DE69124711D1 - Halbleiter-Speichereinrichtung - Google Patents

Halbleiter-Speichereinrichtung

Info

Publication number
DE69124711D1
DE69124711D1 DE69124711T DE69124711T DE69124711D1 DE 69124711 D1 DE69124711 D1 DE 69124711D1 DE 69124711 T DE69124711 T DE 69124711T DE 69124711 T DE69124711 T DE 69124711T DE 69124711 D1 DE69124711 D1 DE 69124711D1
Authority
DE
Germany
Prior art keywords
storage device
semiconductor storage
semiconductor
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69124711T
Other languages
English (en)
Other versions
DE69124711T2 (de
Inventor
Shinsuke Takase
Toshiya Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba Electronic Device Solutions Corp
Original Assignee
Toshiba Corp
Toshiba Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Microelectronics Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE69124711D1 publication Critical patent/DE69124711D1/de
Publication of DE69124711T2 publication Critical patent/DE69124711T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69124711T 1990-04-21 1991-04-19 Halbleiter-Speichereinrichtung Expired - Lifetime DE69124711T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2105908A JP2723338B2 (ja) 1990-04-21 1990-04-21 半導体メモリ装置

Publications (2)

Publication Number Publication Date
DE69124711D1 true DE69124711D1 (de) 1997-03-27
DE69124711T2 DE69124711T2 (de) 1997-07-03

Family

ID=14419971

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69124711T Expired - Lifetime DE69124711T2 (de) 1990-04-21 1991-04-19 Halbleiter-Speichereinrichtung

Country Status (5)

Country Link
US (1) US5355331A (de)
EP (1) EP0453997B1 (de)
JP (1) JP2723338B2 (de)
KR (1) KR950006425B1 (de)
DE (1) DE69124711T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3280704B2 (ja) * 1992-05-29 2002-05-13 株式会社東芝 半導体記憶装置
EP0691612A1 (de) * 1994-07-07 1996-01-10 International Business Machines Corporation Prüfungsschaltkreis eingebetteter Speichermatrizen in gemischter Logistik und Speicherchips
JP2931776B2 (ja) * 1995-08-21 1999-08-09 三菱電機株式会社 半導体集積回路
US5754468A (en) * 1996-06-26 1998-05-19 Simon Fraser University Compact multiport static random access memory cell
US5745405A (en) * 1996-08-26 1998-04-28 Taiwan Semiconductor Manufacturing Company, Ltd Process leakage evaluation and measurement method
US6208567B1 (en) * 1997-01-31 2001-03-27 Matsushita Electric Industrial Co., Ltd. Semiconductor device capable of cutting off a leakage current in a defective array section
US5764581A (en) * 1997-03-04 1998-06-09 Advanced Micro Devices Inc. Dynamic ram with two-transistor cell
TW573288B (en) 2001-09-28 2004-01-21 Sony Corp Display memory, drive circuit, display and portable information apparatus
JP5225453B2 (ja) * 2005-05-23 2013-07-03 ルネサスエレクトロニクス株式会社 半導体装置
US7599210B2 (en) * 2005-08-19 2009-10-06 Sony Corporation Nonvolatile memory cell, storage device and nonvolatile logic circuit
JP2011146121A (ja) * 2011-03-23 2011-07-28 Fujitsu Semiconductor Ltd 半導体記憶装置およびその制御方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3621302A (en) * 1969-01-15 1971-11-16 Ibm Monolithic-integrated semiconductor array having reduced power consumption
JPS5589984A (en) * 1978-12-28 1980-07-08 Fujitsu Ltd Static memory cell
JPS5685934A (en) * 1979-12-14 1981-07-13 Nippon Telegr & Teleph Corp <Ntt> Control signal generating circuit
JPS581884A (ja) * 1981-06-29 1983-01-07 Fujitsu Ltd スタティックｒａｍの電源供給方式
JPS58122693A (ja) * 1982-01-14 1983-07-21 Nippon Telegr & Teleph Corp <Ntt> メモリ回路
JPS5957525A (ja) * 1982-09-28 1984-04-03 Fujitsu Ltd Ｃｍｉｓ回路装置
JPH01166391A (ja) * 1987-12-23 1989-06-30 Toshiba Corp スタティック型ランダムアクセスメモリ
US5159571A (en) * 1987-12-29 1992-10-27 Hitachi, Ltd. Semiconductor memory with a circuit for testing characteristics of flip-flops including selectively applied power supply voltages
DE58903906D1 (de) * 1988-02-10 1993-05-06 Siemens Ag Redundanzdekoder eines integrierten halbleiterspeichers.
JPH07109864B2 (ja) * 1989-09-13 1995-11-22 シャープ株式会社 スタティックｒａｍ

Also Published As

Publication number Publication date
DE69124711T2 (de) 1997-07-03
JPH046695A (ja) 1992-01-10
EP0453997B1 (de) 1997-02-19
EP0453997A1 (de) 1991-10-30
KR950006425B1 (ko) 1995-06-15
JP2723338B2 (ja) 1998-03-09
US5355331A (en) 1994-10-11
KR910019055A (ko) 1991-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition