DE3880216T2 - Spannungsdetektor. - Google Patents

Spannungsdetektor.

Info

Publication number
DE3880216T2
DE3880216T2 DE8888110409T DE3880216T DE3880216T2 DE 3880216 T2 DE3880216 T2 DE 3880216T2 DE 8888110409 T DE8888110409 T DE 8888110409T DE 3880216 T DE3880216 T DE 3880216T DE 3880216 T2 DE3880216 T2 DE 3880216T2
Authority
DE
Germany
Prior art keywords
voltage detector
detector
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888110409T
Other languages
English (en)
Other versions
DE3880216D1 (de
Inventor
Shinichiro C O Hamamat Aoshima
Yutaka C O Hamamatsu Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE3880216D1 publication Critical patent/DE3880216D1/de
Application granted granted Critical
Publication of DE3880216T2 publication Critical patent/DE3880216T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/07Non contact-making probes
    • G01R1/071Non contact-making probes containing electro-optic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
DE8888110409T 1987-06-30 1988-06-29 Spannungsdetektor. Expired - Fee Related DE3880216T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62163540A JPH0830720B2 (ja) 1987-06-30 1987-06-30 電圧検出装置

Publications (2)

Publication Number Publication Date
DE3880216D1 DE3880216D1 (de) 1993-05-19
DE3880216T2 true DE3880216T2 (de) 1993-08-26

Family

ID=15775825

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888110409T Expired - Fee Related DE3880216T2 (de) 1987-06-30 1988-06-29 Spannungsdetektor.

Country Status (4)

Country Link
US (1) US4891579A (de)
EP (1) EP0297562B1 (de)
JP (1) JPH0830720B2 (de)
DE (1) DE3880216T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3683053D1 (de) * 1986-10-23 1992-01-30 Ibm Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen.
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
JP2598458B2 (ja) * 1988-05-31 1997-04-09 浜松ホトニクス株式会社 電気信号観測装置
US5025209A (en) * 1988-06-30 1991-06-18 Victor Company Of Japan, Ltd. Apparatus for detecting surface potential distribution
JP2556910B2 (ja) * 1989-11-30 1996-11-27 浜松ホトニクス株式会社 光強度変化検出装置
JP2655748B2 (ja) * 1990-10-25 1997-09-24 浜松ホトニクス株式会社 電気波形測定方法及び装置
US5499190A (en) * 1992-01-16 1996-03-12 Hamamatsu Photonics K.K. System for measuring timing relationship between two signals
JP3220252B2 (ja) * 1992-09-10 2001-10-22 浜松ホトニクス株式会社 Eoプローブ
JPH0798329A (ja) * 1993-09-28 1995-04-11 Hamamatsu Photonics Kk E−oプローブ
US5408092A (en) * 1993-12-09 1995-04-18 Simmonds Precision Products, Inc. Multiple optic sensor system
JP3317801B2 (ja) * 1994-01-12 2002-08-26 浜松ホトニクス株式会社 2次元電圧検出装置
JP3462272B2 (ja) * 1994-09-07 2003-11-05 浜松ホトニクス株式会社 アレイ電極基板の検査装置
JPH08146051A (ja) * 1994-11-21 1996-06-07 Nec Corp Eoプローブ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4070621A (en) * 1976-07-23 1978-01-24 The United States Of America As Represented By The Department Of Health, Education And Welfare Antenna with electro-optical modulator
JPS5832171A (ja) * 1981-07-27 1983-02-25 Sumitomo Electric Ind Ltd 光応用電圧電界センサ
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4681447A (en) * 1984-03-16 1987-07-21 Hewlett Packard Company Interferometer apparatus and method for determining the spatial relationship of two or more objects
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
FR2574940B1 (fr) * 1984-12-14 1987-08-14 Thomson Csf Dispositif echantillonneur photonique et systeme d'analyse de transitoires utilisant un tel dispositif
US4660978A (en) * 1984-12-19 1987-04-28 Hughes Aircraft Company Direct slope measurement shearing interferometer
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich

Also Published As

Publication number Publication date
JPS649370A (en) 1989-01-12
EP0297562A3 (en) 1990-07-25
EP0297562B1 (de) 1993-04-14
DE3880216D1 (de) 1993-05-19
US4891579A (en) 1990-01-02
JPH0830720B2 (ja) 1996-03-27
EP0297562A2 (de) 1989-01-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee