DE60302361D1 - Schieberegister für sequentiellen fuse-latch-betrieb - Google Patents

Schieberegister für sequentiellen fuse-latch-betrieb

Info

Publication number
DE60302361D1
DE60302361D1 DE60302361T DE60302361T DE60302361D1 DE 60302361 D1 DE60302361 D1 DE 60302361D1 DE 60302361 T DE60302361 T DE 60302361T DE 60302361 T DE60302361 T DE 60302361T DE 60302361 D1 DE60302361 D1 DE 60302361D1
Authority
DE
Germany
Prior art keywords
shift register
latch operation
sequential fuse
fuse
sequential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60302361T
Other languages
English (en)
Other versions
DE60302361T2 (de
Inventor
Gunther Lehmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Application granted granted Critical
Publication of DE60302361D1 publication Critical patent/DE60302361D1/de
Publication of DE60302361T2 publication Critical patent/DE60302361T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
DE60302361T 2002-07-02 2003-06-21 Schieberegister für sequentiellen fuse-latch-betrieb Expired - Fee Related DE60302361T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/187,868 US6798272B2 (en) 2002-07-02 2002-07-02 Shift register for sequential fuse latch operation
US187868 2002-07-02
PCT/EP2003/006557 WO2004006267A1 (en) 2002-07-02 2003-06-21 Shift register for sequential fuse latch operation

Publications (2)

Publication Number Publication Date
DE60302361D1 true DE60302361D1 (de) 2005-12-22
DE60302361T2 DE60302361T2 (de) 2006-08-03

Family

ID=29999413

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60302361T Expired - Fee Related DE60302361T2 (de) 2002-07-02 2003-06-21 Schieberegister für sequentiellen fuse-latch-betrieb

Country Status (7)

Country Link
US (1) US6798272B2 (de)
EP (1) EP1518248B1 (de)
JP (1) JP2005529571A (de)
CN (1) CN1666297A (de)
DE (1) DE60302361T2 (de)
TW (1) TWI245291B (de)
WO (1) WO2004006267A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7031218B2 (en) * 2002-11-18 2006-04-18 Infineon Technologies Ag Externally clocked electrical fuse programming with asynchronous fuse selection
JP4158922B2 (ja) * 2004-12-20 2008-10-01 インターナショナル・ビジネス・マシーンズ・コーポレーション マイクロコンピュータ
JP4614775B2 (ja) * 2005-01-14 2011-01-19 パナソニック株式会社 電気ヒューズ回路
JP2007048394A (ja) * 2005-08-11 2007-02-22 Matsushita Electric Ind Co Ltd 電気ヒューズモジュールを備えた半導体記憶装置
KR100660899B1 (ko) * 2005-12-15 2006-12-26 삼성전자주식회사 누설 전류 패스를 제거할 수 있는 퓨즈 회로
DE102006019075B4 (de) * 2006-04-25 2008-01-31 Infineon Technologies Ag Integrierte Schaltung zur Speicherung eines Datums
US7821041B2 (en) * 2007-05-15 2010-10-26 Taiwan Semiconductor Manufacturing Co., Ltd. Electrical fuse circuit for security applications
US7567115B2 (en) * 2007-11-01 2009-07-28 Elite Semiconductor Memory Technology Inc. Fuse-fetching circuit and method for using the same
KR100930411B1 (ko) * 2008-04-10 2009-12-08 주식회사 하이닉스반도체 퓨즈 정보 제어 장치, 이를 이용한 반도체 집적회로 및그의 퓨즈 정보 제어 방법
US8864027B2 (en) * 2011-08-10 2014-10-21 University of Pittsburgh—of the Commonwealth System of Higher Education Low-power pulse width encoding scheme and counter-less shift register that may be employed therewith
KR102044827B1 (ko) 2012-10-17 2019-11-15 삼성전자주식회사 데이터 로딩 회로 및 이를 포함하는 반도체 메모리 장치
US9548135B2 (en) * 2013-03-11 2017-01-17 Macronix International Co., Ltd. Method and apparatus for determining status element total with sequentially coupled counting status circuits
KR20160006482A (ko) * 2014-07-09 2016-01-19 에스케이하이닉스 주식회사 반도체 장치
US9666307B1 (en) * 2016-09-14 2017-05-30 Micron Technology, Inc. Apparatuses and methods for flexible fuse transmission
US10381103B2 (en) * 2017-08-18 2019-08-13 Micron Technology, Inc. Apparatuses and methods for latching redundancy repair addresses to avoid address bits overwritten at a repair block
US10443531B2 (en) 2017-08-18 2019-10-15 Micron Technology, Inc. Apparatuses and methods for storing redundancy repair information for memories
CN113436660B (zh) 2020-03-23 2022-05-24 长鑫存储技术有限公司 锁存电路
TWI773638B (zh) * 2022-04-19 2022-08-01 華邦電子股份有限公司 保險絲區塊單元、保險絲區塊系統,以及記憶體裝置
CN114927156B (zh) * 2022-07-21 2022-11-11 浙江力积存储科技有限公司 一种包含冗余存储单元的移位寄存方法及移位寄存结构

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5038368A (en) * 1990-02-02 1991-08-06 David Sarnoff Research Center, Inc. Redundancy control circuit employed with various digital logic systems including shift registers
US5749871A (en) * 1993-08-23 1998-05-12 Refractec Inc. Method and apparatus for modifications of visual acuity by thermal means
US5402390A (en) * 1993-10-04 1995-03-28 Texas Instruments Inc. Fuse selectable timing signals for internal signal generators
US5668818A (en) * 1996-08-06 1997-09-16 Hewlett-Packard Co. System and method for scan control of a programmable fuse circuit in an integrated circuit
US5859801A (en) 1997-03-28 1999-01-12 Siemens Aktiengesellschaft Flexible fuse placement in redundant semiconductor memory
DE19823687A1 (de) * 1998-05-27 1999-12-09 Siemens Ag Fuselatch-Schaltung
JP3799197B2 (ja) * 1999-08-26 2006-07-19 株式会社東芝 半導体記憶装置
US6426911B1 (en) * 2000-10-19 2002-07-30 Infineon Technologies Ag Area efficient method for programming electrical fuses

Also Published As

Publication number Publication date
EP1518248B1 (de) 2005-11-16
WO2004006267A1 (en) 2004-01-15
US6798272B2 (en) 2004-09-28
EP1518248A1 (de) 2005-03-30
TW200401300A (en) 2004-01-16
DE60302361T2 (de) 2006-08-03
TWI245291B (en) 2005-12-11
US20040004510A1 (en) 2004-01-08
CN1666297A (zh) 2005-09-07
JP2005529571A (ja) 2005-09-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee