US6833613B1
(en)
*
|
1997-12-18 |
2004-12-21 |
Micron Technology, Inc. |
Stacked semiconductor package having laser machined contacts
|
US6455833B1
(en)
|
1999-03-09 |
2002-09-24 |
Micron Technology, Inc. |
Superposed multi-junction color APS
|
US6727521B2
(en)
|
2000-09-25 |
2004-04-27 |
Foveon, Inc. |
Vertical color filter detector group and array
|
JP3724374B2
(ja)
*
|
2001-01-15 |
2005-12-07 |
ソニー株式会社 |
固体撮像装置及びその駆動方法
|
US7442629B2
(en)
|
2004-09-24 |
2008-10-28 |
President & Fellows Of Harvard College |
Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate
|
US7057256B2
(en)
|
2001-05-25 |
2006-06-06 |
President & Fellows Of Harvard College |
Silicon-based visible and near-infrared optoelectric devices
|
US6960757B2
(en)
*
|
2001-06-18 |
2005-11-01 |
Foveon, Inc. |
Simplified wiring schemes for vertical color filter pixel sensors
|
US6930336B1
(en)
|
2001-06-18 |
2005-08-16 |
Foveon, Inc. |
Vertical-color-filter detector group with trench isolation
|
US6756616B2
(en)
*
|
2001-08-30 |
2004-06-29 |
Micron Technology, Inc. |
CMOS imager and method of formation
|
US6738171B1
(en)
*
|
2001-11-21 |
2004-05-18 |
Micron Technology, Inc. |
Color filter array and microlens array having holographic optical elements
|
US20040178463A1
(en)
|
2002-03-20 |
2004-09-16 |
Foveon, Inc. |
Vertical color filter sensor group with carrier-collection elements of different size and method for fabricating such a sensor group
|
US6998660B2
(en)
|
2002-03-20 |
2006-02-14 |
Foveon, Inc. |
Vertical color filter sensor group array that emulates a pattern of single-layer sensors with efficient use of each sensor group's sensors
|
JP2003298038A
(ja)
*
|
2002-04-05 |
2003-10-17 |
Canon Inc |
光電変換素子及びそれを用いた固体撮像装置
|
JP3854887B2
(ja)
*
|
2002-04-05 |
2006-12-06 |
キヤノン株式会社 |
光電変換装置
|
JP2003303949A
(ja)
*
|
2002-04-11 |
2003-10-24 |
Canon Inc |
撮像装置
|
US7129466B2
(en)
*
|
2002-05-08 |
2006-10-31 |
Canon Kabushiki Kaisha |
Color image pickup device and color light-receiving device
|
WO2003100925A2
(en)
|
2002-05-22 |
2003-12-04 |
Beth Israel Deaconess Medical Center |
Device for wavelength-selective imaging
|
US6844585B1
(en)
|
2002-06-17 |
2005-01-18 |
National Semiconductor Corporation |
Circuit and method of forming the circuit having subsurface conductors
|
US6946715B2
(en)
|
2003-02-19 |
2005-09-20 |
Micron Technology, Inc. |
CMOS image sensor and method of fabrication
|
US6646318B1
(en)
|
2002-08-15 |
2003-11-11 |
National Semiconductor Corporation |
Bandgap tuned vertical color imager cell
|
US7391450B2
(en)
|
2002-08-16 |
2008-06-24 |
Zoran Corporation |
Techniques for modifying image field data
|
US7408576B2
(en)
|
2002-08-16 |
2008-08-05 |
Zoran Corporation |
Techniques for modifying image field data as a function of radius across the image field
|
US7388610B2
(en)
|
2002-08-16 |
2008-06-17 |
Zoran Corporation |
Techniques of modifying image field data by extrapolation
|
US7008814B2
(en)
*
|
2002-08-23 |
2006-03-07 |
Motorola, Inc. |
Method and apparatus for increasing digital color imaging utilizing tandem RGB photodiodes
|
US6753585B1
(en)
*
|
2002-12-05 |
2004-06-22 |
National Semiconductor Corporation |
Vertical color photo-detector with increased sensitivity and compatible video interface
|
JP4039234B2
(ja)
*
|
2002-12-25 |
2008-01-30 |
ソニー株式会社 |
固体撮像素子およびその電荷転送方法
|
US7067895B1
(en)
|
2003-01-10 |
2006-06-27 |
Eastman Kodak Company |
Color imager cell with transistors formed under the photodiodes
|
KR20040068438A
(ko)
*
|
2003-01-25 |
2004-07-31 |
삼성전자주식회사 |
보행식 로봇 및 그 위치이동방법
|
US7339216B1
(en)
|
2003-01-31 |
2008-03-04 |
Foveon, Inc. |
Vertical color filter sensor group array with full-resolution top layer and lower-resolution lower layer
|
US6894265B2
(en)
|
2003-01-31 |
2005-05-17 |
Foveon, Inc. |
Vertical color filter sensor group and semiconductor integrated circuit fabrication method for fabricating same
|
US6914314B2
(en)
|
2003-01-31 |
2005-07-05 |
Foveon, Inc. |
Vertical color filter sensor group including semiconductor other than crystalline silicon and method for fabricating same
|
US6897429B1
(en)
|
2003-02-10 |
2005-05-24 |
Foveon, Inc. |
Managing power consumption by sampling circuit current sources
|
JP4388752B2
(ja)
*
|
2003-03-11 |
2009-12-24 |
富士フイルム株式会社 |
Ccd型カラー固体撮像装置
|
US7554587B2
(en)
*
|
2003-03-11 |
2009-06-30 |
Fujifilm Corporation |
Color solid-state image pickup device
|
EP1620895B1
(de)
*
|
2003-05-08 |
2016-03-02 |
The Science and Technology Facilities Council |
Sensor zur detektion von beschleunigten teilchen und hochenergiestrahlung
|
US7502058B2
(en)
*
|
2003-06-09 |
2009-03-10 |
Micron Technology, Inc. |
Imager with tuned color filter
|
US7462553B2
(en)
*
|
2003-06-25 |
2008-12-09 |
Semicoa |
Ultra thin back-illuminated photodiode array fabrication methods
|
US6762473B1
(en)
*
|
2003-06-25 |
2004-07-13 |
Semicoa Semiconductors |
Ultra thin back-illuminated photodiode array structures and fabrication methods
|
JP4219755B2
(ja)
*
|
2003-07-16 |
2009-02-04 |
ローム株式会社 |
イメージセンサの製造方法およびイメージセンサ
|
US7105373B1
(en)
|
2003-08-14 |
2006-09-12 |
National Semiconductor Corporation |
Vertical photodiode with heavily-doped regions of alternating conductivity types
|
US20050057671A1
(en)
*
|
2003-09-17 |
2005-03-17 |
Cole Bryan G. |
Method to filter EM radiation of certain energies using poly silicon
|
US7423681B2
(en)
*
|
2003-09-17 |
2008-09-09 |
Eastman Kodak Company |
Interline CCD implementation of hybrid two color per pixel architecture
|
US7405761B2
(en)
|
2003-10-01 |
2008-07-29 |
Tessera North America, Inc. |
Thin camera having sub-pixel resolution
|
US7022968B1
(en)
|
2003-10-21 |
2006-04-04 |
National Semiconductor Corporation |
Optical sensor that measures the light output by the combustion chamber of an internal combustion engine
|
US6958194B1
(en)
|
2003-10-21 |
2005-10-25 |
Foveon, Inc. |
Imager with improved sensitivity
|
JP4578797B2
(ja)
|
2003-11-10 |
2010-11-10 |
パナソニック株式会社 |
撮像装置
|
DE10352741B4
(de)
*
|
2003-11-12 |
2012-08-16 |
Austriamicrosystems Ag |
Strahlungsdetektierendes optoelektronisches Bauelement, Verfahren zu dessen Herstellung und Verwendung
|
US6852562B1
(en)
|
2003-12-05 |
2005-02-08 |
Eastman Kodak Company |
Low-cost method of forming a color imager
|
US7999214B2
(en)
*
|
2003-12-19 |
2011-08-16 |
The Invention Science Fund I, Llc |
Photo-detector filter having a cascaded low noise amplifier
|
US7098439B2
(en)
*
|
2003-12-22 |
2006-08-29 |
Searete Llc |
Augmented photo-detector filter
|
US7511254B2
(en)
*
|
2003-12-19 |
2009-03-31 |
Searete, Llc |
Photo-detector filter having a cascaded low noise amplifier
|
US7053809B2
(en)
*
|
2003-12-19 |
2006-05-30 |
Searete Llc |
Analog-to-digital converter circuitry having a cascade
|
US7515082B2
(en)
*
|
2003-12-19 |
2009-04-07 |
Searete, Llc |
Photo-detector filter having a cascaded low noise amplifier
|
US7250595B2
(en)
*
|
2004-01-14 |
2007-07-31 |
Searete, Llc |
Photo-detector filter having a cascaded low noise amplifier
|
US7045760B2
(en)
*
|
2003-12-19 |
2006-05-16 |
Searete Llc |
Intensity detector circuitry
|
US7542133B2
(en)
*
|
2003-12-22 |
2009-06-02 |
Searete, Llc |
Photo-detector filter
|
US8724006B2
(en)
*
|
2004-01-26 |
2014-05-13 |
Flir Systems, Inc. |
Focal plane coding for digital imaging
|
CN1934872B
(zh)
*
|
2004-01-26 |
2016-08-03 |
数字光学公司 |
具有子像素分辨率的薄式照相机
|
US7773143B2
(en)
*
|
2004-04-08 |
2010-08-10 |
Tessera North America, Inc. |
Thin color camera having sub-pixel resolution
|
US7541627B2
(en)
*
|
2004-03-08 |
2009-06-02 |
Foveon, Inc. |
Method and apparatus for improving sensitivity in vertical color CMOS image sensors
|
JP2005268609A
(ja)
*
|
2004-03-19 |
2005-09-29 |
Fuji Photo Film Co Ltd |
多層積層型多画素撮像素子及びテレビカメラ
|
JP2005269526A
(ja)
*
|
2004-03-22 |
2005-09-29 |
Fuji Photo Film Co Ltd |
カラーセンサー及びカラー撮像システム
|
US8049806B2
(en)
*
|
2004-09-27 |
2011-11-01 |
Digitaloptics Corporation East |
Thin camera and associated methods
|
US8953087B2
(en)
*
|
2004-04-08 |
2015-02-10 |
Flir Systems Trading Belgium Bvba |
Camera system and associated methods
|
US6972457B1
(en)
*
|
2004-04-09 |
2005-12-06 |
Eastman Kodak Company |
Imaging cell that has a long integration period and method of operating the imaging cell
|
US6972995B1
(en)
|
2004-04-09 |
2005-12-06 |
Eastman Kodak Company |
Imaging cell with a non-volatile memory that provides a long integration period and method of operating the imaging cell
|
WO2005098956A1
(en)
*
|
2004-04-12 |
2005-10-20 |
Nanyang Technological University |
Method and device for wavelength-sensitive photo-sensing using multiple pn-junction
|
JP4227069B2
(ja)
|
2004-05-07 |
2009-02-18 |
ローム株式会社 |
光電変換デバイス、イメージセンサおよび光電変換デバイスの製造方法
|
JP5448134B2
(ja)
|
2004-05-27 |
2014-03-19 |
フォブオン・インク |
垂直カラーフィルターセンサー群およびその半導体集積回路の製造方法
|
CN1943002A
(zh)
*
|
2004-05-27 |
2007-04-04 |
通用电气公司 |
对物件进行等离子体处理的装置和方法
|
JP4542138B2
(ja)
*
|
2004-05-27 |
2010-09-08 |
フォベオン・インコーポレーテッド |
垂直色フィルタピクセルセンサに対する簡易化された配線計画
|
JP2006066456A
(ja)
*
|
2004-08-24 |
2006-03-09 |
Fuji Photo Film Co Ltd |
固体撮像素子
|
US7916180B2
(en)
*
|
2004-08-25 |
2011-03-29 |
Protarius Filo Ag, L.L.C. |
Simultaneous multiple field of view digital cameras
|
US8124929B2
(en)
*
|
2004-08-25 |
2012-02-28 |
Protarius Filo Ag, L.L.C. |
Imager module optical focus and assembly method
|
US7795577B2
(en)
*
|
2004-08-25 |
2010-09-14 |
Richard Ian Olsen |
Lens frame and optical focus assembly for imager module
|
WO2006026354A2
(en)
|
2004-08-25 |
2006-03-09 |
Newport Imaging Corporation |
Apparatus for multiple camera devices and method of operating same
|
US7564019B2
(en)
|
2005-08-25 |
2009-07-21 |
Richard Ian Olsen |
Large dynamic range cameras
|
EP1643565B1
(de)
*
|
2004-09-30 |
2020-03-04 |
OSRAM Opto Semiconductors GmbH |
Strahlungsdetektor
|
EP1667246A1
(de)
*
|
2004-12-03 |
2006-06-07 |
ETeCH AG |
Mehrfarbenempfindliches Bauteil zur Farbbilderfassung
|
US7400022B2
(en)
*
|
2004-12-17 |
2008-07-15 |
Unique Ic's |
Photoreceiver cell with color separation
|
KR100672664B1
(ko)
*
|
2004-12-29 |
2007-01-24 |
동부일렉트로닉스 주식회사 |
버티컬 씨모스 이미지 센서의 제조방법
|
KR100660319B1
(ko)
*
|
2004-12-30 |
2006-12-22 |
동부일렉트로닉스 주식회사 |
씨모스 이미지센서 및 그의 제조방법
|
KR100606918B1
(ko)
*
|
2004-12-30 |
2006-08-01 |
동부일렉트로닉스 주식회사 |
버티컬 씨모스 이미지 센서의 핫 픽셀 및 그 제조방법
|
KR100660320B1
(ko)
*
|
2004-12-30 |
2006-12-22 |
동부일렉트로닉스 주식회사 |
씨모스 이미지 센서 및 그의 제조방법
|
KR20060077536A
(ko)
*
|
2004-12-30 |
2006-07-05 |
동부일렉트로닉스 주식회사 |
씨모스 이미지 센서 및 그의 제조방법
|
JP2006270021A
(ja)
*
|
2005-02-28 |
2006-10-05 |
Fuji Photo Film Co Ltd |
積層型光電変換素子
|
US7388665B2
(en)
*
|
2005-05-20 |
2008-06-17 |
Tir Technology Lp |
Multicolour chromaticity sensor
|
US20070102622A1
(en)
|
2005-07-01 |
2007-05-10 |
Olsen Richard I |
Apparatus for multiple camera devices and method of operating same
|
US7271025B2
(en)
*
|
2005-07-12 |
2007-09-18 |
Micron Technology, Inc. |
Image sensor with SOI substrate
|
US8139130B2
(en)
|
2005-07-28 |
2012-03-20 |
Omnivision Technologies, Inc. |
Image sensor with improved light sensitivity
|
US8274715B2
(en)
|
2005-07-28 |
2012-09-25 |
Omnivision Technologies, Inc. |
Processing color and panchromatic pixels
|
JP4227152B2
(ja)
*
|
2005-08-02 |
2009-02-18 |
三星電機株式会社 |
Cmosイメージセンサの能動ピクセルアレイ
|
US20070258006A1
(en)
*
|
2005-08-25 |
2007-11-08 |
Olsen Richard I |
Solid state camera optics frame and assembly
|
US7964835B2
(en)
|
2005-08-25 |
2011-06-21 |
Protarius Filo Ag, L.L.C. |
Digital cameras with direct luminance and chrominance detection
|
US20070048343A1
(en)
*
|
2005-08-26 |
2007-03-01 |
Honeywell International Inc. |
Biocidal premixtures
|
JP2007067194A
(ja)
*
|
2005-08-31 |
2007-03-15 |
Fujifilm Corp |
有機光電変換素子、および積層型光電変換素子
|
JP2007081137A
(ja)
*
|
2005-09-14 |
2007-03-29 |
Fujifilm Corp |
光電変換素子及び固体撮像素子
|
US7652313B2
(en)
*
|
2005-11-10 |
2010-01-26 |
International Business Machines Corporation |
Deep trench contact and isolation of buried photodetectors
|
CN101151735B
(zh)
*
|
2005-11-22 |
2010-09-08 |
佛文恩股份有限公司 |
具有全分辨率顶层和较低分辨率下层的垂直滤色片传感器组阵列
|
KR100723137B1
(ko)
*
|
2005-11-24 |
2007-05-30 |
삼성전기주식회사 |
포토다이오드 소자 및 이를 이용한 광센서용 포토다이오드어레이
|
US7521658B2
(en)
*
|
2005-12-01 |
2009-04-21 |
Aptina Imaging Corporation |
Pixel having photoconductive layers to absorb different ranges of wavelengths
|
KR100720483B1
(ko)
*
|
2005-12-09 |
2007-05-22 |
동부일렉트로닉스 주식회사 |
수직 칼라 필터 검출기단 및 그 제조방법
|
JP4573769B2
(ja)
|
2005-12-20 |
2010-11-04 |
富士通セミコンダクター株式会社 |
画像処理回路および画像処理方法
|
DE102005061820B4
(de)
*
|
2005-12-23 |
2014-09-04 |
Infineon Technologies Austria Ag |
Verfahren zur Herstellung einer Solarzelle
|
KR100660333B1
(ko)
*
|
2005-12-28 |
2006-12-22 |
동부일렉트로닉스 주식회사 |
Cmos 이미지 센서의 제조방법
|
KR100752168B1
(ko)
*
|
2005-12-28 |
2007-08-24 |
동부일렉트로닉스 주식회사 |
수직형 씨모스 이미지 센서의 포토 다이오드 측정 패턴
|
KR100788347B1
(ko)
|
2005-12-28 |
2008-01-02 |
동부일렉트로닉스 주식회사 |
수직형 씨모스 이미지 센서, 이의 제조 방법 및 이의 게터링 방법
|
KR100788350B1
(ko)
|
2005-12-29 |
2008-01-02 |
동부일렉트로닉스 주식회사 |
수직형 씨모스 이미지 센서 및 이의 제조 방법
|
US7855786B2
(en)
*
|
2006-01-09 |
2010-12-21 |
Bae Systems Spectral Solutions Llc |
Single camera multi-spectral imager
|
JP2007227574A
(ja)
*
|
2006-02-22 |
2007-09-06 |
Fujifilm Corp |
光電変換素子、固体撮像素子
|
US7576371B1
(en)
|
2006-03-03 |
2009-08-18 |
Array Optronix, Inc. |
Structures and methods to improve the crosstalk between adjacent pixels of back-illuminated photodiode arrays
|
JP5227511B2
(ja)
*
|
2006-03-06 |
2013-07-03 |
富士フイルム株式会社 |
光電変換素子及び固体撮像素子
|
US7419844B2
(en)
*
|
2006-03-17 |
2008-09-02 |
Sharp Laboratories Of America, Inc. |
Real-time CMOS imager having stacked photodiodes fabricated on SOI wafer
|
US7608874B2
(en)
*
|
2006-03-17 |
2009-10-27 |
Sharp Laboratories Of America, Inc. |
Fully isolated photodiode stack
|
US8599301B2
(en)
*
|
2006-04-17 |
2013-12-03 |
Omnivision Technologies, Inc. |
Arrayed imaging systems having improved alignment and associated methods
|
KR100776146B1
(ko)
*
|
2006-05-04 |
2007-11-15 |
매그나칩 반도체 유한회사 |
화소를 버스트 리셋 동작과 통합하여 개선된 성능을 갖는cmos이미지 센서
|
US7916362B2
(en)
|
2006-05-22 |
2011-03-29 |
Eastman Kodak Company |
Image sensor with improved light sensitivity
|
KR20090040343A
(ko)
*
|
2006-07-18 |
2009-04-23 |
티아이알 테크놀로지 엘피 |
광의 세기 및 피크 파장을 결정하는 방법 및 장치
|
US20080067330A1
(en)
*
|
2006-09-19 |
2008-03-20 |
Denso Corporation |
Color sensor for vehicle and method for manufacturing the same
|
JP4396684B2
(ja)
*
|
2006-10-04 |
2010-01-13 |
ソニー株式会社 |
固体撮像装置の製造方法
|
JP4960058B2
(ja)
*
|
2006-10-04 |
2012-06-27 |
株式会社東芝 |
増幅型固体撮像素子
|
US8031258B2
(en)
|
2006-10-04 |
2011-10-04 |
Omnivision Technologies, Inc. |
Providing multiple video signals from single sensor
|
KR100821469B1
(ko)
*
|
2006-10-13 |
2008-04-11 |
매그나칩 반도체 유한회사 |
개선된 컬러 크로스토크를 갖는 소형 cmos 이미지 센서및 그 제조 방법
|
US20080124830A1
(en)
*
|
2006-11-29 |
2008-05-29 |
Sang-Gi Lee |
Method of manufacturing image sensor
|
KR100802295B1
(ko)
*
|
2006-11-30 |
2008-02-11 |
동부일렉트로닉스 주식회사 |
씨모스 이미지 센서 및 그 제조방법
|
US20080138926A1
(en)
*
|
2006-12-11 |
2008-06-12 |
Lavine James P |
Two epitaxial layers to reduce crosstalk in an image sensor
|
US7763913B2
(en)
*
|
2006-12-12 |
2010-07-27 |
Aptina Imaging Corporation |
Imaging method, apparatus, and system providing improved imager quantum efficiency
|
KR100850859B1
(ko)
*
|
2006-12-21 |
2008-08-06 |
동부일렉트로닉스 주식회사 |
이미지 센서 및 그 제조 방법
|
KR20080058841A
(ko)
*
|
2006-12-22 |
2008-06-26 |
동부일렉트로닉스 주식회사 |
수직형 시모스 이미지 센서 및 그 제조 방법
|
JP5151145B2
(ja)
|
2006-12-26 |
2013-02-27 |
ソニー株式会社 |
スイッチ回路、可変コンデンサ回路およびそのic
|
KR20080060560A
(ko)
*
|
2006-12-27 |
2008-07-02 |
동부일렉트로닉스 주식회사 |
버티칼 이미지 센서 및 그 제조 방법
|
US8115242B2
(en)
|
2007-02-07 |
2012-02-14 |
Foveon, Inc. |
Pinned photodiode CMOS pixel sensor
|
JP5584982B2
(ja)
|
2009-02-09 |
2014-09-10 |
ソニー株式会社 |
固体撮像素子およびカメラシステム
|
JP5273932B2
(ja)
*
|
2007-03-23 |
2013-08-28 |
キヤノン株式会社 |
光検出素子及び光検出方法、撮像素子及び撮像方法
|
JP4384198B2
(ja)
|
2007-04-03 |
2009-12-16 |
シャープ株式会社 |
固体撮像装置およびその製造方法、電子情報機器
|
US7602430B1
(en)
|
2007-04-18 |
2009-10-13 |
Foveon, Inc. |
High-gain multicolor pixel sensor with reset noise cancellation
|
US7651883B2
(en)
*
|
2007-05-09 |
2010-01-26 |
Sharp Laboratories Of America, Inc. |
High energy implant photodiode stack
|
US7834411B2
(en)
*
|
2007-05-15 |
2010-11-16 |
Foveon, Inc. |
CMOS pixel sensor with depleted photocollectors and a depleted common node
|
JP5104036B2
(ja)
|
2007-05-24 |
2012-12-19 |
ソニー株式会社 |
固体撮像素子とその製造方法及び撮像装置
|
CN101779109A
(zh)
*
|
2007-07-25 |
2010-07-14 |
Nxp股份有限公司 |
室内/室外检测
|
WO2009016600A2
(en)
*
|
2007-07-30 |
2009-02-05 |
Nxp B.V. |
Light sensor arrangement
|
DE102008039794A1
(de)
*
|
2007-08-30 |
2009-03-12 |
Dongbu Hitek Co., Ltd. |
Bildsensor und Verfahren zu dessen Herstellung
|
KR100878697B1
(ko)
*
|
2007-08-30 |
2009-01-13 |
주식회사 동부하이텍 |
이미지 센서 및 그 제조방법
|
DE202007019236U1
(de)
|
2007-11-02 |
2011-11-09 |
Valentina Anzupowa |
Farbteiler-Bildwandler-Gruppe mit teildurchlässigen Spiegeln und Mosaikfarbfiltern
|
US7608906B2
(en)
*
|
2007-11-13 |
2009-10-27 |
Teledyne Licensing, Llc |
Simultaneous unipolar multispectral integrated technology (SUMIT) detectors
|
US20090159799A1
(en)
*
|
2007-12-19 |
2009-06-25 |
Spectral Instruments, Inc. |
Color infrared light sensor, camera, and method for capturing images
|
US20090160981A1
(en)
*
|
2007-12-20 |
2009-06-25 |
Micron Technology, Inc. |
Apparatus including green and magenta pixels and method thereof
|
KR101009393B1
(ko)
|
2007-12-27 |
2011-01-19 |
주식회사 동부하이텍 |
수직형 씨모스 이미지 센서 및 그의 제조방법
|
GB2456771A
(en)
*
|
2008-01-22 |
2009-07-29 |
Sharp Kk |
Spectrally compensating a light sensor
|
US7759756B2
(en)
*
|
2008-02-04 |
2010-07-20 |
Sharp Laboratories Of America, Inc. |
Dual-pixel full color CMOS imager
|
EP2243009B1
(de)
*
|
2008-02-12 |
2018-10-10 |
Hewlett-Packard Development Company, L.P. |
Farbdetektor
|
US7745773B1
(en)
|
2008-04-11 |
2010-06-29 |
Foveon, Inc. |
Multi-color CMOS pixel sensor with shared row wiring and dual output lines
|
JP2009277798A
(ja)
*
|
2008-05-13 |
2009-11-26 |
Sony Corp |
固体撮像装置及び電子機器
|
US7807955B2
(en)
*
|
2008-05-30 |
2010-10-05 |
Eastman Kodak Company |
Image sensor having reduced well bounce
|
EP2133918B1
(de)
*
|
2008-06-09 |
2015-01-28 |
Sony Corporation |
Festkörperabbildungsvorrichtung, entsprechendes Steuerungsverfahren und elektronische Vorrichtung
|
JP4582205B2
(ja)
*
|
2008-06-12 |
2010-11-17 |
トヨタ自動車株式会社 |
電動車両
|
WO2010024799A1
(en)
*
|
2008-08-29 |
2010-03-04 |
Foveon, Inc. |
Cmos pixel sensor with depleted photocollectors and a depleted common node
|
US8054355B2
(en)
|
2008-10-16 |
2011-11-08 |
Omnivision Technologies, Inc. |
Image sensor having multiple sensing layers
|
EP2180513A1
(de)
*
|
2008-10-27 |
2010-04-28 |
Stmicroelectronics SA |
Sensor für Nahinfrarot-/Farbbilder
|
JP4900404B2
(ja)
*
|
2009-02-23 |
2012-03-21 |
ソニー株式会社 |
固体撮像素子及びその駆動方法
|
US8816460B2
(en)
*
|
2009-04-06 |
2014-08-26 |
Nokia Corporation |
Image sensor
|
US7875918B2
(en)
|
2009-04-24 |
2011-01-25 |
Omnivision Technologies, Inc. |
Multilayer image sensor pixel structure for reducing crosstalk
|
US8405750B2
(en)
*
|
2009-06-08 |
2013-03-26 |
Aptina Imaging Corporation |
Image sensors and image reconstruction methods for capturing high dynamic range images
|
US8198578B2
(en)
*
|
2009-06-23 |
2012-06-12 |
Nokia Corporation |
Color filters for sub-diffraction limit-sized light sensors
|
US8179457B2
(en)
*
|
2009-06-23 |
2012-05-15 |
Nokia Corporation |
Gradient color filters for sub-diffraction limit sensors
|
US8134115B2
(en)
*
|
2009-06-23 |
2012-03-13 |
Nokia Corporation |
Color filters for sub-diffraction limit-sized light sensors
|
US20100327391A1
(en)
*
|
2009-06-26 |
2010-12-30 |
Mccarten John P |
Back-illuminated image sensor with electrically biased frontside and backside
|
US8018016B2
(en)
*
|
2009-06-26 |
2011-09-13 |
Omnivision Technologies, Inc. |
Back-illuminated image sensors having both frontside and backside photodetectors
|
KR102234065B1
(ko)
|
2009-09-17 |
2021-03-31 |
사이오닉스, 엘엘씨 |
감광성 이미징 장치 및 이와 관련된 방법
|
US9673243B2
(en)
|
2009-09-17 |
2017-06-06 |
Sionyx, Llc |
Photosensitive imaging devices and associated methods
|
US9911781B2
(en)
|
2009-09-17 |
2018-03-06 |
Sionyx, Llc |
Photosensitive imaging devices and associated methods
|
US8048711B2
(en)
|
2009-12-30 |
2011-11-01 |
Omnivision Technologies, Inc. |
Method for forming deep isolation in imagers
|
US8692198B2
(en)
|
2010-04-21 |
2014-04-08 |
Sionyx, Inc. |
Photosensitive imaging devices and associated methods
|
US20110267505A1
(en)
*
|
2010-04-29 |
2011-11-03 |
Bart Dierickx |
Pixel with reduced 1/f noise
|
US8383443B2
(en)
|
2010-05-14 |
2013-02-26 |
International Business Machines Corporation |
Non-uniform gate dielectric charge for pixel sensor cells and methods of manufacturing
|
CN106449684B
(zh)
|
2010-06-18 |
2019-09-27 |
西奥尼克斯公司 |
高速光敏设备及相关方法
|
JP5538089B2
(ja)
*
|
2010-06-23 |
2014-07-02 |
スタンレー電気株式会社 |
車両用灯具ユニット
|
RU2431906C1
(ru)
*
|
2010-06-25 |
2011-10-20 |
Алексей Олегович Федосеенко |
Способ регистрации светового сигнала, устройство для его осуществления и способ сканирования объекта
|
US9634173B2
(en)
*
|
2010-07-26 |
2017-04-25 |
Polyvalor, Limited Partnership |
Photodetector for determining light wavelengths
|
FR2969390B1
(fr)
*
|
2010-12-15 |
2014-09-26 |
St Microelectronics Rousset |
Dispositif d'imagerie avec filtrage du rayonnement infrarouge.
|
KR102394088B1
(ko)
|
2011-03-10 |
2022-05-03 |
사이오닉스, 엘엘씨 |
3차원 센서, 시스템, 및 관련 방법
|
US9496308B2
(en)
|
2011-06-09 |
2016-11-15 |
Sionyx, Llc |
Process module for increasing the response of backside illuminated photosensitive imagers and associated methods
|
EP2732402A2
(de)
|
2011-07-13 |
2014-05-21 |
Sionyx, Inc. |
Biometrische bildgebungsvorrichtungen und entsprechende verfahren
|
US8946612B2
(en)
|
2011-07-29 |
2015-02-03 |
Semiconductor Components Industries, Llc |
Image sensor with controllable vertically integrated photodetectors
|
US8829637B2
(en)
|
2011-07-29 |
2014-09-09 |
Semiconductor Components Industries, Llc |
Image sensor with controllable vertically integrated photodetectors using a buried layer
|
US8736728B2
(en)
|
2011-07-29 |
2014-05-27 |
Truesense Imaging, Inc. |
Image sensor with controllable vertically integrated photodetectors
|
US8339494B1
(en)
|
2011-07-29 |
2012-12-25 |
Truesense Imaging, Inc. |
Image sensor with controllable vertically integrated photodetectors
|
US9070611B2
(en)
|
2011-07-29 |
2015-06-30 |
Semiconductor Components Industries, Llc |
Image sensor with controllable vertically integrated photodetectors
|
US8730362B2
(en)
|
2011-07-29 |
2014-05-20 |
Truesense Imaging, Inc. |
Image sensor with controllable vertically integrated photodetectors
|
JP5843527B2
(ja)
|
2011-09-05 |
2016-01-13 |
キヤノン株式会社 |
光電変換装置
|
US8865507B2
(en)
|
2011-09-16 |
2014-10-21 |
Sionyx, Inc. |
Integrated visible and infrared imager devices and associated methods
|
US8913153B2
(en)
|
2011-10-06 |
2014-12-16 |
Aptina Imaging Corporation |
Imaging systems and methods for generating motion-compensated high-dynamic-range images
|
TWI427783B
(zh)
|
2011-10-28 |
2014-02-21 |
Ti Shiue Biotech Inc |
應用於分子檢測與鑑別的多接面結構之光二極體及其製造方法
|
JP5759353B2
(ja)
*
|
2011-12-07 |
2015-08-05 |
フォブオン・インク |
垂直に積層したセンサーを含む感光性センサー群
|
JP5369168B2
(ja)
*
|
2011-12-07 |
2013-12-18 |
フォブオン・インク |
垂直に積層したセンサーを含む感光性センサー群
|
US9172889B2
(en)
|
2012-02-09 |
2015-10-27 |
Semiconductor Components Industries, Llc |
Imaging systems and methods for generating auto-exposed high-dynamic-range images
|
US9007488B2
(en)
|
2012-03-08 |
2015-04-14 |
Semiconductor Components Industries, Llc |
Systems and methods for generating interpolated high-dynamic-range images
|
US9064764B2
(en)
|
2012-03-22 |
2015-06-23 |
Sionyx, Inc. |
Pixel isolation elements, devices, and associated methods
|
DE102012007677B4
(de)
|
2012-04-17 |
2015-05-07 |
Airbus Defence and Space GmbH |
Optische Sensoranordnung
|
US9338372B2
(en)
|
2012-09-19 |
2016-05-10 |
Semiconductor Components Industries, Llc |
Column-based high dynamic range imaging systems
|
US9231015B2
(en)
|
2012-09-24 |
2016-01-05 |
Omnivision Technologies, Inc. |
Backside-illuminated photosensor array with white, yellow and red-sensitive elements
|
US9136300B2
(en)
|
2013-01-11 |
2015-09-15 |
Digimarc Corporation |
Next generation imaging methods and systems
|
EP2763397A1
(de)
|
2013-02-05 |
2014-08-06 |
Burg-Wächter Kg |
Fotosensor
|
KR20150130303A
(ko)
|
2013-02-15 |
2015-11-23 |
사이오닉스, 아이엔씨. |
안티 블루밍 특성 및 관련 방법을 가지는 높은 동적 범위의 cmos 이미지 센서
|
WO2014151093A1
(en)
|
2013-03-15 |
2014-09-25 |
Sionyx, Inc. |
Three dimensional imaging utilizing stacked imager devices and associated methods
|
TW201501276A
(zh)
*
|
2013-06-20 |
2015-01-01 |
Upi Semiconductor Corp |
具有多個光感測器之光感測晶片及其製造方法
|
US9209345B2
(en)
|
2013-06-29 |
2015-12-08 |
Sionyx, Inc. |
Shallow trench textured regions and associated methods
|
KR102140482B1
(ko)
|
2013-12-30 |
2020-08-04 |
삼성전자주식회사 |
적층형 이미지 센서의 단위 픽셀 및 이를 포함하는 적층형 이미지 센서
|
WO2015185662A2
(en)
|
2014-06-05 |
2015-12-10 |
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. |
Method and means for multispectral imaging
|
US9455291B2
(en)
|
2015-01-20 |
2016-09-27 |
Omnivision Technologies, Inc. |
Blue enhanced image sensor
|
US9565405B2
(en)
|
2015-02-03 |
2017-02-07 |
Omnivision Technologies, Inc. |
Image sensor with enhanced quantum efficiency
|
US20160255323A1
(en)
|
2015-02-26 |
2016-09-01 |
Dual Aperture International Co. Ltd. |
Multi-Aperture Depth Map Using Blur Kernels and Down-Sampling
|
KR102531712B1
(ko)
|
2015-08-19 |
2023-05-11 |
삼성전자주식회사 |
적층형 이미지 센서와 그 제조방법
|
KR102573163B1
(ko)
*
|
2015-08-21 |
2023-08-30 |
삼성전자주식회사 |
이미지 센서 및 이를 포함하는 전자 장치
|
KR102519178B1
(ko)
|
2015-09-25 |
2023-04-06 |
삼성전자주식회사 |
색분리 소자를 포함하는 이미지 센서 및 이를 포함하는 촬상 장치
|
KR102466671B1
(ko)
|
2015-10-02 |
2022-11-14 |
삼성전자주식회사 |
적층형 이미지 센서
|
CN107099844B
(zh)
*
|
2016-02-23 |
2021-01-05 |
松下知识产权经营株式会社 |
Ramo4基板及其制造方法
|
DE102018119710A1
(de)
|
2018-08-14 |
2020-02-20 |
Universität Leipzig |
Vorrichtung und verfahren zur bestimmung einer wellenlänge einer strahlung
|