DE3574621D1 - Oberflaechen-ultraschall-interferenz-mikroskop. - Google Patents

Oberflaechen-ultraschall-interferenz-mikroskop.

Info

Publication number
DE3574621D1
DE3574621D1 DE8585903386T DE3574621T DE3574621D1 DE 3574621 D1 DE3574621 D1 DE 3574621D1 DE 8585903386 T DE8585903386 T DE 8585903386T DE 3574621 T DE3574621 T DE 3574621T DE 3574621 D1 DE3574621 D1 DE 3574621D1
Authority
DE
Germany
Prior art keywords
interference microscope
surface ultrasonic
ultrasonic interference
microscope
ultrasonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585903386T
Other languages
English (en)
Inventor
Noriyoshi Chubachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59141204A external-priority patent/JPS6120857A/ja
Priority claimed from JP60051190A external-priority patent/JPS61209353A/ja
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of DE3574621D1 publication Critical patent/DE3574621D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0258—Structural degradation, e.g. fatigue of composites, ageing of oils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0421—Longitudinal waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0422—Shear waves, transverse waves, horizontally polarised waves
DE8585903386T 1984-07-08 1985-07-08 Oberflaechen-ultraschall-interferenz-mikroskop. Expired - Lifetime DE3574621D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP59141204A JPS6120857A (ja) 1984-07-08 1984-07-08 表面超音波干渉顕微鏡
JP60051190A JPS61209353A (ja) 1985-03-13 1985-03-13 方向性超音波顕微鏡
PCT/JP1985/000384 WO1986000710A1 (en) 1984-07-08 1985-07-08 Surface ultrasonic wave interference microscope

Publications (1)

Publication Number Publication Date
DE3574621D1 true DE3574621D1 (de) 1990-01-11

Family

ID=26391724

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585903386T Expired - Lifetime DE3574621D1 (de) 1984-07-08 1985-07-08 Oberflaechen-ultraschall-interferenz-mikroskop.

Country Status (4)

Country Link
US (1) US4655083A (de)
EP (1) EP0187866B1 (de)
DE (1) DE3574621D1 (de)
WO (1) WO1986000710A1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4852575A (en) * 1988-02-26 1989-08-01 North American Philips Corporation Ultrasound flow measurement apparatus
US5627320A (en) * 1988-03-23 1997-05-06 Texas Instruments Incorporated Apparatus and method for automated non-destructive inspection of integrated circuit packages
JPH0266449A (ja) * 1988-09-01 1990-03-06 Olympus Optical Co Ltd 超音波顕微鏡
JPH0740020B2 (ja) * 1989-04-17 1995-05-01 敏夫 成田 セラミツクス接合部の強度判定方法
EP0398428B1 (de) * 1989-05-12 1994-03-23 Hitachi Construction Machinery Co., Ltd. Ultraschallmikroskopsonde
CN1019919C (zh) * 1990-03-08 1993-02-17 清华大学 具有新型声镜的反射式声显微镜
EP0488300B1 (de) * 1990-11-29 1996-07-17 Hitachi Construction Machinery Co., Ltd. Akustisches Mikroskopsystem
US5406849A (en) * 1992-07-31 1995-04-18 The United States Of America, As Represented By The Secretary Of Commerce Method and apparatus for detecting guided leaky waves in acoustic microscopy
US5307680A (en) * 1992-10-21 1994-05-03 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for visualization of internal stresses in solid non-transparent materials by elastoacoustic technique
US5549003A (en) * 1992-10-21 1996-08-27 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for visualization of internal stresses in solid non-transparent materials by ultrasonic techniques and ultrasonic computer tomography of stress
US5922961A (en) * 1996-05-10 1999-07-13 The United States Of America As Represented By The Secretary Of Commerce Time and polarization resolved acoustic microscope
DE19849102C1 (de) * 1998-10-24 2000-07-20 Nukem Nutronik Gmbh Verfahren und Vorrichtung zur zerstörungsfreien Prüfung von Gegenständen auf oberflächenoffene und/oder oberflächennahe Fehlstellen
TW490559B (en) * 1999-07-30 2002-06-11 Hitachi Construction Machinery Ultrasonic inspection apparatus and ultrasonic detector
GB2373329B (en) * 2000-05-05 2003-03-05 Acoustical Tech Sg Pte Ltd Acoustic microscope
DE10117772C2 (de) 2001-04-09 2003-04-03 Advalytix Ag Mischvorrichtung und Mischverfahren für die Durchmischung kleiner Flüssigkeitsmengen
JP4443957B2 (ja) * 2003-04-28 2010-03-31 株式会社根本杏林堂 漏出検出装置および方法
TWI341014B (en) * 2007-05-30 2011-04-21 Ind Tech Res Inst A device structure with preformed ring and method therefor
US8296084B1 (en) * 2012-01-17 2012-10-23 Robert Hickling Non-contact, focused, ultrasonic probes for vibrometry, gauging, condition monitoring and feedback control of robots
GB2524759A (en) * 2014-04-01 2015-10-07 Stratec Biomedical Ag Shaker
US10072963B1 (en) * 2014-07-11 2018-09-11 Nick V. Solokhin Ultrasonic volume-sensing transducer instrument with concave transceiver element
US9599807B2 (en) * 2015-06-30 2017-03-21 General Electric Company Optical microscope and method for detecting lens immersion
CN111112037A (zh) * 2020-01-20 2020-05-08 重庆医科大学 透镜式多频聚焦超声换能器、换能系统及其声焦域轴向长度的确定方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589063A (ja) * 1981-07-08 1983-01-19 Noritoshi Nakabachi 超音波顕微鏡
US4503708A (en) * 1983-02-07 1985-03-12 Board Of Trustees Of The Leland Stanford Junior University Reflection acoustic microscope for precision differential phase imaging
US4541281A (en) * 1983-04-03 1985-09-17 Noriyoshi Chubachi Ultrasonic microscope system
JPS59183364A (ja) * 1983-04-03 1984-10-18 Noritoshi Nakabachi 超音波顕微鏡装置
JPS59206758A (ja) * 1983-05-11 1984-11-22 Noritoshi Nakabachi 超音波顕微鏡装置
JPS606858A (ja) * 1983-06-24 1985-01-14 Agency Of Ind Science & Technol 表面弾性波の音速・減衰測定法

Also Published As

Publication number Publication date
US4655083A (en) 1987-04-07
EP0187866A4 (de) 1987-01-20
EP0187866A1 (de) 1986-07-23
WO1986000710A1 (en) 1986-01-30
EP0187866B1 (de) 1989-12-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee