DE69011418D1 - Mikroskopische Vorrichtung mit atomarem Sensor. - Google Patents

Mikroskopische Vorrichtung mit atomarem Sensor.

Info

Publication number
DE69011418D1
DE69011418D1 DE69011418T DE69011418T DE69011418D1 DE 69011418 D1 DE69011418 D1 DE 69011418D1 DE 69011418 T DE69011418 T DE 69011418T DE 69011418 T DE69011418 T DE 69011418T DE 69011418 D1 DE69011418 D1 DE 69011418D1
Authority
DE
Germany
Prior art keywords
microscopic device
atomic sensor
atomic
sensor
microscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69011418T
Other languages
English (en)
Other versions
DE69011418T2 (de
Inventor
Akitoshi Toda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE69011418D1 publication Critical patent/DE69011418D1/de
Application granted granted Critical
Publication of DE69011418T2 publication Critical patent/DE69011418T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/58—SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/871—Scanning probe structure with environmental regulation means
DE69011418T 1989-05-29 1990-05-28 Mikroskopische Vorrichtung mit atomarem Sensor. Expired - Fee Related DE69011418T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1135013A JPH02311702A (ja) 1989-05-29 1989-05-29 走査型トンネル顕微鏡装置

Publications (2)

Publication Number Publication Date
DE69011418D1 true DE69011418D1 (de) 1994-09-15
DE69011418T2 DE69011418T2 (de) 1994-12-15

Family

ID=15141893

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69011418T Expired - Fee Related DE69011418T2 (de) 1989-05-29 1990-05-28 Mikroskopische Vorrichtung mit atomarem Sensor.

Country Status (4)

Country Link
US (1) US5047637A (de)
EP (1) EP0400541B1 (de)
JP (1) JPH02311702A (de)
DE (1) DE69011418T2 (de)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2936545B2 (ja) * 1988-06-24 1999-08-23 株式会社日立製作所 走査プローブ顕微鏡
JP2672160B2 (ja) * 1989-10-23 1997-11-05 キヤノン株式会社 振動型アクチュエータ装置
US5253515A (en) * 1990-03-01 1993-10-19 Olympus Optical Co., Ltd. Atomic probe microscope and cantilever unit for use in the microscope
JP2741629B2 (ja) * 1990-10-09 1998-04-22 キヤノン株式会社 カンチレバー型プローブ、それを用いた走査型トンネル顕微鏡及び情報処理装置
DE4041029C1 (en) * 1990-12-20 1992-02-06 Siemens Nixdorf Informationssysteme Ag, 4790 Paderborn, De Component cooler for vacuum chamber - has stamper-like heat sink inserted in sealed opening and directly contacting base of component
US5386720A (en) * 1992-01-09 1995-02-07 Olympus Optical Co., Ltd. Integrated AFM sensor
JP3320472B2 (ja) * 1992-02-03 2002-09-03 株式会社東芝 走査型探針装置
US5267471A (en) * 1992-04-30 1993-12-07 Ibm Corporation Double cantilever sensor for atomic force microscope
US5476006A (en) * 1992-07-07 1995-12-19 Matsushita Electronics Corporation Crystal evaluation apparatus and crystal evaluation method
JP3270165B2 (ja) * 1993-01-22 2002-04-02 セイコーインスツルメンツ株式会社 表面分析及び加工装置
US5537863A (en) * 1993-07-15 1996-07-23 Nikon Corporation Scanning probe microscope having a cantilever used therein
US5410910A (en) * 1993-12-22 1995-05-02 University Of Virginia Patent Foundation Cryogenic atomic force microscope
US5440920A (en) * 1994-02-03 1995-08-15 Molecular Imaging Systems Scanning force microscope with beam tracking lens
US5929438A (en) * 1994-08-12 1999-07-27 Nikon Corporation Cantilever and measuring apparatus using it
CN1054431C (zh) * 1994-08-27 2000-07-12 国际商业机器公司 具有原子分辨率的精密定位装置
DE4442247C2 (de) * 1994-11-28 2000-06-29 Heidenhain Gmbh Dr Johannes Positioniereinrichtung mit Temperaturstabilisierung
US5750989A (en) * 1995-02-10 1998-05-12 Molecular Imaging Corporation Scanning probe microscope for use in fluids
US5874668A (en) * 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
US5907095A (en) * 1996-06-17 1999-05-25 Industrial Technology Research Institute High-sensitivity strain probe
JPH11123195A (ja) * 1997-08-22 1999-05-11 Kdk Corp 生体測定方法及び装置
US6455838B2 (en) 1998-10-06 2002-09-24 The Regents Of The University Of California High sensitivity deflection sensing device
US6185992B1 (en) * 1999-07-15 2001-02-13 Veeco Instruments Inc. Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample
JP3925610B2 (ja) * 2001-02-13 2007-06-06 喜萬 中山 発熱プローブ及び発熱プローブ装置
US20040002655A1 (en) * 2002-06-27 2004-01-01 Acuson, A Siemens Company System and method for improved transducer thermal design using thermo-electric cooling
US7314447B2 (en) * 2002-06-27 2008-01-01 Siemens Medical Solutions Usa, Inc. System and method for actively cooling transducer assembly electronics
JP2004227842A (ja) * 2003-01-21 2004-08-12 Canon Inc プローブ保持装置、試料の取得装置、試料加工装置、試料加工方法、および試料評価方法
DE102004037837B3 (de) * 2004-08-04 2006-05-11 Universität Augsburg Vorrichtung zur Schaffung einer evakuierten Tieftemperaturumgebung für eine Probe und Verwendung der Vorrichtung
US8261662B1 (en) 2004-11-08 2012-09-11 Nanolnk, Inc. Active pen nanolithography
US20060173344A1 (en) * 2005-01-19 2006-08-03 Siemens Medical Solutions Usa, Inc. Method for using a refrigeration system to remove waste heat from an ultrasound transducer
US7956625B1 (en) * 2006-10-31 2011-06-07 Dcg Systems, Inc. Undoped silicon heat spreader window
JP4474405B2 (ja) * 2006-12-21 2010-06-02 株式会社日立ハイテクノロジーズ 試料検査装置及び試料検査方法
JP5907484B2 (ja) * 2010-07-08 2016-04-26 国立大学法人北陸先端科学技術大学院大学 高速走査型プローブ顕微鏡を用いる合成高分子の観測方法
CN102590558B (zh) * 2012-01-10 2013-05-01 西安科技大学 环境扫描电子显微镜内使用的可移动式温度控制系统
US10620118B2 (en) * 2012-02-27 2020-04-14 Steris Instrument Management Services, Inc. Systems and methods for identifying optical materials
CN103537326B (zh) * 2013-10-25 2015-10-07 上海大学 恒温箱及测温系统
CN105510639B (zh) * 2014-09-24 2018-10-19 中国科学院宁波材料技术与工程研究所 一种扫描探针显微镜中的探针、其制备方法及探测方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0194323B1 (de) * 1985-03-07 1989-08-02 International Business Machines Corporation Tunneleffektabtastungsmikroskop
US4747698A (en) * 1986-04-30 1988-05-31 International Business Machines Corp. Scanning thermal profiler
US4841148A (en) * 1988-03-21 1989-06-20 The Board Of Trustees Of The University Of Illinois Variable temperature scanning tunneling microscope

Also Published As

Publication number Publication date
EP0400541B1 (de) 1994-08-10
US5047637A (en) 1991-09-10
EP0400541A1 (de) 1990-12-05
JPH02311702A (ja) 1990-12-27
DE69011418T2 (de) 1994-12-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee