DE60227279D1 - Verfahren und vorrichtung für eingebetteten eingebauten selbsttest (bist) elektronischer schaltungen und systeme - Google Patents

Verfahren und vorrichtung für eingebetteten eingebauten selbsttest (bist) elektronischer schaltungen und systeme

Info

Publication number
DE60227279D1
DE60227279D1 DE60227279T DE60227279T DE60227279D1 DE 60227279 D1 DE60227279 D1 DE 60227279D1 DE 60227279 T DE60227279 T DE 60227279T DE 60227279 T DE60227279 T DE 60227279T DE 60227279 D1 DE60227279 D1 DE 60227279D1
Authority
DE
Germany
Prior art keywords
controller
embedded
test
external
bist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60227279T
Other languages
English (en)
Inventor
Michael Ricchetti
Christopher J Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intellitech Corp
Original Assignee
Intellitech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intellitech Corp filed Critical Intellitech Corp
Application granted granted Critical
Publication of DE60227279D1 publication Critical patent/DE60227279D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
DE60227279T 2001-12-04 2002-11-12 Verfahren und vorrichtung für eingebetteten eingebauten selbsttest (bist) elektronischer schaltungen und systeme Expired - Lifetime DE60227279D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US33658601P 2001-12-04 2001-12-04
US10/142,556 US6957371B2 (en) 2001-12-04 2002-05-10 Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems
PCT/US2002/036246 WO2003048794A1 (en) 2001-12-04 2002-11-12 Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems

Publications (1)

Publication Number Publication Date
DE60227279D1 true DE60227279D1 (de) 2008-08-07

Family

ID=26840211

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60227279T Expired - Lifetime DE60227279D1 (de) 2001-12-04 2002-11-12 Verfahren und vorrichtung für eingebetteten eingebauten selbsttest (bist) elektronischer schaltungen und systeme

Country Status (9)

Country Link
US (2) US6957371B2 (de)
EP (1) EP1451599B1 (de)
AT (1) ATE399331T1 (de)
AU (1) AU2002352644A1 (de)
CA (1) CA2468860C (de)
DE (1) DE60227279D1 (de)
HK (1) HK1069207A1 (de)
TW (1) TWI230329B (de)
WO (1) WO2003048794A1 (de)

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Also Published As

Publication number Publication date
CA2468860C (en) 2009-05-19
EP1451599B1 (de) 2008-06-25
TWI230329B (en) 2005-04-01
US20050210352A1 (en) 2005-09-22
US6957371B2 (en) 2005-10-18
HK1069207A1 (en) 2005-05-13
ATE399331T1 (de) 2008-07-15
WO2003048794A1 (en) 2003-06-12
CA2468860A1 (en) 2003-06-12
TW200301420A (en) 2003-07-01
EP1451599A4 (de) 2005-05-18
AU2002352644A1 (en) 2003-06-17
US20030106004A1 (en) 2003-06-05
US7467342B2 (en) 2008-12-16
EP1451599A1 (de) 2004-09-01

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