DE602008004169D1 - Programmierbares diagnostik-speichermodul - Google Patents

Programmierbares diagnostik-speichermodul

Info

Publication number
DE602008004169D1
DE602008004169D1 DE602008004169T DE602008004169T DE602008004169D1 DE 602008004169 D1 DE602008004169 D1 DE 602008004169D1 DE 602008004169 T DE602008004169 T DE 602008004169T DE 602008004169 T DE602008004169 T DE 602008004169T DE 602008004169 D1 DE602008004169 D1 DE 602008004169D1
Authority
DE
Germany
Prior art keywords
memory module
memory
signals
interface
programmable diagnostic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602008004169T
Other languages
English (en)
Inventor
Moises Cases
Nam Huu Pham
Daniel N De Araujo
Bhyrav Murthy Mutnury
Daniel Mark Dreps
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE602008004169D1 publication Critical patent/DE602008004169D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
DE602008004169T 2007-08-17 2008-07-21 Programmierbares diagnostik-speichermodul Active DE602008004169D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/840,481 US7739562B2 (en) 2007-08-17 2007-08-17 Programmable diagnostic memory module
PCT/EP2008/059539 WO2009024423A1 (en) 2007-08-17 2008-07-21 Programmable diagnostic memory module

Publications (1)

Publication Number Publication Date
DE602008004169D1 true DE602008004169D1 (de) 2011-02-03

Family

ID=39929531

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602008004169T Active DE602008004169D1 (de) 2007-08-17 2008-07-21 Programmierbares diagnostik-speichermodul

Country Status (8)

Country Link
US (1) US7739562B2 (de)
EP (1) EP2179421B1 (de)
JP (1) JP5147942B2 (de)
KR (1) KR101039226B1 (de)
CN (1) CN101785066B (de)
AT (1) ATE492886T1 (de)
DE (1) DE602008004169D1 (de)
WO (1) WO2009024423A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102255208A (zh) * 2010-05-21 2011-11-23 鸿富锦精密工业（深圳）有限公司 转接卡
CN102354537B (zh) * 2011-07-06 2014-03-05 华中科技大学 一种相变存储器芯片测试方法
US9280859B2 (en) * 2012-10-08 2016-03-08 Toyota Motor Engineering & Manufacturing North America, Inc. Enhanced vehicle onboard diagnostic system and method
TWI492054B (zh) * 2012-11-05 2015-07-11 Phison Electronics Corp 快閃記憶體的模擬方法與模擬器
EP2759939B1 (de) 2013-01-29 2016-06-08 dSPACE digital signal processing and control engineering GmbH Verfahren zum Manipulieren einer Speicheroperation eines Steuergeräteprogramms auf einen virtuellen oder realen Speicher
KR101254091B1 (ko) 2013-02-26 2013-04-15 주식회사 이산 내진과 방수 기능을 겸비한 구조를 지닌 배전반
CN104697513B (zh) * 2013-12-10 2017-12-22 惠州市德赛西威汽车电子股份有限公司 多媒体导航仪
US20160124888A1 (en) * 2014-10-31 2016-05-05 William Michael Gervasi Memory Bus Loading and Conditioning Module
US11915739B2 (en) * 2021-12-21 2024-02-27 Micron Technology, Inc. On-chip device testing circuit that generates noise on power bus of memory device

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
US6467053B1 (en) * 1999-06-28 2002-10-15 International Business Machines Corporation Captured synchronous DRAM fails in a working environment
US6314034B1 (en) * 2000-04-14 2001-11-06 Advantest Corp. Application specific event based semiconductor memory test system
JP2002050195A (ja) * 2000-08-03 2002-02-15 Hitachi Ltd メモリ評価システム
JP3785389B2 (ja) * 2002-09-19 2006-06-14 株式会社バッファロー 補助モジュールおよび補助モジュールの制御方法
US6832141B2 (en) * 2002-10-25 2004-12-14 Davis Instruments Module for monitoring vehicle operation through onboard diagnostic port
DE10300781B4 (de) 2003-01-11 2014-02-06 Qimonda Ag Speicherbaustein, Testsystem und Verfahren zum Testen eines oder mehrerer Speicherbausteine
US7184915B2 (en) 2003-03-20 2007-02-27 Qualcomm, Incorporated Tiered built-in self-test (BIST) architecture for testing distributed memory modules
US7392442B2 (en) 2003-03-20 2008-06-24 Qualcomm Incorporated Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol
US6996648B2 (en) * 2003-05-28 2006-02-07 Hewlett-Packard Development Company, L.P. Generating notification that a new memory module has been added to a second memory slot in response to replacement of a memory module in a first memory slot
US7210059B2 (en) * 2003-08-19 2007-04-24 Micron Technology, Inc. System and method for on-board diagnostics of memory modules
DE10344877B3 (de) * 2003-09-26 2004-12-30 Infineon Technologies Ag Vorrichtung zum Testen eines Speichermoduls
US7353328B2 (en) * 2004-03-29 2008-04-01 Hewlett-Packard Development Company, L.P. Memory testing
US7206979B1 (en) 2004-06-28 2007-04-17 Sun Microsystems, Inc. Method and apparatus for at-speed diagnostics of embedded memories
DE102004051344A1 (de) 2004-10-21 2006-05-04 Infineon Technologies Ag Halbleiter-Bauelement-Test-Einrichtung mit Schieberegister, sowie Halbleiter-Bauelement-Test-Verfahren
US7356737B2 (en) * 2004-10-29 2008-04-08 International Business Machines Corporation System, method and storage medium for testing a memory module
US7395476B2 (en) 2004-10-29 2008-07-01 International Business Machines Corporation System, method and storage medium for providing a high speed test interface to a memory subsystem
KR100703969B1 (ko) 2005-04-07 2007-04-06 삼성전자주식회사 메모리 모듈의 테스트 장치
US7250784B2 (en) 2005-06-29 2007-07-31 Marvell International Ltd. Integrated systems testing
JP2007304919A (ja) * 2006-05-12 2007-11-22 Akiyoshi Shiina メモリモジュール保守用装置
JP2008009991A (ja) * 2006-06-29 2008-01-17 Hynix Semiconductor Inc テスト用デュアルインラインメモリモジュール及びそのテストシステム
US20080082221A1 (en) * 2006-07-14 2008-04-03 David Nagy System for monitoring, controlling, and reporting vehicle operation through onboard diagnostic port

Also Published As

Publication number Publication date
US20090049339A1 (en) 2009-02-19
US7739562B2 (en) 2010-06-15
WO2009024423A1 (en) 2009-02-26
JP2010537264A (ja) 2010-12-02
ATE492886T1 (de) 2011-01-15
EP2179421B1 (de) 2010-12-22
EP2179421A1 (de) 2010-04-28
CN101785066B (zh) 2013-08-28
JP5147942B2 (ja) 2013-02-20
KR20100046197A (ko) 2010-05-06
CN101785066A (zh) 2010-07-21
KR101039226B1 (ko) 2011-06-03

Similar Documents

Publication Publication Date Title
ATE492886T1 (de) Programmierbares diagnostik-speichermodul
WO2011021174A3 (en) Storage peripheral device emulation
WO2011130474A3 (en) System and computer - implemented method of simulating of power environments
WO2006133106A3 (en) System and methods for functional testing of embedded processor-based systems
US20150089289A1 (en) Programmable interface-based validation and debug
WO2006026526A3 (en) Memory system and method for strobing data, command and address signals
CN104317690B (zh) 一种基于ITP工具的Memory Demand Scrub测试方法
JP2010537264A5 (de)
GB2445320A (en) Vehicle control system and method
CN107479918B (zh) 一种可重构的mcu烧录的fpga模型
WO2010009066A3 (en) Gamma and temperature hardened pharmaceutical devices
WO2007016699A3 (en) Method and system for debug and test using replicated logic
CN101237365B (zh) 一种eda网络实验系统及实验方法
WO2008114697A1 (ja) 試験装置、及び電子デバイス
CN102122530A (zh) 一种烧写闪存的系统及方法
GB2474607A (en) Method and device for customizing software
WO2008121426A3 (en) Testing for sram memory data retention
TW200717539A (en) Internal signal generator for use in semiconductor memory device
CN201607721U (zh) 嵌入式在线调试系统
PL1855173T3 (pl) Procedura masowego rejestrowania danych operacyjnych turbiny wiatrowej
WO2011119405A3 (en) Method and circuit for testing and characterizing high speed signals using an on-chip oscilloscope
CN202150274U (zh) 一种eeprom数据防丢失电路结构
CN105825741A (zh) 基于VC5509和CCSLink的DSP及语音信号处理一体化实验平台
US7711540B2 (en) In-circuit emulation system with a programming function
WO2008102492A1 (ja) 使用時間制限機能付きパーソナルコンピュータシステム、及びそれに使用するコンピュータプログラム及びその記録媒体

Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)