DE3880216T2 - Spannungsdetektor. - Google Patents
Spannungsdetektor.Info
- Publication number
- DE3880216T2 DE3880216T2 DE8888110409T DE3880216T DE3880216T2 DE 3880216 T2 DE3880216 T2 DE 3880216T2 DE 8888110409 T DE8888110409 T DE 8888110409T DE 3880216 T DE3880216 T DE 3880216T DE 3880216 T2 DE3880216 T2 DE 3880216T2
- Authority
- DE
- Germany
- Prior art keywords
- voltage detector
- detector
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62163540A JPH0830720B2 (ja) | 1987-06-30 | 1987-06-30 | 電圧検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3880216D1 DE3880216D1 (de) | 1993-05-19 |
DE3880216T2 true DE3880216T2 (de) | 1993-08-26 |
Family
ID=15775825
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8888110409T Expired - Fee Related DE3880216T2 (de) | 1987-06-30 | 1988-06-29 | Spannungsdetektor. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4891579A (de) |
EP (1) | EP0297562B1 (de) |
JP (1) | JPH0830720B2 (de) |
DE (1) | DE3880216T2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3683053D1 (de) * | 1986-10-23 | 1992-01-30 | Ibm | Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen. |
US5272434A (en) * | 1987-06-20 | 1993-12-21 | Schlumberger Technologies, Inc. | Method and apparatus for electro-optically testing circuits |
JP2598458B2 (ja) * | 1988-05-31 | 1997-04-09 | 浜松ホトニクス株式会社 | 電気信号観測装置 |
US5025209A (en) * | 1988-06-30 | 1991-06-18 | Victor Company Of Japan, Ltd. | Apparatus for detecting surface potential distribution |
JP2556910B2 (ja) * | 1989-11-30 | 1996-11-27 | 浜松ホトニクス株式会社 | 光強度変化検出装置 |
JP2655748B2 (ja) * | 1990-10-25 | 1997-09-24 | 浜松ホトニクス株式会社 | 電気波形測定方法及び装置 |
US5499190A (en) * | 1992-01-16 | 1996-03-12 | Hamamatsu Photonics K.K. | System for measuring timing relationship between two signals |
JP3220252B2 (ja) * | 1992-09-10 | 2001-10-22 | 浜松ホトニクス株式会社 | Eoプローブ |
JPH0798329A (ja) * | 1993-09-28 | 1995-04-11 | Hamamatsu Photonics Kk | E−oプローブ |
US5408092A (en) * | 1993-12-09 | 1995-04-18 | Simmonds Precision Products, Inc. | Multiple optic sensor system |
JP3317801B2 (ja) * | 1994-01-12 | 2002-08-26 | 浜松ホトニクス株式会社 | 2次元電圧検出装置 |
JP3462272B2 (ja) * | 1994-09-07 | 2003-11-05 | 浜松ホトニクス株式会社 | アレイ電極基板の検査装置 |
JPH08146051A (ja) * | 1994-11-21 | 1996-06-07 | Nec Corp | Eoプローブ |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4070621A (en) * | 1976-07-23 | 1978-01-24 | The United States Of America As Represented By The Department Of Health, Education And Welfare | Antenna with electro-optical modulator |
JPS5832171A (ja) * | 1981-07-27 | 1983-02-25 | Sumitomo Electric Ind Ltd | 光応用電圧電界センサ |
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
US4681447A (en) * | 1984-03-16 | 1987-07-21 | Hewlett Packard Company | Interferometer apparatus and method for determining the spatial relationship of two or more objects |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4603293A (en) * | 1984-03-27 | 1986-07-29 | University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
FR2574940B1 (fr) * | 1984-12-14 | 1987-08-14 | Thomson Csf | Dispositif echantillonneur photonique et systeme d'analyse de transitoires utilisant un tel dispositif |
US4660978A (en) * | 1984-12-19 | 1987-04-28 | Hughes Aircraft Company | Direct slope measurement shearing interferometer |
EP0197196A1 (de) * | 1985-03-08 | 1986-10-15 | The University Of Rochester | Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich |
-
1987
- 1987-06-30 JP JP62163540A patent/JPH0830720B2/ja not_active Expired - Fee Related
-
1988
- 1988-06-29 DE DE8888110409T patent/DE3880216T2/de not_active Expired - Fee Related
- 1988-06-29 EP EP88110409A patent/EP0297562B1/de not_active Expired - Lifetime
- 1988-06-29 US US07/212,984 patent/US4891579A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS649370A (en) | 1989-01-12 |
EP0297562A3 (en) | 1990-07-25 |
EP0297562B1 (de) | 1993-04-14 |
DE3880216D1 (de) | 1993-05-19 |
US4891579A (en) | 1990-01-02 |
JPH0830720B2 (ja) | 1996-03-27 |
EP0297562A2 (de) | 1989-01-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |