DE68919901D1 - Optisches Profilmessgerät. - Google Patents

Optisches Profilmessgerät.

Info

Publication number
DE68919901D1
DE68919901D1 DE68919901T DE68919901T DE68919901D1 DE 68919901 D1 DE68919901 D1 DE 68919901D1 DE 68919901 T DE68919901 T DE 68919901T DE 68919901 T DE68919901 T DE 68919901T DE 68919901 D1 DE68919901 D1 DE 68919901D1
Authority
DE
Germany
Prior art keywords
measuring device
profile measuring
optical profile
optical
profile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68919901T
Other languages
English (en)
Other versions
DE68919901T2 (de
Inventor
Alan E Thomas
Leon E Thompson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Glass Technology Development Corp
Original Assignee
Glass Technology Development Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glass Technology Development Corp filed Critical Glass Technology Development Corp
Publication of DE68919901D1 publication Critical patent/DE68919901D1/de
Application granted granted Critical
Publication of DE68919901T2 publication Critical patent/DE68919901T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
DE68919901T 1988-05-09 1989-04-21 Optisches Profilmessgerät. Expired - Fee Related DE68919901T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/192,584 US4906098A (en) 1988-05-09 1988-05-09 Optical profile measuring apparatus

Publications (2)

Publication Number Publication Date
DE68919901D1 true DE68919901D1 (de) 1995-01-26
DE68919901T2 DE68919901T2 (de) 1995-05-04

Family

ID=22710286

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68919901T Expired - Fee Related DE68919901T2 (de) 1988-05-09 1989-04-21 Optisches Profilmessgerät.

Country Status (7)

Country Link
US (1) US4906098A (de)
EP (1) EP0341849B1 (de)
JP (1) JP2925163B2 (de)
AU (1) AU616497B2 (de)
CA (1) CA1311117C (de)
DE (1) DE68919901T2 (de)
MX (1) MX166591B (de)

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US7684054B2 (en) 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components
US7738121B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Method and inspection head apparatus for optically measuring geometric dimensions of a part
US7777900B2 (en) * 2007-10-23 2010-08-17 Gii Acquisition, Llc Method and system for optically inspecting parts
US8132802B2 (en) * 2007-10-23 2012-03-13 Gii Acquisition, Llc Apparatus for quickly retaining and releasing parts to be optically measured
US7738088B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Optical method and system for generating calibration data for use in calibrating a part inspection system
US7633046B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
US7755754B2 (en) * 2007-10-23 2010-07-13 Gii Acquisition, Llc Calibration device for use in an optical part measuring system
US8237935B2 (en) * 2007-10-23 2012-08-07 Gii Acquisition, Llc Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts
US8550444B2 (en) * 2007-10-23 2013-10-08 Gii Acquisition, Llc Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station
US7633634B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition, Llc Optical modules and method of precisely assembling same
US7920278B2 (en) * 2007-10-23 2011-04-05 Gii Acquisition, Llc Non-contact method and system for inspecting parts
US7812970B2 (en) * 2007-10-23 2010-10-12 Gii Acquisition, Llc Method and system for inspecting parts utilizing triangulation
US7796278B2 (en) * 2008-09-19 2010-09-14 Gii Acquisition, Llc Method for precisely measuring position of a part to be inspected at a part inspection station
US8004694B2 (en) * 2009-03-27 2011-08-23 Gll Acquistion LLC System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station
CN103492834B (zh) * 2010-09-15 2016-03-30 吴乃恩 用于检测回转部件质量的自动器具及检验方法
FR2973501B1 (fr) * 2011-03-30 2013-11-22 Msc & Sgcc Procede et dispositif pour la mesure de la verticalite sur un recipient
US8390826B2 (en) 2011-04-20 2013-03-05 Gii Acquisition, Llc Method and system for optically inspecting parts
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US9228957B2 (en) 2013-05-24 2016-01-05 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts
US9372160B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
US9047657B2 (en) 2011-05-17 2015-06-02 Gii Acquisition, Lcc Method and system for optically inspecting outer peripheral surfaces of parts
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US8570504B2 (en) 2011-05-17 2013-10-29 Gii Acquisition, Llc Method and system for optically inspecting parts
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US8723068B2 (en) 2011-09-08 2014-05-13 Michael G. Nygaard Method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired
FR2981450B1 (fr) * 2011-10-17 2014-06-06 Eads Europ Aeronautic Defence Systeme et procede de controle de la qualite d'un objet
US9188545B2 (en) * 2011-10-28 2015-11-17 Owens-Brockway Glass Container Inc. Container inspection apparatus and method
US8993914B2 (en) 2012-12-14 2015-03-31 Gii Acquisition, Llc High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US9486840B2 (en) 2013-05-24 2016-11-08 Gii Acquisition, Llc High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
FR3000193B1 (fr) 2012-12-20 2015-01-16 Msc & Sgcc Procede et dispositif de mesure de la verticalite sur un recipient
US9539619B2 (en) 2013-05-24 2017-01-10 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts at a pair of inspection stations
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US9377297B2 (en) 2013-08-21 2016-06-28 Gii Acquisition, Llc High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined
US9372077B2 (en) 2013-08-21 2016-06-21 Gii Acquistion, Llc High-resolution imaging and processing method and system for determining a geometric dimension of a part
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
US20170052024A1 (en) * 2015-08-21 2017-02-23 Adcole Corporation Optical profiler and methods of use thereof
WO2017068295A1 (fr) 2015-10-21 2017-04-27 Tiama Procede et installation pour assurer l'inspection optique de recipients selon leur profil incluant le fond
DE102016117870A1 (de) 2016-09-22 2018-03-22 Krones Ag Verfahren und Vorrichtung zum Herstellen von Behältnissen
US10274311B2 (en) 2016-10-19 2019-04-30 Columbia Insurance Company Three dimensional laser measurement device for quality control measurements
CN112004762B (zh) * 2018-04-20 2022-05-17 阿自倍尔株式会社 输送物品筛选装置
CN108534695A (zh) * 2018-05-04 2018-09-14 无锡恩特卫自动化检测设备有限公司 一种基于机器视觉系统的瓶塞漏酒检测方法及装置
JP7181790B2 (ja) * 2018-12-28 2022-12-01 株式会社キーエンス レーザ加工装置
RU199302U1 (ru) * 2019-01-22 2020-08-26 Общество с ограниченной ответственностью "Сенсис" Оптическое устройство для измерения и контроля осевого режущего инструмента для мехобработки с компактной оптической схемой
CN112304230A (zh) * 2020-11-05 2021-02-02 彩虹（合肥）液晶玻璃有限公司 一种基板玻璃短辊直径的测量装置

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Also Published As

Publication number Publication date
CA1311117C (en) 1992-12-08
EP0341849A2 (de) 1989-11-15
JPH0285705A (ja) 1990-03-27
JP2925163B2 (ja) 1999-07-28
AU616497B2 (en) 1991-10-31
EP0341849B1 (de) 1994-12-14
AU3240189A (en) 1989-11-09
MX166591B (es) 1993-01-20
DE68919901T2 (de) 1995-05-04
EP0341849A3 (en) 1990-11-07
US4906098A (en) 1990-03-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee