DE60029558D1 - Verfahren zum kalibrieren eines analog-digital wandlers und eine kalibrierungsvorrichtung - Google Patents

Verfahren zum kalibrieren eines analog-digital wandlers und eine kalibrierungsvorrichtung

Info

Publication number
DE60029558D1
DE60029558D1 DE60029558T DE60029558T DE60029558D1 DE 60029558 D1 DE60029558 D1 DE 60029558D1 DE 60029558 T DE60029558 T DE 60029558T DE 60029558 T DE60029558 T DE 60029558T DE 60029558 D1 DE60029558 D1 DE 60029558D1
Authority
DE
Germany
Prior art keywords
analog
calibrating
digital
voltage sector
calibration device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60029558T
Other languages
English (en)
Other versions
DE60029558T2 (de
Inventor
Paavo Kosonen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia Oyj
Original Assignee
Nokia Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nokia Oyj filed Critical Nokia Oyj
Application granted granted Critical
Publication of DE60029558D1 publication Critical patent/DE60029558D1/de
Publication of DE60029558T2 publication Critical patent/DE60029558T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/162—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in a single stage, i.e. recirculation type
DE60029558T 1999-09-20 2000-09-19 Verfahren zum Kalibrieren eines Analog-Digital-Wandlers und eine Kalibrierungsvorrichtung Expired - Lifetime DE60029558T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI992001 1999-09-20
FI992001A FI107482B (fi) 1999-09-20 1999-09-20 Menetelmä analogia-digitaalimuuntimen kalibroimiseksi sekä kalibrointilaite
PCT/FI2000/000790 WO2001022594A1 (en) 1999-09-20 2000-09-19 Method of calibrating an analog-to-digital converter, and a calibration equipment

Publications (2)

Publication Number Publication Date
DE60029558D1 true DE60029558D1 (de) 2006-09-07
DE60029558T2 DE60029558T2 (de) 2007-06-06

Family

ID=8555314

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60029558T Expired - Lifetime DE60029558T2 (de) 1999-09-20 2000-09-19 Verfahren zum Kalibrieren eines Analog-Digital-Wandlers und eine Kalibrierungsvorrichtung

Country Status (10)

Country Link
US (1) US6384757B1 (de)
EP (1) EP1131888B1 (de)
JP (1) JP3523639B2 (de)
CN (1) CN1131593C (de)
AT (1) ATE334506T1 (de)
AU (1) AU7292000A (de)
BR (1) BR0007163A (de)
DE (1) DE60029558T2 (de)
FI (1) FI107482B (de)
WO (1) WO2001022594A1 (de)

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US6690311B2 (en) * 1998-11-20 2004-02-10 Telefonaktiebolaget Lm Ericsson (Publ) Adaptively calibrating analog-to-digital conversion with correction table indexing
US6700523B2 (en) * 2001-10-25 2004-03-02 Oki Electric Industry Co., Ltd. Analog to digital converter selecting reference voltages in accordance with feedback from prior stages
US6570523B1 (en) * 2002-02-13 2003-05-27 Intersil Americas Inc. Analog to digital converter using subranging and interpolation
US6714886B2 (en) * 2002-02-13 2004-03-30 Eric C. Sung System and method of DC calibration of amplifiers
CN1306708C (zh) * 2002-04-03 2007-03-21 华邦电子股份有限公司 随机失误码的检测方法及检测装置
US20040046684A1 (en) * 2002-09-11 2004-03-11 Paolo Cusinato Low power pipeline analog-to-digital converter
TWI231098B (en) * 2002-12-27 2005-04-11 Novatek Microelectronics Corp Correcting system and method of successive approximation A/D converter
US6690310B1 (en) * 2003-02-13 2004-02-10 Northrop Grumman Corporation Method and apparatus for adaptively compensating for an inaccuracy in an analog-to-digital converter
US7196649B2 (en) * 2004-02-03 2007-03-27 Hrl Laboratories, Llc Reprogrammable distributed reference ladder for analog-to-digital converters
US7119728B2 (en) * 2004-02-27 2006-10-10 Sanyo Electric Co., Ltd. Analog/digital converting device
TWI227071B (en) * 2004-04-13 2005-01-21 Realtek Semiconductor Corp Pipeline ADC calibrating method utilizing extra ADC module and apparatus thereof
US7091891B2 (en) * 2004-04-28 2006-08-15 Analog Devices, Inc. Calibration of analog to digital converter by means of multiplexed stages
CN1694263A (zh) * 2004-05-07 2005-11-09 松下电器产业株式会社 半导体装置及其制造方法
JP2006067201A (ja) * 2004-08-26 2006-03-09 Matsushita Electric Ind Co Ltd パイプラインａ／ｄ変換器およびその出力誤差補正方法
US7161515B2 (en) * 2004-11-04 2007-01-09 Tektronix, Inc. Calibration system and method for a linearity corrector using filter products
CN1815893B (zh) * 2004-11-04 2012-04-18 特克特朗尼克公司 利用滤波器乘积的线性校正器
US7385536B2 (en) * 2004-12-14 2008-06-10 Texas Instruments Incorporated Methods and circuits for output of sample-and-hold in pipelined ADC
US7187310B2 (en) * 2005-03-04 2007-03-06 Kamal El-Sankary Circuit calibration using voltage injection
JP4372111B2 (ja) * 2005-03-04 2009-11-25 三洋電機株式会社 アナログデジタル変換器
US7295937B2 (en) * 2005-07-20 2007-11-13 Texas Instruments Incorporated Method and system for determining noise components of an analog-to-digital converter
JP4314275B2 (ja) * 2005-09-16 2009-08-12 パナソニック株式会社 Ａ／ｄ変換器及びａ／ｄ変換方法
US7852913B2 (en) * 2005-10-03 2010-12-14 Clariphy Communications, Inc. High-speed receiver architecture
US8139630B2 (en) * 2005-10-03 2012-03-20 Clariphy Communications, Inc. High-speed receiver architecture
US8831074B2 (en) 2005-10-03 2014-09-09 Clariphy Communications, Inc. High-speed receiver architecture
US7778320B2 (en) * 2005-10-03 2010-08-17 Clariphy Communications, Inc. Multi-channel equalization to compensate for impairments introduced by interleaved devices
US8483343B2 (en) * 2005-10-03 2013-07-09 Clariphy Communications, Inc. High-speed receiver architecture
US7576676B2 (en) * 2006-02-02 2009-08-18 Clariphy Communications, Inc. Analog-to-digital converter using lookahead pipelined architecture and open-loop residue amplifiers
JP4774953B2 (ja) * 2005-11-28 2011-09-21 株式会社日立製作所 時間インターリーブａｄ変換器
US8094056B2 (en) * 2006-02-02 2012-01-10 Clariphy Communications, Inc. Analog-to-digital converter
KR100845134B1 (ko) * 2006-11-06 2008-07-09 삼성전자주식회사 디지털 자동 보정기능을 가지는 파이프 라인아날로그-디지털 변환기 및 그것의 디지털 보정방법
US7688238B2 (en) * 2007-03-27 2010-03-30 Slicex, Inc. Methods and systems for calibrating a pipelined analog-to-digital converter
US7808417B2 (en) * 2007-09-14 2010-10-05 Clariphy Communications, Inc. Analog-to-digital converter
EP2246984B1 (de) 2009-04-28 2013-07-03 VEGA Grieshaber KG Diagnoseschaltung zur Überwachung einer Analog-Digital-Wandlungsschaltung
CN101800548B (zh) * 2010-02-04 2013-03-20 中国电子科技集团公司第五十八研究所 电荷耦合流水线模数转换器的差模误差校准电路
CN102043093B (zh) * 2010-05-25 2013-01-23 中联重科股份有限公司 测量电流型模数转换器的转换电阻的阻值的方法
JP5554644B2 (ja) * 2010-06-29 2014-07-23 パナソニック株式会社 固体撮像装置
US8836549B2 (en) * 2011-12-20 2014-09-16 Analog Devices, Inc. Use of logic circuit embedded into comparator for foreground offset cancellation
US8754794B1 (en) * 2012-07-25 2014-06-17 Altera Corporation Methods and apparatus for calibrating pipeline analog-to-digital converters
US20140306689A1 (en) * 2013-04-10 2014-10-16 Texas Instruments, Incorporated High resolution current pulse analog measurement
US9727342B2 (en) * 2013-12-20 2017-08-08 Utah State University Error resilient pipeline
US9306591B2 (en) * 2014-05-08 2016-04-05 SiTune Corporation Calibration of high speed asynchronous convertor
US9264059B2 (en) 2014-05-08 2016-02-16 SiTune Corporation Calibration of time-interleaved analog-to-digital converter
CN106899298A (zh) * 2015-12-17 2017-06-27 北京展讯高科通信技术有限公司 校准误差确认方法、装置及移动终端
CN107359878B (zh) * 2017-08-17 2020-04-14 电子科技大学 一种基于最小量化误差的流水线adc的前端校准方法
US10608655B1 (en) 2018-12-06 2020-03-31 Analog Devices, Inc. Inter-stage gain calibration in double conversion analog-to-digital converter

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Publication number Priority date Publication date Assignee Title
FR2697955B1 (fr) * 1992-11-06 1994-12-09 Thomson Csf Procédé et dispositif de conversion analogique numérique à auto-calibration.
EP0698315B1 (de) * 1993-05-12 2001-03-07 Analog Devices, Incorporated Algorithmischer analog-/digitalwandler mit digital kalibriertem ausgang
KR970005828B1 (ko) * 1993-12-31 1997-04-21 김정덕 파이프 라인 구조의 다단 아날로그/디지탈 변환기
JP2679658B2 (ja) * 1995-01-13 1997-11-19 日本電気株式会社 Ａ／ｄ変換器
KR0157122B1 (ko) * 1995-12-23 1999-02-18 김광호 디지탈 보상형 아날로그 디지탈 변환기
FR2755324B1 (fr) * 1996-10-25 1999-01-08 Thomson Multimedia Sa Conversion d'un signal analogique en signal numerique en particulier un signal video de tv
JP2001525627A (ja) * 1997-12-02 2001-12-11 マキシム・インテグレーテッド・プロダクツ・インコーポレーテッド パイプライン接続型アナログ‐ディジタル変換器における効率的な誤差補正
US6184809B1 (en) 1998-08-19 2001-02-06 Texas Instruments Incorporated User transparent self-calibration technique for pipelined ADC architecture

Also Published As

Publication number Publication date
CN1131593C (zh) 2003-12-17
JP2003510880A (ja) 2003-03-18
JP3523639B2 (ja) 2004-04-26
AU7292000A (en) 2001-04-24
BR0007163A (pt) 2001-07-31
ATE334506T1 (de) 2006-08-15
WO2001022594A1 (en) 2001-03-29
DE60029558T2 (de) 2007-06-06
FI19992001A (fi) 2001-03-20
US6384757B1 (en) 2002-05-07
EP1131888A1 (de) 2001-09-12
EP1131888B1 (de) 2006-07-26
FI107482B (fi) 2001-08-15
CN1322404A (zh) 2001-11-14

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