DE59611442D1 - Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung - Google Patents

Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung

Info

Publication number
DE59611442D1
DE59611442D1 DE59611442T DE59611442T DE59611442D1 DE 59611442 D1 DE59611442 D1 DE 59611442D1 DE 59611442 T DE59611442 T DE 59611442T DE 59611442 T DE59611442 T DE 59611442T DE 59611442 D1 DE59611442 D1 DE 59611442D1
Authority
DE
Germany
Prior art keywords
measurement
calibration
gas
filled
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE59611442T
Other languages
English (en)
Inventor
Eckhard Aidam
Johann Weinel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Application granted granted Critical
Publication of DE59611442D1 publication Critical patent/DE59611442D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/37—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
DE59611442T 1995-12-20 1996-11-26 Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung Expired - Lifetime DE59611442D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19547787A DE19547787C1 (de) 1995-12-20 1995-12-20 Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung

Publications (1)

Publication Number Publication Date
DE59611442D1 true DE59611442D1 (de) 2007-10-18

Family

ID=7780790

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19547787A Expired - Fee Related DE19547787C1 (de) 1995-12-20 1995-12-20 Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung
DE59611442T Expired - Lifetime DE59611442D1 (de) 1995-12-20 1996-11-26 Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19547787A Expired - Fee Related DE19547787C1 (de) 1995-12-20 1995-12-20 Zweistrahl-Gasanalysator und Verfahren zu seiner Kalibrierung

Country Status (4)

Country Link
US (1) US5764354A (de)
EP (1) EP0780681B1 (de)
AT (1) ATE372511T1 (de)
DE (2) DE19547787C1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19810483A1 (de) * 1998-03-11 1999-09-23 Bosch Gmbh Robert Verfahren zur Bestimmung des Sensor-Offsets bei HC- und/oder NOx-Sensoren
US6320192B1 (en) * 1998-05-29 2001-11-20 Horiba, Ltd. Detector for use in infrared analyzer, flow detector and manufacturing method thereof
DE19926121C2 (de) 1999-06-08 2001-10-18 Cs Halbleiter Solartech Analysegerät
FR2811761B1 (fr) * 2000-07-17 2002-10-11 Production Rech S Appliquees Ellipsometre a haute resolution spatiale fonctionnant dans l'infrarouge
US7307718B2 (en) * 2004-02-23 2007-12-11 Ortho-Clinical Diagnostics, Inc. Determining an analyte by multiple measurements through a cuvette
US20050185176A1 (en) * 2004-02-23 2005-08-25 Moran Donald J.Jr. Determining an analyte by multiple measurements through a cuvette
EP1640708A1 (de) * 2004-09-25 2006-03-29 Maihak Ag Zweistrahl-Gasanalysator
JP4411599B2 (ja) * 2004-10-26 2010-02-10 横河電機株式会社 赤外線ガス分析計および赤外線ガス分析方法
DE102004055741B4 (de) * 2004-11-18 2007-03-15 Siemens Ag Nichtdispersiver Infrarot-Gasanalysator nach dem Zweistrahl-Prinzip
CN100494983C (zh) * 2005-08-12 2009-06-03 深圳迈瑞生物医疗电子股份有限公司 利用红外光吸收特性自动校准和测量气体浓度的方法和装置
EP2142909B1 (de) * 2007-05-02 2015-08-26 Siemens Aktiengesellschaft Detektoranordnung für einen nichtdispersiven infrarot-gasanalysator und verfahren zum nachweis einer messgaskomponente in einem gasgemisch mittels eines solchen gasanalysators
CA2758757A1 (en) * 2009-04-14 2010-10-21 Airware, Inc. Saturation filtering ndir gas sensing methodology
DE102009017932B4 (de) 2009-04-20 2010-12-09 Gröger & Obst Vertriebs- und Service GmbH Verfahren zur kontinuierlichen quantitativen Bestimmung einer oxidierbaren chemischen Verbindung in einem Untersuchungsmedium
DE102009021829A1 (de) 2009-05-19 2010-11-25 Siemens Aktiengesellschaft NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators
DE102009059962B4 (de) * 2009-12-22 2011-09-01 Siemens Aktiengesellschaft NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators
US8358417B2 (en) * 2010-10-21 2013-01-22 Spectrasensors, Inc. Spectrometer with validation cell
DE102012216210A1 (de) 2012-09-12 2014-01-30 Siemens Aktiengesellschaft Nichtdispersiver Infrarot-Gasanalysator nach dem Zweistrahlverfahren
AT521624B1 (de) * 2019-01-17 2020-03-15 Scan Messtechnik Gmbh Vorrichtung und Verfahren zum Erfassen von Eigenschaften eines zu untersuchenden Fluids

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1082433B (de) * 1958-08-20 1960-05-25 Hartmann & Braun Ag Anordnung zur Eichung von Gasanalysegeraeten, die auf dem Prinzip der Absorption infraroter Strahlung beruhen
US3560736A (en) * 1968-10-09 1971-02-02 Mine Safety Appliances Co Non-dispersive infrared gas analyzer with unbalanced operation
DE2042727B2 (de) * 1970-08-28 1974-03-21 Siemens Ag, 1000 Berlin U. 8000 Muenchen Justiereinrichtung für ein Infrarot-Gasanalysegerät
DE2359637C2 (de) * 1973-11-30 1982-08-26 Hartmann & Braun Ag, 6000 Frankfurt Nichtdispersives Ultrarot-Gasanalysengerät
US4010368A (en) * 1974-04-23 1977-03-01 Autoscan, Inc. Test apparatus
DE2614181C3 (de) * 1976-04-02 1981-08-20 Leybold-Heraeus Gmbh, 5000 Koeln Verfahren zur Messung des optischen Absorptionsvermögens von Proben und Vorrichtung zur Durchführung des Verfahrens
DE2638522C3 (de) * 1976-08-26 1979-12-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Nichtdispersiver Zweistrahl-Infrarot-Gasanalysator mit je einem Doppelschichtempfänger im Meß- und Vergleichsstrahlengang
DE2639210C2 (de) * 1976-08-31 1985-09-26 Siemens AG, 1000 Berlin und 8000 München Nichtdispersiver Infrarot-Gasanalysator nach dem Zweistrahlverfahren
DD234493B1 (de) * 1985-02-01 1989-01-18 Junkalor Dessau Anordnung zur nachkalibrierung von nichtdispersiven infrarot-gasanalysatoren
EP0198995A3 (de) * 1985-04-26 1987-12-16 Hartmann & Braun Aktiengesellschaft Infrarot-Gasanalysator
DE3522949A1 (de) * 1985-06-27 1987-01-08 Hartmann & Braun Ag Verfahren zum nachjustieren von infrarot-gasanalysatoren
US4694174A (en) * 1985-10-01 1987-09-15 Gas Alarm Service, Inc. Infrared gas detector
JPS62126329A (ja) * 1985-11-27 1987-06-08 Horiba Ltd 吸光分析計
DE3932838C2 (de) * 1989-09-30 1996-03-07 Hartmann & Braun Ag Nichtdispersiver Infrarot-Gasanalysator
DE4111187C2 (de) * 1991-04-06 1994-11-24 Lfe Lab Fuer Ind Forschung Gmb Verfahren zur Messung des optischen Absorptionsvermögens von Proben unter Eliminierung des Anzeigefehlers hinsichtlich gas-physikalischer Eigenschaften und Vorrichtung zur Durchführung des Verfahrens
JPH07140075A (ja) * 1993-09-24 1995-06-02 Fuji Electric Co Ltd 赤外線ガス分析計
DE4432940C2 (de) * 1993-09-24 1997-10-02 Fuji Electric Co Ltd Infrarot-Gasanalysator

Also Published As

Publication number Publication date
EP0780681A2 (de) 1997-06-25
EP0780681B1 (de) 2007-09-05
ATE372511T1 (de) 2007-09-15
EP0780681A3 (de) 1998-05-06
US5764354A (en) 1998-06-09
DE19547787C1 (de) 1997-04-17

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