DE60002827D1 - Automatische testeinrichtung mit sigma-delta modulation zur erzeugung von referenzpegeln - Google Patents

Automatische testeinrichtung mit sigma-delta modulation zur erzeugung von referenzpegeln

Info

Publication number
DE60002827D1
DE60002827D1 DE60002827T DE60002827T DE60002827D1 DE 60002827 D1 DE60002827 D1 DE 60002827D1 DE 60002827 T DE60002827 T DE 60002827T DE 60002827 T DE60002827 T DE 60002827T DE 60002827 D1 DE60002827 D1 DE 60002827D1
Authority
DE
Germany
Prior art keywords
circuitry
reference levels
automatic test
pin slice
analog reference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60002827T
Other languages
English (en)
Other versions
DE60002827T2 (de
Inventor
P Walker
A Sartschev
M Ryan
D Blom
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE60002827D1 publication Critical patent/DE60002827D1/de
Publication of DE60002827T2 publication Critical patent/DE60002827T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
DE60002827T 1999-02-05 2000-02-03 Automatische testeinrichtung mit sigma-delta modulation zur erzeugung von referenzpegeln Expired - Lifetime DE60002827T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US245223 1999-02-05
US09/245,223 US6282682B1 (en) 1999-02-05 1999-02-05 Automatic test equipment using sigma delta modulation to create reference levels
PCT/US2000/002914 WO2000046610A1 (en) 1999-02-05 2000-02-03 Automatic test equipment using sigma delta modulation to create reference levels

Publications (2)

Publication Number Publication Date
DE60002827D1 true DE60002827D1 (de) 2003-06-26
DE60002827T2 DE60002827T2 (de) 2004-04-01

Family

ID=22925798

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60002827T Expired - Lifetime DE60002827T2 (de) 1999-02-05 2000-02-03 Automatische testeinrichtung mit sigma-delta modulation zur erzeugung von referenzpegeln

Country Status (7)

Country Link
US (1) US6282682B1 (de)
EP (1) EP1149298B1 (de)
JP (1) JP4485691B2 (de)
KR (1) KR100676185B1 (de)
CN (1) CN1248002C (de)
DE (1) DE60002827T2 (de)
WO (1) WO2000046610A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6859902B1 (en) * 2000-10-02 2005-02-22 Credence Systems Corporation Method and apparatus for high speed IC test interface
DE10102863A1 (de) * 2001-01-23 2002-07-25 Philips Corp Intellectual Pty Schaltungsanordnung
US7560947B2 (en) 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
CN100425999C (zh) * 2006-01-19 2008-10-15 中兴通讯股份有限公司 一种基于可编程逻辑器件的电路板故障自定位装置及其方法
JP4799260B2 (ja) * 2006-04-26 2011-10-26 日本カニゼン株式会社 無電解ニッケルめっき液の長寿命化装置
US9842633B2 (en) * 2014-12-11 2017-12-12 Micron Technology, Inc. Tracking and correction of timing signals
CN104484885B (zh) * 2014-12-25 2017-09-19 上海华岭集成电路技术股份有限公司 Cis芯片yuv格式输出的ate测试方法
US9964597B2 (en) * 2016-09-01 2018-05-08 Texas Instruments Incorporated Self test for safety logic
KR102583174B1 (ko) 2018-06-12 2023-09-26 삼성전자주식회사 테스트 인터페이스 보드, 이를 포함하는 테스트 시스템 및 이의 동작 방법
KR102609902B1 (ko) * 2021-09-14 2023-12-05 테크위드유 주식회사 실장 면적을 효율적으로 활용 가능한 테스트 회로

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626769A (en) 1985-03-13 1986-12-02 Analog Devices, Inc. Voltage/current source
DE3621937A1 (de) 1986-06-30 1988-01-07 Bosch Gmbh Robert Ueberwachungseinrichtung fuer eine elektronische steuereinrichtung in einem kraftfahrzeug
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5235273A (en) 1991-07-12 1993-08-10 Schlumberger Technologies, Inc. Apparatus for setting pin driver/sensor reference voltage level
US5512895A (en) 1994-04-25 1996-04-30 Teradyne, Inc. Sample rate converter
US5566188A (en) * 1995-03-29 1996-10-15 Teradyne, Inc. Low cost timing generator for automatic test equipment operating at high data rates
JP3341566B2 (ja) 1996-02-15 2002-11-05 ソニー株式会社 信号伝送方法及び装置、並びに信号再生方法及び装置
US6218972B1 (en) * 1997-09-11 2001-04-17 Rockwell Science Center, Inc. Tunable bandpass sigma-delta digital receiver
US5905403A (en) 1997-09-29 1999-05-18 Credence Systems Corporation Multiple output programmable reference voltage source

Also Published As

Publication number Publication date
EP1149298B1 (de) 2003-05-21
WO2000046610A1 (en) 2000-08-10
DE60002827T2 (de) 2004-04-01
US6282682B1 (en) 2001-08-28
CN1248002C (zh) 2006-03-29
JP4485691B2 (ja) 2010-06-23
CN1339112A (zh) 2002-03-06
EP1149298A1 (de) 2001-10-31
KR20010101990A (ko) 2001-11-15
KR100676185B1 (ko) 2007-01-30
JP2002536644A (ja) 2002-10-29

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