DE3872446T2 - Vorspannungseinrichtung, um eine spannungsunabhaengige kapazitanz zu verwirklichen. - Google Patents

Vorspannungseinrichtung, um eine spannungsunabhaengige kapazitanz zu verwirklichen.

Info

Publication number
DE3872446T2
DE3872446T2 DE8888106663T DE3872446T DE3872446T2 DE 3872446 T2 DE3872446 T2 DE 3872446T2 DE 8888106663 T DE8888106663 T DE 8888106663T DE 3872446 T DE3872446 T DE 3872446T DE 3872446 T2 DE3872446 T2 DE 3872446T2
Authority
DE
Germany
Prior art keywords
voltage
tension device
free capacity
capacity
free
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888106663T
Other languages
English (en)
Other versions
DE3872446D1 (de
Inventor
Charles Reeves Hoffmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3872446D1 publication Critical patent/DE3872446D1/de
Publication of DE3872446T2 publication Critical patent/DE3872446T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/0805—Capacitors only
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
DE8888106663T 1987-05-15 1988-04-26 Vorspannungseinrichtung, um eine spannungsunabhaengige kapazitanz zu verwirklichen. Expired - Fee Related DE3872446T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/049,914 US4786828A (en) 1987-05-15 1987-05-15 Bias scheme for achieving voltage independent capacitance

Publications (2)

Publication Number Publication Date
DE3872446D1 DE3872446D1 (de) 1992-08-06
DE3872446T2 true DE3872446T2 (de) 1993-02-11

Family

ID=21962427

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888106663T Expired - Fee Related DE3872446T2 (de) 1987-05-15 1988-04-26 Vorspannungseinrichtung, um eine spannungsunabhaengige kapazitanz zu verwirklichen.

Country Status (4)

Country Link
US (1) US4786828A (de)
EP (1) EP0290857B1 (de)
JP (1) JPS63293968A (de)
DE (1) DE3872446T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5384502A (en) * 1993-06-24 1995-01-24 Intel Corporation Phase locked loop circuitry with split loop filter
JP2684976B2 (ja) * 1993-11-24 1997-12-03 日本電気株式会社 半導体装置
DE4447307A1 (de) * 1994-12-31 1996-07-04 Bosch Gmbh Robert Schaltungsanordnung zur Verminderung der Spannungsabhängigkeit einer MOS-Kapazität
US5926064A (en) * 1998-01-23 1999-07-20 National Semiconductor Corporation Floating MOS capacitor
US6262469B1 (en) * 1998-03-25 2001-07-17 Advanced Micro Devices, Inc. Capacitor for use in a capacitor divider that has a floating gate transistor as a corresponding capacitor
US6020616A (en) * 1998-03-31 2000-02-01 Vlsi Technology, Inc. Automated design of on-chip capacitive structures for suppressing inductive noise
US6010939A (en) 1998-03-31 2000-01-04 Vlsi Technology, Inc. Methods for making shallow trench capacitive structures
US6153463A (en) * 1999-07-09 2000-11-28 Macronix International Co., Ltd. Triple plate capacitor and method for manufacturing
DE19961487B4 (de) * 1999-09-30 2005-08-04 Infineon Technologies Ag Schaltungsanordnung zur Bildung eines MOS-Kondensators mit geringer Spannungsabhängigkeit und geringem Flächenbedarf
EP1218945A1 (de) 1999-09-30 2002-07-03 Infineon Technologies AG Schaltungsanordnung zur bildung eines mos-kondensators mit geringer spannungsabhängigkeit und geringem flächenbedarf
US6667539B2 (en) * 2001-11-08 2003-12-23 International Business Machines Corporation Method to increase the tuning voltage range of MOS varactors
US20040206999A1 (en) * 2002-05-09 2004-10-21 Impinj, Inc., A Delaware Corporation Metal dielectric semiconductor floating gate variable capacitor
US7728362B2 (en) 2006-01-20 2010-06-01 International Business Machines Corporation Creating integrated circuit capacitance from gate array structures

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3109995A (en) * 1959-09-01 1963-11-05 Hughes Aircraft Co Voltage tuned oscillator
US3139596A (en) * 1962-05-09 1964-06-30 Bell Telephone Labor Inc Phase modulation by nonlinear voltagesensitive capacitor with preservation of modulation index
NL298376A (de) * 1962-09-28
US3559104A (en) * 1968-08-26 1971-01-26 Trw Inc Wideband crystal-controlled fm modulator having noise cancelling feedback
US3582823A (en) * 1969-02-24 1971-06-01 Fairchild Camera Instr Co Voltage controlled oscillator in which capacitive diodes become resistive during portions of each cycle
US3586929A (en) * 1969-03-27 1971-06-22 Philips Corp Semiconductor device having two varicap diodes arranged back to back
US3569865A (en) * 1969-06-12 1971-03-09 Us Navy High stability voltage-controlled crystal oscillator
US3962713A (en) * 1972-06-02 1976-06-08 Texas Instruments Incorporated Large value capacitor
NL7215200A (de) * 1972-11-10 1974-05-14
CA1007308A (en) * 1972-12-29 1977-03-22 Jack A. Dorler Cross-coupled capacitor for ac performance tuning
US4017885A (en) * 1973-10-25 1977-04-12 Texas Instruments Incorporated Large value capacitor
SE379461B (de) * 1974-07-26 1975-10-06 Ericsson Telefon Ab L M
US4003004A (en) * 1975-04-09 1977-01-11 Nasa Frequency modulated oscillator
US4005466A (en) * 1975-05-07 1977-01-25 Rca Corporation Planar voltage variable tuning capacitors
DE2524171C2 (de) * 1975-05-31 1984-11-08 Telefunken electronic GmbH, 7100 Heilbronn Abstimmschaltung
US4214252A (en) * 1977-08-06 1980-07-22 U.S. Philips Corporation Semiconductor device having a MOS-capacitor
US4249194A (en) * 1977-08-29 1981-02-03 Texas Instruments Incorporated Integrated circuit MOS capacitor using implanted region to change threshold
US4698653A (en) * 1979-10-09 1987-10-06 Cardwell Jr Walter T Semiconductor devices controlled by depletion regions
JPS56129756U (de) * 1980-02-29 1981-10-02
NL8003874A (nl) * 1980-07-04 1982-02-01 Philips Nv Veldeffektcapaciteit.
FR2499766A1 (en) * 1981-02-11 1982-08-13 Texas Instruments France NMOS integrated circuit capacitors using poly-silicon gates - uses auxiliary ion implant for capacitors and auto alignment diffusion for telephone analogue=to=digital converter
JPS6068662U (ja) * 1983-10-17 1985-05-15 三洋電機株式会社 集積化コンデンサ

Also Published As

Publication number Publication date
EP0290857B1 (de) 1992-07-01
JPH0558670B2 (de) 1993-08-27
EP0290857A1 (de) 1988-11-17
DE3872446D1 (de) 1992-08-06
US4786828A (en) 1988-11-22
JPS63293968A (ja) 1988-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee