DE68915012D1 - Anlage zur Erzeugung von Dünnschichten und Ionenquelle unter Anwendung von Plasmazerstäubung. - Google Patents
Anlage zur Erzeugung von Dünnschichten und Ionenquelle unter Anwendung von Plasmazerstäubung.Info
- Publication number
- DE68915012D1 DE68915012D1 DE68915012T DE68915012T DE68915012D1 DE 68915012 D1 DE68915012 D1 DE 68915012D1 DE 68915012 T DE68915012 T DE 68915012T DE 68915012 T DE68915012 T DE 68915012T DE 68915012 D1 DE68915012 D1 DE 68915012D1
- Authority
- DE
- Germany
- Prior art keywords
- plant
- production
- ion source
- thin films
- plasma atomization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63025604A JP2595009B2 (ja) | 1988-02-08 | 1988-02-08 | プラズマ生成装置およびプラズマを利用した薄膜形成装置 |
JP63025603A JP2566602B2 (ja) | 1988-02-08 | 1988-02-08 | イオン源 |
JP20011388A JPH0721993B2 (ja) | 1988-08-12 | 1988-08-12 | スパッタ型イオン源 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68915012D1 true DE68915012D1 (de) | 1994-06-09 |
DE68915012T2 DE68915012T2 (de) | 1994-12-08 |
Family
ID=27285074
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68915012T Expired - Lifetime DE68915012T2 (de) | 1988-02-08 | 1989-02-06 | Anlage zur Erzeugung von Dünnschichten und Ionenquelle unter Anwendung von Plasmazerstäubung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4941915A (de) |
EP (1) | EP0328033B1 (de) |
KR (1) | KR920003789B1 (de) |
DE (1) | DE68915012T2 (de) |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5178739A (en) * | 1990-10-31 | 1993-01-12 | International Business Machines Corporation | Apparatus for depositing material into high aspect ratio holes |
JPH0816266B2 (ja) * | 1990-10-31 | 1996-02-21 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 高アスペクト比の穴に材料を付着させる装置 |
WO1992016671A1 (en) * | 1991-03-20 | 1992-10-01 | Canon Kabushiki Kaisha | Method and device for forming film by sputtering process |
US5510088A (en) * | 1992-06-11 | 1996-04-23 | The United States Of America As Represented By The Secretary Of The Navy | Low temperature plasma film deposition using dielectric chamber as source material |
EP0726593A1 (de) * | 1995-02-13 | 1996-08-14 | Applied Materials, Inc. | Hochleistung-Reaktivespezieserzeuger auf der Basis von Plasma |
US6264812B1 (en) | 1995-11-15 | 2001-07-24 | Applied Materials, Inc. | Method and apparatus for generating a plasma |
US5895548A (en) * | 1996-03-29 | 1999-04-20 | Applied Komatsu Technology, Inc. | High power microwave plasma applicator |
US6368469B1 (en) * | 1996-05-09 | 2002-04-09 | Applied Materials, Inc. | Coils for generating a plasma and for sputtering |
US6254746B1 (en) | 1996-05-09 | 2001-07-03 | Applied Materials, Inc. | Recessed coil for generating a plasma |
KR100489918B1 (ko) * | 1996-05-09 | 2005-08-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 플라즈마발생및스퍼터링용코일 |
US6254737B1 (en) | 1996-10-08 | 2001-07-03 | Applied Materials, Inc. | Active shield for generating a plasma for sputtering |
US6190513B1 (en) | 1997-05-14 | 2001-02-20 | Applied Materials, Inc. | Darkspace shield for improved RF transmission in inductively coupled plasma sources for sputter deposition |
US5961793A (en) * | 1996-10-31 | 1999-10-05 | Applied Materials, Inc. | Method of reducing generation of particulate matter in a sputtering chamber |
TW358964B (en) | 1996-11-21 | 1999-05-21 | Applied Materials Inc | Method and apparatus for improving sidewall coverage during sputtering in a chamber having an inductively coupled plasma |
US6451179B1 (en) | 1997-01-30 | 2002-09-17 | Applied Materials, Inc. | Method and apparatus for enhancing sidewall coverage during sputtering in a chamber having an inductively coupled plasma |
US6599399B2 (en) | 1997-03-07 | 2003-07-29 | Applied Materials, Inc. | Sputtering method to generate ionized metal plasma using electron beams and magnetic field |
JPH10255987A (ja) * | 1997-03-11 | 1998-09-25 | Tdk Corp | 有機el素子の製造方法 |
US6030514A (en) * | 1997-05-02 | 2000-02-29 | Sony Corporation | Method of reducing sputtering burn-in time, minimizing sputtered particulate, and target assembly therefor |
US6210539B1 (en) | 1997-05-14 | 2001-04-03 | Applied Materials, Inc. | Method and apparatus for producing a uniform density plasma above a substrate |
US6077402A (en) * | 1997-05-16 | 2000-06-20 | Applied Materials, Inc. | Central coil design for ionized metal plasma deposition |
US6361661B2 (en) | 1997-05-16 | 2002-03-26 | Applies Materials, Inc. | Hybrid coil design for ionized deposition |
US6579426B1 (en) | 1997-05-16 | 2003-06-17 | Applied Materials, Inc. | Use of variable impedance to control coil sputter distribution |
US6652717B1 (en) | 1997-05-16 | 2003-11-25 | Applied Materials, Inc. | Use of variable impedance to control coil sputter distribution |
US6235169B1 (en) | 1997-08-07 | 2001-05-22 | Applied Materials, Inc. | Modulated power for ionized metal plasma deposition |
US6375810B2 (en) | 1997-08-07 | 2002-04-23 | Applied Materials, Inc. | Plasma vapor deposition with coil sputtering |
US6345588B1 (en) | 1997-08-07 | 2002-02-12 | Applied Materials, Inc. | Use of variable RF generator to control coil voltage distribution |
US5902461A (en) * | 1997-09-03 | 1999-05-11 | Applied Materials, Inc. | Apparatus and method for enhancing uniformity of a metal film formed on a substrate with the aid of an inductively coupled plasma |
US20010049196A1 (en) * | 1997-09-09 | 2001-12-06 | Roger Patrick | Apparatus for improving etch uniformity and methods therefor |
US6042700A (en) * | 1997-09-15 | 2000-03-28 | Applied Materials, Inc. | Adjustment of deposition uniformity in an inductively coupled plasma source |
US6565717B1 (en) | 1997-09-15 | 2003-05-20 | Applied Materials, Inc. | Apparatus for sputtering ionized material in a medium to high density plasma |
US6023038A (en) * | 1997-09-16 | 2000-02-08 | Applied Materials, Inc. | Resistive heating of powered coil to reduce transient heating/start up effects multiple loadlock system |
US6280579B1 (en) | 1997-12-19 | 2001-08-28 | Applied Materials, Inc. | Target misalignment detector |
IT1298891B1 (it) * | 1998-02-06 | 2000-02-07 | Ca Te V Centro Tecnologie Del | Impianto da vuoto portatile provvisto di precamera per la deposizione di film sottili su superfici anche inamovibili. |
US6506287B1 (en) | 1998-03-16 | 2003-01-14 | Applied Materials, Inc. | Overlap design of one-turn coil |
US6254738B1 (en) | 1998-03-31 | 2001-07-03 | Applied Materials, Inc. | Use of variable impedance having rotating core to control coil sputter distribution |
US6095160A (en) * | 1998-04-06 | 2000-08-01 | Chu; Xi | In-situ magnetron assisted DC plasma etching apparatus and method for cleaning magnetic recording disks |
US6146508A (en) * | 1998-04-22 | 2000-11-14 | Applied Materials, Inc. | Sputtering method and apparatus with small diameter RF coil |
TW434636B (en) | 1998-07-13 | 2001-05-16 | Applied Komatsu Technology Inc | RF matching network with distributed outputs |
US6231725B1 (en) | 1998-08-04 | 2001-05-15 | Applied Materials, Inc. | Apparatus for sputtering material onto a workpiece with the aid of a plasma |
US6238528B1 (en) | 1998-10-13 | 2001-05-29 | Applied Materials, Inc. | Plasma density modulator for improved plasma density uniformity and thickness uniformity in an ionized metal plasma source |
US6139679A (en) * | 1998-10-15 | 2000-10-31 | Applied Materials, Inc. | Coil and coil feedthrough |
US6217718B1 (en) | 1999-02-17 | 2001-04-17 | Applied Materials, Inc. | Method and apparatus for reducing plasma nonuniformity across the surface of a substrate in apparatus for producing an ionized metal plasma |
US6237526B1 (en) * | 1999-03-26 | 2001-05-29 | Tokyo Electron Limited | Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma |
US6474258B2 (en) | 1999-03-26 | 2002-11-05 | Tokyo Electron Limited | Apparatus and method for improving plasma distribution and performance in an inductively coupled plasma |
US6409890B1 (en) | 1999-07-27 | 2002-06-25 | Applied Materials, Inc. | Method and apparatus for forming a uniform layer on a workpiece during sputtering |
US6342132B1 (en) | 1999-10-29 | 2002-01-29 | International Business Machines Corporation | Method of controlling gas density in an ionized physical vapor deposition apparatus |
US6494998B1 (en) | 2000-08-30 | 2002-12-17 | Tokyo Electron Limited | Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma using an internal inductive element |
EP2385542B1 (de) * | 2010-05-07 | 2013-01-02 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Elektronenstrahlvorrichtung mit Dispersionskompensation und Betriebsverfahren dafür |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3616450A (en) * | 1968-11-07 | 1971-10-26 | Peter J Clark | Sputtering apparatus |
US4041353A (en) * | 1971-09-07 | 1977-08-09 | Telic Corporation | Glow discharge method and apparatus |
US3878085A (en) * | 1973-07-05 | 1975-04-15 | Sloan Technology Corp | Cathode sputtering apparatus |
US4046660A (en) * | 1975-12-29 | 1977-09-06 | Bell Telephone Laboratories, Incorporated | Sputter coating with charged particle flux control |
US4175029A (en) * | 1978-03-16 | 1979-11-20 | Dmitriev Jury A | Apparatus for ion plasma coating of articles |
JPS5943546B2 (ja) * | 1981-05-26 | 1984-10-23 | 日本真空技術株式会社 | スパツタリング装置 |
JPS6050167A (ja) * | 1983-08-26 | 1985-03-19 | Nippon Telegr & Teleph Corp <Ntt> | プラズマ付着装置 |
US4690744A (en) * | 1983-07-20 | 1987-09-01 | Konishiroku Photo Industry Co., Ltd. | Method of ion beam generation and an apparatus based on such method |
JPS60130039A (ja) * | 1983-12-16 | 1985-07-11 | Jeol Ltd | イオン源 |
JPS60195855A (ja) * | 1984-03-19 | 1985-10-04 | Hitachi Ltd | 大容量イオン源 |
CH659484A5 (de) * | 1984-04-19 | 1987-01-30 | Balzers Hochvakuum | Anordnung zur beschichtung von substraten mittels kathodenzerstaeubung. |
JPH07107189B2 (ja) * | 1986-03-24 | 1995-11-15 | 日本電信電話株式会社 | 薄膜形成装置 |
JPH0689464B2 (ja) * | 1986-03-26 | 1994-11-09 | 日本電信電話株式会社 | イオン源 |
-
1989
- 1989-02-03 KR KR1019890001268A patent/KR920003789B1/ko not_active IP Right Cessation
- 1989-02-06 DE DE68915012T patent/DE68915012T2/de not_active Expired - Lifetime
- 1989-02-06 EP EP89102042A patent/EP0328033B1/de not_active Expired - Lifetime
- 1989-02-07 US US07/307,342 patent/US4941915A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0328033A3 (en) | 1990-08-08 |
EP0328033A2 (de) | 1989-08-16 |
KR890013819A (ko) | 1989-09-26 |
KR920003789B1 (ko) | 1992-05-14 |
EP0328033B1 (de) | 1994-05-04 |
DE68915012T2 (de) | 1994-12-08 |
US4941915A (en) | 1990-07-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE68915012D1 (de) | Anlage zur Erzeugung von Dünnschichten und Ionenquelle unter Anwendung von Plasmazerstäubung. | |
DE69022664D1 (de) | Verfahren und Vorrichtung zur kontinuierlichen Herstellung von funktionellen aufgedampften Filmen grosser Oberfläche mittels Mikrowellen-Plasma CVD. | |
ATA3086A (de) | Vorrichtung zur herstellung von farbrollern und damit hergestellter farbroller | |
DE69003175T2 (de) | Verfahren und Vorrichtung zur Plasmaaussenabscheidung von hydroxylionenfreier Silika. | |
DE69601041T2 (de) | Vorrichtung zur Gewinnung von Sauerstoff | |
DE69601295T2 (de) | Vorrichtung zur Gewinnung von Sauerstoff | |
DE59102132D1 (de) | Verfahren zur Erzeugung von Aktinium-225 und Wismut-213. | |
DE69424508D1 (de) | Vorrichtung zur Erzeugung von negativen Ionen | |
DE3888274D1 (de) | Vorrichtung zur intensiven und kontrollierten Herstellung von Mikroorganismen durch Photosynthese. | |
DE68909361D1 (de) | Verfahren und vorrichtung zur herstellung einer werkstoffschicht mittels einer laser-ionenquelle. | |
DE68922191T2 (de) | Verfahren zur Produktion von Akrylat und von Akrylat enthaltendem Polymer. | |
DE68919156T3 (de) | Verfahren zur Herstellung grosser symmetrischer Polymerteilchen. | |
DE68909943T2 (de) | Verfahren und vorrichtung zur regelung des spritzens von beschichtungsmaterialien. | |
DE69310669T2 (de) | Prozess und Vorrichtung zur Herstellung von Allylchlorid | |
DE69027238D1 (de) | Verfahren zur kontinuierlichen Herstellung von Kunststoff-Folien und Vorrichtung dafür. | |
DE68924579T2 (de) | Verfahren zur Herstellung von Polymer-Partikeln und Toner-Partikeln. | |
DE69011834T2 (de) | Vorrichtung zur Erzeugung optischer Oberwellen und dieselbe benutzende Vorrichtung. | |
DE69119123D1 (de) | Methoden zur Herstellung von Silanen und Polysilanen | |
DE69602766T2 (de) | Vorrichtung zur autonomen herstellung von atembaren hochdrucksauerstoff | |
DE68915387T2 (de) | Verfahren zur Herstellung von ethylenischen Pfropfcopolymeren. | |
DE68908992D1 (de) | Verfahren zur Änderung der Ionen-Wertigkeit und Vorrichtung dazu. | |
DE69609898D1 (de) | Feingiessverfahren zur Erzeugung von Gegenständen mit sehr präziser Oberfläche | |
DE68912292T2 (de) | Vorrichtung zur Herstellung von Glastafeln. | |
DE69012528D1 (de) | Vorrichtung zur kontinuierlichen Abstimmung einer kohärenten und linear polarisierten Lichtquelle. | |
ATE182557T1 (de) | Verfahren zur herstellung und verwendungen von polyfluorfulleren |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |