DE68916667D1 - Mikroskop. - Google Patents

Mikroskop.

Info

Publication number
DE68916667D1
DE68916667D1 DE68916667T DE68916667T DE68916667D1 DE 68916667 D1 DE68916667 D1 DE 68916667D1 DE 68916667 T DE68916667 T DE 68916667T DE 68916667 T DE68916667 T DE 68916667T DE 68916667 D1 DE68916667 D1 DE 68916667D1
Authority
DE
Germany
Prior art keywords
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68916667T
Other languages
English (en)
Other versions
DE68916667T2 (de
Inventor
Masakazu Hayashi
Fumihiko Ishida
Junzou Utida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26391371&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE68916667(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from JP63214104A external-priority patent/JPH0216403A/ja
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE68916667D1 publication Critical patent/DE68916667D1/de
Publication of DE68916667T2 publication Critical patent/DE68916667T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G01Q30/025—Optical microscopes coupled with SPM
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/861—Scanning tunneling probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/868—Scanning probe structure with optical means
    • Y10S977/869—Optical microscope
DE68916667T 1988-03-04 1989-03-01 Mikroskop. Expired - Fee Related DE68916667T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5089188 1988-03-04
JP63214104A JPH0216403A (ja) 1988-03-04 1988-08-29 顕微鏡装置

Publications (2)

Publication Number Publication Date
DE68916667D1 true DE68916667D1 (de) 1994-08-18
DE68916667T2 DE68916667T2 (de) 1995-01-12

Family

ID=26391371

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68916667T Expired - Fee Related DE68916667T2 (de) 1988-03-04 1989-03-01 Mikroskop.

Country Status (3)

Country Link
US (1) US4914293A (de)
EP (1) EP0331148B1 (de)
DE (1) DE68916667T2 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3854620T2 (de) * 1987-08-12 1996-03-28 Olympus Optical Co Tunnel-abtastmikroskop.
US4947042A (en) * 1988-12-13 1990-08-07 Mitsubishi Denki Kabushiki Kaisha Tunnel unit and scanning head for scanning tunneling microscope
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
US5260824A (en) * 1989-04-24 1993-11-09 Olympus Optical Co., Ltd. Atomic force microscope
JPH0334250A (ja) * 1989-06-29 1991-02-14 Seiko Instr Inc 光学顕微鏡複合走査型トンネル顕微鏡
JP2909829B2 (ja) * 1989-07-05 1999-06-23 セイコーインスツルメンツ株式会社 位置合わせ機能付複合走査型トンネル顕微鏡
JP2909828B2 (ja) * 1989-07-05 1999-06-23 セイコーインスツルメンツ株式会社 複合走査型トンネル顕微鏡
JP2821005B2 (ja) * 1989-10-02 1998-11-05 オリンパス光学工業株式会社 微細表面形状計測装置
JP2815196B2 (ja) * 1989-10-02 1998-10-27 オリンパス光学工業株式会社 微細表面形状計測装置
US5289004A (en) * 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
US5060248A (en) * 1990-06-29 1991-10-22 General Electric Company Scanning analysis and imaging system with modulated electro-magnetic energy source
US5394741A (en) * 1990-07-11 1995-03-07 Olympus Optical Co., Ltd. Atomic probe microscope
US5157251A (en) * 1991-03-13 1992-10-20 Park Scientific Instruments Scanning force microscope having aligning and adjusting means
DE69226554T2 (de) * 1991-03-15 1999-03-04 Nikon Corp Mikroskop bestehend aus Rastertunnelmikroskop kombiniert mit optischem Mikroskop
US5155361A (en) * 1991-07-26 1992-10-13 The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State University Potentiostatic preparation of molecular adsorbates for scanning probe microscopy
JPH0540009A (ja) * 1991-08-08 1993-02-19 Nikon Corp 走査型トンネル顕微鏡
JPH0540034A (ja) * 1991-08-08 1993-02-19 Nikon Corp 複合型顕微鏡
FR2685789A1 (fr) * 1991-12-31 1993-07-02 Centre Nat Rech Scient Microscope en champ proche fonctionnant par detection tunnel optique.
US5319960A (en) * 1992-03-06 1994-06-14 Topometrix Scanning force microscope
JPH05256641A (ja) * 1992-03-11 1993-10-05 Olympus Optical Co Ltd カンチレバー変位検出装置
US5376790A (en) * 1992-03-13 1994-12-27 Park Scientific Instruments Scanning probe microscope
US5448399A (en) * 1992-03-13 1995-09-05 Park Scientific Instruments Optical system for scanning microscope
DE4233399C2 (de) * 1992-10-05 2002-09-19 Zeiss Carl Kraftmikroskop
US5426302A (en) * 1993-04-28 1995-06-20 Board Of Regents, University Of Texas Optically guided macroscopic-scan-range/nanometer resolution probing system
US5689063A (en) * 1993-07-15 1997-11-18 Nikon Corporation Atomic force microscope using cantilever attached to optical microscope
US5463897A (en) * 1993-08-17 1995-11-07 Digital Instruments, Inc. Scanning stylus atomic force microscope with cantilever tracking and optical access
US5440920A (en) * 1994-02-03 1995-08-15 Molecular Imaging Systems Scanning force microscope with beam tracking lens
US5753814A (en) * 1994-05-19 1998-05-19 Molecular Imaging Corporation Magnetically-oscillated probe microscope for operation in liquids
US5513518A (en) * 1994-05-19 1996-05-07 Molecular Imaging Corporation Magnetic modulation of force sensor for AC detection in an atomic force microscope
US5866805A (en) * 1994-05-19 1999-02-02 Molecular Imaging Corporation Arizona Board Of Regents Cantilevers for a magnetically driven atomic force microscope
US5515719A (en) * 1994-05-19 1996-05-14 Molecular Imaging Corporation Controlled force microscope for operation in liquids
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US5751683A (en) * 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US5675154A (en) * 1995-02-10 1997-10-07 Molecular Imaging Corporation Scanning probe microscope
US5621210A (en) * 1995-02-10 1997-04-15 Molecular Imaging Corporation Microscope for force and tunneling microscopy in liquids
US5750989A (en) * 1995-02-10 1998-05-12 Molecular Imaging Corporation Scanning probe microscope for use in fluids
US5581082A (en) * 1995-03-28 1996-12-03 The Regents Of The University Of California Combined scanning probe and scanning energy microscope
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
US5952562A (en) * 1995-11-22 1999-09-14 Olympus Optical Co., Ltd. Scanning probe microscope incorporating an optical microscope
AU8760698A (en) * 1997-08-22 1999-03-16 Park Scientific Instruments Scanning probe microscope system removably attachable to an optical microscope objective
US5952657A (en) * 1997-08-22 1999-09-14 Thermo Microscopes, Corp. Atomic force microscope with integrated optics for attachment to optical microscope
DE19841931C2 (de) * 1998-09-14 2002-06-20 Zeiss Carl Jena Gmbh Mikroskop für die optische Nahfeldmikroskopie
US6369397B1 (en) * 1999-01-04 2002-04-09 International Business Machines Corporation SPM base focal plane positioning
JP2001154098A (ja) * 1999-11-30 2001-06-08 Mitsutoyo Corp 画像プローブ
DE10066519B3 (de) * 1999-11-30 2019-08-14 Mitutoyo Corporation Bilderzeugungssonde
JP2003202284A (ja) * 2002-01-09 2003-07-18 Hitachi Ltd 走査プローブ顕微鏡およびこれを用いた試料観察方法およびデバイス製造方法
US7571638B1 (en) * 2005-05-10 2009-08-11 Kley Victor B Tool tips with scanning probe microscopy and/or atomic force microscopy applications
US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
CN101501785A (zh) * 2006-06-02 2009-08-05 维克托·B·克利 针对米到亚纳米长度范围内的高速测量、分析和成像的系统及方法
US7784107B2 (en) * 2006-06-02 2010-08-24 Victor B. Kley High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer
WO2008019679A1 (de) * 2006-08-18 2008-02-21 Jpk Instruments Ag Vorrichtung und ein verfahren zum sondenmikroskopischen untersuchen einer probe
JP2014041734A (ja) * 2012-08-22 2014-03-06 Hitachi High-Technologies Corp 複合荷電粒子線装置
US9778572B1 (en) 2013-03-15 2017-10-03 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH643397A5 (de) * 1979-09-20 1984-05-30 Ibm Raster-tunnelmikroskop.
JPS60205411A (ja) * 1984-03-29 1985-10-17 Olympus Optical Co Ltd 倒立型顕微鏡
JPS643502A (en) * 1987-06-25 1989-01-09 Seiko Instr & Electronics Scanning type tunnel microscope
DE3854620T2 (de) * 1987-08-12 1996-03-28 Olympus Optical Co Tunnel-abtastmikroskop.

Also Published As

Publication number Publication date
EP0331148A2 (de) 1989-09-06
US4914293A (en) 1990-04-03
EP0331148A3 (de) 1991-06-12
DE68916667T2 (de) 1995-01-12
EP0331148B1 (de) 1994-07-13

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8365 Fully valid after opposition proceedings
8339 Ceased/non-payment of the annual fee