DE69105815T2 - Fehlerkorrektur für CCD- und CID-Bilderzeugungsvorrichtungen. - Google Patents

Fehlerkorrektur für CCD- und CID-Bilderzeugungsvorrichtungen.

Info

Publication number
DE69105815T2
DE69105815T2 DE69105815T DE69105815T DE69105815T2 DE 69105815 T2 DE69105815 T2 DE 69105815T2 DE 69105815 T DE69105815 T DE 69105815T DE 69105815 T DE69105815 T DE 69105815T DE 69105815 T2 DE69105815 T2 DE 69105815T2
Authority
DE
Germany
Prior art keywords
frame buffer
imaging device
pixel data
register
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69105815T
Other languages
English (en)
Other versions
DE69105815D1 (de
Inventor
David D Pape
Wanda T Reiss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Polaroid Corp
Original Assignee
Polaroid Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Polaroid Corp filed Critical Polaroid Corp
Publication of DE69105815D1 publication Critical patent/DE69105815D1/de
Application granted granted Critical
Publication of DE69105815T2 publication Critical patent/DE69105815T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection
DE69105815T 1990-05-24 1991-03-20 Fehlerkorrektur für CCD- und CID-Bilderzeugungsvorrichtungen. Expired - Fee Related DE69105815T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/528,123 US5047863A (en) 1990-05-24 1990-05-24 Defect correction apparatus for solid state imaging devices including inoperative pixel detection

Publications (2)

Publication Number Publication Date
DE69105815D1 DE69105815D1 (de) 1995-01-26
DE69105815T2 true DE69105815T2 (de) 1995-04-20

Family

ID=24104352

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69105815T Expired - Fee Related DE69105815T2 (de) 1990-05-24 1991-03-20 Fehlerkorrektur für CCD- und CID-Bilderzeugungsvorrichtungen.

Country Status (9)

Country Link
US (1) US5047863A (de)
EP (1) EP0458030B1 (de)
JP (1) JPH0670238A (de)
AT (1) ATE115811T1 (de)
CA (1) CA2038914A1 (de)
DE (1) DE69105815T2 (de)
DK (1) DK0458030T3 (de)
ES (1) ES2068411T3 (de)
GR (1) GR3015401T3 (de)

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US7872678B2 (en) 2002-02-04 2011-01-18 Pilz Gmbh & Co. Kg Method for checking functional reliability of an image sensor having a plurality of pixels

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US6381374B1 (en) * 1998-10-30 2002-04-30 General Electric Company Histogram analysis method for defective pixel identification
JP3532781B2 (ja) * 1999-02-12 2004-05-31 株式会社メガチップス 画像入力装置の画像処理回路
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JP4199874B2 (ja) * 1999-03-30 2008-12-24 富士フイルム株式会社 画像処理装置及び処理方法
AU4079800A (en) * 1999-04-13 2000-11-14 Rochester Institute Of Technology Method and system for reducing noise in a digital image and apparatus thereof
US7324143B1 (en) 1999-04-13 2008-01-29 Rochester Institute Of Technology Method and system for reducing noise in a digital image and apparatus thereof
US6661456B1 (en) * 1999-04-30 2003-12-09 General Electric Company Imaging of pixel defects in digital detectors
US7140766B2 (en) * 1999-08-04 2006-11-28 Given Imaging Ltd. Device, system and method for temperature sensing in an in-vivo device
US6654054B1 (en) 1999-11-02 2003-11-25 Agilent Technologies, Inc. Method and apparatus for canceling the effects of noise in an electronic signal
US6792159B1 (en) 1999-12-29 2004-09-14 Ge Medical Systems Global Technology Company, Llc Correction of defective pixels in a detector using temporal gradients
US7068854B1 (en) 1999-12-29 2006-06-27 Ge Medical Systems Global Technology Company, Llc Correction of defective pixels in a detector
US6768512B1 (en) * 2000-07-12 2004-07-27 Vanguard International Semiconductor Corp. Method of bad pixel correction
JP2002354340A (ja) * 2001-05-24 2002-12-06 Olympus Optical Co Ltd 撮像装置
US6737625B2 (en) 2001-06-28 2004-05-18 Agilent Technologies, Inc. Bad pixel detection and correction in an image sensing device
US6623161B2 (en) 2001-08-28 2003-09-23 Ge Medical Systems Global Technology Company, Llc Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
US6663281B2 (en) 2001-09-25 2003-12-16 Ge Medical Systems Global Technology Company, Llc X-ray detector monitoring
US6974973B2 (en) * 2002-11-08 2005-12-13 Micron Technology, Inc. Apparatus for determining temperature of an active pixel imager and correcting temperature induced variations in an imager
US6919568B2 (en) 2003-04-08 2005-07-19 Ge Medical Systems Global Technology Company Llc Method and apparatus for identifying composite defective pixel map
EP1594308A1 (de) * 2004-05-07 2005-11-09 Dialog Semiconductor GmbH Korrektur von defekten RGB Bildpunkten einer einzelnen Zeile eines Bayerfilters
US20060262210A1 (en) * 2005-05-19 2006-11-23 Micron Technology, Inc. Method and apparatus for column-wise suppression of noise in an imager
JP4351658B2 (ja) * 2005-07-21 2009-10-28 マイクロン テクノロジー， インク． メモリ容量低減化方法、メモリ容量低減化雑音低減化回路及びメモリ容量低減化装置
JP2008048104A (ja) 2006-08-14 2008-02-28 Sony Corp 撮像装置と欠陥補正回路および欠陥補正方法
US7796806B2 (en) * 2006-09-25 2010-09-14 Nokia Corporation Removing singlet and couplet defects from images
DE102007013620A1 (de) * 2007-03-21 2008-09-25 Siemens Ag Vorrichtung und Verfahren zur Überwachung von Festkörperdetektoren
US20100231763A1 (en) * 2009-03-16 2010-09-16 Harris Corporation, Corporation Of The State Of Delaware Defective pixel detector for a digital video camera and associated methods
JP5521460B2 (ja) * 2009-09-18 2014-06-11 ソニー株式会社 撮像装置および方法、電子機器、並びにプログラム
KR101559724B1 (ko) 2010-11-12 2015-10-13 인디안 인스티튜트 오브 테크놀로지, 카라그푸르 센서 어레이의 불량 픽셀 검출과 에러 은폐를 위한 방법 및 장치
EP2721810B1 (de) 2011-07-11 2015-08-26 Fraunhofer Gesellschaft zur Förderung der angewandten Forschung E.V. Kameravorrichtung und kamera
US8830361B2 (en) 2012-04-12 2014-09-09 Taiwan Semiconductor Manufacturing Company, Ltd. Method of reducing column fixed pattern noise
US9014504B2 (en) * 2012-05-31 2015-04-21 Apple Inc. Systems and methods for highlight recovery in an image signal processor

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7872678B2 (en) 2002-02-04 2011-01-18 Pilz Gmbh & Co. Kg Method for checking functional reliability of an image sensor having a plurality of pixels

Also Published As

Publication number Publication date
DK0458030T3 (da) 1995-02-20
ES2068411T3 (es) 1995-04-16
EP0458030B1 (de) 1994-12-14
DE69105815D1 (de) 1995-01-26
GR3015401T3 (en) 1995-06-30
ATE115811T1 (de) 1994-12-15
EP0458030A1 (de) 1991-11-27
US5047863A (en) 1991-09-10
JPH0670238A (ja) 1994-03-11
CA2038914A1 (en) 1991-11-25

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee