DE68928613D1 - Bidirektionale-Boundary-Scan-Testzelle - Google Patents

Bidirektionale-Boundary-Scan-Testzelle

Info

Publication number
DE68928613D1
DE68928613D1 DE68928613T DE68928613T DE68928613D1 DE 68928613 D1 DE68928613 D1 DE 68928613D1 DE 68928613 T DE68928613 T DE 68928613T DE 68928613 T DE68928613 T DE 68928613T DE 68928613 D1 DE68928613 D1 DE 68928613D1
Authority
DE
Germany
Prior art keywords
test cell
boundary scan
scan test
bidirectional boundary
bidirectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68928613T
Other languages
English (en)
Other versions
DE68928613T2 (de
Inventor
Lee D Whetsel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE68928613D1 publication Critical patent/DE68928613D1/de
Application granted granted Critical
Publication of DE68928613T2 publication Critical patent/DE68928613T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
DE68928613T 1988-09-07 1989-08-23 Bidirektionale-Boundary-Scan-Testzelle Expired - Fee Related DE68928613T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US24152088A 1988-09-07 1988-09-07

Publications (2)

Publication Number Publication Date
DE68928613D1 true DE68928613D1 (de) 1998-04-23
DE68928613T2 DE68928613T2 (de) 1998-09-24

Family

ID=22911025

Family Applications (2)

Application Number Title Priority Date Filing Date
DE68928613T Expired - Fee Related DE68928613T2 (de) 1988-09-07 1989-08-23 Bidirektionale-Boundary-Scan-Testzelle
DE68921269T Expired - Fee Related DE68921269T2 (de) 1988-09-07 1989-08-23 Integrierte Prüfschaltung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE68921269T Expired - Fee Related DE68921269T2 (de) 1988-09-07 1989-08-23 Integrierte Prüfschaltung.

Country Status (5)

Country Link
US (3) US5631911A (de)
EP (2) EP0628831B1 (de)
JP (1) JP2994666B2 (de)
KR (1) KR0156547B1 (de)
DE (2) DE68928613T2 (de)

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DE19948902C1 (de) * 1999-10-11 2001-07-12 Infineon Technologies Ag Schaltungszelle zur Testmuster-Generierung und Testmuster-Kompression
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JP4002378B2 (ja) * 1999-12-27 2007-10-31 エルピーダメモリ株式会社 電子回路
US6662324B1 (en) * 1999-12-28 2003-12-09 International Business Machines Corporation Global transition scan based AC method
US6453436B1 (en) * 1999-12-28 2002-09-17 International Business Machines Corporation Method and apparatus for improving transition fault testability of semiconductor chips
US6625768B1 (en) * 2000-03-29 2003-09-23 Intel Corporation Test bus architecture
US6567943B1 (en) * 2000-04-07 2003-05-20 International Business Machines Corporation D flip-flop structure with flush path for high-speed boundary scan applications
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JP4748337B2 (ja) * 2000-09-26 2011-08-17 大日本印刷株式会社 半導体回路のテスト用設計回路パタン
JP3727838B2 (ja) * 2000-09-27 2005-12-21 株式会社東芝 半導体集積回路
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DE10132159B4 (de) * 2001-07-03 2004-03-11 Infineon Technologies Ag Verfahren und Vorrichtung zum gleichzeitigen Testen einer Mehrzahl von integrierten Schaltungen
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US7343535B2 (en) * 2002-02-06 2008-03-11 Avago Technologies General Ip Dte Ltd Embedded testing capability for integrated serializer/deserializers
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Also Published As

Publication number Publication date
DE68921269T2 (de) 1995-06-22
US5602855A (en) 1997-02-11
KR900005473A (ko) 1990-04-14
DE68921269D1 (de) 1995-03-30
EP0358376A2 (de) 1990-03-14
EP0358376A3 (de) 1991-05-29
EP0628831A1 (de) 1994-12-14
EP0628831B1 (de) 1998-03-18
DE68928613T2 (de) 1998-09-24
EP0358376B1 (de) 1995-02-22
KR0156547B1 (ko) 1998-12-01
US5631911A (en) 1997-05-20
JPH02181676A (ja) 1990-07-16
JP2994666B2 (ja) 1999-12-27
US6081916A (en) 2000-06-27

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