DE3789636D1 - Infrarot-gasanalysiereinrichtung mit automatischer nulleinstellung. - Google Patents

Infrarot-gasanalysiereinrichtung mit automatischer nulleinstellung.

Info

Publication number
DE3789636D1
DE3789636D1 DE3789636T DE3789636T DE3789636D1 DE 3789636 D1 DE3789636 D1 DE 3789636D1 DE 3789636 T DE3789636 T DE 3789636T DE 3789636 T DE3789636 T DE 3789636T DE 3789636 D1 DE3789636 D1 DE 3789636D1
Authority
DE
Germany
Prior art keywords
gas analyzer
infrared gas
zero adjustment
automatic zero
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3789636T
Other languages
English (en)
Other versions
DE3789636T2 (de
Inventor
Robert Eugene Passaro
Raymond Earl Rogers
Craig James Griffith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Andros Inc
Original Assignee
Andros Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Andros Inc filed Critical Andros Inc
Publication of DE3789636D1 publication Critical patent/DE3789636D1/de
Application granted granted Critical
Publication of DE3789636T2 publication Critical patent/DE3789636T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3159—Special features of multiplexing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3166—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using separate detectors and filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/126—Microprocessor processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/1273—Check triggered by sensing conditions, e.g. ambient changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12769—Calibration values determination and adjusting controls, e.g. zero and 100 %
DE3789636T 1986-01-10 1987-01-09 Infrarot-gasanalysiereinrichtung mit automatischer nulleinstellung. Expired - Fee Related DE3789636T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/818,342 US4687934A (en) 1986-01-10 1986-01-10 Infrared gas analyzer with automatic zero adjustment
PCT/US1987/000051 WO1987004240A1 (en) 1986-01-10 1987-01-09 Infrared gas analyzer with automatic zero adjustment

Publications (2)

Publication Number Publication Date
DE3789636D1 true DE3789636D1 (de) 1994-05-26
DE3789636T2 DE3789636T2 (de) 1994-08-25

Family

ID=25225311

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3789636T Expired - Fee Related DE3789636T2 (de) 1986-01-10 1987-01-09 Infrarot-gasanalysiereinrichtung mit automatischer nulleinstellung.

Country Status (4)

Country Link
US (1) US4687934A (de)
EP (1) EP0253872B1 (de)
DE (1) DE3789636T2 (de)
WO (1) WO1987004240A1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4918311A (en) * 1988-04-15 1990-04-17 Andros Analyzers Incorporated Set point control circuit for an infrared gas analyzer
US4970671A (en) * 1988-12-20 1990-11-13 Trebor Industries, Inc. Bias drift compensation in near infrared quantitative analysis instruments
JPH0774784B2 (ja) * 1989-05-20 1995-08-09 株式会社堀場製作所 赤外線分析計
US5060505A (en) * 1989-09-12 1991-10-29 Sensors, Inc. Non-dispersive infrared gas analyzer system
US5184017A (en) * 1989-09-12 1993-02-02 Sensors, Inc. Method and apparatus for detecting a component gas in a sample
US5332901A (en) * 1991-03-15 1994-07-26 Li-Cor, Inc. Gas analyzing apparatus and method for simultaneous measurement of carbon dioxide and water
US5335534A (en) * 1992-06-08 1994-08-09 Gaztech International Corporation Functional testing method for toxic gas sensors
US5510269A (en) * 1992-11-20 1996-04-23 Sensors, Inc. Infrared method and apparatus for measuring gas concentration including electronic calibration
US5376163A (en) * 1993-05-18 1994-12-27 Andros Incorporated Filter system
FI935788A0 (fi) * 1993-12-22 1993-12-22 Instrumentarium Oy Foerfarande foer kalibrering av en gasanalysator
US5464983A (en) * 1994-04-05 1995-11-07 Industrial Scientific Corporation Method and apparatus for determining the concentration of a gas
US5709082A (en) * 1994-06-27 1998-01-20 General Motors Corporation Modulation schemes for on-board diagnostic exhaust system
US5585635A (en) * 1994-09-26 1996-12-17 Marquette Electronics, Inc. Infrared gas analyzer and method
US5621166A (en) * 1995-04-06 1997-04-15 Ford Motor Company Exhaust emissions analysis apparatus and method
US5604298A (en) * 1995-12-07 1997-02-18 In Usa, Inc. Gas measurement system
US6114700A (en) * 1998-03-31 2000-09-05 Anatel Corporation NDIR instrument
US6750444B2 (en) 2000-12-29 2004-06-15 Spx Corporation Apparatus and method for measuring vehicle speed and/or acceleration
US6561027B2 (en) 2000-12-29 2003-05-13 Spx Corporation Support structure for system for measuring vehicle speed and/or acceleration
US6781110B2 (en) * 2000-12-29 2004-08-24 Spx Corporation Apparatus and method for measuring vehicle speed and/or acceleration
US6745613B2 (en) 2001-08-13 2004-06-08 Spx Corporation Method and system for determining the type of fuel used to power a vehicle
US6857262B2 (en) 2001-08-16 2005-02-22 Spx Corporation Catalytic converter function detection
US7183945B2 (en) * 2001-08-17 2007-02-27 Spx Corporation Method and system for video capture of vehicle information
US20030034889A1 (en) 2001-08-20 2003-02-20 Rendahl Craig S. Host system and method for sensed vehicle data
US6744516B2 (en) * 2001-08-21 2004-06-01 Spx Corporation Optical path structure for open path emissions sensing
US6757607B2 (en) 2001-08-23 2004-06-29 Spx Corporation Audit vehicle and audit method for remote emissions sensing
US7043958B2 (en) * 2002-09-27 2006-05-16 Spx Corporation Gas analyzer automated purge/zero process
WO2007059263A2 (en) * 2005-11-16 2007-05-24 Cardiopulmonary Technologies, Inc, Side-stream respiratory gas monitoring system and method
CN103163102B (zh) * 2011-12-09 2017-07-18 深圳迈瑞生物医疗电子股份有限公司 一种气体测量方法、设备及干扰气体补偿装置
RU174321U1 (ru) * 2017-05-16 2017-10-11 Андрей Иванович Иващенко Газоанализатор портативный

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2829268A (en) * 1952-05-05 1958-04-01 Industrial Nucleonics Corp Standardization system
BE691870A (de) * 1966-01-18 1967-05-29
US3812330A (en) * 1972-08-18 1974-05-21 Dasibi Corp Automatic calibration circuit for gas analyzers
US3979589A (en) * 1973-11-29 1976-09-07 Finn Bergishagen Method and system for the infrared analysis of gases
US4013260A (en) * 1974-09-27 1977-03-22 Andros, Incorporated Gas analyzer
US4028534A (en) * 1976-04-14 1977-06-07 The United States Of America As Represented By The Secretary Of The Army Automatic span circuit
US4233513A (en) * 1978-10-05 1980-11-11 Andros Incorporated Gas analyzer
US4346296A (en) * 1980-08-15 1982-08-24 Andros Analyzers Incorporated Non-dispersive infrared gas analyzer
DE3117757A1 (de) * 1981-05-05 1982-11-25 Hekatron GmbH, 7811 Sulzburg "verfahren und system zum ermitteln eines aerosols, wie rauch, in einem gasfoermigen medium"
US4398091A (en) * 1981-08-24 1983-08-09 Andros Analyzers Incorporated Temperature compensated gas analyzer
US4480190A (en) * 1982-05-20 1984-10-30 Andros Analyzers Incorporated Non-dispersive infrared gas analyzer

Also Published As

Publication number Publication date
WO1987004240A1 (en) 1987-07-16
EP0253872A4 (de) 1990-04-10
US4687934A (en) 1987-08-18
EP0253872A1 (de) 1988-01-27
EP0253872B1 (de) 1994-04-20
DE3789636T2 (de) 1994-08-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee