DE60113780D1 - Verfahren und Vorrichtung zum Verfolgen von Hardwarezustanden mit dynamischen rekonfigurierbaren Testschaltungen - Google Patents

Verfahren und Vorrichtung zum Verfolgen von Hardwarezustanden mit dynamischen rekonfigurierbaren Testschaltungen

Info

Publication number
DE60113780D1
DE60113780D1 DE60113780T DE60113780T DE60113780D1 DE 60113780 D1 DE60113780 D1 DE 60113780D1 DE 60113780 T DE60113780 T DE 60113780T DE 60113780 T DE60113780 T DE 60113780T DE 60113780 D1 DE60113780 D1 DE 60113780D1
Authority
DE
Germany
Prior art keywords
test
hardware
logic
test circuits
fpgas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60113780T
Other languages
English (en)
Other versions
DE60113780T2 (de
Inventor
Stephen Dale Hanna
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE60113780D1 publication Critical patent/DE60113780D1/de
Publication of DE60113780T2 publication Critical patent/DE60113780T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
DE60113780T 2000-08-02 2001-07-11 Verfahren und Vorrichtung zum Verfolgen von Hardwarezustanden mit dynamischen rekonfigurierbaren Testschaltungen Expired - Lifetime DE60113780T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US631130 2000-08-02
US09/631,130 US6542844B1 (en) 2000-08-02 2000-08-02 Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits

Publications (2)

Publication Number Publication Date
DE60113780D1 true DE60113780D1 (de) 2005-11-10
DE60113780T2 DE60113780T2 (de) 2006-06-22

Family

ID=24529882

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60113780T Expired - Lifetime DE60113780T2 (de) 2000-08-02 2001-07-11 Verfahren und Vorrichtung zum Verfolgen von Hardwarezustanden mit dynamischen rekonfigurierbaren Testschaltungen

Country Status (8)

Country Link
US (1) US6542844B1 (de)
EP (1) EP1178324B1 (de)
KR (1) KR100420418B1 (de)
CN (1) CN1201229C (de)
AT (1) ATE306084T1 (de)
CA (1) CA2354248C (de)
DE (1) DE60113780T2 (de)
GB (1) GB2368421A (de)

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Also Published As

Publication number Publication date
KR100420418B1 (ko) 2004-03-04
EP1178324A2 (de) 2002-02-06
CA2354248C (en) 2006-09-19
KR20020011870A (ko) 2002-02-09
CA2354248A1 (en) 2002-02-02
GB0110357D0 (en) 2001-06-20
ATE306084T1 (de) 2005-10-15
EP1178324A3 (de) 2004-01-07
EP1178324B1 (de) 2005-10-05
DE60113780T2 (de) 2006-06-22
GB2368421A (en) 2002-05-01
US6542844B1 (en) 2003-04-01
CN1336588A (zh) 2002-02-20
CN1201229C (zh) 2005-05-11

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