DE60018574D1 - Selbstprüfende elektronische vorrichtung und prüfverfahren dafür - Google Patents

Selbstprüfende elektronische vorrichtung und prüfverfahren dafür

Info

Publication number
DE60018574D1
DE60018574D1 DE60018574T DE60018574T DE60018574D1 DE 60018574 D1 DE60018574 D1 DE 60018574D1 DE 60018574 T DE60018574 T DE 60018574T DE 60018574 T DE60018574 T DE 60018574T DE 60018574 D1 DE60018574 D1 DE 60018574D1
Authority
DE
Germany
Prior art keywords
self
electronic device
test method
method therefor
testing electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60018574T
Other languages
English (en)
Other versions
DE60018574T2 (de
Inventor
M Barton
Shahin Tahmassebi
David Platt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tivo Solutions Inc
Original Assignee
Tivo Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tivo Inc filed Critical Tivo Inc
Publication of DE60018574D1 publication Critical patent/DE60018574D1/de
Application granted granted Critical
Publication of DE60018574T2 publication Critical patent/DE60018574T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G06F11/2635—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268—Logging of test results
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
DE60018574T 1999-07-19 2000-07-12 Selbstprüfende elektronische vorrichtung und prüfverfahren dafür Expired - Lifetime DE60018574T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US357183 1999-07-19
US09/357,183 US6385739B1 (en) 1999-07-19 1999-07-19 Self-test electronic assembly and test system
PCT/US2000/018955 WO2001006370A1 (en) 1999-07-19 2000-07-12 Self-test electronic assembly and test system

Publications (2)

Publication Number Publication Date
DE60018574D1 true DE60018574D1 (de) 2005-04-14
DE60018574T2 DE60018574T2 (de) 2006-01-19

Family

ID=23404630

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60018574T Expired - Lifetime DE60018574T2 (de) 1999-07-19 2000-07-12 Selbstprüfende elektronische vorrichtung und prüfverfahren dafür

Country Status (8)

Country Link
US (2) US6385739B1 (de)
EP (1) EP1203294B1 (de)
CN (2) CN1282082C (de)
AU (1) AU5930600A (de)
DE (1) DE60018574T2 (de)
HK (1) HK1071941A1 (de)
TW (1) TW470878B (de)
WO (1) WO2001006370A1 (de)

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WO2001006370A1 (en) 2001-01-25
US6385739B1 (en) 2002-05-07
CN1550987A (zh) 2004-12-01
CN100437507C (zh) 2008-11-26
CN1375085A (zh) 2002-10-16
US6643798B2 (en) 2003-11-04
CN1282082C (zh) 2006-10-25
AU5930600A (en) 2001-02-05
TW470878B (en) 2002-01-01
US20020091966A1 (en) 2002-07-11
EP1203294B1 (de) 2005-03-09
HK1071941A1 (en) 2005-08-05
DE60018574T2 (de) 2006-01-19

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