DE3877862D1 - Bestimmung der ausrichtung von bauteilen. - Google Patents
Bestimmung der ausrichtung von bauteilen.Info
- Publication number
- DE3877862D1 DE3877862D1 DE8888307805T DE3877862T DE3877862D1 DE 3877862 D1 DE3877862 D1 DE 3877862D1 DE 8888307805 T DE8888307805 T DE 8888307805T DE 3877862 T DE3877862 T DE 3877862T DE 3877862 D1 DE3877862 D1 DE 3877862D1
- Authority
- DE
- Germany
- Prior art keywords
- orientation
- determining
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/089,638 US4779043A (en) | 1987-08-26 | 1987-08-26 | Reversed IC test device and method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3877862D1 true DE3877862D1 (de) | 1993-03-11 |
DE3877862T2 DE3877862T2 (de) | 1993-08-26 |
Family
ID=22218754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8888307805T Expired - Fee Related DE3877862T2 (de) | 1987-08-26 | 1988-08-23 | Bestimmung der ausrichtung von bauteilen. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4779043A (de) |
EP (1) | EP0305148B1 (de) |
JP (1) | JP2664429B2 (de) |
KR (1) | KR920002874B1 (de) |
DE (1) | DE3877862T2 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4964737A (en) * | 1989-03-17 | 1990-10-23 | Ibm | Removable thermocouple template for monitoring temperature of multichip modules |
US5045782A (en) * | 1990-01-23 | 1991-09-03 | Hewlett-Packard Company | Negative feedback high current driver for in-circuit tester |
KR920007535B1 (ko) * | 1990-05-23 | 1992-09-05 | 삼성전자 주식회사 | 식별회로를 구비한 반도체 집적회로 칩 |
US5265099A (en) * | 1991-02-28 | 1993-11-23 | Feinstein David Y | Method for heating dynamic memory units whereby |
US5132612A (en) * | 1991-03-14 | 1992-07-21 | The United States Of America As Represented By The Secretary Of The Air Force | Apparatus for electrostatic discharge (ESD) stress/testing |
DE4110551C1 (de) * | 1991-03-30 | 1992-07-23 | Ita Ingenieurbuero Fuer Testaufgaben Gmbh, 2000 Hamburg, De | |
JP2969391B2 (ja) * | 1991-05-24 | 1999-11-02 | 株式会社新川 | ボンド点極性設定装置 |
US5426361A (en) * | 1991-09-09 | 1995-06-20 | Simmons; Selwyn D. | Electronic reconfigurable interconnect system |
US5355082A (en) * | 1992-03-27 | 1994-10-11 | Tandy Corporation | Automatic transistor checker |
GB9212646D0 (en) * | 1992-06-15 | 1992-07-29 | Marconi Instruments Ltd | A method of and equipment for testing the electrical conductivity of a connection |
DE4319710C1 (de) * | 1993-06-15 | 1994-09-29 | Ita Ingb Testaufgaben Gmbh | Testverfahren für einen auf einer Platine eingelöteten IC und Testvorrichtung zum Durchführen des Testverfahrens |
US5521513A (en) * | 1994-10-25 | 1996-05-28 | Teradyne Inc | Manufacturing defect analyzer |
US6429670B2 (en) * | 1995-07-18 | 2002-08-06 | Murata Manufacturing Co., Ltd. | Method of examining posture of an electronic part |
US5811980A (en) * | 1995-08-21 | 1998-09-22 | Genrad, Inc. | Test system for determining the orientation of components on a circuit board |
US5786700A (en) * | 1996-05-20 | 1998-07-28 | International Business Machines Corporation | Method for determining interconnection resistance of wire leads in electronic packages |
US5818251A (en) * | 1996-06-11 | 1998-10-06 | National Semiconductor Corporation | Apparatus and method for testing the connections between an integrated circuit and a printed circuit board |
US6005385A (en) * | 1996-06-24 | 1999-12-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Test board circuit for detecting tester malfunction and protecting devices under test |
KR100479501B1 (ko) * | 1997-09-13 | 2005-07-08 | 삼성전자주식회사 | 엘씨디구동용인쇄회로기판의테스트시스템 |
EP0927888B1 (de) * | 1997-12-29 | 2004-09-29 | Deutsche Thomson Brandt | Photodiodendetektorschaltung zur automatischen Anpassung an Vorwärtsvorspannung oder umgekehrter Vorspannung |
EP0928971A1 (de) * | 1997-12-29 | 1999-07-14 | Deutsche Thomson Brandt | Photodiodendetektorschaltung zur automatischen Anpassung an Vorwärtsvorspannung oder umgekehrter Vorspannung |
EP1203518B1 (de) * | 1999-08-12 | 2003-01-22 | Siemens Aktiengesellschaft | Verfahren zum erkennen der lage oder der oberflächenstruktur eines gegenstands und anwendung des verfahrens sowie eine maschine zur verarbeitung von gegenständen |
KR100684842B1 (ko) * | 2004-12-10 | 2007-02-20 | 삼성에스디아이 주식회사 | 플라즈마 표시 장치 및 그 검사 방법 |
NL2009490C2 (en) * | 2012-09-19 | 2014-03-20 | Prodrive B V | Testing device for printed circuit boards. |
DE102013208690A1 (de) * | 2013-05-13 | 2014-11-13 | Robert Bosch Gmbh | Verfahren und Vorrichtung zum Erkennen einer Polung einer Freilaufdiode, Aktuatorschaltung und Sicherheitsvorrichtung für ein Fahrzeug |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1376595A (en) * | 1970-10-29 | 1974-12-04 | Gen Electric Co Ltd | Methods of testing electric circuit arrangements |
US3995215A (en) * | 1974-06-26 | 1976-11-30 | International Business Machines Corporation | Test technique for semiconductor memory array |
US3969670A (en) * | 1975-06-30 | 1976-07-13 | International Business Machines Corporation | Electron beam testing of integrated circuits |
GB1512950A (en) * | 1975-07-28 | 1978-06-01 | Plessey Co Ltd | Electrical testing apparatus |
JPS6010400B2 (ja) * | 1980-10-09 | 1985-03-16 | 富士通株式会社 | 半導体集積回路装置 |
US4418403A (en) * | 1981-02-02 | 1983-11-29 | Mostek Corporation | Semiconductor memory cell margin test circuit |
JPS5853775A (ja) * | 1981-09-26 | 1983-03-30 | Fujitsu Ltd | Icメモリ試験方法 |
JPS5891594A (ja) * | 1981-11-27 | 1983-05-31 | Fujitsu Ltd | ダイナミツク型半導体記憶装置 |
US4502140A (en) * | 1983-07-25 | 1985-02-26 | Mostek Corporation | GO/NO GO margin test circuit for semiconductor memory |
GB8428405D0 (en) * | 1984-11-09 | 1984-12-19 | Membrain Ltd | Automatic test equipment |
US4719418A (en) * | 1985-02-19 | 1988-01-12 | International Business Machines Corporation | Defect leakage screen system |
EP0195839B1 (de) * | 1985-03-29 | 1989-08-09 | Ibm Deutschland Gmbh | Stabilitätsprüfung für Halbleiterspeicher |
-
1987
- 1987-08-26 US US07/089,638 patent/US4779043A/en not_active Expired - Lifetime
-
1988
- 1988-08-23 EP EP88307805A patent/EP0305148B1/de not_active Expired - Lifetime
- 1988-08-23 DE DE8888307805T patent/DE3877862T2/de not_active Expired - Fee Related
- 1988-08-25 KR KR1019880010811A patent/KR920002874B1/ko not_active IP Right Cessation
- 1988-08-26 JP JP63212337A patent/JP2664429B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4779043A (en) | 1988-10-18 |
JPH01112179A (ja) | 1989-04-28 |
JP2664429B2 (ja) | 1997-10-15 |
KR890004171A (ko) | 1989-04-20 |
EP0305148B1 (de) | 1993-01-27 |
EP0305148A1 (de) | 1989-03-01 |
DE3877862T2 (de) | 1993-08-26 |
KR920002874B1 (ko) | 1992-04-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |