DE602005027810D1 - Selbst-boost-system für flash-speicherzellen - Google Patents

Selbst-boost-system für flash-speicherzellen

Info

Publication number
DE602005027810D1
DE602005027810D1 DE602005027810T DE602005027810T DE602005027810D1 DE 602005027810 D1 DE602005027810 D1 DE 602005027810D1 DE 602005027810 T DE602005027810 T DE 602005027810T DE 602005027810 T DE602005027810 T DE 602005027810T DE 602005027810 D1 DE602005027810 D1 DE 602005027810D1
Authority
DE
Germany
Prior art keywords
word line
self boosting
band
reduce
word lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005027810T
Other languages
English (en)
Inventor
Gerrit Hemink
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SanDisk Corp
Original Assignee
SanDisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SanDisk Corp filed Critical SanDisk Corp
Publication of DE602005027810D1 publication Critical patent/DE602005027810D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
DE602005027810T 2004-02-06 2005-01-20 Selbst-boost-system für flash-speicherzellen Active DE602005027810D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/774,014 US7161833B2 (en) 2004-02-06 2004-02-06 Self-boosting system for flash memory cells
PCT/US2005/001962 WO2005078733A2 (en) 2004-02-06 2005-01-20 Self-boosting system for flash memory cells

Publications (1)

Publication Number Publication Date
DE602005027810D1 true DE602005027810D1 (de) 2011-06-16

Family

ID=34826888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005027810T Active DE602005027810D1 (de) 2004-02-06 2005-01-20 Selbst-boost-system für flash-speicherzellen

Country Status (9)

Country Link
US (3) US7161833B2 (de)
EP (2) EP1714291B1 (de)
JP (2) JP4819702B2 (de)
KR (1) KR101161152B1 (de)
CN (1) CN100555453C (de)
AT (1) ATE508460T1 (de)
DE (1) DE602005027810D1 (de)
TW (1) TWI328228B (de)
WO (1) WO2005078733A2 (de)

Families Citing this family (113)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7161833B2 (en) * 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells
US7466590B2 (en) * 2004-02-06 2008-12-16 Sandisk Corporation Self-boosting method for flash memory cells
JP4398750B2 (ja) * 2004-02-17 2010-01-13 株式会社東芝 Nand型フラッシュメモリ
US7170793B2 (en) * 2004-04-13 2007-01-30 Sandisk Corporation Programming inhibit for non-volatile memory
US7294882B2 (en) * 2004-09-28 2007-11-13 Sandisk Corporation Non-volatile memory with asymmetrical doping profile
US7895617B2 (en) * 2004-12-15 2011-02-22 Sony Corporation Content substitution editor
KR100680462B1 (ko) * 2005-04-11 2007-02-08 주식회사 하이닉스반도체 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법
US7196930B2 (en) * 2005-04-27 2007-03-27 Micron Technology, Inc. Flash memory programming to reduce program disturb
KR100697284B1 (ko) * 2005-05-02 2007-03-20 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법
KR100621634B1 (ko) * 2005-05-06 2006-09-07 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법
US7345918B2 (en) * 2005-08-31 2008-03-18 Micron Technology, Inc. Selective threshold voltage verification and compaction
ATE450043T1 (de) * 2005-12-19 2009-12-15 Sandisk Corp Verfahren zur programmierung eines nicht flüchtigen speichers mit verminderter programmstörung über modizifierte durchgangsspannungen
US7355888B2 (en) * 2005-12-19 2008-04-08 Sandisk Corporation Apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages
US7355889B2 (en) * 2005-12-19 2008-04-08 Sandisk Corporation Method for programming non-volatile memory with reduced program disturb using modified pass voltages
US7362615B2 (en) * 2005-12-27 2008-04-22 Sandisk Corporation Methods for active boosting to minimize capacitive coupling effect between adjacent gates of flash memory devices
EP1974383B1 (de) 2005-12-27 2016-10-19 SanDisk Technologies LLC Verfahren zum Auslesen einer Flash-Speicheranordnung mit einer Booster-Plate
US7436703B2 (en) * 2005-12-27 2008-10-14 Sandisk Corporation Active boosting to minimize capacitive coupling effect between adjacent gates of flash memory devices
US7443726B2 (en) 2005-12-29 2008-10-28 Sandisk Corporation Systems for alternate row-based reading and writing for non-volatile memory
US7616489B2 (en) 2006-02-08 2009-11-10 Micron Technology, Inc. Memory array segmentation and methods
US7408810B2 (en) * 2006-02-22 2008-08-05 Micron Technology, Inc. Minimizing effects of program disturb in a memory device
US7436733B2 (en) * 2006-03-03 2008-10-14 Sandisk Corporation System for performing read operation on non-volatile storage with compensation for coupling
US7499319B2 (en) * 2006-03-03 2009-03-03 Sandisk Corporation Read operation for non-volatile storage with compensation for coupling
US7561469B2 (en) * 2006-03-28 2009-07-14 Micron Technology, Inc. Programming method to reduce word line to word line breakdown for NAND flash
US7428165B2 (en) * 2006-03-30 2008-09-23 Sandisk Corporation Self-boosting method with suppression of high lateral electric fields
US7511995B2 (en) * 2006-03-30 2009-03-31 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
WO2007117869A2 (en) * 2006-03-30 2007-10-18 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
US7440321B2 (en) * 2006-04-12 2008-10-21 Micron Technology, Inc. Multiple select gate architecture with select gates of different lengths
US7286408B1 (en) 2006-05-05 2007-10-23 Sandisk Corporation Boosting methods for NAND flash memory
US7436709B2 (en) * 2006-05-05 2008-10-14 Sandisk Corporation NAND flash memory with boosting
US7310272B1 (en) * 2006-06-02 2007-12-18 Sandisk Corporation System for performing data pattern sensitivity compensation using different voltage
US7450421B2 (en) * 2006-06-02 2008-11-11 Sandisk Corporation Data pattern sensitivity compensation using different voltage
US7525841B2 (en) * 2006-06-14 2009-04-28 Micron Technology, Inc. Programming method for NAND flash
US7492633B2 (en) 2006-06-19 2009-02-17 Sandisk Corporation System for increasing programming speed for non-volatile memory by applying counter-transitioning waveforms to word lines
US7349261B2 (en) * 2006-06-19 2008-03-25 Sandisk Corporation Method for increasing programming speed for non-volatile memory by applying counter-transitioning waveforms to word lines
KR100800479B1 (ko) 2006-07-25 2008-02-04 삼성전자주식회사 하이브리드 로컬 부스팅 방식을 이용한 불휘발성 메모리장치의 프로그램 방법
KR100761470B1 (ko) 2006-07-31 2007-09-27 삼성전자주식회사 프로그램 디스터브를 방지할 수 있는 플래시 메모리 장치및 그것의 프로그램 방법
CA2660453A1 (en) * 2006-08-08 2008-02-14 Kimoto Co., Ltd. Screening apparatus and screening method
KR100764053B1 (ko) 2006-08-10 2007-10-08 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법
US7471565B2 (en) * 2006-08-22 2008-12-30 Micron Technology, Inc. Reducing effects of program disturb in a memory device
JP2008052808A (ja) * 2006-08-24 2008-03-06 Toshiba Corp 不揮発性半導体記憶装置及びそのデータの読出方法並びにメモリカード
TWI349286B (en) * 2006-09-06 2011-09-21 Sandisk Corp System and method for programming non-volatile memory with improved boosting
US7440326B2 (en) 2006-09-06 2008-10-21 Sandisk Corporation Programming non-volatile memory with improved boosting
US8189378B2 (en) * 2006-09-27 2012-05-29 Sandisk Technologies Inc. Reducing program disturb in non-volatile storage
WO2008039667A2 (en) * 2006-09-27 2008-04-03 Sandisk Corporation Reducing program disturb in non-volatile storage
US8184478B2 (en) * 2006-09-27 2012-05-22 Sandisk Technologies Inc. Apparatus with reduced program disturb in non-volatile storage
US7705387B2 (en) * 2006-09-28 2010-04-27 Sandisk Corporation Non-volatile memory with local boosting control implant
US7977186B2 (en) * 2006-09-28 2011-07-12 Sandisk Corporation Providing local boosting control implant for non-volatile memory
KR100763093B1 (ko) * 2006-09-29 2007-10-04 주식회사 하이닉스반도체 플래쉬 메모리 장치의 프로그램 방법
US7596031B2 (en) 2006-10-30 2009-09-29 Sandisk Corporation Faster programming of highest multi-level state for non-volatile memory
US7505326B2 (en) 2006-10-31 2009-03-17 Atmel Corporation Programming pulse generator
US7417904B2 (en) 2006-10-31 2008-08-26 Atmel Corporation Adaptive gate voltage regulation
US7468911B2 (en) * 2006-11-02 2008-12-23 Sandisk Corporation Non-volatile memory using multiple boosting modes for reduced program disturb
US7440323B2 (en) * 2006-11-02 2008-10-21 Sandisk Corporation Reducing program disturb in non-volatile memory using multiple boosting modes
US7511996B2 (en) 2006-11-30 2009-03-31 Mosaid Technologies Incorporated Flash memory program inhibit scheme
US7623387B2 (en) * 2006-12-12 2009-11-24 Sandisk Corporation Non-volatile storage with early source-side boosting for reducing program disturb
US7623386B2 (en) * 2006-12-12 2009-11-24 Sandisk Corporation Reducing program disturb in non-volatile storage using early source-side boosting
CN100576356C (zh) * 2006-12-21 2009-12-30 中芯国际集成电路制造(上海)有限公司 减小存储单元写入扰乱的方法
US7440324B2 (en) * 2006-12-29 2008-10-21 Sandisk Corporation Apparatus with alternating read mode
US7468918B2 (en) * 2006-12-29 2008-12-23 Sandisk Corporation Systems for programming non-volatile memory with reduced program disturb by removing pre-charge dependency on word line data
US7433241B2 (en) * 2006-12-29 2008-10-07 Sandisk Corporation Programming non-volatile memory with reduced program disturb by removing pre-charge dependency on word line data
US7495962B2 (en) * 2006-12-29 2009-02-24 Sandisk Corporation Alternating read mode
US7463531B2 (en) * 2006-12-29 2008-12-09 Sandisk Corporation Systems for programming non-volatile memory with reduced program disturb by using different pre-charge enable voltages
US7450430B2 (en) * 2006-12-29 2008-11-11 Sandisk Corporation Programming non-volatile memory with reduced program disturb by using different pre-charge enable voltages
ITRM20070107A1 (it) * 2007-02-27 2008-08-28 Micron Technology Inc Sistema di inibizione di autoboost locale con linea di parole schermata
JP2008270343A (ja) * 2007-04-17 2008-11-06 Renesas Technology Corp 不揮発性半導体記憶装置
KR101263823B1 (ko) 2007-04-19 2013-05-13 삼성전자주식회사 비휘발성 메모리 소자 및 그 동작 방법
KR100889780B1 (ko) * 2007-04-24 2009-03-20 삼성전자주식회사 패스 전압 윈도우를 향상시킬 수 있는 플래시 메모리 장치및 그것의 프로그램 방법
US7440327B1 (en) 2007-04-25 2008-10-21 Sandisk Corporation Non-volatile storage with reduced power consumption during read operations
US7606079B2 (en) * 2007-04-25 2009-10-20 Sandisk Corporation Reducing power consumption during read operations in non-volatile storage
WO2008136826A1 (en) 2007-05-04 2008-11-13 Micron Technology, Inc. Word line voltage boost system and method for non-volatile memory devices and memory devices and processor-based system using same
KR101431195B1 (ko) 2007-05-07 2014-08-18 샌디스크 테크놀로지스, 인코포레이티드 채널 절연 스위칭을 이용한 비휘발성 저장을 위한 부스팅
US7460404B1 (en) * 2007-05-07 2008-12-02 Sandisk Corporation Boosting for non-volatile storage using channel isolation switching
US7463522B2 (en) * 2007-05-07 2008-12-09 Sandisk Corporation Non-volatile storage with boosting using channel isolation switching
US7577026B2 (en) * 2007-05-07 2009-08-18 Sandisk Corporation Source and drain side early boosting using local self boosting for non-volatile storage
JP2008300019A (ja) * 2007-06-04 2008-12-11 Toshiba Corp 不揮発性半導体記憶装置
US7986553B2 (en) * 2007-06-15 2011-07-26 Micron Technology, Inc. Programming of a solid state memory utilizing analog communication of bit patterns
KR100882205B1 (ko) * 2007-06-27 2009-02-06 삼성전자주식회사 글로벌 워드라인 디코더의 레이아웃 면적을 줄이는비휘발성 메모리 장치 및 그 동작 방법
JP4504405B2 (ja) 2007-09-12 2010-07-14 株式会社東芝 半導体記憶装置
US7978520B2 (en) 2007-09-27 2011-07-12 Sandisk Corporation Compensation of non-volatile memory chip non-idealities by program pulse adjustment
US7894263B2 (en) * 2007-09-28 2011-02-22 Sandisk Corporation High voltage generation and control in source-side injection programming of non-volatile memory
KR100858293B1 (ko) 2007-10-01 2008-09-11 최웅림 Nand 메모리 셀 어레이, 상기 nand 메모리 셀어레이를 구비하는 nand 플래시 메모리 및 nand플래시 메모리의 데이터 처리방법
KR20090035203A (ko) 2007-10-05 2009-04-09 삼성전자주식회사 비휘발성 메모리 장치 및 그 동작 방법
US7733705B2 (en) 2008-03-13 2010-06-08 Micron Technology, Inc. Reduction of punch-through disturb during programming of a memory device
US7949821B2 (en) 2008-06-12 2011-05-24 Micron Technology, Inc. Method of storing data on a flash memory device
KR101569894B1 (ko) * 2008-11-12 2015-11-17 삼성전자주식회사 불 휘발성 메모리 장치의 프로그램 방법
US8692310B2 (en) 2009-02-09 2014-04-08 Spansion Llc Gate fringing effect based channel formation for semiconductor device
KR101523677B1 (ko) * 2009-02-26 2015-05-28 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법 그리고 그것을 포함하는 메모리 시스템
US8009478B2 (en) 2009-10-05 2011-08-30 Micron Technology, Inc. Non-volatile memory apparatus and methods
US8102712B2 (en) * 2009-12-22 2012-01-24 Intel Corporation NAND programming technique
US8982631B2 (en) 2010-02-09 2015-03-17 Micron Technology, Inc. Programming methods and memories
JP2011192349A (ja) * 2010-03-15 2011-09-29 Toshiba Corp Nand型フラッシュメモリ
KR101682666B1 (ko) * 2010-08-11 2016-12-07 삼성전자주식회사 비휘발성 메모리 장치, 그것의 채널 부스팅 방법, 그것의 프로그램 방법 및 그것을 포함하는 메모리 시스템
KR20120129609A (ko) * 2011-05-20 2012-11-28 에스케이하이닉스 주식회사 비휘발성 메모리 장치의 프로그램 방법
US8638606B2 (en) 2011-09-16 2014-01-28 Sandisk Technologies Inc. Substrate bias during program of non-volatile storage
KR101913331B1 (ko) 2012-01-19 2018-10-30 삼성전자주식회사 비휘발성 메모리 장치, 그것을 포함하는 비휘발성 메모리 시스템, 그것의 프로그램 방법, 그리고 그것을 제어하는 컨트롤러 동작 방법
US9136784B2 (en) * 2012-03-20 2015-09-15 GM Global Technology Operations LLC Universal control unit for brushed or brushless DC motor
KR101979395B1 (ko) * 2012-05-08 2019-08-28 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그 동작 방법
US9177657B2 (en) * 2012-08-29 2015-11-03 Renesas Electronics Corporation Semiconductor device having non-volatile memory with data erase scheme
KR102094336B1 (ko) * 2013-02-13 2020-04-14 삼성전자주식회사 메모리 시스템 및 그것의 구동 방법
KR102062314B1 (ko) 2013-03-15 2020-01-03 삼성전자주식회사 불휘발성 메모리 장치 및 프로그램 방법
US9449690B2 (en) * 2013-04-03 2016-09-20 Cypress Semiconductor Corporation Modified local segmented self-boosting of memory cell channels
TWI514391B (zh) * 2013-07-23 2015-12-21 Winbond Electronics Corp 半導體記憶裝置及其抹除方法
US9595342B2 (en) 2015-01-20 2017-03-14 Sandisk Technologies Llc Method and apparatus for refresh programming of memory cells based on amount of threshold voltage downshift
KR20170073980A (ko) * 2015-12-21 2017-06-29 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그것의 동작 방법
US9953717B2 (en) * 2016-03-31 2018-04-24 Sandisk Technologies Llc NAND structure with tier select gate transistors
JP2018116755A (ja) 2017-01-19 2018-07-26 東芝メモリ株式会社 半導体記憶装置
JP7074583B2 (ja) * 2018-06-26 2022-05-24 キオクシア株式会社 半導体記憶装置
US10665306B1 (en) 2019-04-08 2020-05-26 Sandisk Technologies Llc Memory device with discharge voltage pulse to reduce injection type of program disturb
CN110619910B (zh) * 2019-08-30 2021-08-03 长江存储科技有限责任公司 存储器的控制方法、装置、存储介质
CN113066518B (zh) 2019-12-09 2022-09-30 长江存储科技有限责任公司 减少存储器件中编程干扰的方法及利用该方法的存储器件
KR20220015245A (ko) * 2020-07-30 2022-02-08 삼성전자주식회사 프로그래밍 동안 양방향 채널 프리차지를 수행하는 비휘발성 메모리 장치
CN114822615A (zh) * 2021-01-20 2022-07-29 长江存储科技有限责任公司 存储器的编程操作方法及装置
US11688469B2 (en) 2021-08-11 2023-06-27 Sandisk Technologies Llc Non-volatile memory with sub-block based self-boosting scheme

Family Cites Families (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5043940A (en) 1988-06-08 1991-08-27 Eliyahou Harari Flash EEPROM memory systems having multistate storage cells
US5172338B1 (en) 1989-04-13 1997-07-08 Sandisk Corp Multi-state eeprom read and write circuits and techniques
US5555204A (en) 1993-06-29 1996-09-10 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device
US5887145A (en) 1993-09-01 1999-03-23 Sandisk Corporation Removable mother/daughter peripheral card
KR0169267B1 (ko) 1993-09-21 1999-02-01 사토 후미오 불휘발성 반도체 기억장치
KR0142368B1 (ko) 1994-09-09 1998-07-15 김광호 불휘발성 반도체 메모리장치의 자동프로그램 회로
KR0145475B1 (ko) * 1995-03-31 1998-08-17 김광호 낸드구조를 가지는 불휘발성 반도체 메모리의 프로그램장치 및 방법
KR100192430B1 (ko) * 1995-08-21 1999-06-15 구본준 비휘발성 메모리 및 이 비휘발성 메모리를 프로그램하는 방법
JP3419969B2 (ja) 1995-09-12 2003-06-23 株式会社東芝 不揮発性半導体記憶装置
KR0172441B1 (ko) 1995-09-19 1999-03-30 김광호 불휘발성 반도체 메모리의 프로그램 방법
KR100244864B1 (ko) 1996-03-18 2000-03-02 니시무로 타이죠 불휘발성 반도체 기억 장치
US5903495A (en) 1996-03-18 1999-05-11 Kabushiki Kaisha Toshiba Semiconductor device and memory system
US5793677A (en) 1996-06-18 1998-08-11 Hu; Chung-You Using floating gate devices as select gate devices for NAND flash memory and its bias scheme
US5715194A (en) 1996-07-24 1998-02-03 Advanced Micro Devices, Inc. Bias scheme of program inhibit for random programming in a nand flash memory
KR100272037B1 (ko) 1997-02-27 2000-12-01 니시무로 타이죠 불휘발성 반도체 기억 장치
JP3481817B2 (ja) 1997-04-07 2003-12-22 株式会社東芝 半導体記憶装置
JP3583579B2 (ja) * 1997-06-06 2004-11-04 株式会社東芝 不揮発性半導体記憶装置およびその製造方法
JP3805867B2 (ja) 1997-09-18 2006-08-09 株式会社東芝 不揮発性半導体記憶装置
JP3540579B2 (ja) * 1997-11-07 2004-07-07 株式会社東芝 半導体記憶装置及びその製造方法
KR100297602B1 (ko) 1997-12-31 2001-08-07 윤종용 비휘발성메모리장치의프로그램방법
JP2000048581A (ja) * 1998-07-28 2000-02-18 Sony Corp 不揮発性半導体記憶装置
US5991202A (en) 1998-09-24 1999-11-23 Advanced Micro Devices, Inc. Method for reducing program disturb during self-boosting in a NAND flash memory
JP3866460B2 (ja) * 1998-11-26 2007-01-10 株式会社東芝 不揮発性半導体記憶装置
JP3540640B2 (ja) * 1998-12-22 2004-07-07 株式会社東芝 不揮発性半導体記憶装置
US6314026B1 (en) 1999-02-08 2001-11-06 Kabushiki Kaisha Toshiba Nonvolatile semiconductor device using local self boost technique
KR100385229B1 (ko) 2000-12-14 2003-05-27 삼성전자주식회사 스트링 선택 라인에 유도되는 노이즈 전압으로 인한프로그램 디스터브를 방지할 수 있는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법
US7070973B2 (en) * 2000-12-26 2006-07-04 Board Of Regents Of The University Of Nebraska Butyrylcholinesterase variants and methods of use
KR100385230B1 (ko) * 2000-12-28 2003-05-27 삼성전자주식회사 불휘발성 반도체 메모리 장치의 프로그램 방법
JP4713752B2 (ja) * 2000-12-28 2011-06-29 財団法人国際科学振興財団 半導体装置およびその製造方法
JP3631463B2 (ja) 2001-12-27 2005-03-23 株式会社東芝 不揮発性半導体記憶装置
JP3957985B2 (ja) * 2001-03-06 2007-08-15 株式会社東芝 不揮発性半導体記憶装置
US6522580B2 (en) 2001-06-27 2003-02-18 Sandisk Corporation Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states
US6535424B2 (en) * 2001-07-25 2003-03-18 Advanced Micro Devices, Inc. Voltage boost circuit using supply voltage detection to compensate for supply voltage variations in read mode voltage
JP2003045174A (ja) * 2001-08-01 2003-02-14 Sharp Corp 半導体記憶装置
TW520507B (en) 2001-08-16 2003-02-11 Integrated Circuit Solution In Control unit and method for plannable and re-programmable non-volatile memory
KR100453854B1 (ko) * 2001-09-07 2004-10-20 삼성전자주식회사 향상된 프로그램 방지 특성을 갖는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법
US6456528B1 (en) 2001-09-17 2002-09-24 Sandisk Corporation Selective operation of a multi-state non-volatile memory system in a binary mode
US6700815B2 (en) * 2002-04-08 2004-03-02 Advanced Micro Devices, Inc. Refresh scheme for dynamic page programming
DE10220293A1 (de) * 2002-05-07 2003-11-27 Philips Intellectual Property Gerät und Verfahren zur Reduktion von Bildartefakten
TW569221B (en) * 2002-09-11 2004-01-01 Elan Microelectronics Corp Chip having on-system programmable nonvolatile memory and off-system programmable nonvolatile memory, and forming method and programming method of the same
KR100502412B1 (ko) * 2002-10-23 2005-07-19 삼성전자주식회사 불 휘발성 반도체 메모리 장치 및 그것의 프로그램 방법
JP3863485B2 (ja) 2002-11-29 2006-12-27 株式会社東芝 不揮発性半導体記憶装置
US6859397B2 (en) * 2003-03-05 2005-02-22 Sandisk Corporation Source side self boosting technique for non-volatile memory
JP4537680B2 (ja) * 2003-08-04 2010-09-01 株式会社東芝 不揮発性半導体記憶装置及びその動作方法、製造方法、半導体集積回路及びシステム
US6977842B2 (en) * 2003-09-16 2005-12-20 Micron Technology, Inc. Boosted substrate/tub programming for flash memories
JP4212444B2 (ja) * 2003-09-22 2009-01-21 株式会社東芝 不揮発性半導体記憶装置
KR100562506B1 (ko) * 2003-12-01 2006-03-21 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법
US6898126B1 (en) * 2003-12-15 2005-05-24 Powerchip Semiconductor Corp. Method of programming a flash memory through boosting a voltage level of a source line
US7154779B2 (en) 2004-01-21 2006-12-26 Sandisk Corporation Non-volatile memory cell using high-k material inter-gate programming
US7161833B2 (en) * 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells
US7466590B2 (en) * 2004-02-06 2008-12-16 Sandisk Corporation Self-boosting method for flash memory cells
US7170793B2 (en) 2004-04-13 2007-01-30 Sandisk Corporation Programming inhibit for non-volatile memory
US7020026B2 (en) * 2004-05-05 2006-03-28 Sandisk Corporation Bitline governed approach for program control of non-volatile memory
JP4758625B2 (ja) 2004-08-09 2011-08-31 ルネサスエレクトロニクス株式会社 半導体装置
DK1786287T3 (en) * 2004-08-16 2016-12-12 Pacific World Corp Structurally flexible artificial nails
KR100645055B1 (ko) * 2004-10-28 2006-11-10 삼성전자주식회사 플래시 메모리 장치 및 그것의 프로그램 방법
KR100748553B1 (ko) * 2004-12-20 2007-08-10 삼성전자주식회사 리플-프리 고전압 발생회로 및 방법, 그리고 이를 구비한반도체 메모리 장치
KR100680462B1 (ko) 2005-04-11 2007-02-08 주식회사 하이닉스반도체 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법
US7295478B2 (en) 2005-05-12 2007-11-13 Sandisk Corporation Selective application of program inhibit schemes in non-volatile memory
KR100648289B1 (ko) 2005-07-25 2006-11-23 삼성전자주식회사 프로그램 속도를 향상시킬 수 있는 플래시 메모리 장치 및그것의 프로그램 방법
US7292476B2 (en) 2005-08-31 2007-11-06 Micron Technology, Inc. Programming method for NAND EEPROM
US7355889B2 (en) * 2005-12-19 2008-04-08 Sandisk Corporation Method for programming non-volatile memory with reduced program disturb using modified pass voltages
ATE450043T1 (de) 2005-12-19 2009-12-15 Sandisk Corp Verfahren zur programmierung eines nicht flüchtigen speichers mit verminderter programmstörung über modizifierte durchgangsspannungen
US7428165B2 (en) * 2006-03-30 2008-09-23 Sandisk Corporation Self-boosting method with suppression of high lateral electric fields
US7511995B2 (en) * 2006-03-30 2009-03-31 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
WO2007117869A2 (en) 2006-03-30 2007-10-18 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields

Also Published As

Publication number Publication date
JP2007520850A (ja) 2007-07-26
US7773414B2 (en) 2010-08-10
JP4819702B2 (ja) 2011-11-24
US20090073761A1 (en) 2009-03-19
ATE508460T1 (de) 2011-05-15
EP2341506A3 (de) 2012-03-21
US20050174852A1 (en) 2005-08-11
WO2005078733A2 (en) 2005-08-25
EP1714291A2 (de) 2006-10-25
US7471566B2 (en) 2008-12-30
WO2005078733A3 (en) 2005-10-13
TWI328228B (en) 2010-08-01
EP1714291B1 (de) 2011-05-04
KR101161152B1 (ko) 2012-07-03
KR20060133576A (ko) 2006-12-26
JP5416161B2 (ja) 2014-02-12
TW200608398A (en) 2006-03-01
CN1934653A (zh) 2007-03-21
EP2341506A2 (de) 2011-07-06
CN100555453C (zh) 2009-10-28
US7161833B2 (en) 2007-01-09
JP2011154778A (ja) 2011-08-11
US20070081384A1 (en) 2007-04-12

Similar Documents

Publication Publication Date Title
ATE508460T1 (de) Selbst-boost-system für flash-speicherzellen
TW200802381A (en) Self-boosting method for flash memory cells
KR100770754B1 (ko) 비휘발성 반도체 메모리 장치 및 그것의 프로그램 방법
KR100385229B1 (ko) 스트링 선택 라인에 유도되는 노이즈 전압으로 인한프로그램 디스터브를 방지할 수 있는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법
KR100612569B1 (ko) 향상된 프리-프로그램 기능을 가지는 플래쉬 메모리 장치및 그 프리-프로그램 동작 제어방법
JP5476572B2 (ja) ソース側非対称プリチャージプログラム方式
KR100885785B1 (ko) 플래시 메모리 소자의 프로그램 방법
US6549463B2 (en) Fast program to program verify method
US20080212375A1 (en) Method of programming and erasing a p-channel be-sonos nand flash memory
KR940010355A (ko) 반도체 불휘발성 메모리의 데이타 기입 및 데이타 소거방법
KR970017670A (ko) 비휘발성 메모리소자
ATE366983T1 (de) Stromarme programmiertechnik für einen schwebkörper-speichertransistor, speicherzelle und speichermatrix
ATE485589T1 (de) Verfahrenstechniken zur reduzierung von programm- und lesestörungen eines nicht-flüchtigen speichers
TW200636731A (en) Word line compensation in non-volatile memory erase operations
ATE450043T1 (de) Verfahren zur programmierung eines nicht flüchtigen speichers mit verminderter programmstörung über modizifierte durchgangsspannungen
US20120008415A1 (en) Semiconductor memory device and method of erasing the same
US20130163345A1 (en) Semiconductor memory device and method of operating the same
WO2007087097A3 (en) Nonvolatile memory and method of program inhibition
DE60222504D1 (de) Steuergate- und Wortleitungs-Spannungserhöhungsverfahren für Zwilling-MONOS-Zellenspeichern
KR970063271A (ko) 불휘발성 반도체 기억 장치
KR20060108324A (ko) Nand형 플래쉬 메모리 셀의 프로그램 방법
ATE489708T1 (de) Reduktion von programmstörungen in einem nichtflüchtigen speicher mit frühem quellenseitigem boosting
GB2259171A (en) Erasure control in EEPROM
KR20100106767A (ko) 불휘발성 메모리 소자의 프로그램 방법
US20080304324A1 (en) Nonvolatile semiconductor memory device which realizes "1" write operation by boosting channel potential

Legal Events

Date Code Title Description
R082 Change of representative

Ref document number: 1714291

Country of ref document: EP

Representative=s name: MARKS & CLERK (LUXEMBOURG) LLP, LU