DE3780861D1 - Stromabschwaecher fuer eine messeinrichtung fuer sehr kleine leckstroeme. - Google Patents

Stromabschwaecher fuer eine messeinrichtung fuer sehr kleine leckstroeme.

Info

Publication number
DE3780861D1
DE3780861D1 DE8787104936T DE3780861T DE3780861D1 DE 3780861 D1 DE3780861 D1 DE 3780861D1 DE 8787104936 T DE8787104936 T DE 8787104936T DE 3780861 T DE3780861 T DE 3780861T DE 3780861 D1 DE3780861 D1 DE 3780861D1
Authority
DE
Germany
Prior art keywords
measuring device
leakage currents
small leakage
current reducer
reducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787104936T
Other languages
English (en)
Other versions
DE3780861T2 (de
Inventor
Shashi Dhar Malaviya
Daniel Peter Morris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE3780861D1 publication Critical patent/DE3780861D1/de
Application granted granted Critical
Publication of DE3780861T2 publication Critical patent/DE3780861T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
DE8787104936T 1986-04-24 1987-04-03 Stromabschwaecher fuer eine messeinrichtung fuer sehr kleine leckstroeme. Expired - Fee Related DE3780861T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/855,241 US4739252A (en) 1986-04-24 1986-04-24 Current attenuator useful in a very low leakage current measuring device

Publications (2)

Publication Number Publication Date
DE3780861D1 true DE3780861D1 (de) 1992-09-10
DE3780861T2 DE3780861T2 (de) 1993-03-11

Family

ID=25320724

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787104936T Expired - Fee Related DE3780861T2 (de) 1986-04-24 1987-04-03 Stromabschwaecher fuer eine messeinrichtung fuer sehr kleine leckstroeme.

Country Status (4)

Country Link
US (1) US4739252A (de)
EP (1) EP0246433B1 (de)
JP (1) JPS62251671A (de)
DE (1) DE3780861T2 (de)

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US5414352A (en) * 1993-01-26 1995-05-09 Raytheon Company Parametric test circuit with plural range resistors
US6104206A (en) * 1997-08-05 2000-08-15 Verkuil; Roger L. Product wafer junction leakage measurement using corona and a kelvin probe
US6429641B1 (en) * 2000-05-26 2002-08-06 International Business Machines Corporation Power booster and current measuring unit
US6882172B1 (en) * 2002-04-16 2005-04-19 Transmeta Corporation System and method for measuring transistor leakage current with a ring oscillator
US7315178B1 (en) * 2002-04-16 2008-01-01 Transmeta Corporation System and method for measuring negative bias thermal instability with a ring oscillator
US7941675B2 (en) * 2002-12-31 2011-05-10 Burr James B Adaptive power control
US7112978B1 (en) 2002-04-16 2006-09-26 Transmeta Corporation Frequency specific closed loop feedback control of integrated circuits
US7886164B1 (en) 2002-11-14 2011-02-08 Nvidia Corporation Processor temperature adjustment system and method
US7882369B1 (en) 2002-11-14 2011-02-01 Nvidia Corporation Processor performance adjustment system and method
US7849332B1 (en) 2002-11-14 2010-12-07 Nvidia Corporation Processor voltage adjustment system and method
US7949864B1 (en) 2002-12-31 2011-05-24 Vjekoslav Svilan Balanced adaptive body bias control
US7953990B2 (en) * 2002-12-31 2011-05-31 Stewart Thomas E Adaptive power control based on post package characterization of integrated circuits
US6998850B2 (en) * 2003-10-10 2006-02-14 Agilent Technologies, Inc. Systems and methods for measuring picoampere current levels
US7649402B1 (en) * 2003-12-23 2010-01-19 Tien-Min Chen Feedback-controlled body-bias voltage source
US7656212B1 (en) 2004-06-08 2010-02-02 Robert Paul Masleid Configurable delay chain with switching control for tail delay elements
US7635992B1 (en) 2004-06-08 2009-12-22 Robert Paul Masleid Configurable tapered delay chain with multiple sizes of delay elements
US7498846B1 (en) 2004-06-08 2009-03-03 Transmeta Corporation Power efficient multiplexer
US7336103B1 (en) * 2004-06-08 2008-02-26 Transmeta Corporation Stacked inverter delay chain
US7304503B2 (en) * 2004-06-08 2007-12-04 Transmeta Corporation Repeater circuit with high performance repeater mode and normal repeater mode, wherein high performance repeater mode has fast reset capability
US7405597B1 (en) * 2005-06-30 2008-07-29 Transmeta Corporation Advanced repeater with duty cycle adjustment
US7173455B2 (en) 2004-06-08 2007-02-06 Transmeta Corporation Repeater circuit having different operating and reset voltage ranges, and methods thereof
US7142018B2 (en) 2004-06-08 2006-11-28 Transmeta Corporation Circuits and methods for detecting and assisting wire transitions
US7071747B1 (en) * 2004-06-15 2006-07-04 Transmeta Corporation Inverting zipper repeater circuit
US7330080B1 (en) 2004-11-04 2008-02-12 Transmeta Corporation Ring based impedance control of an output driver
US7592842B2 (en) * 2004-12-23 2009-09-22 Robert Paul Masleid Configurable delay chain with stacked inverter delay elements
US7739531B1 (en) 2005-03-04 2010-06-15 Nvidia Corporation Dynamic voltage scaling
US20070013425A1 (en) * 2005-06-30 2007-01-18 Burr James B Lower minimum retention voltage storage elements
US7663408B2 (en) * 2005-06-30 2010-02-16 Robert Paul Masleid Scannable dynamic circuit latch
US7394681B1 (en) 2005-11-14 2008-07-01 Transmeta Corporation Column select multiplexer circuit for a domino random access memory array
US7642866B1 (en) 2005-12-30 2010-01-05 Robert Masleid Circuits, systems and methods relating to a dynamic dual domino ring oscillator
US7414485B1 (en) * 2005-12-30 2008-08-19 Transmeta Corporation Circuits, systems and methods relating to dynamic ring oscillators
US7710153B1 (en) * 2006-06-30 2010-05-04 Masleid Robert P Cross point switch
US7495466B1 (en) * 2006-06-30 2009-02-24 Transmeta Corporation Triple latch flip flop system and method
US9134782B2 (en) 2007-05-07 2015-09-15 Nvidia Corporation Maintaining optimum voltage supply to match performance of an integrated circuit
US8370663B2 (en) * 2008-02-11 2013-02-05 Nvidia Corporation Power management with dynamic frequency adjustments
US9256265B2 (en) 2009-12-30 2016-02-09 Nvidia Corporation Method and system for artificially and dynamically limiting the framerate of a graphics processing unit
US9830889B2 (en) 2009-12-31 2017-11-28 Nvidia Corporation Methods and system for artifically and dynamically limiting the display resolution of an application
US8839006B2 (en) 2010-05-28 2014-09-16 Nvidia Corporation Power consumption reduction systems and methods
US8599512B2 (en) 2011-09-16 2013-12-03 Western Digital Technologies, Inc. Current sensor comprising differential amplifier biased by leakage current
US8681442B2 (en) 2012-05-11 2014-03-25 Western Digital Technologies, Inc. Disk drive comprising extended range head proximity sensor
US9336343B2 (en) 2014-02-28 2016-05-10 International Business Machines Corporation Calculating circuit-level leakage using three dimensional technology computer aided design and a reduced number of transistors

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US3865648A (en) * 1972-01-07 1975-02-11 Ibm Method of making a common emitter transistor integrated circuit structure
DE2203247C3 (de) * 1972-01-24 1980-02-28 Siemens Ag, 1000 Berlin Und 8000 Muenchen Halbleiterbauelement mit steuerbarer Dämpfung sowie Schaltungsanordnung zu dessen Betrieb
US3795859A (en) * 1972-07-03 1974-03-05 Ibm Method and apparatus for determining the electrical characteristics of a memory cell having field effect transistors
US3904962A (en) * 1974-10-21 1975-09-09 Bell Telephone Labor Inc Impatt diode testing
US3952257A (en) * 1974-10-29 1976-04-20 Rca Corporation Current proportioning circuits
US4081822A (en) * 1975-06-30 1978-03-28 Signetics Corporation Threshold integrated injection logic
US4055773A (en) * 1975-12-22 1977-10-25 Precision Monolithics, Inc. Multistage electrical ladder for decrementing a signal into a plurality of weighted signals
US4015203A (en) * 1975-12-31 1977-03-29 International Business Machines Corporation Contactless LSI junction leakage testing method
US4068254A (en) * 1976-12-13 1978-01-10 Precision Monolithics, Inc. Integrated FET circuit with input current cancellation
DE2712369C2 (de) * 1977-03-22 1981-09-24 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Oszillator zur Erzeugung von Rechteckimpulsen
CA1097752A (en) * 1978-02-03 1981-03-17 Tohru Nakamura Current mirror circuit
JPS5633566A (en) * 1979-08-28 1981-04-04 Pioneer Electronic Corp Direct viewing device for characteristic of voltage variable capacity diode
US4323795A (en) * 1980-02-12 1982-04-06 Analog Devices, Incorporated Bias current network for IC digital-to-analog converters and the like
JPS5765014A (en) * 1980-10-07 1982-04-20 Matsushita Electric Ind Co Ltd Digital control attenuator
JPS586035A (ja) * 1981-06-30 1983-01-13 シャープ株式会社 電圧源回路
JPS59715A (ja) * 1982-06-25 1984-01-05 Mitsubishi Electric Corp 定電流分割回路
JPS595322A (ja) * 1982-07-01 1984-01-12 Matsushita Electric Ind Co Ltd 定電流源回路

Also Published As

Publication number Publication date
EP0246433B1 (de) 1992-08-05
JPS62251671A (ja) 1987-11-02
EP0246433A1 (de) 1987-11-25
US4739252A (en) 1988-04-19
JPH0543272B2 (de) 1993-07-01
DE3780861T2 (de) 1993-03-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee