DE3477448D1 - Complementary mos circuit - Google Patents
Complementary mos circuitInfo
- Publication number
- DE3477448D1 DE3477448D1 DE8484100033T DE3477448T DE3477448D1 DE 3477448 D1 DE3477448 D1 DE 3477448D1 DE 8484100033 T DE8484100033 T DE 8484100033T DE 3477448 T DE3477448 T DE 3477448T DE 3477448 D1 DE3477448 D1 DE 3477448D1
- Authority
- DE
- Germany
- Prior art keywords
- complementary mos
- mos circuit
- circuit
- complementary
- mos
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/205—Substrate bias-voltage generators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
- H01L27/0218—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L of field effect structures
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58027470A JPS59153331A (ja) | 1983-02-21 | 1983-02-21 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3477448D1 true DE3477448D1 (de) | 1989-04-27 |
Family
ID=12221993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8484100033T Expired DE3477448D1 (de) | 1983-02-21 | 1984-01-03 | Complementary mos circuit |
Country Status (4)
Country | Link |
---|---|
US (1) | US4837460A (de) |
EP (1) | EP0116820B1 (de) |
JP (1) | JPS59153331A (de) |
DE (1) | DE3477448D1 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0754628B2 (ja) * | 1985-09-30 | 1995-06-07 | 株式会社東芝 | 半導体装置 |
USRE40132E1 (en) | 1988-06-17 | 2008-03-04 | Elpida Memory, Inc. | Large scale integrated circuit with sense amplifier circuits for low voltage operation |
JP2569777B2 (ja) * | 1988-12-16 | 1997-01-08 | 日本電気株式会社 | 入力信号切り換え回路 |
US5079441A (en) * | 1988-12-19 | 1992-01-07 | Texas Instruments Incorporated | Integrated circuit having an internal reference circuit to supply internal logic circuits with a reduced voltage |
US4958086A (en) * | 1989-05-08 | 1990-09-18 | Motorola, Inc. | Low di/dt output buffer with improved speed |
US5128560A (en) * | 1991-03-22 | 1992-07-07 | Micron Technology, Inc. | Boosted supply output driver circuit for driving an all N-channel output stage |
US5160855A (en) * | 1991-06-28 | 1992-11-03 | Digital Equipment Corporation | Floating-well CMOS output driver |
CN1075690C (zh) * | 1991-11-07 | 2001-11-28 | 摩托罗拉公司 | 混合信号处理系统及其供电方法 |
JP2914408B2 (ja) * | 1991-11-29 | 1999-06-28 | 富士電機株式会社 | 高耐圧集積回路 |
DE69328743T2 (de) * | 1992-03-30 | 2000-09-07 | Mitsubishi Electric Corp | Halbleiteranordnung |
US5329184A (en) * | 1992-11-05 | 1994-07-12 | National Semiconductor Corporation | Method and apparatus for feedback control of I/O characteristics of digital interface circuits |
US5371419A (en) * | 1992-11-23 | 1994-12-06 | Mitsubishi Denki Kabushiki Kaisha | CMOS well switching circuit |
EP0602268A1 (de) * | 1992-12-16 | 1994-06-22 | Landis & Gyr Business Support AG | Integrierte Schaltung mit Feldeffekt-Transistoren |
US5338978A (en) * | 1993-02-10 | 1994-08-16 | National Semiconductor Corporation | Full swing power down buffer circuit with multiple power supply isolation |
WO1995019046A1 (en) * | 1994-01-10 | 1995-07-13 | Carnegie Mellon University | Four rail circuit architecture for ultra-low power and voltage cmos circuit design |
US5814845A (en) * | 1995-01-10 | 1998-09-29 | Carnegie Mellon University | Four rail circuit architecture for ultra-low power and voltage CMOS circuit design |
GB2300531A (en) * | 1995-05-02 | 1996-11-06 | Plessey Semiconductors Ltd | Reduced swing CMOS output buffer |
JPH0974347A (ja) * | 1995-06-26 | 1997-03-18 | Mitsubishi Electric Corp | Mos集積回路 |
JP4036487B2 (ja) * | 1995-08-18 | 2008-01-23 | 株式会社ルネサステクノロジ | 半導体記憶装置、および半導体回路装置 |
GB2349999B (en) * | 1996-05-28 | 2001-01-31 | Altera Corp | Techniques of fabricating integrated circuits having interfaces compatible with different operating voltage conditions |
US6147511A (en) | 1996-05-28 | 2000-11-14 | Altera Corporation | Overvoltage-tolerant interface for integrated circuits |
US6025737A (en) * | 1996-11-27 | 2000-02-15 | Altera Corporation | Circuitry for a low internal voltage integrated circuit |
US6175952B1 (en) | 1997-05-27 | 2001-01-16 | Altera Corporation | Technique of fabricating integrated circuits having interfaces compatible with different operating voltage conditions |
JP3266527B2 (ja) * | 1996-12-10 | 2002-03-18 | 富士通株式会社 | 出力ドライバ回路及び半導体装置 |
JP3732914B2 (ja) | 1997-02-28 | 2006-01-11 | 株式会社ルネサステクノロジ | 半導体装置 |
US6239612B1 (en) | 1997-08-20 | 2001-05-29 | Altera Corporation | Programmable I/O cells with multiple drivers |
TW462143B (en) * | 1997-09-11 | 2001-11-01 | Mitsubishi Electric Corp | Semiconductor integrated circuit |
US6087885A (en) * | 1997-09-11 | 2000-07-11 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device allowing fast and stable transmission of signals |
JP3542476B2 (ja) * | 1997-12-01 | 2004-07-14 | 三菱電機株式会社 | Soi構造のcmos回路 |
US5988819A (en) * | 1998-02-17 | 1999-11-23 | Maxim Integrated Products, Inc. | Single output transistor output stage for interface applications |
US6366061B1 (en) | 1999-01-13 | 2002-04-02 | Carnegie Mellon University | Multiple power supply circuit architecture |
US6680650B2 (en) * | 2001-01-12 | 2004-01-20 | Broadcom Corporation | MOSFET well biasing scheme that migrates body effect |
US20080166524A1 (en) * | 2007-01-02 | 2008-07-10 | Polyworks, Inc. | Thermoformed cushioning material and method of making |
US7868667B2 (en) * | 2008-03-26 | 2011-01-11 | Hynix Semiconductor Inc. | Output driving device |
KR101699033B1 (ko) * | 2009-11-30 | 2017-01-24 | 에스케이하이닉스 주식회사 | 출력 드라이버 |
EP2953524B1 (de) | 2013-02-06 | 2018-08-01 | Freenome Holdings Inc. | Systeme und verfahren für frühe krankheitserkennung und echtzeitüberwachung von krankheiten |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3855549A (en) * | 1973-08-24 | 1974-12-17 | Rca Corp | Circuit, such as cmos crystal oscillator, with reduced power consumption |
US4006491A (en) * | 1975-05-15 | 1977-02-01 | Motorola, Inc. | Integrated circuit having internal main supply voltage regulator |
US4209713A (en) * | 1975-07-18 | 1980-06-24 | Tokyo Shibaura Electric Co., Ltd. | Semiconductor integrated circuit device in which difficulties caused by parasitic transistors are eliminated |
US4039869A (en) * | 1975-11-28 | 1977-08-02 | Rca Corporation | Protection circuit |
JPS5318377A (en) * | 1976-08-03 | 1978-02-20 | Toshiba Corp | Logical operation circuit |
JPS5323555A (en) * | 1976-08-17 | 1978-03-04 | Nec Corp | Complemen tary mos integrated circuit |
JPS5935217B2 (ja) * | 1977-03-31 | 1984-08-27 | シャープ株式会社 | C−mos回路 |
JPS6042621B2 (ja) * | 1977-03-31 | 1985-09-24 | 株式会社東芝 | Mos集積回路装置 |
JPS54159158A (en) * | 1978-06-06 | 1979-12-15 | Nec Corp | Field effect transistor circuit |
JPS5516539A (en) * | 1978-07-20 | 1980-02-05 | Nec Corp | Level shifter circuit |
JPS5591861A (en) * | 1978-12-29 | 1980-07-11 | Fujitsu Ltd | Cmos logic circuit |
JPS582061B2 (ja) * | 1980-03-05 | 1983-01-13 | 株式会社新潟鐵工所 | 多成分液状プラスチツク原料混合装置の原料供給装置 |
US4482985A (en) * | 1981-04-17 | 1984-11-13 | Hitachi, Ltd. | Semiconductor integrated circuit |
JPS582061A (ja) * | 1981-06-26 | 1983-01-07 | Seiko Epson Corp | Cmos集積回路 |
JPS5882560A (ja) * | 1981-11-11 | 1983-05-18 | Oki Electric Ind Co Ltd | Cmos集積回路 |
US4585955B1 (en) * | 1982-12-15 | 2000-11-21 | Tokyo Shibaura Electric Co | Internally regulated power voltage circuit for mis semiconductor integrated circuit |
-
1983
- 1983-02-21 JP JP58027470A patent/JPS59153331A/ja active Granted
-
1984
- 1984-01-03 DE DE8484100033T patent/DE3477448D1/de not_active Expired
- 1984-01-03 EP EP84100033A patent/EP0116820B1/de not_active Expired
- 1984-01-23 US US06/573,202 patent/US4837460A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0116820B1 (de) | 1989-03-22 |
EP0116820A2 (de) | 1984-08-29 |
JPS59153331A (ja) | 1984-09-01 |
EP0116820A3 (en) | 1986-06-25 |
JPH0412649B2 (de) | 1992-03-05 |
US4837460A (en) | 1989-06-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) |