DE3880854T2 - Optische Achsenverschiebungsfühler. - Google Patents

Optische Achsenverschiebungsfühler.

Info

Publication number
DE3880854T2
DE3880854T2 DE88101956T DE3880854T DE3880854T2 DE 3880854 T2 DE3880854 T2 DE 3880854T2 DE 88101956 T DE88101956 T DE 88101956T DE 3880854 T DE3880854 T DE 3880854T DE 3880854 T2 DE3880854 T2 DE 3880854T2
Authority
DE
Germany
Prior art keywords
optical axis
displacement sensor
axis displacement
sensor
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88101956T
Other languages
English (en)
Other versions
DE3880854D1 (de
Inventor
Takashi Miyoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OKADA Inc
Original Assignee
OKADA Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OKADA Inc filed Critical OKADA Inc
Application granted granted Critical
Publication of DE3880854D1 publication Critical patent/DE3880854D1/de
Publication of DE3880854T2 publication Critical patent/DE3880854T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
DE88101956T 1987-02-10 1988-02-10 Optische Achsenverschiebungsfühler. Expired - Fee Related DE3880854T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62027084A JPH0652171B2 (ja) 1987-02-10 1987-02-10 光学式非接触位置測定装置

Publications (2)

Publication Number Publication Date
DE3880854D1 DE3880854D1 (de) 1993-06-17
DE3880854T2 true DE3880854T2 (de) 1993-12-23

Family

ID=12211209

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88101956T Expired - Fee Related DE3880854T2 (de) 1987-02-10 1988-02-10 Optische Achsenverschiebungsfühler.

Country Status (4)

Country Link
US (1) US4897536A (de)
EP (1) EP0279347B1 (de)
JP (1) JPH0652171B2 (de)
DE (1) DE3880854T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3920133A1 (de) * 1989-06-20 1991-01-03 Siemens Ag Optischer sensor zur untersuchung der lage und/oder der kontur eines objekts
WO1991000489A1 (fr) * 1989-06-28 1991-01-10 Michel Baikrich Dispositif de divergence et de marquage pour pointeur de cible
JPH03129310A (ja) * 1989-10-14 1991-06-03 Canon Inc 距離検出光学系
DE4024546C1 (de) * 1990-08-02 1991-11-14 Gebhard 7750 Konstanz De Birkle
JPH07117872B2 (ja) * 1991-04-22 1995-12-18 株式会社デジタルストリーム ワイヤレス方式コンピュータ入力装置
DE4222659C2 (de) * 1992-07-10 1995-09-21 Daimler Benz Aerospace Ag Abtastendes Hinderniswarngerät
JPH0642914A (ja) * 1992-07-24 1994-02-18 Canon Inc 変位測定装置
DE4339710C2 (de) * 1993-11-22 1997-02-13 Univ Schiller Jena Optoelektronische Abstandsmeßeinrichtung
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
JPH07209080A (ja) * 1993-12-28 1995-08-11 Amberg Measuring Technik Ltd 光学走査装置
DE4445535A1 (de) * 1994-12-20 1996-06-27 Tr Elektronic Gmbh Optischer Sensor zur berührungslosen Abstandserfassung
DE19606453C2 (de) * 1996-02-21 1998-07-16 Wagner Int Verfahren und Vorrichtung zum photothermischen Prüfen von Werkstücken
JP3019835B2 (ja) * 1998-04-22 2000-03-13 日本電気株式会社 焦点検出装置
JP3624887B2 (ja) * 2000-03-31 2005-03-02 オムロン株式会社 変位センサ
DE10211070A1 (de) * 2002-03-13 2003-09-25 Gurny Broesch Andrea Vorrichtung zum Vermessen eines Messobjekts
JP4121803B2 (ja) * 2002-08-08 2008-07-23 株式会社トプコン 光波距離測定装置
JP2004117161A (ja) * 2002-09-26 2004-04-15 Sharp Corp 光学式変位センサ
US8315834B2 (en) * 2003-12-17 2012-11-20 Siemens Energy, Inc. System and method for measuring coating thickness
TWI268339B (en) * 2005-05-25 2006-12-11 Ind Tech Res Inst Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter
US7768629B2 (en) * 2006-05-12 2010-08-03 Voith Patent Gmbh Device and process for optical distance measurement
CN103424071B (zh) * 2012-05-23 2016-02-10 北京理工大学 基于激光三角法的内孔测头固有几何参数标定方法
US8865824B2 (en) 2012-09-19 2014-10-21 IFS Industries Inc. Hot melt adhesive
US9277206B1 (en) 2013-01-28 2016-03-01 Cognex Corporation Dual-view laser-based three-dimensional capture system and method for employing the same
WO2016088203A1 (ja) * 2014-12-02 2016-06-09 三菱電機株式会社 変位センサ、変位検出装置及び変位検出方法
KR101690073B1 (ko) * 2015-12-28 2016-12-27 (주)해아림 컴팩트한 구조를 갖는 분광분석장치
US10969569B2 (en) 2015-12-28 2021-04-06 Wethe Lab Co., Ltd. Light source-integrated lens assembly and optical apparatus including the same
IT202000007837A1 (it) * 2020-04-14 2021-10-14 Tecnosens S P A Dispositivo di misura dimensionale non a contatto con risoluzione micrometrica

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617128A (en) * 1968-10-28 1971-11-02 Eastman Kodak Co Automatic rangefinder means
US3623811A (en) * 1970-10-30 1971-11-30 Eastman Kodak Co Electrooptical rangefinder means
US4204772A (en) * 1978-09-25 1980-05-27 Recognition Systems, Inc. Optical measuring system
US4211922A (en) * 1978-11-01 1980-07-08 Westinghouse Electric Corp. Heliostat guidance
JPS6049841B2 (ja) * 1980-07-16 1985-11-05 室蘭工業大学長 光学式非接触型検出装置
EP0071667A1 (de) * 1981-08-11 1983-02-16 Karl-Erik Morander Vorrichtung zur Bestimmung des reellen oder virtuellen Abstands einer Lichtquelle von einer Messebene
EP0096570B1 (de) * 1982-06-05 1988-08-24 Olympus Optical Co., Ltd. Optische Einrichtung zur Messung des Brennpunktes
JPS60125812A (ja) * 1983-12-12 1985-07-05 Canon Inc 合焦検出装置
US4753528A (en) * 1983-12-13 1988-06-28 Quantime, Inc. Laser archery distance device
JPS61155905A (ja) * 1984-12-28 1986-07-15 Rikagaku Kenkyusho 距離検出器
US4645347A (en) * 1985-04-30 1987-02-24 Canadian Patents And Development Limited-Societe Canadienne Des Brevets Et D'exploitation Limitee Three dimensional imaging device
GB2177793B (en) * 1985-06-28 1990-03-28 Ando Electric Reflected light type surface roughness analyzer
JPH0652170B2 (ja) * 1986-02-25 1994-07-06 株式会社オカダ 光結像式非接触位置測定装置
DE3774765D1 (de) * 1986-06-04 1992-01-09 Philips Nv Optische messanordnung des abstands zwischen einer oberflaeche und einer bezugsebene.
US4767934A (en) * 1986-07-02 1988-08-30 Honeywell Inc. Active ranging system

Also Published As

Publication number Publication date
EP0279347A3 (en) 1989-04-26
EP0279347A2 (de) 1988-08-24
US4897536A (en) 1990-01-30
JPS63195513A (ja) 1988-08-12
EP0279347B1 (de) 1993-05-12
JPH0652171B2 (ja) 1994-07-06
DE3880854D1 (de) 1993-06-17

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Legal Events

Date Code Title Description
8380 Miscellaneous part iii

Free format text: DER PATENTINHABER LAUTET RICHTIG: OKADA INC., SHIZUOKA, JP

8339 Ceased/non-payment of the annual fee