DE69002170D1 - Phasenregelschleife mit genauem frequenz- und phasenabgleich zweier signale. - Google Patents
Phasenregelschleife mit genauem frequenz- und phasenabgleich zweier signale.Info
- Publication number
- DE69002170D1 DE69002170D1 DE9090101072T DE69002170T DE69002170D1 DE 69002170 D1 DE69002170 D1 DE 69002170D1 DE 9090101072 T DE9090101072 T DE 9090101072T DE 69002170 T DE69002170 T DE 69002170T DE 69002170 D1 DE69002170 D1 DE 69002170D1
- Authority
- DE
- Germany
- Prior art keywords
- signals
- phase
- control loop
- accurate frequency
- phase control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/0805—Details of the phase-locked loop the loop being adapted to provide an additional control signal for use outside the loop
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B27/00—Generation of oscillations providing a plurality of outputs of the same frequency but differing in phase, other than merely two anti-phase outputs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0995—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator comprising a ring oscillator
- H03L7/0996—Selecting a signal among the plurality of phase-shifted signals produced by the ring oscillator
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07303927 US4902986B1 (en) | 1989-01-30 | 1989-01-30 | Phased locked loop to provide precise frequency and phase tracking of two signals |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69002170D1 true DE69002170D1 (de) | 1993-08-19 |
DE69002170T2 DE69002170T2 (de) | 1994-02-17 |
Family
ID=23174298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE90101072T Expired - Fee Related DE69002170T2 (de) | 1989-01-30 | 1990-01-19 | Phasenregelschleife mit genauem Frequenz- und Phasenabgleich zweier Signale. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4902986B1 (de) |
EP (1) | EP0380979B1 (de) |
JP (1) | JP2976206B2 (de) |
DE (1) | DE69002170T2 (de) |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5018169A (en) * | 1989-06-21 | 1991-05-21 | National Semiconductor Corporation | High resolution sample clock generator with deglitcher |
US5045811A (en) * | 1990-02-02 | 1991-09-03 | Seagate Technology, Inc. | Tuned ring oscillator |
JP2597739B2 (ja) * | 1990-08-24 | 1997-04-09 | 株式会社東芝 | 信号遅延回路、クロック信号発生回路及び集積回路システム |
JPH04351008A (ja) * | 1991-05-28 | 1992-12-04 | Sony Corp | ディジタルvco |
US6418424B1 (en) | 1991-12-23 | 2002-07-09 | Steven M. Hoffberg | Ergonomic man-machine interface incorporating adaptive pattern recognition based control system |
US8352400B2 (en) | 1991-12-23 | 2013-01-08 | Hoffberg Steven M | Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore |
US6400996B1 (en) | 1999-02-01 | 2002-06-04 | Steven M. Hoffberg | Adaptive pattern recognition based control system and method |
US10361802B1 (en) | 1999-02-01 | 2019-07-23 | Blanding Hovenweep, Llc | Adaptive pattern recognition based control system and method |
US5903454A (en) | 1991-12-23 | 1999-05-11 | Hoffberg; Linda Irene | Human-factored interface corporating adaptive pattern recognition based controller apparatus |
US6850252B1 (en) * | 1999-10-05 | 2005-02-01 | Steven M. Hoffberg | Intelligent electronic appliance system and method |
US5278522A (en) * | 1992-11-19 | 1994-01-11 | Codex, Corp. | High frequency voltage controlled oscillator |
JP2996328B2 (ja) * | 1992-12-17 | 1999-12-27 | 三菱電機株式会社 | 半導体集積回路、およびそれを用いた半導体集積回路組合回路 |
US5345186A (en) * | 1993-01-19 | 1994-09-06 | Credence Systems Corporation | Retriggered oscillator for jitter-free phase locked loop frequency synthesis |
US5552733A (en) * | 1993-01-19 | 1996-09-03 | Credence Systems Corporation | Precise and agile timing signal generator based on a retriggered oscillator |
US5611053A (en) * | 1994-01-21 | 1997-03-11 | Advanced Micro Devices, Inc. | Apparatus and method for integrating bus master ownership of local bus load by plural data transceivers |
US6295572B1 (en) * | 1994-01-24 | 2001-09-25 | Advanced Micro Devices, Inc. | Integrated SCSI and ethernet controller on a PCI local bus |
US6469493B1 (en) | 1995-08-01 | 2002-10-22 | Teradyne, Inc. | Low cost CMOS tester with edge rate compensation |
US5684421A (en) * | 1995-10-13 | 1997-11-04 | Credence Systems Corporation | Compensated delay locked loop timing vernier |
US6115769A (en) * | 1996-06-28 | 2000-09-05 | Lsi Logic Corporation | Method and apparatus for providing precise circuit delays |
US6115318A (en) * | 1996-12-03 | 2000-09-05 | Micron Technology, Inc. | Clock vernier adjustment |
US5940608A (en) * | 1997-02-11 | 1999-08-17 | Micron Technology, Inc. | Method and apparatus for generating an internal clock signal that is synchronized to an external clock signal |
US6912680B1 (en) | 1997-02-11 | 2005-06-28 | Micron Technology, Inc. | Memory system with dynamic timing correction |
US5920518A (en) * | 1997-02-11 | 1999-07-06 | Micron Technology, Inc. | Synchronous clock generator including delay-locked loop |
US5946244A (en) | 1997-03-05 | 1999-08-31 | Micron Technology, Inc. | Delay-locked loop with binary-coupled capacitor |
US6173432B1 (en) * | 1997-06-20 | 2001-01-09 | Micron Technology, Inc. | Method and apparatus for generating a sequence of clock signals |
US5953284A (en) * | 1997-07-09 | 1999-09-14 | Micron Technology, Inc. | Method and apparatus for adaptively adjusting the timing of a clock signal used to latch digital signals, and memory device using same |
US6073259A (en) * | 1997-08-05 | 2000-06-06 | Teradyne, Inc. | Low cost CMOS tester with high channel density |
US6011732A (en) * | 1997-08-20 | 2000-01-04 | Micron Technology, Inc. | Synchronous clock generator including a compound delay-locked loop |
US5940609A (en) * | 1997-08-29 | 1999-08-17 | Micorn Technology, Inc. | Synchronous clock generator including a false lock detector |
US5926047A (en) | 1997-08-29 | 1999-07-20 | Micron Technology, Inc. | Synchronous clock generator including a delay-locked loop signal loss detector |
US6101197A (en) * | 1997-09-18 | 2000-08-08 | Micron Technology, Inc. | Method and apparatus for adjusting the timing of signals over fine and coarse ranges |
US6487647B1 (en) * | 1997-12-29 | 2002-11-26 | Intel Corporation | Adaptive memory interface timing generation |
US6269451B1 (en) | 1998-02-27 | 2001-07-31 | Micron Technology, Inc. | Method and apparatus for adjusting data timing by delaying clock signal |
US6016282A (en) * | 1998-05-28 | 2000-01-18 | Micron Technology, Inc. | Clock vernier adjustment |
US6338127B1 (en) | 1998-08-28 | 2002-01-08 | Micron Technology, Inc. | Method and apparatus for resynchronizing a plurality of clock signals used to latch respective digital signals, and memory device using same |
US6349399B1 (en) | 1998-09-03 | 2002-02-19 | Micron Technology, Inc. | Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
US6279090B1 (en) | 1998-09-03 | 2001-08-21 | Micron Technology, Inc. | Method and apparatus for resynchronizing a plurality of clock signals used in latching respective digital signals applied to a packetized memory device |
US6029250A (en) * | 1998-09-09 | 2000-02-22 | Micron Technology, Inc. | Method and apparatus for adaptively adjusting the timing offset between a clock signal and digital signals transmitted coincident with that clock signal, and memory device and system using same |
US6430696B1 (en) | 1998-11-30 | 2002-08-06 | Micron Technology, Inc. | Method and apparatus for high speed data capture utilizing bit-to-bit timing correction, and memory device using same |
US6374360B1 (en) | 1998-12-11 | 2002-04-16 | Micron Technology, Inc. | Method and apparatus for bit-to-bit timing correction of a high speed memory bus |
US7966078B2 (en) | 1999-02-01 | 2011-06-21 | Steven Hoffberg | Network media appliance system and method |
US6470060B1 (en) | 1999-03-01 | 2002-10-22 | Micron Technology, Inc. | Method and apparatus for generating a phase dependent control signal |
US6294937B1 (en) | 1999-05-25 | 2001-09-25 | Lsi Logic Corporation | Method and apparatus for self correcting parallel I/O circuitry |
US6557066B1 (en) | 1999-05-25 | 2003-04-29 | Lsi Logic Corporation | Method and apparatus for data dependent, dual level output driver |
US6307496B1 (en) * | 1999-10-04 | 2001-10-23 | Denso Corporation | Sensing apparatus including an A/D conversion circuit for detecting a physical quantity |
US6801989B2 (en) * | 2001-06-28 | 2004-10-05 | Micron Technology, Inc. | Method and system for adjusting the timing offset between a clock signal and respective digital signals transmitted along with that clock signal, and memory device and computer system using same |
US6680874B1 (en) | 2002-08-29 | 2004-01-20 | Micron Technology, Inc. | Delay lock loop circuit useful in a synchronous system and associated methods |
US7256628B2 (en) * | 2003-01-29 | 2007-08-14 | Sun Microsystems, Inc. | Speed-matching control method and circuit |
US7168027B2 (en) | 2003-06-12 | 2007-01-23 | Micron Technology, Inc. | Dynamic synchronization of data capture on an optical or other high speed communications link |
US7234070B2 (en) * | 2003-10-27 | 2007-06-19 | Micron Technology, Inc. | System and method for using a learning sequence to establish communications on a high-speed nonsynchronous interface in the absence of clock forwarding |
US20060095221A1 (en) * | 2004-11-03 | 2006-05-04 | Teradyne, Inc. | Method and apparatus for controlling variable delays in electronic circuitry |
US20080046789A1 (en) * | 2006-08-21 | 2008-02-21 | Igor Arsovski | Apparatus and method for testing memory devices and circuits in integrated circuits |
US7804371B2 (en) * | 2006-12-31 | 2010-09-28 | Sandisk Corporation | Systems, modules, chips, circuits and methods with delay trim value updates on power-up |
US7765445B2 (en) | 2008-02-16 | 2010-07-27 | International Business Machines Corporation | Analog testing of ring oscillators using built-in self test apparatus |
US20130226496A1 (en) * | 2012-02-29 | 2013-08-29 | Qualcomm Incorporated | Precise calibration of electronic components |
CN104764914A (zh) * | 2014-01-03 | 2015-07-08 | 致茂电子股份有限公司 | 误差补偿方法与应用此方法的自动测试设备 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4417246A (en) * | 1979-11-19 | 1983-11-22 | General Electric Company | Paging receiver having a serial code plug |
US4346343A (en) * | 1980-05-16 | 1982-08-24 | International Business Machines Corporation | Power control means for eliminating circuit to circuit delay differences and providing a desired circuit delay |
US4584695A (en) * | 1983-11-09 | 1986-04-22 | National Semiconductor Corporation | Digital PLL decoder |
US4641048A (en) * | 1984-08-24 | 1987-02-03 | Tektronix, Inc. | Digital integrated circuit propagation delay time controller |
US4813005A (en) * | 1987-06-24 | 1989-03-14 | Hewlett-Packard Company | Device for synchronizing the output pulses of a circuit with an input clock |
-
1989
- 1989-01-30 US US07303927 patent/US4902986B1/en not_active Expired - Lifetime
- 1989-12-26 JP JP1338052A patent/JP2976206B2/ja not_active Expired - Fee Related
-
1990
- 1990-01-19 EP EP90101072A patent/EP0380979B1/de not_active Expired - Lifetime
- 1990-01-19 DE DE90101072T patent/DE69002170T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4902986A (en) | 1990-02-20 |
JPH02251779A (ja) | 1990-10-09 |
EP0380979B1 (de) | 1993-07-14 |
US4902986B1 (en) | 1998-09-01 |
JP2976206B2 (ja) | 1999-11-10 |
EP0380979A2 (de) | 1990-08-08 |
DE69002170T2 (de) | 1994-02-17 |
EP0380979A3 (de) | 1991-10-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: BLUMBACH, KRAMER & PARTNER, 65193 WIESBADEN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: CREDENCE SYSTEMS CORP. (N.D.GESETZEN D.STAATES DEL |
|
8328 | Change in the person/name/address of the agent |
Free format text: ZIPSE & HABERSACK, 80639 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |