702T1 publication Critical patent/DE10084702T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
DE10084702T 1999-08-18 2000-08-16 Verfahren und Vorrichtung zur Umweltüberwachung Withdrawn DE10084702T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP23149599 1999-08-18
PCT/JP2000/005471 WO2001013093A1 (fr) 1999-08-18 2000-08-16 Procede et appareil de surveillance de l'environnement

Publications (1)

Publication Number Publication Date
DE10084702T1 true DE10084702T1 (de) 2003-07-03

Family

ID=16924396

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10084702T Withdrawn DE10084702T1 (de) 1999-08-18 2000-08-16 Verfahren und Vorrichtung zur Umweltüberwachung

Country Status (4)

Country Link
US (1) US6657196B2 (de)
AU (1) AU6592700A (de)
DE (1) DE10084702T1 (de)
WO (1) WO2001013093A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002168776A (ja) * 2000-12-01 2002-06-14 Advantest Corp 環境モニタ方法及び装置並びに半導体製造装置
JP2002286636A (ja) * 2001-01-19 2002-10-03 Advantest Corp 化学物質検出方法及び装置
JP3834224B2 (ja) * 2001-06-28 2006-10-18 株式会社アドバンテスト 化学物質検出方法及び装置
EP1587616B1 (de) * 2003-01-22 2013-05-01 Camfil Ab Verfahren zur herstellung einer filterkonstruktion
US7504154B2 (en) * 2005-03-23 2009-03-17 Lockheed Martin Corporation Moisture barrier coatings for infrared salt optics
US8092030B2 (en) 2006-04-12 2012-01-10 Plx, Inc. Mount for an optical structure and method of mounting an optical structure using such mount
DE102006056929B4 (de) * 2006-12-04 2010-09-02 Bruker Daltonik Gmbh Massenspektrometrie mit Laser-Ablation
US8194246B2 (en) * 2008-08-11 2012-06-05 UT-Battellle, LLC Photoacoustic microcantilevers
US7924423B2 (en) * 2008-08-11 2011-04-12 Ut-Battelle, Llc Reverse photoacoustic standoff spectroscopy
US7961313B2 (en) * 2008-08-11 2011-06-14 Ut-Battelle, Llc Photoacoustic point spectroscopy
US8448261B2 (en) 2010-03-17 2013-05-21 University Of Tennessee Research Foundation Mode synthesizing atomic force microscopy and mode-synthesizing sensing
US20110231966A1 (en) * 2010-03-17 2011-09-22 Ali Passian Scanning probe microscopy with spectroscopic molecular recognition
US8080796B1 (en) 2010-06-30 2011-12-20 Ut-Battelle, Llc Standoff spectroscopy using a conditioned target
US9798051B2 (en) 2011-02-28 2017-10-24 Plx, Inc. Mount for an optical structure having a grooved protruding member and method of mounting an optical structure using such mount
WO2013078281A2 (en) 2011-11-23 2013-05-30 Ftrx Llc Quasi- translator, fourier modulator, fourier spectrometer, motion control system and methods for controlling same, and signal processor circuit
US8851689B2 (en) 2012-07-27 2014-10-07 Plx, Inc. Interferometer, and optical assembly each having a three-pin mount for mounting an optical element at at least three points or areas and method of mounting same
US20150007429A1 (en) 2013-02-21 2015-01-08 Plx, Inc. Mounts for an optical structure having a grooved protruding member with a damping ring disposed in or on the groove and methods of mounting an optical structure using such mounts

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5082629A (en) * 1989-12-29 1992-01-21 The Board Of The University Of Washington Thin-film spectroscopic sensor
JPH07105424B2 (ja) * 1991-07-23 1995-11-13 信越半導体株式会社 シリコンウェーハの表面の結合状態及び不純物の評価方法
US5436454A (en) * 1993-10-15 1995-07-25 Nicolet Instrument Corporation Optical probe for remote attenuated total reflectance measurements
US5386121A (en) * 1993-12-23 1995-01-31 International Business Machines Corporation In situ, non-destructive CVD surface monitor
JPH08313430A (ja) * 1995-05-18 1996-11-29 Nippon Telegr & Teleph Corp <Ntt> ガスセンサ
US6166834A (en) * 1996-03-15 2000-12-26 Matsushita Electric Industrial Co., Ltd. Display apparatus and method for forming hologram suitable for the display apparatus
US6217695B1 (en) * 1996-05-06 2001-04-17 Wmw Systems, Llc Method and apparatus for radiation heating substrates and applying extruded material
JPH11160317A (ja) * 1997-11-27 1999-06-18 Suzuki Motor Corp 免疫反応測定装置
JP3187759B2 (ja) * 1997-12-09 2001-07-11 株式会社アドバンテスト 有機汚染検出・除去装置及びその有機汚染検出・除去方法並びに化学汚染検出・除去装置及びその化学汚染検出・除去方法
CA2268469C (en) * 1998-04-10 2004-03-23 University Of Central Florida Apparatus and method for photocatalytic and thermocatalytic pollution control
JP3261362B2 (ja) * 1998-05-28 2002-02-25 株式会社アドバンテスト 表面状態測定方法及び装置

Also Published As

Publication number Publication date
WO2001013093A1 (fr) 2001-02-22
AU6592700A (en) 2001-03-13
US6657196B2 (en) 2003-12-02
US20020125433A1 (en) 2002-09-12

Similar Documents

Publication Publication Date Title
DE60018733D1 (de) Vorrichtung und verfahren zur probenanalyse
DE60021077D1 (de) Vorrichtung und verfahren zur probenabgabe
DE60034121D1 (de) Verfahren und vorrichtung zur streuparameter-kalibrierung
DE60033866D1 (de) Vorrichtung und Verfahren zur Planarisierung
DE60030658D1 (de) Verfahren und Vorrichtung zur Überprüfung von Gegenständen
DE60008102D1 (de) Verfahren und vorrichtung zur mehrfachsendung
DE69927559D1 (de) Vorrichtung und Verfahren zur ressourcensparenden und ereignisgesteuerten Überwachung
ATE269512T1 (de) Verfahren und vorrichtung zur nox reduktion
DE69927328T2 (de) Vorrichtung und Verfahren zur Signalspitzenbegrenzung
DE69807202T2 (de) Verfahren und gerät zur bohrlochüberwachung
DE50012668D1 (de) Verfahren und vorrichtung zur fahrweisenbewertung
DE60038833D1 (de) Vorrichtung und Verfahren zur Bandbreitenüberwachung
DE60100249D1 (de) Vorrichtung und Verfahren zur Fahrzeugerfassung
DE60036939D1 (de) Verfahren und vorrichtung zur markierung von fehlern
DE60037008D1 (de) Verfahren und vorrichtung zur synchronisierung
DE60013627D1 (de) Verfahren und vorrichtung zur aufwärtsplanung
DE60000380T2 (de) Verfahren und Vorrichtung zur Datenkompression
DE59902261D1 (de) Verfahren und Einrichtung zur Zustandsschätzung
ATA15599A (de) Verfahren und vorrichtung zur querstromfiltration
DE19983717T1 (de) Vorrichtung und Verfahren zur Ausrichtung
DE69927115T2 (de) Verfahren und Vorrichtung zur Flammenüberwachung
DE50111492D1 (de) Verfahren und vorrichtung zur überwachung von gasen
DE60033330D1 (de) Verfahren und Vorrichtung zur Blockrauschdetektion
DE10084702T1 (de) Verfahren und Vorrichtung zur Umweltüberwachung
DE60016639D1 (de) Verfahren und Vorrichtung zur Pfadsuche

Legal Events

Date Code Title Description
8141 Disposal/no request for examination