DE3138038C2 - - Google Patents

Info

Publication number
DE3138038C2
DE3138038C2 DE3138038A DE3138038A DE3138038C2 DE 3138038 C2 DE3138038 C2 DE 3138038C2 DE 3138038 A DE3138038 A DE 3138038A DE 3138038 A DE3138038 A DE 3138038A DE 3138038 C2 DE3138038 C2 DE 3138038C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3138038A
Other versions
DE3138038A1 (de
Inventor
Hiroshi Yokohama Jp Iwahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE3138038A1 publication Critical patent/DE3138038A1/de
Application granted granted Critical
Publication of DE3138038C2 publication Critical patent/DE3138038C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • G11C17/10Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
    • G11C17/12Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5692Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency read-only digital stores using storage elements with more than two stable states
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/563Multilevel memory reading aspects
    • G11C2211/5634Reference cells
DE19813138038 1980-09-25 1981-09-24 Integrierter halbleiterspeicher Granted DE3138038A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55133560A JPS5856199B2 (ja) 1980-09-25 1980-09-25 半導体記憶装置

Publications (2)

Publication Number Publication Date
DE3138038A1 DE3138038A1 (de) 1982-04-22
DE3138038C2 true DE3138038C2 (de) 1987-04-02

Family

ID=15107652

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19813138038 Granted DE3138038A1 (de) 1980-09-25 1981-09-24 Integrierter halbleiterspeicher

Country Status (4)

Country Link
US (1) US4503518A (de)
JP (1) JPS5856199B2 (de)
DE (1) DE3138038A1 (de)
GB (1) GB2084828B (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4415992A (en) * 1981-02-25 1983-11-15 Motorola, Inc. Memory system having memory cells capable of storing more than two states
JPS59126315A (ja) * 1982-12-24 1984-07-20 Fujitsu Ltd 比較回路
US4634893A (en) * 1983-01-10 1987-01-06 Ncr Corporation FET driver circuit with mask programmable transition rates
US4571709A (en) * 1983-01-31 1986-02-18 Intel Corporation Timing apparatus for non-volatile MOS RAM
JPS59151395A (ja) * 1983-02-08 1984-08-29 Toshiba Corp 半導体記憶装置
DE3472502D1 (en) * 1983-09-16 1988-08-04 Fujitsu Ltd Plural-bit-per-cell read-only memory
JPH0828431B2 (ja) * 1986-04-22 1996-03-21 日本電気株式会社 半導体記憶装置
JPS6342100A (ja) * 1986-08-08 1988-02-23 Fujitsu Ltd 3値レベルrom
US5268870A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Flash EEPROM system and intelligent programming and erasing methods therefor
US7190617B1 (en) * 1989-04-13 2007-03-13 Sandisk Corporation Flash EEprom system
US7447069B1 (en) 1989-04-13 2008-11-04 Sandisk Corporation Flash EEprom system
DE69033438T2 (de) * 1989-04-13 2000-07-06 Sandisk Corp Austausch von fehlerhaften Speicherzellen einer EEprommatritze
US6002614A (en) * 1991-02-08 1999-12-14 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
US5218569A (en) * 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
JP3397427B2 (ja) * 1994-02-02 2003-04-14 株式会社東芝 半導体記憶装置
US6353554B1 (en) 1995-02-27 2002-03-05 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
JPH11283386A (ja) * 1998-03-31 1999-10-15 Nec Ic Microcomput Syst Ltd 半導体記憶装置
FR2836750A1 (fr) * 2002-02-11 2003-09-05 St Microelectronics Sa Cellule memoire a programmation unique non destructrice
FR2836752A1 (fr) * 2002-02-11 2003-09-05 St Microelectronics Sa Cellule memoire a programmation unique
FR2836751A1 (fr) * 2002-02-11 2003-09-05 St Microelectronics Sa Cellule memoire a programmation unique non destructrice
US20070268045A1 (en) * 2006-05-22 2007-11-22 Profusion Energy, Inc. Drive Circuit And Method For Semiconductor Devices
US8624636B2 (en) * 2006-05-22 2014-01-07 Brillouin Energy Corp. Drive circuit and method for semiconductor devices
US7929328B2 (en) * 2009-06-12 2011-04-19 Vanguard International Semiconductor Corporation Memory and storage device utilizing the same
JP1643024S (de) * 2019-03-15 2019-10-07

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4094008A (en) * 1976-06-18 1978-06-06 Ncr Corporation Alterable capacitor memory array
US4134151A (en) * 1977-05-02 1979-01-09 Electronic Memories & Magnetics Corporation Single sense line memory cell
US4202044A (en) * 1978-06-13 1980-05-06 International Business Machines Corporation Quaternary FET read only memory
US4192014A (en) * 1978-11-20 1980-03-04 Ncr Corporation ROM memory cell with 2n FET channel widths
US4301518A (en) * 1979-11-01 1981-11-17 Texas Instruments Incorporated Differential sensing of single ended memory array

Also Published As

Publication number Publication date
JPS5856199B2 (ja) 1983-12-13
GB2084828B (en) 1984-09-12
DE3138038A1 (de) 1982-04-22
JPS5758298A (en) 1982-04-07
GB2084828A (en) 1982-04-15
US4503518A (en) 1985-03-05

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8128 New person/name/address of the agent

Representative=s name: HENKEL, G., DR.PHIL. FEILER, L., DR.RER.NAT. HAENZ

D2 Grant after examination
8327 Change in the person/name/address of the patent owner

Owner name: KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP

8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)