DE3484514D1 - Halbleiterspeichergeraet. - Google Patents

Halbleiterspeichergeraet.

Info

Publication number
DE3484514D1
DE3484514D1 DE8484300802T DE3484514T DE3484514D1 DE 3484514 D1 DE3484514 D1 DE 3484514D1 DE 8484300802 T DE8484300802 T DE 8484300802T DE 3484514 T DE3484514 T DE 3484514T DE 3484514 D1 DE3484514 D1 DE 3484514D1
Authority
DE
Germany
Prior art keywords
storage device
semiconductor storage
semiconductor
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8484300802T
Other languages
English (en)
Inventor
Masanobu Yoshida
Kiyoshi Itano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3484514D1 publication Critical patent/DE3484514D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/835Masking faults in memories by using spares or by reconfiguring using programmable devices with roll call arrangements for redundant substitutions
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
DE8484300802T 1983-02-08 1984-02-08 Halbleiterspeichergeraet. Expired - Fee Related DE3484514D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58018027A JPS59144098A (ja) 1983-02-08 1983-02-08 半導体記憶装置

Publications (1)

Publication Number Publication Date
DE3484514D1 true DE3484514D1 (de) 1991-06-06

Family

ID=11960179

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484300802T Expired - Fee Related DE3484514D1 (de) 1983-02-08 1984-02-08 Halbleiterspeichergeraet.

Country Status (7)

Country Link
US (1) US4604730A (de)
EP (1) EP0116464B1 (de)
JP (1) JPS59144098A (de)
KR (1) KR890005156B1 (de)
CA (1) CA1214553A (de)
DE (1) DE3484514D1 (de)
IE (1) IE56815B1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6148200A (ja) * 1984-08-14 1986-03-08 Fujitsu Ltd 半導体記憶装置
JPS6355799A (ja) * 1986-08-26 1988-03-10 Mitsubishi Electric Corp 半導体記憶装置
JP2590897B2 (ja) * 1987-07-20 1997-03-12 日本電気株式会社 半導体メモリ
US4807191A (en) * 1988-01-04 1989-02-21 Motorola, Inc. Redundancy for a block-architecture memory
JPH01167760U (de) * 1988-05-16 1989-11-27
US5134584A (en) * 1988-07-22 1992-07-28 Vtc Incorporated Reconfigurable memory
JPH0289299A (ja) * 1988-09-27 1990-03-29 Nec Corp 半導体記憶装置
US7190617B1 (en) 1989-04-13 2007-03-13 Sandisk Corporation Flash EEprom system
DE69033262T2 (de) 1989-04-13 2000-02-24 Sandisk Corp EEPROM-Karte mit Austauch von fehlerhaften Speicherzellen und Zwischenspeicher
US7447069B1 (en) 1989-04-13 2008-11-04 Sandisk Corporation Flash EEprom system
KR910005601B1 (ko) * 1989-05-24 1991-07-31 삼성전자주식회사 리던던트 블럭을 가지는 반도체 메모리장치
JP2837433B2 (ja) * 1989-06-05 1998-12-16 三菱電機株式会社 半導体記憶装置における不良ビット救済回路
JPH03116498A (ja) * 1989-09-28 1991-05-17 Nec Ic Microcomput Syst Ltd 記憶装置
GB8926004D0 (en) * 1989-11-17 1990-01-10 Inmos Ltd Repairable memory circuit
US5126973A (en) * 1990-02-14 1992-06-30 Texas Instruments Incorporated Redundancy scheme for eliminating defects in a memory device
JPH03241598A (ja) * 1990-02-19 1991-10-28 Fujitsu Ltd シグネチャー回路
US5274593A (en) * 1990-09-28 1993-12-28 Intergraph Corporation High speed redundant rows and columns for semiconductor memories
JPH06111596A (ja) * 1990-10-09 1994-04-22 Texas Instr Inc <Ti> メモリ
JP3001252B2 (ja) * 1990-11-16 2000-01-24 株式会社日立製作所 半導体メモリ
JPH06203595A (ja) * 1991-08-30 1994-07-22 Texas Instr Inc <Ti> ユニバーサル・モジューラ・メモリ
KR100296850B1 (ko) * 1992-05-28 2001-10-24 썬 마이크로시스템즈, 인코포레이티드 캐시램용다수의뱅크열용장성초기화제어기
US5471479A (en) * 1992-08-06 1995-11-28 Motorola, Inc. Arrangement for column sparing of memory
JP2980472B2 (ja) * 1992-12-21 1999-11-22 株式会社東芝 半導体記憶装置
JP2833574B2 (ja) * 1996-03-28 1998-12-09 日本電気株式会社 不揮発性半導体記憶装置
US6249464B1 (en) 1999-12-15 2001-06-19 Cypress Semiconductor Corp. Block redundancy in ultra low power memory circuits
JP2007257791A (ja) * 2006-03-24 2007-10-04 Fujitsu Ltd 半導体記憶装置
US8837192B2 (en) * 2012-10-19 2014-09-16 Taiwan Semiconductor Manufacturing Company Limited N-bit rom cell
DE112017007727T5 (de) * 2017-07-06 2020-03-19 Hewlett-Packard Development Company, L.P. Decoder für speicher von fluidausstossvorrichtungen

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4281398A (en) * 1980-02-12 1981-07-28 Mostek Corporation Block redundancy for memory array
CA1158775A (en) * 1980-06-04 1983-12-13 Thomas L. Phinney Computer annotation system
JPS57150197A (en) * 1981-03-11 1982-09-16 Nippon Telegr & Teleph Corp <Ntt> Storage circuit
US4471472A (en) * 1982-02-05 1984-09-11 Advanced Micro Devices, Inc. Semiconductor memory utilizing an improved redundant circuitry configuration

Also Published As

Publication number Publication date
EP0116464A3 (en) 1987-06-03
EP0116464A2 (de) 1984-08-22
IE840285L (en) 1984-08-08
CA1214553A (en) 1986-11-25
JPS59144098A (ja) 1984-08-17
KR840008073A (ko) 1984-12-12
EP0116464B1 (de) 1991-05-02
US4604730A (en) 1986-08-05
KR890005156B1 (ko) 1989-12-14
JPS6237479B2 (de) 1987-08-12
IE56815B1 (en) 1991-12-18

Similar Documents

Publication Publication Date Title
DE3576433D1 (de) Halbleiterspeichervorrichtung.
DE3484514D1 (de) Halbleiterspeichergeraet.
DE3581773D1 (de) Halbleiterspeichervorrichtung.
DE3584189D1 (de) Halbleiterspeichergeraet.
DE3177183D1 (de) Halbleiterspeichergeraet.
DE3484232D1 (de) Halbleiterspeichervorrichtung.
DE3684509D1 (de) Halbleiterspeichergeraet.
DE3681082D1 (de) Halbleiterspeichervorrichtung.
DE3685361D1 (de) Halbleiterspeichervorrichtung.
DE3382212D1 (de) Halbleiterspeicher.
DE3381545D1 (de) Halbleiterspeicheranordnung.
DE3382802T2 (de) Halbleiterspeichergerät
DE3482935D1 (de) Halbleiterlaservorrichtung.
DE3485174D1 (de) Halbleiterspeicheranordnung.
DE3485625D1 (de) Halbleiterspeicheranordnung.
DE3484180D1 (de) Halbleiterspeicheranordnung.
DE3481355D1 (de) Halbleiterspeicheranordnung.
DE3587052D1 (de) Halbleiterspeichergeraet.
IT8322373A0 (it) Dispositivo semiconduttore.
DE3486094T2 (de) Halbleiterspeicheranordnung.
DE3882150D1 (de) Halbleiterspeichergeraet.
DE3484630D1 (de) Halbleiterspeicheranordnung.
DE3486082D1 (de) Halbleiterspeicheranordnung.
DE3481395D1 (de) Halbleiterspeicheranordnung.
DE3177173D1 (de) Halbleiterspeichervorrichtung.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee