DE69032710T2 - Auf statistischen Prinzipien basiertes kontinuierliches Autokalibrierungsverfahren und -gerät - Google Patents

Auf statistischen Prinzipien basiertes kontinuierliches Autokalibrierungsverfahren und -gerät

Info

Publication number
DE69032710T2
DE69032710T2 DE69032710T DE69032710T DE69032710T2 DE 69032710 T2 DE69032710 T2 DE 69032710T2 DE 69032710 T DE69032710 T DE 69032710T DE 69032710 T DE69032710 T DE 69032710T DE 69032710 T2 DE69032710 T2 DE 69032710T2
Authority
DE
Germany
Prior art keywords
continuous
device based
statistical principles
autocalibration method
autocalibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69032710T
Other languages
English (en)
Other versions
DE69032710D1 (de
Inventor
Howard E Hilton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE69032710D1 publication Critical patent/DE69032710D1/de
Publication of DE69032710T2 publication Critical patent/DE69032710T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0636—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain
    • H03M1/0639—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms
    • H03M1/0641—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms the dither being a random signal
    • G—PHYSICS
    • G12—INSTRUMENT DETAILS
    • G12B—CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G12B13/00—Calibrating of instruments and apparatus
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
    • H03M1/167—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages all stages comprising simultaneous converters
DE69032710T 1989-11-27 1990-11-23 Auf statistischen Prinzipien basiertes kontinuierliches Autokalibrierungsverfahren und -gerät Expired - Fee Related DE69032710T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/442,379 US4996530A (en) 1989-11-27 1989-11-27 Statistically based continuous autocalibration method and apparatus

Publications (2)

Publication Number Publication Date
DE69032710D1 DE69032710D1 (de) 1998-11-26
DE69032710T2 true DE69032710T2 (de) 1999-03-11

Family

ID=23756589

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69032710T Expired - Fee Related DE69032710T2 (de) 1989-11-27 1990-11-23 Auf statistischen Prinzipien basiertes kontinuierliches Autokalibrierungsverfahren und -gerät

Country Status (5)

Country Link
US (1) US4996530A (de)
EP (2) EP0430599B1 (de)
JP (1) JP3173783B2 (de)
CA (1) CA2029944C (de)
DE (1) DE69032710T2 (de)

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DE10133538A1 (de) * 2001-07-11 2003-01-30 Infineon Technologies Ag Kalibriereinrichtung zur Kalibrierung von A/D-Wandlern mit beliebigem Bitgewicht
DE102004049348A1 (de) * 2004-10-08 2006-04-20 Micronas Gmbh Verfahren sowie Einrichtung zur Kompensation von Kennlinienfehlern eines Analog-Digital-Wandlers

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US7171016B1 (en) 1993-11-18 2007-01-30 Digimarc Corporation Method for monitoring internet dissemination of image, video and/or audio files
DE69432480T2 (de) * 1993-11-18 2004-03-18 Digimarc Corp., Tualatin Identifikations/beglaubigungskodierungsverfahren und -vorrichtung
US6614914B1 (en) 1995-05-08 2003-09-02 Digimarc Corporation Watermark embedder and reader
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US6516079B1 (en) 2000-02-14 2003-02-04 Digimarc Corporation Digital watermark screening and detecting strategies
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US5832119C1 (en) * 1993-11-18 2002-03-05 Digimarc Corp Methods for controlling systems using control signals embedded in empirical data
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US6625297B1 (en) * 2000-02-10 2003-09-23 Digimarc Corporation Self-orienting watermarks
SE517536C2 (sv) 2000-03-14 2002-06-18 Ericsson Telefon Ab L M Anordning samt metod för bakgrundskalibrering av A/D- omvandlare
US6466189B1 (en) * 2000-03-29 2002-10-15 Koninklijke Philips Electronics N.V. Digitally controlled current integrator for reflective liquid crystal displays
US6496173B1 (en) * 2000-03-29 2002-12-17 Koninklijke Philips Electronics N.V. RLCD transconductance sample and hold column buffer
US7027614B2 (en) 2000-04-19 2006-04-11 Digimarc Corporation Hiding information to reduce or offset perceptible artifacts
US6804377B2 (en) 2000-04-19 2004-10-12 Digimarc Corporation Detecting information hidden out-of-phase in color channels
US7171542B1 (en) * 2000-06-19 2007-01-30 Silicon Labs Cp, Inc. Reconfigurable interface for coupling functional input/output blocks to limited number of i/o pins
US6404369B1 (en) * 2000-09-29 2002-06-11 Teradyne, Inc. Digital to analog converter employing sigma-delta loop and feedback DAC model
US6901422B1 (en) * 2001-03-21 2005-05-31 Apple Computer, Inc. Matrix multiplication in a vector processing system
US6563444B2 (en) * 2001-03-30 2003-05-13 Iowa State University Research Foundation, Inc. Apparatus for and method of performing a conversion operation
US6489913B1 (en) 2001-09-24 2002-12-03 Tektronix, Inc. Sub-ranging analog-to-digital converter using a sigma delta converter
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US7694887B2 (en) * 2001-12-24 2010-04-13 L-1 Secure Credentialing, Inc. Optically variable personalized indicia for identification documents
EP1459246B1 (de) * 2001-12-24 2012-05-02 L-1 Secure Credentialing, Inc. Verfahren zur vollfarb-markierung von id-dokumenten
EP1459239B1 (de) * 2001-12-24 2012-04-04 L-1 Secure Credentialing, Inc. Verdeckte variableninformationen auf id-dokumenten und verfahren zu ihrer herstellung
US7728048B2 (en) 2002-12-20 2010-06-01 L-1 Secure Credentialing, Inc. Increasing thermal conductivity of host polymer used with laser engraving methods and compositions
US6781531B2 (en) 2002-01-15 2004-08-24 Raytheon Company Statistically based cascaded analog-to-digital converter calibration technique
US7824029B2 (en) 2002-05-10 2010-11-02 L-1 Secure Credentialing, Inc. Identification card printer-assembler for over the counter card issuing
US7804982B2 (en) 2002-11-26 2010-09-28 L-1 Secure Credentialing, Inc. Systems and methods for managing and detecting fraud in image databases used with identification documents
DE10255354B3 (de) * 2002-11-27 2004-03-04 Infineon Technologies Ag A/D-Wandler mit minimiertem Umschaltfehler
US7712673B2 (en) 2002-12-18 2010-05-11 L-L Secure Credentialing, Inc. Identification document with three dimensional image of bearer
DE10305972A1 (de) * 2003-02-13 2004-09-02 Micronas Gmbh Kompensationsschaltungsanordnung und Kompensationsverfahren zum Kompensieren von nicht-linearen Verzerrungen eines AD-Wandlers
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10133538A1 (de) * 2001-07-11 2003-01-30 Infineon Technologies Ag Kalibriereinrichtung zur Kalibrierung von A/D-Wandlern mit beliebigem Bitgewicht
DE10133538B4 (de) * 2001-07-11 2004-02-19 Infineon Technologies Ag Kalibriereinrichtung zur Kalibrierung von A/D-Wandlern mit beliebigem Bitgewicht
DE102004049348A1 (de) * 2004-10-08 2006-04-20 Micronas Gmbh Verfahren sowie Einrichtung zur Kompensation von Kennlinienfehlern eines Analog-Digital-Wandlers

Also Published As

Publication number Publication date
US4996530A (en) 1991-02-26
EP0430599A2 (de) 1991-06-05
EP0430599A3 (en) 1993-04-14
EP0616433A1 (de) 1994-09-21
CA2029944C (en) 2000-11-07
DE69032710D1 (de) 1998-11-26
EP0430599B1 (de) 1998-10-21
CA2029944A1 (en) 1991-05-28
JPH03181227A (ja) 1991-08-07
JP3173783B2 (ja) 2001-06-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee