DE602004025461D1 - Lichtemittierendes bauelement auf galliumnitridbasis - Google Patents

Lichtemittierendes bauelement auf galliumnitridbasis

Info

Publication number
DE602004025461D1
DE602004025461D1 DE602004025461T DE602004025461T DE602004025461D1 DE 602004025461 D1 DE602004025461 D1 DE 602004025461D1 DE 602004025461 T DE602004025461 T DE 602004025461T DE 602004025461 T DE602004025461 T DE 602004025461T DE 602004025461 D1 DE602004025461 D1 DE 602004025461D1
Authority
DE
Germany
Prior art keywords
light
gallium nitride
construction element
nitride base
emitting construction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004025461T
Other languages
English (en)
Inventor
H Sato
N Wada
Shiro Sakai
M Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitride Semiconductors Co Ltd
Original Assignee
Nitride Semiconductors Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitride Semiconductors Co Ltd filed Critical Nitride Semiconductors Co Ltd
Publication of DE602004025461D1 publication Critical patent/DE602004025461D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of group III and group V of the periodic system
    • H01L33/32Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34333Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • H01L33/06Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0213Sapphire, quartz or diamond based substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/2004Confining in the direction perpendicular to the layer structure
    • H01S5/2009Confining in the direction perpendicular to the layer structure by using electron barrier layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2218Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties
    • H01S5/222Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties having a refractive index lower than that of the cladding layers or outer guiding layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/305Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3086Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/3211Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
    • H01S5/3216Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities quantum well or superlattice cladding layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3407Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by special barrier layers
DE602004025461T 2004-04-16 2004-04-16 Lichtemittierendes bauelement auf galliumnitridbasis Expired - Lifetime DE602004025461D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2004/005475 WO2005101532A1 (ja) 2004-04-16 2004-04-16 窒化ガリウム系発光装置

Publications (1)

Publication Number Publication Date
DE602004025461D1 true DE602004025461D1 (de) 2010-03-25

Family

ID=35150265

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004025461T Expired - Lifetime DE602004025461D1 (de) 2004-04-16 2004-04-16 Lichtemittierendes bauelement auf galliumnitridbasis

Country Status (6)

Country Link
US (1) US7067838B1 (de)
EP (1) EP1619729B1 (de)
JP (1) JP3863177B2 (de)
CN (1) CN100359707C (de)
DE (1) DE602004025461D1 (de)
WO (1) WO2005101532A1 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI224877B (en) * 2003-12-25 2004-12-01 Super Nova Optoelectronics Cor Gallium nitride series light-emitting diode structure and its manufacturing method
US8174037B2 (en) 2004-09-22 2012-05-08 Cree, Inc. High efficiency group III nitride LED with lenticular surface
JP5191650B2 (ja) * 2005-12-16 2013-05-08 シャープ株式会社 窒化物半導体発光素子および窒化物半導体発光素子の製造方法
KR101199176B1 (ko) 2005-12-27 2012-11-07 엘지이노텍 주식회사 발광 소자
JP4948134B2 (ja) * 2006-11-22 2012-06-06 シャープ株式会社 窒化物半導体発光素子
KR100920915B1 (ko) 2006-12-28 2009-10-12 서울옵토디바이스주식회사 초격자 구조의 장벽층을 갖는 발광 다이오드
EP1976031A3 (de) 2007-03-29 2010-09-08 Seoul Opto Device Co., Ltd. Lichtemittierende Diode mit Bohr- und/oder Sperrschichten mit Übergitterstruktur
KR101316492B1 (ko) 2007-04-23 2013-10-10 엘지이노텍 주식회사 질화물 반도체 발광소자 및 그 제조 방법
KR101459752B1 (ko) * 2007-06-22 2014-11-13 엘지이노텍 주식회사 반도체 발광소자 및 그 제조방법
TWI341600B (en) * 2007-08-31 2011-05-01 Huga Optotech Inc Light optoelectronic device and forming method thereof
KR100877774B1 (ko) 2007-09-10 2009-01-16 서울옵토디바이스주식회사 개선된 구조의 발광다이오드
TWI466314B (zh) * 2008-03-05 2014-12-21 Advanced Optoelectronic Tech 三族氮化合物半導體發光二極體
CN101527341B (zh) * 2008-03-07 2013-04-24 展晶科技(深圳)有限公司 三族氮化合物半导体发光二极管
TWI566431B (zh) * 2008-07-24 2017-01-11 榮創能源科技股份有限公司 組合式電子阻擋層發光元件
CN101640236A (zh) * 2008-07-29 2010-02-03 先进开发光电股份有限公司 组合式电子阻挡层发光元件
TW201007981A (en) * 2008-08-11 2010-02-16 Advanced Optoelectronic Tech Light emitting device and reduced polarization interlayer thereof
JP5641173B2 (ja) * 2009-02-27 2014-12-17 独立行政法人理化学研究所 光半導体素子及びその製造方法
KR101754900B1 (ko) * 2010-04-09 2017-07-06 엘지이노텍 주식회사 발광 소자
EP2408028B1 (de) * 2010-07-16 2015-04-08 LG Innotek Co., Ltd. Lichtemittierende Vorrichtung
CN102104097A (zh) * 2011-01-14 2011-06-22 映瑞光电科技(上海)有限公司 多量子阱结构、发光二极管和发光二极管封装件
CN102738340B (zh) * 2011-04-01 2015-07-22 山东华光光电子有限公司 一种采用AlInN量子垒提高GaN基LED内量子效率的LED结构及制备方法
FR2973946B1 (fr) * 2011-04-08 2013-03-22 Saint Gobain Dispositif électronique a couches
US8748919B2 (en) 2011-04-28 2014-06-10 Palo Alto Research Center Incorporated Ultraviolet light emitting device incorporating optically absorbing layers
JP5545272B2 (ja) 2011-06-21 2014-07-09 豊田合成株式会社 Iii族窒化物半導体発光素子
JP2013008803A (ja) 2011-06-23 2013-01-10 Toyoda Gosei Co Ltd Iii族窒化物半導体発光素子の製造方法
JP5996846B2 (ja) 2011-06-30 2016-09-21 シャープ株式会社 窒化物半導体発光素子およびその製造方法
JP5543946B2 (ja) * 2011-08-26 2014-07-09 株式会社東芝 半導体発光素子および発光装置
JP5668647B2 (ja) * 2011-09-06 2015-02-12 豊田合成株式会社 Iii族窒化物半導体発光素子およびその製造方法
EP2823515A4 (de) 2012-03-06 2015-08-19 Soraa Inc Lichtemittierende dioden mit materialschichten mit niedrigem brechungsindex zur reduzierung von lichtleitungseffekten
KR102246648B1 (ko) * 2014-07-29 2021-04-30 서울바이오시스 주식회사 자외선 발광 다이오드
KR20140019635A (ko) * 2012-08-06 2014-02-17 엘지이노텍 주식회사 발광 소자 및 발광 소자 패키지
US9087946B2 (en) * 2012-10-26 2015-07-21 Epistar Corporation Light emitting device
JP2014192274A (ja) * 2013-03-27 2014-10-06 Stanley Electric Co Ltd 高出力GaN系半導体発光素子
JP2015119171A (ja) * 2013-11-13 2015-06-25 スタンレー電気株式会社 多重量子井戸半導体発光素子
TWI568016B (zh) * 2014-12-23 2017-01-21 錼創科技股份有限公司 半導體發光元件
TWI577046B (zh) * 2014-12-23 2017-04-01 錼創科技股份有限公司 半導體發光元件及其製作方法
DE102015100029A1 (de) * 2015-01-05 2016-07-07 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement
WO2017023535A1 (en) 2015-07-31 2017-02-09 Sxaymiq Technologies Llc Light emitting diode with displaced p-type doping
JP6327323B2 (ja) * 2015-11-30 2018-05-23 日亜化学工業株式会社 半導体レーザ素子及びその製造方法
JP6387978B2 (ja) * 2016-02-09 2018-09-12 日亜化学工業株式会社 窒化物半導体発光素子
CN114093994A (zh) 2016-06-20 2022-02-25 苏州乐琻半导体有限公司 半导体器件以及半导体器件封装
US10340415B2 (en) * 2016-09-01 2019-07-02 Lg Innotek Co., Ltd. Semiconductor device and semiconductor device package including the same
JP7178712B2 (ja) 2016-09-10 2022-11-28 スージョウ レキン セミコンダクター カンパニー リミテッド 半導体素子
EP3514840A4 (de) 2016-09-13 2019-08-21 LG Innotek Co., Ltd. Halbleiterbauelement und halbleiterbauelementgehäuse damit
US10903395B2 (en) 2016-11-24 2021-01-26 Lg Innotek Co., Ltd. Semiconductor device having varying concentrations of aluminum
JP6486401B2 (ja) 2017-03-08 2019-03-20 日機装株式会社 半導体発光素子および半導体発光素子の製造方法
CN107302043A (zh) * 2017-07-11 2017-10-27 安徽三安光电有限公司 一种具有量子阱保护层的发光二极管及其制备方法
KR102390828B1 (ko) 2017-08-14 2022-04-26 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 반도체 소자
US20190103509A1 (en) * 2017-09-30 2019-04-04 Sensor Electronic Technology, Inc. Semiconductor Heterostructure with P-type Superlattice
KR102507671B1 (ko) * 2017-10-02 2023-03-08 도와 일렉트로닉스 가부시키가이샤 심자외 발광소자 및 그 제조 방법
CN107819058B (zh) 2017-11-28 2019-07-23 厦门三安光电有限公司 发光二极管
CN109103311A (zh) * 2018-09-03 2018-12-28 淮安澳洋顺昌光电技术有限公司 一种降低氮化镓基led发光二极管工作电压的外延片及生长方法
US11139342B2 (en) * 2018-09-26 2021-10-05 Nitride Semiconductors Co., Ltd. UV-LED and display
JP6829235B2 (ja) * 2018-11-01 2021-02-10 日機装株式会社 半導体発光素子および半導体発光素子の製造方法
WO2023243518A1 (ja) * 2022-06-13 2023-12-21 ヌヴォトンテクノロジージャパン株式会社 窒化物系半導体発光素子

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07170022A (ja) * 1993-12-16 1995-07-04 Mitsubishi Electric Corp 半導体レーザ装置
JP3658112B2 (ja) * 1995-11-06 2005-06-08 日亜化学工業株式会社 窒化物半導体レーザダイオード
KR100267839B1 (ko) * 1995-11-06 2000-10-16 오가와 에이지 질화물 반도체 장치
CN1195895A (zh) * 1997-04-10 1998-10-14 李炳辉 半导体量子振荡器件
JP4304750B2 (ja) * 1998-12-08 2009-07-29 日亜化学工業株式会社 窒化物半導体の成長方法及び窒化物半導体素子
GB2344932A (en) * 1998-12-15 2000-06-21 Sharp Kk Semiconductor Laser with gamma and X electron barriers
JP2000196194A (ja) * 1998-12-25 2000-07-14 Sanyo Electric Co Ltd 半導体発光素子
US6614059B1 (en) * 1999-01-07 2003-09-02 Matsushita Electric Industrial Co., Ltd. Semiconductor light-emitting device with quantum well
JP4032636B2 (ja) * 1999-12-13 2008-01-16 日亜化学工業株式会社 発光素子
JP4161603B2 (ja) * 2001-03-28 2008-10-08 日亜化学工業株式会社 窒化物半導体素子
JP2002314204A (ja) 2001-04-16 2002-10-25 Ricoh Co Ltd p型超格子構造とその作製方法、III族窒化物半導体素子及びIII族窒化物半導体発光素子
WO2003041234A1 (fr) * 2001-11-05 2003-05-15 Nichia Corporation Element semi-conducteur
JP2003289176A (ja) * 2002-01-24 2003-10-10 Sony Corp 半導体発光素子およびその製造方法
JP2004087908A (ja) 2002-08-28 2004-03-18 Sharp Corp 窒化物半導体発光素子、その製造方法、それを搭載した光学装置
US7058105B2 (en) * 2002-10-17 2006-06-06 Samsung Electro-Mechanics Co., Ltd. Semiconductor optoelectronic device

Also Published As

Publication number Publication date
WO2005101532A1 (ja) 2005-10-27
JP3863177B2 (ja) 2006-12-27
US20060131558A1 (en) 2006-06-22
EP1619729A1 (de) 2006-01-25
CN1698215A (zh) 2005-11-16
CN100359707C (zh) 2008-01-02
EP1619729A4 (de) 2006-09-27
US7067838B1 (en) 2006-06-27
EP1619729B1 (de) 2010-02-10
JPWO2005101532A1 (ja) 2007-08-16

Similar Documents

Publication Publication Date Title
DE602004025461D1 (de) Lichtemittierendes bauelement auf galliumnitridbasis
DE602006017872D1 (de) Lichtemittierende halbleitervorrichtung auf basis einer galliumnitridverbindung
DE60331704D1 (de) Organisches lichtemittierendes Element
NL1030036A1 (nl) Illuminator.
EP1746664A4 (de) Nitrid-halbleiter-lichtemissionselement
FR2898434B1 (fr) Diode electroluminescente blanche monolithique
DK3722665T3 (da) Belysningsindretning
DE602005022024D1 (de) Lichtemittierende Anzeigevorrichtung
DE502005000846D1 (de) Ventilanordnung
DE112006004259A5 (de) Lichtemittierendes Element
DE602005015525D1 (de) Beleuchtungseinrichtung
DE602004025575D1 (de) Schleifringanordnung
DE112004002671D2 (de) Diode
FR2868878B3 (fr) STRUCTURE DE DIODE ELECTROLUMINESCENTE A BASE DE GaN
DE602004021460D1 (de) Lichtemittierende Halbleitervorrichtung
NO20053040D0 (no) Inntrekkbar belysningsanordning.
DE60319440D1 (de) Organisches elektrolumineszierendes element
NL1027229A1 (nl) Markeerinrichting.
AT500139B8 (de) Ringelement
ES1057114Y (es) Dispositivo empotrable de iluminacion.
ITTV20050055A1 (it) Dispositivo luminoso.
ITMI20051289A1 (it) Valvola di iniezione
NO20043024D0 (no) Ventilanordning
ES1057350Y (es) Dispositivo de iluminacion.
SE0402224D0 (sv) Katadioptrisk belysningsanordning