DE69223471T2 - Atmospherdruckionisation-Massenspektrometer und Vakuumanlage dafür - Google Patents

Atmospherdruckionisation-Massenspektrometer und Vakuumanlage dafür

Info

Publication number
DE69223471T2
DE69223471T2 DE69223471T DE69223471T DE69223471T2 DE 69223471 T2 DE69223471 T2 DE 69223471T2 DE 69223471 T DE69223471 T DE 69223471T DE 69223471 T DE69223471 T DE 69223471T DE 69223471 T2 DE69223471 T2 DE 69223471T2
Authority
DE
Germany
Prior art keywords
atmospheric pressure
mass spectrometer
vacuum system
ionization mass
system therefor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69223471T
Other languages
English (en)
Other versions
DE69223471D1 (de
Inventor
Yoshiaki Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE69223471D1 publication Critical patent/DE69223471D1/de
Publication of DE69223471T2 publication Critical patent/DE69223471T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
DE69223471T 1991-09-12 1992-09-11 Atmospherdruckionisation-Massenspektrometer und Vakuumanlage dafür Expired - Lifetime DE69223471T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3232956A JP2913924B2 (ja) 1991-09-12 1991-09-12 質量分析の方法および装置

Publications (2)

Publication Number Publication Date
DE69223471D1 DE69223471D1 (de) 1998-01-22
DE69223471T2 true DE69223471T2 (de) 1998-07-16

Family

ID=16947503

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69223471T Expired - Lifetime DE69223471T2 (de) 1991-09-12 1992-09-11 Atmospherdruckionisation-Massenspektrometer und Vakuumanlage dafür

Country Status (4)

Country Link
US (2) US5298743A (de)
EP (1) EP0532046B1 (de)
JP (1) JP2913924B2 (de)
DE (1) DE69223471T2 (de)

Families Citing this family (28)

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US5304798A (en) * 1992-04-10 1994-04-19 Millipore Corporation Housing for converting an electrospray to an ion stream
DE4322102C2 (de) * 1993-07-02 1995-08-17 Bergmann Thorald Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle
GB9324213D0 (en) * 1993-11-25 1994-01-12 Kore Tech Ltd Vacuum inlet
US5495107A (en) * 1994-04-06 1996-02-27 Thermo Jarrell Ash Corporation Analysis
DE4415480C2 (de) * 1994-05-02 1999-09-02 Bruker Daltonik Gmbh Vorrichtung und Verfahren zur massenspektrometrischen Untersuchung von Substanzgemischen durch Kopplung kapillarelektrophoretischer Separation (CE) mit Elektrospray-Ionisierung (ESI)
DE19520276C2 (de) * 1995-06-02 1999-08-26 Bruker Daltonik Gmbh Vorrichtung für die Einführung von Ionen in ein Massenspektrometer
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
US5672868A (en) * 1996-02-16 1997-09-30 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
DE69824586T2 (de) * 1997-06-26 2005-06-23 PerSeptive Biosystems, Inc., Framingham Probenträger hoher dichte für die analyse biologischer proben
US6122050A (en) * 1998-02-26 2000-09-19 Cornell Research Foundation, Inc. Optical interface for a radially viewed inductively coupled argon plasma-Optical emission spectrometer
JP3581604B2 (ja) * 1999-09-13 2004-10-27 株式会社日立製作所 大気圧イオン化質量分析装置
US6528784B1 (en) * 1999-12-03 2003-03-04 Thermo Finnigan Llc Mass spectrometer system including a double ion guide interface and method of operation
US20020115056A1 (en) * 2000-12-26 2002-08-22 Goodlett David R. Rapid and quantitative proteome analysis and related methods
US7405397B2 (en) * 2002-03-28 2008-07-29 Mds Sciex Inc. Laser desorption ion source with ion guide coupling for ion mass spectroscopy
GB0305796D0 (en) * 2002-07-24 2003-04-16 Micromass Ltd Method of mass spectrometry and a mass spectrometer
US7015466B2 (en) * 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
US7259371B2 (en) * 2005-01-10 2007-08-21 Applera Corporation Method and apparatus for improved sensitivity in a mass spectrometer
US7256395B2 (en) * 2005-01-10 2007-08-14 Applera Corporation Method and apparatus for improved sensitivity in a mass spectrometer
US20070095726A1 (en) * 2005-10-28 2007-05-03 Tihiro Ohkawa Chafftron
GB0609253D0 (en) * 2006-05-10 2006-06-21 Micromass Ltd Mass spectrometer
US8288719B1 (en) * 2006-12-29 2012-10-16 Griffin Analytical Technologies, Llc Analytical instruments, assemblies, and methods
WO2009030048A1 (en) * 2007-09-07 2009-03-12 Ionics Mass Spectrometry Group, Inc. Multi-pressure stage mass spectrometer and methods
JP5671145B2 (ja) * 2010-10-21 2015-02-18 アドヴィオン インコーポレーテッドＡｄｖｉｏｎ Ｉｎｃ． 質量分析計の大気圧イオン化導入口
EP2643845B1 (de) * 2010-11-26 2022-03-30 Analytik Jena GmbH Verbesserungen an oder im zusammenhang mit massenspektrometrie
EP2660590A1 (de) * 2010-12-27 2013-11-06 Shiseido Co., Ltd. Massenspektrometrisches verfahren, massenspektrometer und massenspektrometriesystem
JP5792561B2 (ja) * 2011-08-25 2015-10-14 株式会社日立製作所 自動クリーニング機能付き質量分析装置
US9368335B1 (en) 2015-02-02 2016-06-14 Thermo Finnigan Llc Mass spectrometer
JP7047936B2 (ja) * 2018-11-29 2022-04-05 株式会社島津製作所 質量分析装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3842266A (en) * 1973-04-11 1974-10-15 Us Air Force Atmospheric sampling probe for a mass spectrometer
US4209696A (en) * 1977-09-21 1980-06-24 Fite Wade L Methods and apparatus for mass spectrometric analysis of constituents in liquids
JPS6215747A (ja) * 1985-07-15 1987-01-24 Hitachi Ltd 質量分析計
JPS6220231A (ja) * 1985-07-18 1987-01-28 Seiko Instr & Electronics Ltd Ｉｃｐ質量分析装置
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
JP2753265B2 (ja) * 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
US4963735A (en) * 1988-11-11 1990-10-16 Hitachi, Ltd. Plasma source mass spectrometer
US4996424A (en) * 1990-05-03 1991-02-26 Hitachi, Ltd. Atmospheric pressure ionization mass spectrometer
US5015845A (en) * 1990-06-01 1991-05-14 Vestec Corporation Electrospray method for mass spectrometry
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus

Also Published As

Publication number Publication date
US5298743A (en) 1994-03-29
EP0532046B1 (de) 1997-12-10
JP2913924B2 (ja) 1999-06-28
EP0532046A1 (de) 1993-03-17
DE69223471D1 (de) 1998-01-22
US5744798A (en) 1998-04-28
JPH0574409A (ja) 1993-03-26

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